Citations refer to the original publication, not to a Scieee localized version.
Bernal Méndez, J., Mesa Ledesma, F. L., & Medina Mena, F. (2001). Analysis of leakage in multilayered microstrip lines using complex images. Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/APS.2001.959790
Bernal Méndez, Joaquín, et al. Analysis of leakage in multilayered microstrip lines using complex images. Institute of Electrical and Electronics Engineers, 2001. https://doi.org/10.1109/APS.2001.959790.
Bernal Méndez, Joaquín, Francisco Luis Mesa Ledesma, and Francisco Medina Mena. Analysis of leakage in multilayered microstrip lines using complex images. Institute of Electrical and Electronics Engineers, 2001. https://doi.org/10.1109/APS.2001.959790.
Bernal Méndez, J., Mesa Ledesma, F. L. and Medina Mena, F. (2001) Analysis of leakage in multilayered microstrip lines using complex images. Institute of Electrical and Electronics Engineers. Available at: https://doi.org/10.1109/APS.2001.959790.
J. Bernal Méndez, F. L. Mesa Ledesma, and F. Medina Mena, “Analysis of leakage in multilayered microstrip lines using complex images,” Institute of Electrical and Electronics Engineers, 2001, doi: 10.1109/APS.2001.959790.
@misc{bernalmendez2001analysis,
author = {Bernal Méndez, Joaquín and Mesa Ledesma, Francisco Luis and Medina Mena, Francisco},
title = {Analysis of leakage in multilayered microstrip lines using complex images},
year = {2001},
publisher = {Institute of Electrical and Electronics Engineers},
doi = {10.1109/APS.2001.959790},
url = {https://doi.org/10.1109/APS.2001.959790}
}
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