h ps:// adnex .web.ce n.ch/
h ps://www.linkedin.com/company/ adnex
EDMS NO.
3328320
VALIDITY
Released
REV.
1.0
DOI: 10.5281/zenodo.17288061
RADNEXT T ansna ional Access Summa y Repo
P ojec i le
Enhancing Neu omo phic Tole ance o Radia ion h ough
Algo i hm-Ha dwa e Linking (ENTHRAL)
P ojec TA iden i ie
TA12-384
Gene al applica ion
Space, high- eliabili y g ound le el
Type o es
SEE
G oup leade , Ins i u e
Ma co O a i
Co-au ho s, Ins i u es
B uno End es Fo lin, Uni e si y o Twen e
Elijah Cishugi, Uni e si y o Twen e
Tijmen Smi , Uni e si y o Twen e
Da e(s) o he expe imen
03 May 2025 o 05 May 2025
Facili y
ChipIR
Amoun o access g an ed
48 h
Objec i es o he expe imen s
This p oposal aims o e alua e he eliabili y o neu omo phic p ocesso s agains adia ion-induced
aul s. Neu omo phic p ocesso s mimic he neu al a chi ec u e o he human b ain and o e e icien ,
low-powe compu a ion ac oss a ious applica ions. Howe e , unde s anding hei esilience o
adia ion is c ucial, pa icula ly in c i ical en i onmen s like au omo i e, space, nuclea acili ies, and
medical de ices. While a ew s udies ha e examined hei eliabili y, we ocus on i e a i e design
echniques o imp o e eliabili y a he a chi ec u e le el, using Flash-based FPGAs. Neu omo phic
p ocesso s o e signi ican ad ancemen s in compu a ional e iciency and eal- ime p ocessing
capabili ies. Howe e , hei unique a chi ec u e and algo i hmic choices may in oduce ulne abili ies
o adia ion-induced aul s ha ha e ye o be ully explo ed. By le e aging Flash based FPGAs, we
aim o mo e accu a ely mimic he beha iou o dedica ed ASIC uni s, p o iding a mo e eliable
assessmen o adia ion ole ance compa ed o adi ional SRAM FPGA-based e alua ions.
Expe imen es epo
The expe imen al se up consis ed o 10xSma Fusion 2 Flash FPGAs and 1xPola Fi e Flash FPGA.
Sma Fusions we e used o es mul iple ha dwa e implemen a ions o ha dwa e accele a o s and
RISC-V so co es, he Pola Fi e FPGA was used o es he pe o mance o online lea ning o
Neu omo phic p ocessing a chi ec u e. A b ie desc ip ion o each expe imen ollows:
1. Valida ion o p obabilis ic e o de ec ion mechanisms
2. Valida ion o so wa e eliabili y mechanisms
3. Cha ac e iza ion o a cus om RISC-V ope a ing sys em
EDMS 3328320 .1 s a us In Wo k access Res ic ed
PDF om TA12-384-Zenodo.doc modi ied 2025-10-07 16:11
h ps:// adnex .web.ce n.ch/
h ps://www.linkedin.com/company/ adnex
EDMS NO.
3328320
VALIDITY
Released
REV.
1.0
4. Cha ac e iza ion o online lea ning on a Neu omo phic p ocesso .
Each expe imen had mul iple con igu a ions o alida e di e en pa ame e s. The measu emen s om
each expe imen consis ed o pe o ming a speci ic compu a ion ou ine wi h a known esul . The ou pu
o he compu a ion was ansmi ed ou o he De ice Unde Tes (DUT) ia a UART/E he ne adap e .
The alida ion o he co ec esul is done en i ely in pos -p ocessing.
A p elimina y o e iew o he esul s o each expe imen ollows:
1. This expe imen is a ollow up om ou p e ious ChipIR campaign. Imp o emen s o he
p obabilis ic s uc u es we e implemen ed and es ed. Resul s a e cu en ly being
p ocessed, bu p elimina y esul s show ha he modi ica ions we e success ul in imp o ing
he esul s om p e ious campaigns.
2. These expe imen s we e pe o med in coope a ion wi h he Uni e si y o Pu due and aimed a
alida ing compile -based aul eliabili y me hods execu ing on a RISC-V p ocesso . The
esul s a e cu en ly being e alua ed by he Pu due eam.
3. This cus om RISC-V ope a ing sys em has been in de elopmen o he pas 3 yea s. The goal
o his campaign was o alida e he so wa e de ec ion mechanisms o imp o e he
de ec ion o SDCs ha would o he wise be unde ec able. The esul s show ha indeed ou
me hodology wo ks and has disco e ed mo e e o s han i i sel caused. A jou nal pape is
cu en ly being w i en.
4. This wo k was pa o a mas e hesis assignmen . The s uden implemen ed neu omo phic
compu ing a chi ec u e on a Flash FPGA. Resul s show ha he ne wo k is o a ce ain
ex en esilien o e o s and online lea ning can imp o e esul s, bu a he same ime, he
a chi ec u e consis s o many ACE bi s (c i ical single poin s o ailu e). The e o e, ha dening
is necessa y ega dless o aining me hod o main ain a high accu acy.
Ou come o he expe imen s
Please indica e wha he expe imen is likely o lead o by pu ing an ‘X’ nex o one o mo e o he
possible ou comes below.
Jou nal publica ion
x
Da a o Thesis
x
Follow-up expe imen a same acili y
x
Follow-up expe imen a ano he acili y
x
O he
As a RADNEXT use , we encou age you o submi he scien i ic esul s o you expe imen s o jou nals
as well as o he NSREC and RADECS da a wo kshops. Please emembe o include he RADNEXT
acknowledgmen in o you publica ions!
RADNEXT acknowledgmen :
This p ojec has ecei ed unding om he Eu opean Union's Ho izon 2020
esea ch and inno a ion p og amme unde g an ag eemen No 101008126.
