Citations refer to the original publication, not to a Scieee localized version.
Schierholz, R., Lacroix, B., Fortio Godinho, V. C., Caballero Hernández, J., Duchamp, M., & Fernández Camacho, A. (2015). STEM‐EELS analysis reveals stable high‐density He in nanopores of amorphous silicon coatings deposited by magnetron sputtering. IOP Publishing. https://doi.org/10.1088/0957-4484/26/7/075703
Schierholz, Roland, et al. STEM‐EELS analysis reveals stable high‐density He in nanopores of amorphous silicon coatings deposited by magnetron sputtering. IOP Publishing, 2015. https://doi.org/10.1088/0957-4484/26/7/075703.
Schierholz, Roland, Bertrand Lacroix, Vanda Cristina Fortio Godinho, Jaime Caballero Hernández, Martial Duchamp, and Asunción Fernández Camacho. STEM‐EELS analysis reveals stable high‐density He in nanopores of amorphous silicon coatings deposited by magnetron sputtering. IOP Publishing, 2015. https://doi.org/10.1088/0957-4484/26/7/075703.
Schierholz, R. et al. (2015) STEM‐EELS analysis reveals stable high‐density He in nanopores of amorphous silicon coatings deposited by magnetron sputtering. IOP Publishing. Available at: https://doi.org/10.1088/0957-4484/26/7/075703.
R. Schierholz, B. Lacroix, V. C. Fortio Godinho, J. Caballero Hernández, M. Duchamp, and A. Fernández Camacho, “STEM‐EELS analysis reveals stable high‐density He in nanopores of amorphous silicon coatings deposited by magnetron sputtering,” IOP Publishing, 2015, doi: 10.1088/0957-4484/26/7/075703.
@misc{schierholz2015stemeels,
author = {Schierholz, Roland and Lacroix, Bertrand and Fortio Godinho, Vanda Cristina and Caballero Hernández, Jaime and Duchamp, Martial and Fernández Camacho, Asunción},
title = {STEM‐EELS analysis reveals stable high‐density He in nanopores of amorphous silicon coatings deposited by magnetron sputtering},
year = {2015},
publisher = {IOP Publishing},
doi = {10.1088/0957-4484/26/7/075703},
url = {https://doi.org/10.1088/0957-4484/26/7/075703}
}
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