Citations refer to the original publication, not to a Scieee localized version.
Escobar-Galindo, R., Gago, R., Duday, D., & Palacio Orcajo, C. (2010). Towards nanometric resolution in multilayer depth profiling: a comparative study of RBS, SIMS, XPS and GDOES. SpringerLink. https://doi.org/10.1007/s00216-009-3339-y
Escobar-Galindo, Ramón, et al. Towards nanometric resolution in multilayer depth profiling: a comparative study of RBS, SIMS, XPS and GDOES. SpringerLink, 2010. https://doi.org/10.1007/s00216-009-3339-y.
Escobar-Galindo, Ramón, Raúl Gago, David Duday, and Carlos Palacio Orcajo. Towards nanometric resolution in multilayer depth profiling: a comparative study of RBS, SIMS, XPS and GDOES. SpringerLink, 2010. https://doi.org/10.1007/s00216-009-3339-y.
Escobar-Galindo, R. et al. (2010) Towards nanometric resolution in multilayer depth profiling: a comparative study of RBS, SIMS, XPS and GDOES. SpringerLink. Available at: https://doi.org/10.1007/s00216-009-3339-y.
R. Escobar-Galindo, R. Gago, D. Duday, and C. Palacio Orcajo, “Towards nanometric resolution in multilayer depth profiling: a comparative study of RBS, SIMS, XPS and GDOES,” SpringerLink, 2010, doi: 10.1007/s00216-009-3339-y.
@misc{escobargalindo2010towards,
author = {Escobar-Galindo, Ramón and Gago, Raúl and Duday, David and Palacio Orcajo, Carlos},
title = {Towards nanometric resolution in multilayer depth profiling: a comparative study of RBS, SIMS, XPS and GDOES},
year = {2010},
publisher = {SpringerLink},
doi = {10.1007/s00216-009-3339-y},
url = {https://doi.org/10.1007/s00216-009-3339-y}
}
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