Citations refer to the original publication, not to a Scieee localized version.
Barranco Quero, Á., Yubero Valencia, F., Espinós Manzorro, J. P., Groening, P., & Rodríguez González-Elipe, A. (2005). Electronic state characterization of SiOx thin films prepared by evaporation. American Institute of Physics. https://doi.org/10.1063/1.1927278
Barranco Quero, Ángel, et al. Electronic state characterization of SiOx thin films prepared by evaporation. American Institute of Physics, 2005. https://doi.org/10.1063/1.1927278.
Barranco Quero, Ángel, Francisco Yubero Valencia, Juan Pedro Espinós Manzorro, P. Groening, and Agustín Rodríguez González-Elipe. Electronic state characterization of SiOx thin films prepared by evaporation. American Institute of Physics, 2005. https://doi.org/10.1063/1.1927278.
Barranco Quero, Á. et al. (2005) Electronic state characterization of SiOx thin films prepared by evaporation. American Institute of Physics. Available at: https://doi.org/10.1063/1.1927278.
Á. Barranco Quero, F. Yubero Valencia, J. P. Espinós Manzorro, P. Groening, and A. Rodríguez González-Elipe, “Electronic state characterization of SiOx thin films prepared by evaporation,” American Institute of Physics, 2005, doi: 10.1063/1.1927278.
@misc{barrancoquero2005electronic,
author = {Barranco Quero, Ángel and Yubero Valencia, Francisco and Espinós Manzorro, Juan Pedro and Groening, P. and Rodríguez González-Elipe, Agustín},
title = {Electronic state characterization of SiOx thin films prepared by evaporation},
year = {2005},
publisher = {American Institute of Physics},
doi = {10.1063/1.1927278},
url = {https://doi.org/10.1063/1.1927278}
}
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