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The influence of an electric field on the latent heat of the ferroelectric phase transition in KDP

Abstract

The specific heat, heat flux (DTA trace) and dielectric constant of KDP ferroelectric crystal have been measured simultaneously for various electric fields with a conduction calorimeter. The specific heat presents a strong anomaly but these simultaneous measurements allow us to evaluate the latent heat accurately. Latent heat decreases with field and the value of critical electric field ---that where latent heat disappears--- is estimated to be (0.44\pm0.03)kV/cm. Incidentally, we have measured simultaneously the dielectric permittivity which s uggests that latent heat is developed as domains are growing.

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The influence of an electric field on the latent heat of the ferroelectric phase transition in KDP

Author: Delgado Sánchez, José María; Martín Olalla, José María; Gallardo Cruz, María del Carmen; Ramos Vicente, Saturio; Koralewski, M.; Cerro González, Jaime del
Publisher: IOP Publishing
Year: 2005
DOI: 10.1088/0953-8984/17/17/012
Source: https://idus.us.es/bitstreams/b8a1e608-d3c1-4041-ae6b-1194a341c363/download
This is he accep ed manusc ip p io o house edi s. ©2005 IOP Publishing L d
The Ve sion o Reco d is a J. Phys.: Condens. Ma e 17 (2005) 2645-2654 doi:10.1088/0953-8984/17/17/012
In luence o he elec ic ield on he la en hea o e oelec ic phase ansi ion in
KDP
Jose Ma ia Delgado-Sanchez, Jos´e Ma ´ıa Ma ´ın-Olalla, Ma ´ıa Ca men Galla do, and Sa u io Ramos
Depa amen o de F´ısica de la Ma e ia Condensada. Ins i u o Mix o de Ciencia de Ma e iales
CSIC-Uni e sidad de Se illa
Ap Co eos 1065, ES-41080 Se illa, SPAIN
Ma celi Ko alewski
Ins i u e o Physics, Adam Mickiewicz Uni e si y, Umul owska 85, 61-614, Poznan, Poland
Jaime del Ce o
Depa amen o de F´ısica de la Ma e ia Condensada. Ins i u o Mix o de Ciencia de Ma e iales.
CSIC-Uni e sidad de Se illa
Ap Co eos 1065, ES-41080 Se illa, SPAIN
(Submi ed: 31 Janua y 2005; Re ised: Ma ch 24 2005; Published: 15 Ap il 2005)
The speci ic hea , hea lux (DTA ace) and dielec ic cons an o KDP e oelec ic c ys al ha e
been measu ed simul aneously o a ious elec ic ields wi h a conduc ion calo ime e . The speci ic
hea p esen s a s ong anomaly bu hese simul aneous measu emen s allow us o e alua e he la en
hea accu a ely. La en hea dec eases wi h ield and he alue o c i ical elec ic ield — ha whe e
la en hea disappea s— is es ima ed o be (0.44 ±0.03) kV cm−1. Inciden ally, we ha e measu ed
simul aneously he dielec ic pe mi i i y which sugges s ha la en hea is de eloped as domains
a e g owing.
I. INTRODUCTION
The KDP amily is one o he mos ex ensi ely
s udied[1, 2] hyd ogen-bonded e oelec ic c ys als. The
po assium dihyd ogen phospha e KH2PO4c ys al ex-
hibi s a discon inuous phase ansi ion a T0= 121 K
om a e agonal pa aelec ic phase o an o ho hombic
e oelec ic phase. The speci ic hea anomaly a an-
si ion empe a u e shows[3–5] a s ong λ- ype anomaly;
pe haps, ha is why he ansi ion was ini ially consid-
e ed con inuous. Howe e Reese[4] showed ha he an-
si ion is discon inuous by measu ing i s la en hea , which
was e alua ed o be 46.1 J mol−1. I is shown ha dis-
con inui y disappea unde he in luence o p essu e o
elec ic ield.
The alue o he c i ical elec ic ield Ec o which he
discon inui y disappea s is a subjec o discussion. Reese
e al.[6] also ca ied ou a measu emen o he speci ic
hea wi h an applied ield o 294 V cm−1 inding a con o-
e sial e idence o la en hea . Abo e E= 785 V cm−1
hey ound no e idence o la en hea and sugges ed
Ec= 300 V cm−1 om he shi o he maximum o he
speci ic hea as unc ion o he elec ic ield. Measu e-
men s o speci ic hea unde elec ic ield highe han
360 V cm−1was ca ied ou by Sand old and Fossheim[7]
and he au ho s sugges ha Landau heo y o con inu-
ous ansi ions wi h 2 −4−6 po en ial was app op ia e
o desc ibe he shape o speci ic hea cu es.
O he wo ks ha e lead o es ima ions o he c i ical
ield. Fo ins ance, S uko e al.[8] e alua ed Ec=
124 V cm−1 om elec ocalo ic expe imen s. Sidnenko
and Gladki[9] ound Ec= 370 V cm−1while Okada and
Sugie[10] ob ained 160 V cm−1 o Ec. Vallade[11] de-
duced a alue o 254 V cm−1 om bi e ingence measu e-
men s. In con as o hese alues, Kobayashi e al.[12]
ound, by X- ay measu emen s, 8000 V cm−1; Ebe ha d
and Ho n[13] de i ed a alue o 6500 V cm−1 om dielec-
ic suscep ibili y.
In his ame i would be in e es ing o e alua e he
la en hea as a unc ion o he elec ic ield o de e mine
he alue o he c i ical elec ic ield Ec o which la en
hea becomes null.
The di icul y o an accu a e de e mina ion o Ec om
calo ime ic measu emen s in s anda d equipmen s —
such as di e en ial he mal analysis DTA and di e en ial
scanning calo ime e DSC —is ha hese sys ems eally
measu e changes o en halpy which has wo con ibu ions
nea he ansi ion: one due o he la en hea and o he
due o he a ia ion o speci ic hea wi h empe a u e.
In he case o phase ansi ions nea a ic i ical poin
o a discon inuous e oelec ic phase ansi ion unde
an elec ic ield close o he c i ical ield, he speci ic
hea p esen s a s ong anomaly and la en hea becomes
e y small. This ac makes di icul o sepa a e bo h
con ibu ions and o dis inguish he empe a u e in e -
al whe e he la en hea is p esen . This may explain
he lack o s udy o he in luence o elec ic ield, smalle
han Ec, on speci ic hea and la en hea o KDP a e
Reese[6].
Ou g oup has de eloped a me hod, named squa e
modula ed di e en ial he mal analysis SMDTA[14–16],
based on conduc ion calo ime y, which is able o mea-
su e absolu e alues o speci ic hea and he hea lux ex-
changed by he sample when i s empe a u e is changed
a a a e as low as 0.1 K h−1. The compa ison o he
da a allows us o sepa a e he abo e wo con ibu ions
o he o al en halpy and o e alua e he la en hea , in
case he e we e any.
Typese by REVT
EX
2
This echnique has been success ully applied o he
s udy o he almos ic i ical phase ansi ion o
KMnF3[14], whose la en hea was i s ly measu ed wi h
his echnique. Fu he mo e, he e ec o he subs i u-
ion o Mn by Ca was also in es iga ed measu ing he
la en hea [15], which showed ha he doping makes
he ansi ion become con inuous[17]. The me hod o
SMDTA has been also applied o show ha he phase
ansi ion in CoO[18], whose cha ac e was also con o-
e sial, is con inuous.
In his pape we ha e applied his me hod o s udy
a KDP single c ys al. We ha e measu ed he speci ic
hea and he hea lux exchanged by he sample in he
neighbo hood o he e oelec ic phase ansi ion. The
measu emen s ha e been ca ied ou a ou alues o E:
0 V cm−1, 100 V cm−1, 400 V cm−1, 1000 V cm−1.
Simul aneously o hese measu emen s, he dielec ic
suscep ibili y o he sample has also been measu ed and
we ha e ela ed i s beha iou a ound ansi ion empe a-
u e wi h he empe a u e in e al whe e he la en hea
is p oduced. Dielec ic measu emen s p o ide in o ma-
ion abou he mechanism o e oelec ic phase ansi-
ion o KDP c ys al[19, 20] and he simul aneous mea-
su emen o he mal and dielec ic p ope ies would be
wo hy.
II. EXPERIMENTAL
The measu emen s we e pe o med in a high esolu ion
conduc ion calo ime e which has been desc ibed p e i-
ously in de ails[21–23]. The senso is o med by wo
iden ical hea luxme e s, each one ha ing 48 ch omel-
cons an an he mocouples connec ed elec ically in se ies
bu he mally in pa allel. The sample is p essed be ween
bo h luxme e s whose signal is measu ed by a Kei hley
182 nano ol me e . Two elec odes and wo hea e s a e
placed be ween sample and luxme e s.
The senso is placed inside a calo ime e block which is
suspended wi hin wo cylind ical adia ion shields. The
whole assembly is hen placed in a he me ic ou e case
a a high acuum. The de ice is hen su ounded by a
coiled ube and placed in an alcohol ba h. Liquid N2ci -
cula es h ough he coil and egula es he empe a u e
o he ba h wi h a good he mal s abiliza ion. As a e-
sul , i is possible o change smoo hly he empe a u e
o he sample (a a a e o abou 0.1 K h−1) wi hou ob-
se ing signi ican empe a u e luc ua ions (always less
han 10−6K) in he block empe a u e.
The speci ic hea is measu ed using he me hod p e i-
ously desc ibed[16]. The same cons an powe Wis dissi-
pa ed in bo h hea e s (dissipa ion b anch) o wel e min-
u es and a s eady s a e cha ac e ized by a cons an em-
pe a u e di e ence be ween he sample and he calo ime-
e block is eached. The powe is hen cu o un il a
new s eady s a e is eached wel e minu es la e ( elax-
a ion b anch). Then, he powe is again swi ched on and
he sequence is con inuously epea ed while he empe -
a u e o he assembly is changed a a low cons an a e.
Tha is a long-pe iodic se ial o squa e he mal pulses
is supe posed o a hea ing o cooling amp. The em-
pe a u e inc ease o he sample due o he he mal pulse
o wel e minu es (ci ca 50 ×10−3K) is highe han he
empe a u e a ia ion o he sample p oduced by he a e
o change o empe a u e in hese wel e minu es (ci ca
±20 ×10−3K). Hence, he sample is being cooled and
hea ed al e na i ely du ing a un.
The in eg a ion o he elec omo i e o ce gi en by he
luxme e be ween e e y pai o s eady s a es allows us o
de e mine sample he mal capaci y. Hence, he me hod is
able o de e mine wo da a o hea capaci y in each cycle.
The i s one is calcula ed om he dissipa ion b anch
Cd, and he second one om he elaxa ion b anch C .
Hea capaci y ob ained in ei he b anch show a egula
beha iou i he e is no phase ansi ion o i i is con inu-
ous. When a discon inuous phase ansi ion occu s, bo h
da a become di e en showing an anomalous beha iou
in he empe a u e in e al whe e he la en hea is p o-
duced as a esul o he he mal hys e esis and ansi ion
kine ics. Tha beha iou is an e idence o he discon-
inuous cha ac e o he ansi ion[16]. Inciden ally, we
mus poin ou ha speci ic hea da a a e no eliable
when his beha iou is obse ed.
On he o he hand, he DTA ace is con inuously mea-
su ed in a second un wi hou dissipa ion in he sample
and using he same empe a u e scanning a e used o
measu e he speci ic hea . Due o he high numbe o
he mocouples and hei good he mal s abili y o he
sample, he equipmen wo ks like a e y sensi i e DTA
de ice. The elec omo i e o ce gi en by he luxme e s
is p opo ional o he hea lux, φdexchanged be ween
sample and calo ime e block.
F om he speci ic hea da a ob ained in he i s un-
ning and using a me hod p e iously desc ibed[14–16], we
calcula e he hea lux φcwhich would ha e been due ex-
clusi ely o he beha iou o he he mal capaci y o he
sample a ound he ansi ion empe a u e. Compa ing
he measu ed φdand he calcula ed φcwe deduce ha
only in he empe a u e ange (T , Tp) whe e bo h da a
do no coincide he e is an e ec om he la en hea .
I s alue is de e mined by in eg a ing φd/ , whe e is
he a e o empe a u e change, be ween (T , Tp) and us-
ing he s aigh line φd/ (T )−φd/ (Tp) as baseline[15].
The sensi i i y o he me hod is es ima ed o be be e
han 5 mJ.
The single c ys al o KH2PO4was g own a he In-
s i u e o Physics o Poznan Uni e si y (Poland). The
sample has 0.3857 g mass, wi h a hickness o 2.16 mm
along he e oelec ic axis and elec odes ci cula aces
wi h 78.5 mm2in su ace. The sample was placed ou in
he calo ime e . Gold elec odes we e e apo a ed o he
su ace o he sample; hose elec odes we e connec ed o
a capaci ance b idge ESI −SP5400 which has allowed
us o measu e he dielec ic pe mi i i y o he sample,
simul aneously o he hea lux, wi h an imposed ex e -
nal bias ield o 0 V cm−1, 100 V cm−1, 400 V cm−1and
3
1000 V cm−1.
III. RESULTS
III.1. Calo ime ic measu emen s
The empe a u e dependence o he speci ic hea cpo a
sample o KDP was measu ed on cooling, on quasies a ic
condi ions a a scanning empe a u e a e o ca. ∼
0.1 Kh−1using he me hod desc ibed in Sec. II o di -
e en applied elec ic ields. In Figu e 1, he speci ic hea
da a in a wide empe a u e in e al o di e en applied
elec ic ield (a) E= 0 V cm−1, (b) E= 100 V cm−1, (c)
E= 400 V cm−1and (d) E= 1000 V cm−1is shown.
These speci ic hea da a show a linea empe a u e de-
pendence in he pa aelec ic phase and o 0 V cm−1,
100 V cm−1and 400 V cm−1a sha p λ- ype anomaly
in a na ow empe a u e in e al is obse ed. Fo
1000 V cm−1 he maximum is mo e ounded and he
ansi ion is smea ed. The shape o speci ic hea cu e
o high elec ic ield ends o be almos symme ic, such
beha iou was also sugges ed by Reese[6]. The maxi-
mum alue o cini ially inc eases wi h inc easing ield
bu dec eases o su icien ly high alues. As expec ed,
he speci ic hea ail in he pa aelec ic phase inc eases
wi h ield as a consequence o he coupling o he o de
pa ame e o he ield.
In Figu e 2, we ha e plo ed he speci ic hea ex-
cess ob ained in he dissipa ion b anch (cd) and in he
elaxa ion b anch (c ) in a na ow empe a u e in e -
al, 1 K, o each elec ic ield. We obse ed ha o
0 V cm−1, 100 V cm−1and 400 V cm−1,cdand c da a
do no coincide a ound he ansi ion empe a u e while
o 1000 V cm−1bo h se ies o da a almos coincide in
he whole ange o empe a u e. As we ha e s a ed
abo e, he empe a u e a ia ion o he sample due o
he he mal pulses is sligh ly highe han he a ia ion
due o he empe a u e amp. This means ha in e -
e y pe iod he empe a u e o he sample inc eases and
dec eases consecu i ely. Due o he mal hys e esis, o ki-
ne ics o he phase ansi ion e c, he p ocess o hea ing
and cooling when wo phases coexis is di e en and con-
sequen ly da a ob ained in he dissipa ion b anch and e-
laxa ion b anch become di e en unde hese condi ions.
We ha e epo ed p e iously ha he di e ence is e y
no o ious e en in sys ems nea he ic i ical poin , whe e
he la en hea is e y small ( L = 0.13 J g−1 o KMnF3,
L = 0.010 J g−1 o KMn0.997Ca0.003F3)[16].
Hence, in he case o KDP, i is clea om Figu e 2 ha
o 0 V cm−1, 100 V cm−1and 400 V cm−1 he phase
ansi ion is discon inuous. On he con a y, he simi-
la beha iou o cdand c o 1000 V cm−1, Figu e 2d,
indica e ha no ace o la en hea is p esen , so we can
deduce ha o 1000 V cm−1 he phase ansi ion is con-
inuous. Hence he c i ical ield lies be ween 400 V cm−1
and 1000 V cm−1.
On he o he hand, he baseline espec which he
luxme e em is in eg a ed in o de o calcula e he spe-
ci ic hea is he unde line signal due o he empe a u e
amp imposed on he calo ime e . This signal changes
e y slowly and i does no a ec o he speci ic hea
measu emen excep when a la en hea e ec happens.
I p oduces a non linea a ia ion o he baseline and
consequen ly e oneous da a o speci ic hea may appea .
Keeping in mind ha he measu emen s ha e been ca -
ied ou in a cooling amp, in Figu e 2a he i s c a he
beginning o he ansi ion which does no coincide wi h
he co esponding cdda a is lowe han he egula con-
ibu ion o he speci ic hea . In Figu e 2b we can also
obse e such a simila poin bu his e ec is smea ed.
Finally, in Figu e 2c we canno obse e any dec ease in
c . Ne e heless, c de ia es om cdin a small ange
o empe a u e as in he wo p e ious igu es. Hence,
we can deduce ha la en hea dec eases wi h ield and
should be e y small o 400 V cm−1.
To con i m his sugges ion and o calcula e he la en
hea , we measu ed he DTA ace in a second un, chang-
ing he empe a u e o he sample a he same cons an
a e used in he speci ic hea measu emen s o make bo h
se s o da a compa able. We mus poin ou ha he
a e o change o empe a u e is abou wo o de s o
magni ude lowe han he minimum alue achie ed in
con en ional DTA equipmen s. In Figu e 3, we ep e-
sen he hea lux gi en by he luxme e s φd/ (DTA
ace) and he hea lux φc/ calcula ed om he speci ic
hea da a, using he me hod p e iously desc ibed, o he
ields 0 V cm−1(a), 100 V cm−1(b), 400 V cm−1(c).
Fo 0 V cm−1and 100 V cm−1φd/ is highe han
φc/ in a e y small empe a u e in e al o abou 0.05 K,
showing he e ec o la en hea . Fo 400 V cm−1φd/ is
also highe han φc/ , bu he di e ence be ween hem
is smalle , indica ing a e y small la en hea .
The choosing o he baseline o de e mine he la en
hea alue o 0 V cm−1in g aph Figu e 3a(i) is di i-
cul due o he e y small empe a u e in e al whe e
he la en hea is p esen and, consequen ly, he ew da a
eco ded inside ha in e al. Anyway, by conside ing as
baseline he s aigh line be ween he ex eme empe a-
u es whe e φd/ and φc/ coincide, we ob ain a alue o
43 J mol−1. This line is also ep esen ed in Figu e 3a).
The alue ob ained o KDP deu e a ed a 80% using he
same se -up and p ocedu e was 317 J mol−1[24].
To con i m he alidi y o ha baseline elec ion we
again measu ed he hea lux exchanged by he sample
in iden ical condi ions. Those hea lux da a a e also
plo ed in he Figu e 3a(ii). The igu e shows ha bo h
hea lux da a coincide wi h φc(s a s) in he same ange
o empe a u e hus suppo ing he baseline used o he
de e mina ion o he la en hea . In ac , he la en hea
o he second un is 45 J mol−1in good ag eemen wi h
ha o he i s one. On he o he hand, hese alues
o he la en hea a e in ag eemen wi h Reese[6]. I is
no ewo hy ha peak a ea —i.e. la en hea — is qui e
ep oducible despi e he kine ic e ec s ha showed each
expe imen . On he con a y, he di e ence obse ed i
4
119 120 121 122 123 124 125
0
200
400
600
800
(b)
c/J K−1mol−1
T/K
119 120 121 122 123 124 125
0
200
400
600
800
(d)
c/J K−1mol−1
T/K
0
200
400
600
800
119 120 121 122 123 124 125
(a)
c/J K−1mol−1
T/K
0
200
400
600
800
119 120 121 122 123 124 125
(c)
c/J K−1mol−1
T/K
FIG. 1. The speci ic hea o KDP o di e en applied elec ic ields in a wide empe a u e in e al. F om le o igh and op
o bo om, (a) 0 V cm−1and (b) 100 V cm−1, (c) 400 V cm−1and (d) 1000 V cm−1.
φ/ du ing he phase ansi ions sugges s he exis ence
o non-equilib ium kine ic p ocess as hose expec ed o
a discon inuous phase ansi ion — o ins ance phase
on gene a ion— which, as a gene al ac , a e non e-
p oducible.
Fo E= 100 V cm−1and E= 400 V cm−1we de-
c eased he scanning a e o empe a u e when measu ing
speci ic hea so as o ge a highe numbe o da a poin s
in he neighbo hood o he phase ansi ion. Hence, he
de e mina ion o he baseline becomes easie as shown in
Figu e 3. The in eg a ion o he peaks gi es 35 J mol−1
and 4.2 J mol−1 espec i ely.
The ob ained esul con i m ha la en hea dimin-
ishes wi h elec ic ield (see Figu e 4). A 400 V cm−1
la en hea is educed by and o de o magni ude wi h
espec o ha o ze o ield and i is close o he c i i-
cal ield. Assuming a linea beha iou o he la en hea
wi h he ield we deduce ha he c i ical ield lies on
5
121 121.2 121.4 121.6 121.8 0
200
400
600
800
(b)
c/J K−1mol−1
T/K
120.8 121 121.2 121.4 121.6 121.8
0
200
400
600
800
(d)
c/J K−1mol−1
T/K
0
200
400
600
800
120.6 120.8 121 121.2 121.4 121.6
(a)
c/J K−1mol−1
T/K
0
200
400
600
800
120.8 121 121.2 121.4 121.6 121.8
(c)
c/J K−1mol−1
T/K
FIG. 2. The same as igu e 1 bu in a na owe empe a u e in e al a ound he ansi ion poin . Bold poin s s and o he
dissipa ion b anch (cd), open poin s s and o he elaxa ion b anch (c ).
(0.44 ±0.3) kV cm−1.
III.2. Dielec ic measu emen s
In o de o ela e calo ime ic and dielec ic beha iou
he dielec ic pe mi i i y along he e oelec ic axis has
been measu ed simul aneously o he hea lux.
In Figu e 5 we ep esen ε(T) o he di e en elec-
ic ields. The dielec ic pe mi i i y inc eases in all
cases du ing he phase ansi ion ollowing he Cu ie law.
In he e oelec ic phase he dielec ic pe mi i i y e-
mains in a pla eau, indica ing also he la ge domain wall
con ibu ion o he dielec ic pe mi i i y, bu he max-
imum o pe mi i i y dec eases wi h he applied elec ic
ield. I has been p e iously epo ed ha he maxi-
mum alue o dielec ic pe mi i i y is due o he con-
ibu ion o domain wall [25]; unde elec ic ield he

6
8
4
0
121.5121.4121.3
(a)
(i) (ii)
φ −1/J K−1
T/K
121.5121.4121.3
(b)
T/K
121.6121.5121.4121.3
8
4
0
(c)
φ −1/J K−1
T/K
FIG. 3. Hea lux di ided by a e o change o empe a u e in he neighbo hood o he KDP e oelec ic phase ansi ion.
F om le o igh , op o bo om, (a) 0 V cm−1, (b) 100 V cm−1, (c) 400 V cm−1. Poin s ep esen hea lux da a gi en by he
luxme e s —in (a) wo simila unning labelled (i) and (ii) we e ca ied ou —. S a s ep esen he con ibu ion due o speci ic
hea o Figu e 2. S aigh lines show he baseline used o de e mina ion o he la en hea which happens o be he peak a ea
sub ended by expe imen al poin s and he baseline.
sample becomes close o monodomain s a e, so num-
be o domain walls dec ease and also does he dielec ic
pe mi i i y. Ne e heless he beha iou a ansi ion
empe a u e is di e en o 0 V cm−1and 100 V cm−1
—discon inuous ansi ion— han o 400 V cm−1—
close- o-c i ical-poin ansi ion— and 1000 V cm−1—
con inuous ansi ion—. We will ela e in Figu e 6
he shape o dielec ic pe mi i i y o 0 V cm−1and
400 V cm−1.
The hea lux and he in e se o he dielec ic pe mi -
i i y e sus empe a u e o E= 0 V cm−1a e ep e-
sen ed in Figu e 6(a). Th ee egions may be dis inguish
in his igu e: (i) he pa aelec ic phase whe e he pe mi -
i i y ollows he Cu ie law, (ii) he phase ans o ma ion
in e al whe e he pe mi i i y sligh ly de ia es om he
p e ious beha iou and (iii) he e oelec ic phase whe e
he pe mi i i y shows a pla eau. We mus poin ou ha
he maximum o he pe mi i i y ma ches wi h he end
o phase ans o ma ion.
Fo 400 V cm−1,ε(T) shows a di e en beha iou —
see Figu e 6(b)—. A he ansi ion empe a u e i
is p esen a minimum. This has been obse ed by
Bo na el[19] in c ys als o KDP o highe alues o elec-
ic ield (abou 1 kV cm−1). In ha wo k Bo na el ex-
plains his beha iou in e ms o some domains a ange-
men s du ing he phase ansi ion; ε(T) is desc ibed as
he sum o he beha iou o ε1(T) con ibu ion ha co -
espond o he beha iou o monodomain sample, and he
co esponding ε2(T) due o he con ibu ions o domains.
Mo eo e ε1(T) inc eases om pa aelec ic phase and a -
e he maximum a ansi ion empe a u e dec eases o
ze o in e oelec ic phase; ε2(T) inc eases om ze o a
ansi ion empe a u e and emains in a pla eau in e o-
elec ic phase. The sum o bo h con ibu ions gi es he
appea ance o ε(T) in igu e 6b.
I may be seen also om he esul s p esen ed on Fig-
u e 6 ha he peak o he hea lux a ansi ion em-
pe a u e appea a empe a u e whe e he p oduc ion o
domains become dominan .
IV. CONCLUSIONS
The he mal and dielec ic beha iou o KDP c ys-
al nea he empe a u e o i s e o-pa aelec ic phase
ansi ion has been simul aneously s udied unde he in-
luence o elec ic ield. Fo 0 V cm−1 he la en hea
has been measu ed wice. Al hough bo h measu emen s
shows a di e en kine ic, hei esul s a e simila and in
good ag eemen wi h hose ob ained by Reese[6]. Despi e
he high inc ease o he speci ic hea a ound he an-
si ion empe a u e, he e y small alues o he la en
hea and he na ow empe a u e ange —ca. 0.1 K—
whe e ansi ion is de eloped, we ha e been able o dis-
c imina e he con ibu ion o he la en hea o he o al
change o en halpy. Finally, simul aneous measu emen
o hea lux and dielec ic suscep ibili y sugges ha he
e ec o la en hea appea s a empe a u es ange whe e
7
0
20
40
60
0 200 400
E/V cm−1
∆h/J mol−1
FIG. 4. Plo o he la en hea ∆ha a ious elec ic ields. C i ical ield is ound o be (0.44 ±0.03 kV cm−1
0
5000
10000
15000
120 121 122 123 124
T/K
ε
0 V cm−1
100 V cm−1
400 V cm−1
1000 V cm−1
FIG. 5. Plo o he dielec ic pe mi i i y a a ious elec ic
ields. Pe mi i i y da a we e measu ed simul aneously o
hea lux da a o igu e 3.
domains a e g owing. Maximum dielec ic pe mi i i y
was no iced a empe a u e whe e phase ansi ion ends.
I was es ablished ha he la en hea dec eases wi h
he ield and he c i ical elec ic ield is es ima ed o be
(0.44 ±0.03) kV cm−1.
4
2
0
121.5121.4121.3
0.0002
0.0001
0
(a)
φ −1/J K−1
T/K
1/ε
0
2
4
121.4 121.6 121.8
4000
6000
8000
(b)
φ −1/J K−1
T/K
ε
FIG. 6. (a) Plo o he in e se o he dielec ic pe mi i i y
( igh axis) and φ −1(le axis) o E= 0 V cm−1. (b) Plo
o he dielec ic pe mi i i y ( igh axis) and φ −1(le axis)
E= 400 V cm−1.
ACKNOWLEDGMENTS
We wish o hank P o . Bo na el o ui ul discus-
sions. This wo k was suppo ed by Spanish Minis e io de
Ciencia y Tecnolog´ıa con ac numbe BFM2002-02237.
[1] Y. Xu, Fe oelec ics ma e ials and hei applica ions
(No h-Holland, 1991), ISBN 0-444-88354-1.
[2] M. Lines and A. Glass, P inciples and applica ions o e -
oelec ics and ela ed ma e ials (Cla endon P ess, Ox-
8
o d, 1977).
[3] C. S ephenson, J. Phys. Chem. 66, 1397 (1944).
[4] W. Reese, Physical Re iew 162, 510 (1967).
[5] B. S uko , M. Amin, and V. Kopchik, Physics S a us
Solidi 27, 741 (1969).
[6] W. Reese, Physical Re iew 181, 905 (1969).
[7] E. Sand old and K. Fossheim, J. Phys. C: Solid S a e
Phys. 19, 1481 (1986).
[8] B. S uko , M. Ko zhue , A. Baddu , and V. Kop sik,
So . Phys. Solid S a e 13, 1569 (1972).
[9] E. Sidnenko and V. Gladkii, So . Phys. C ys allg . 18,
83 (1973).
[10] K. Okada and H. Sugie, Fe oelec ics 17, 325 (1977).
[11] M. Vallade, Physical Re iew 12, 3755 (1975).
[12] J. Kobayashi, Y. Uesu, and Y. Enomo o, Phys. S a us
Solidi (b) 45, 293 (1971).
[13] J. Ebe ha and P. Ho n, Solid S a e Communica ions 16,
1343 (1975).
[14] J. del Ce o, F. Rome o, M. C. Galla do, S. Haywa d,
and J. Jim´enez, The mochimica Ac a 343 (2000).
[15] F. Rome o, M. C. Galla do, J. Jim´enez, and J. del Ce o,
The mochimica Ac a 372, 25 (2001).
[16] J. del Ce o, J. M. Ma ´ın-Olalla, and F. Rome o, The -
mochimica Ac a 401, 149 (2003).
[17] M. C. Galla do, F. Rome o, S. Haywa d, E. Salje, and
J. del Ce o, Mine alogical Magazine 64, 971 (2000).
[18] F. Rome o, J. Jim´enez, and J. del Ce o, Jou nal o Mag-
ne ic Ma e ials (in p ess).
[19] J. Bo na el, Fe oelec ics 54, 245 (1984).
[20] E. Nakamu a, Fe oelec ics 135, 237 (1992).
[21] J. del Ce o, Jou nal o The mal Analysis 34, 335 (1988).
[22] F. Jimenez, S. Ramos, and J. del Ce o, Phase T ansi-
ions 12, 275 (1988).
[23] J.-M. Ma ´ın, J. del Ce o, and S. Ramos, Phase T ansi-
ions 64, 45 (1997).
[24] M. C. Galla do, J. Jim´enez, M. Ko alewski, and J. del
Ce o, J. App. Phys. 81, 2584 (1997).
[25] J. Bo na el and R. Cach, Phys. Re . B 60, 3806 (1999).