Citations refer to the original publication, not to a Scieee localized version.
Aguirre, M. A., Tombs, J. N., & Guzmán-Miranda, H. (2009). Fault Injection Analysis of Bidi- rectional Signals. Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/TNS.2009.2019274
Aguirre, M.A., et al. Fault Injection Analysis of Bidi- rectional Signals. Institute of Electrical and Electronics Engineers (IEEE), 2009. https://doi.org/10.1109/TNS.2009.2019274.
Aguirre, M.A., Jonathan Noel Tombs, and Hipólito Guzmán-Miranda. Fault Injection Analysis of Bidi- rectional Signals. Institute of Electrical and Electronics Engineers (IEEE), 2009. https://doi.org/10.1109/TNS.2009.2019274.
Aguirre, M. A., Tombs, J. N. and Guzmán-Miranda, H. (2009) Fault Injection Analysis of Bidi- rectional Signals. Institute of Electrical and Electronics Engineers (IEEE). Available at: https://doi.org/10.1109/TNS.2009.2019274.
M. A. Aguirre, J. N. Tombs, and H. Guzmán-Miranda, “Fault Injection Analysis of Bidi- rectional Signals,” Institute of Electrical and Electronics Engineers (IEEE), 2009, doi: 10.1109/TNS.2009.2019274.
@misc{aguirre2009fault,
author = {Aguirre, M.A. and Tombs, Jonathan Noel and Guzmán-Miranda, Hipólito},
title = {Fault Injection Analysis of Bidi- rectional Signals},
year = {2009},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
doi = {10.1109/TNS.2009.2019274},
url = {https://doi.org/10.1109/TNS.2009.2019274}
}
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