Citations refer to the original publication, not to a Scieee localized version.
Cortés Giraldo, M. A., Quesada Molina, J. M., Gallardo Fuentes, M. I., Espino Navas, J. M., Ovejero Mayoral, M. D. C., Ruiz Prieto, M., Arráns Lara, R., González Álvarez, M. A., Pérez Vega-Leal, A., & Abou-Haidar, Z. (2012). Output factor determination for dose measurements in axial and perpendicular planes using a silicon strip detector. American Physical Society. https://doi.org/10.1103/PhysRevSTAB.15.042802
Cortés Giraldo, Miguel Antonio, et al. Output factor determination for dose measurements in axial and perpendicular planes using a silicon strip detector. American Physical Society, 2012. https://doi.org/10.1103/PhysRevSTAB.15.042802.
Cortés Giraldo, Miguel Antonio, José Manuel Quesada Molina, María Isabel Gallardo Fuentes, José Manuel Espino Navas, María Del Carmen Ovejero Mayoral, Manuel Ruiz Prieto, Rafael Arráns Lara, Marcos Aurelio González Álvarez, Alfredo Pérez Vega-Leal, and Z. Abou-Haidar. Output factor determination for dose measurements in axial and perpendicular planes using a silicon strip detector. American Physical Society, 2012. https://doi.org/10.1103/PhysRevSTAB.15.042802.
Cortés Giraldo, M. A. et al. (2012) Output factor determination for dose measurements in axial and perpendicular planes using a silicon strip detector. American Physical Society. Available at: https://doi.org/10.1103/PhysRevSTAB.15.042802.
M. A. Cortés Giraldo et al., “Output factor determination for dose measurements in axial and perpendicular planes using a silicon strip detector,” American Physical Society, 2012, doi: 10.1103/PhysRevSTAB.15.042802.
@misc{cortesgiraldo2012output,
author = {Cortés Giraldo, Miguel Antonio and Quesada Molina, José Manuel and Gallardo Fuentes, María Isabel and Espino Navas, José Manuel and Ovejero Mayoral, María Del Carmen and Ruiz Prieto, Manuel and Arráns Lara, Rafael and González Álvarez, Marcos Aurelio and Pérez Vega-Leal, Alfredo and Abou-Haidar, Z.},
title = {Output factor determination for dose measurements in axial and perpendicular planes using a silicon strip detector},
year = {2012},
publisher = {American Physical Society},
doi = {10.1103/PhysRevSTAB.15.042802},
url = {https://doi.org/10.1103/PhysRevSTAB.15.042802}
}
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