Citations refer to the original publication, not to a Scieee localized version.
García Leyva, L., Rivera Dueñas, J., Calomarde Palomino, A., Moll Echeto, F. D. B., & Rubio Sola, J. A. (2016). Robust sequential circuits design technique for low voltage and high noise scenarios. https://doi.org/10.1051/matecconf/20164202003
García Leyva, Lancelot, et al. Robust sequential circuits design technique for low voltage and high noise scenarios. 2016. https://doi.org/10.1051/matecconf/20164202003.
García Leyva, Lancelot, Juan Rivera Dueñas, Antonio Calomarde Palomino, Francisco de Borja Moll Echeto, and Jose Antonio Rubio Sola. Robust sequential circuits design technique for low voltage and high noise scenarios. 2016. https://doi.org/10.1051/matecconf/20164202003.
García Leyva, L. et al. (2016) Robust sequential circuits design technique for low voltage and high noise scenarios. Available at: https://doi.org/10.1051/matecconf/20164202003.
L. García Leyva, J. Rivera Dueñas, A. Calomarde Palomino, F. D. B. Moll Echeto, and J. A. Rubio Sola, “Robust sequential circuits design technique for low voltage and high noise scenarios,” 2016, doi: 10.1051/matecconf/20164202003.
@misc{garcialeyva2016robust,
author = {García Leyva, Lancelot and Rivera Dueñas, Juan and Calomarde Palomino, Antonio and Moll Echeto, Francisco de Borja and Rubio Sola, Jose Antonio},
title = {Robust sequential circuits design technique for low voltage and high noise scenarios},
year = {2016},
doi = {10.1051/matecconf/20164202003},
url = {https://doi.org/10.1051/matecconf/20164202003}
}
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