Citations refer to the original publication, not to a Scieee localized version.
El-Sayed, S. A., Spyrou, T., Camuñas Mesa, L. A., & Stratigopoulos, H. G. (2023). Compact Functional Testing for Neuromorphic Computing Circuits. Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/TCAD.2022.3223843
El-Sayed, Sarah A., et al. Compact Functional Testing for Neuromorphic Computing Circuits. Institute of Electrical and Electronics Engineers Inc., 2023. https://doi.org/10.1109/TCAD.2022.3223843.
El-Sayed, Sarah A., Theofilos Spyrou, Luis Alejandro Camuñas Mesa, and Haralampos G. Stratigopoulos. Compact Functional Testing for Neuromorphic Computing Circuits. Institute of Electrical and Electronics Engineers Inc., 2023. https://doi.org/10.1109/TCAD.2022.3223843.
El-Sayed, S. A. et al. (2023) Compact Functional Testing for Neuromorphic Computing Circuits. Institute of Electrical and Electronics Engineers Inc. Available at: https://doi.org/10.1109/TCAD.2022.3223843.
S. A. El-Sayed, T. Spyrou, L. A. Camuñas Mesa, and H. G. Stratigopoulos, “Compact Functional Testing for Neuromorphic Computing Circuits,” Institute of Electrical and Electronics Engineers Inc., 2023, doi: 10.1109/TCAD.2022.3223843.
@misc{elsayed2023compact,
author = {El-Sayed, Sarah A. and Spyrou, Theofilos and Camuñas Mesa, Luis Alejandro and Stratigopoulos, Haralampos G.},
title = {Compact Functional Testing for Neuromorphic Computing Circuits},
year = {2023},
publisher = {Institute of Electrical and Electronics Engineers Inc.},
doi = {10.1109/TCAD.2022.3223843},
url = {https://doi.org/10.1109/TCAD.2022.3223843}
}
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