Citations refer to the original publication, not to a Scieee localized version.
Barragán Asián, M. J., Fiorelli, R., Vázquez García de la Vega, D., Rueda Rueda, A., & Huertas Díaz, J. L. (2010). On-chip characterization of RF systems based on envelope response analysis. Institution of Engineering and Technology. https://doi.org/10.1049/el.2010.2644
Barragán Asián, Manuel José, et al. On-chip characterization of RF systems based on envelope response analysis. Institution of Engineering and Technology, 2010. https://doi.org/10.1049/el.2010.2644.
Barragán Asián, Manuel José, Rafaella Fiorelli, Diego Vázquez García de la Vega, Adoración Rueda Rueda, and José Luis Huertas Díaz. On-chip characterization of RF systems based on envelope response analysis. Institution of Engineering and Technology, 2010. https://doi.org/10.1049/el.2010.2644.
Barragán Asián, M. J. et al. (2010) On-chip characterization of RF systems based on envelope response analysis. Institution of Engineering and Technology. Available at: https://doi.org/10.1049/el.2010.2644.
M. J. Barragán Asián, R. Fiorelli, D. Vázquez García de la Vega, A. Rueda Rueda, and J. L. Huertas Díaz, “On-chip characterization of RF systems based on envelope response analysis,” Institution of Engineering and Technology, 2010, doi: 10.1049/el.2010.2644.
@misc{barraganasian2010onchip,
author = {Barragán Asián, Manuel José and Fiorelli, Rafaella and Vázquez García de la Vega, Diego and Rueda Rueda, Adoración and Huertas Díaz, José Luis},
title = {On-chip characterization of RF systems based on envelope response analysis},
year = {2010},
publisher = {Institution of Engineering and Technology},
doi = {10.1049/el.2010.2644},
url = {https://doi.org/10.1049/el.2010.2644}
}
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