Citations refer to the original publication, not to a Scieee localized version.
Saraza Canflanca, P., Castro López, R., Roca, E., Martín Martínez, J., Rodríguez, R., Nafria, M., & Fernández Fernández, F. V. (2022). Determination of the Time Constant Distribution of a Defect-Centric Time-Dependent Variability Model for Sub-100-nm FETs. IEEE. https://doi.org/10.1109/TED.2022.3198383
Saraza Canflanca, Pablo, et al. Determination of the Time Constant Distribution of a Defect-Centric Time-Dependent Variability Model for Sub-100-nm FETs. IEEE, 2022. https://doi.org/10.1109/TED.2022.3198383.
Saraza Canflanca, Pablo, R. Castro López, E. Roca, J. Martín Martínez, R. Rodríguez, M. Nafria, and Francisco Vidal Fernández Fernández. Determination of the Time Constant Distribution of a Defect-Centric Time-Dependent Variability Model for Sub-100-nm FETs. IEEE, 2022. https://doi.org/10.1109/TED.2022.3198383.
Saraza Canflanca, P. et al. (2022) Determination of the Time Constant Distribution of a Defect-Centric Time-Dependent Variability Model for Sub-100-nm FETs. IEEE. Available at: https://doi.org/10.1109/TED.2022.3198383.
P. Saraza Canflanca et al., “Determination of the Time Constant Distribution of a Defect-Centric Time-Dependent Variability Model for Sub-100-nm FETs,” IEEE, 2022, doi: 10.1109/TED.2022.3198383.
@misc{sarazacanflanca2022determination,
author = {Saraza Canflanca, Pablo and Castro López, R. and Roca, E. and Martín Martínez, J. and Rodríguez, R. and Nafria, M. and Fernández Fernández, Francisco Vidal},
title = {Determination of the Time Constant Distribution of a Defect-Centric Time-Dependent Variability Model for Sub-100-nm FETs},
year = {2022},
publisher = {IEEE},
doi = {10.1109/TED.2022.3198383},
url = {https://doi.org/10.1109/TED.2022.3198383}
}
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