Citations refer to the original publication, not to a Scieee localized version.
White, J., Schmidt, D. C., Benavides Cuevas, D. F., Trinidad Martín Arroyo, P., & Ruiz Cortés, A. (2008). Automated Diagnosis of Product-line Configuration Errors in Feature Models. IEEE Computer Society. https://doi.org/10.1109/SPLC.2008.16
White, Jules, et al. Automated Diagnosis of Product-line Configuration Errors in Feature Models. IEEE Computer Society, 2008. https://doi.org/10.1109/SPLC.2008.16.
White, Jules, Douglas C. Schmidt, David Felipe Benavides Cuevas, Pablo Trinidad Martín Arroyo, and Antonio Ruiz Cortés. Automated Diagnosis of Product-line Configuration Errors in Feature Models. IEEE Computer Society, 2008. https://doi.org/10.1109/SPLC.2008.16.
White, J. et al. (2008) Automated Diagnosis of Product-line Configuration Errors in Feature Models. IEEE Computer Society. Available at: https://doi.org/10.1109/SPLC.2008.16.
J. White, D. C. Schmidt, D. F. Benavides Cuevas, P. Trinidad Martín Arroyo, and A. Ruiz Cortés, “Automated Diagnosis of Product-line Configuration Errors in Feature Models,” IEEE Computer Society, 2008, doi: 10.1109/SPLC.2008.16.
@misc{white2008automated,
author = {White, Jules and Schmidt, Douglas C. and Benavides Cuevas, David Felipe and Trinidad Martín Arroyo, Pablo and Ruiz Cortés, Antonio},
title = {Automated Diagnosis of Product-line Configuration Errors in Feature Models},
year = {2008},
publisher = {IEEE Computer Society},
doi = {10.1109/SPLC.2008.16},
url = {https://doi.org/10.1109/SPLC.2008.16}
}
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