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Synthesis of IDDQ-Testable Circuits: Integrating Built-in Current Sensors

Abstract

"On-Chip" I_{DDQ} testing by the incorporation of Built-In Current (BIC) sensors has some advantages over "off-chip" techniques. However, the integration of sensors poses analog design problems which are hard to be solved by a digital designer. The automatic incorporation of the sensors using parameterized BIC cells could be a promising alternative. The work reported here identifies partitioning criteria to guide the synthesis of I_{DDQ}-testable circuits. The circuit must be partitioned, such that the defective I_{DDQ} is observable, and the power supply voltage perturbation is within specified limits. In addition to these constraints, also cost criteria are considered: circuit extra delay, area overhead of the BIC sensors, connectivity costs of the test circuitry, and the test application time. The parameters are estimated based on logical as well as electrical level information of the target cell library to be used in the technology mapping phase of the synthesis process. The resulting cost function is optimized by an evolution-based algorithm. When run over large benchmark circuits our method gives significantly superior results to those obtained using simpler and less comprehensive partitioning methods.

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Synthesis of IDDQ-Testable Circuits: Integrating Built-in Current Sensors

Author: Wunderlich, H J,Herzog, M,Figueras Pàmies, Joan,Carrasco, Juan A.,Calderón, A
Year: 1995
Source: https://upcommons.upc.edu/bitstream/2117/20064/1/IEEE_DAC_95.pdf
SYNTHESIS
OF
IDDQ-TESTABLE CIRCUITS:
INTEGRATING BUILT-IN CURRENT SENSORS
H.-J. Wunde lichl,
M.
He zogl
J. Figue as2, J.A. Ca asco2, and A. Calde 6n2
(1)Ins i u e
o
Compu e S uc u es, Uni e si y
o
Siegen,
Hoelde lins .
3,57068
Siegen, Ge many
(2)Depa men
o
Elec onics Enginee ing, Uni e si a Poli ecnica de Ca alunya,
Diagonal
647,
pl a.
9,08028
Ba celona, Spain
Abs ac
"On-Chip"
IDDQ
es ing by he inco po a ion
o
Buil -
In Cu en (BIC) senso s has some ad an ages o e
"o -
chip" echniques. Howe e , he in eg a ion o senso s
poses analog design p oblems which a e ha d o be sol-
ed by a digi al designe . The au oma ic inco po a ion
o
he senso s using pa ame e ized BIC cells could be a p o-
mising al e na i e. The wo k epo ed he e iden i ies
pa i ioning c i e ia o guide he syn hesis o
IDDQ-
es able ci cui s. The ci cui mus be pa i ioned, such
ha he de ec i e
IDDQ
is obse able, and he powe
supply ol age pe u ba ion is wi hin speci ied limi s. In
addi ion o hese cons ain s, also cos c i e ia a e consi-
de ed: ci cui ex a delay, a ea o e head
o
he
BIC
sen-
so s, connec i i y cos s
o
he es ci cui y, and he es
applica ion ime. The pa ame e s a e es ima ed based on
logical as well as elec ical le el in o ma ion
o
he a -
ge cell lib a y o be used in he echnology mapping
phase
o
he syn hesis p ocess. The esul ing cos unc-
ion is op imized by an e olu ion-based algo i hm. When
un o e la ge benchma k ci cui s ou me hod gi es
signi ican ly supe io esul s o hose ob ained using
simple and less comp ehensi e pa i ioning me hods.
1
In oduc ion
The es me hodology based on he obse a ion o
he quiescen cu en (IDDQ) complemen s logic ( ol-
age) es ing
in
CMOS echnologies. The quiescen
cu en consumed by he IC is a good indica o o he
p esence o a la ge class o de ec s escaping logic es
[l-61. On-chip Buil -In Cu en (BIC) senso s ha e been
p oposed o o e come some o he p oblems encoun-
e ed in o -chip IDDQ es ing: long es ing imes and
low disc imina ion
o
small de ec i e cu en s. These
This wo k has been pe o med
wi hin
he amewo k o he
ESPRIT P ojec
7107
A chimedes
p oblems can be sol ed by pa i ioning he Ci cui
Unde Tes (CUT) in subci cui s, each p o ided wi h a
BIC senso . In ecen yea s, di e en BIC senso s ha e
been p oposed [7-111. Some BIC senso s (i.e. pn junc i-
ons
o
bipola de ices) in oduce a ol age d op du ing
ansien swi ching which can be unaccep able in some
applica ions due o i s e ec s in delay and noise ma -
gin educ ion.
Fo
hese applica ions he BIC senso s
ha e o inco po a e a bypass elemen
so
ha he pe -
u ba ion
in
he i ual g ound is below a ce ain maxi-
mum.
The class o BIC senso s conside ed in his pape is
illus a ed
in
igu e
1.
The BIC senso includes a sen-
sing de ice, a bypass
MOS
swi ch and a de ec ion ci -
cui y. A con ol signal
C
is applied o he ga e o he
bypass
MOS
de ice. Du ing no mal ope a ion,
C
=
1,
u ns he MOS on. Du ing es ing, i s
C
is se o
1
and
a es pa e n is applied o he CUT. When he ansien
iDD
cu en has decayed,
C
is se o
0,
u ning he
MOS
o , and he sensing de ice p oduces a ol age
signal which is p ocessed by he de ec ion ci cui y o
p oduce a PASSFAIL signal, depending on whe he
he sensed IDDQ alls below/abo e a gi en h eshold
alue
IDDQ,~~.
Se e al sensing de ices can be used
[7-
121,
each wi h i s ad an ages and disad an ages. This
kind o es abili y enhancemen may cause ex a delay
and a ea o e heads as well as a educ ion o he noise
immuni y ma gins
[8,9,12,13,15],
and he objec i e o a
sophis ica ed BIC senso placemen should be minimi-
zing hese d awbacks.
Im- es o la ge CUTS canno be done e ec i ely
using a single BIC senso . One ob ious eason is he
need
o
an app op ia e disc iminabili y. E ec i e es
o de ec s in CMOS ypically equi es
IDDQ, h
=
IPA
and non de ec i e IDDQ cu en s
o
la ge ci cui s can be
la ge han
1
PA. Also, he la ge pa asi ic capaci ance
in oduced a he sensing node by he CUT and he sen-
sing de ice ad e sely impac s es imes. These p o-
blems can be alle ia ed by pa i ioning he CUT in o
573
1066-1409/95 $4.00
0
1995
IEEE
g oups o ga es and in oducing a BIC senso o each
L
de ec ion
i ual
GND
-
ci cui y
-
g oup [12,13].
+
PASS
/
FAIL
pe io i y o his app oach o e a s aigh o wa d manual
BIC senso placemen .
"DD
4
Figu e
1:
A chi ec u e
o
a
BIC
senso
wi h
a
bypass de ice.
Fine-g ain pa i ions yield high disc iminabili y and
low es imes bu incu in high a ea o e head due o
he ( eplica ed) de ec ion ci cui y, ex a ou ing
caused by he in oduc ion o he i ual ail and ou ing
among BIC senso s. Coa se-g ain pa i ions ha e
smalle a ea o e heads bu gi e smalle disc imina-
bili ies and longe es imes. In addi ion, he ,,shape"
o he g oups can ha e a g ea in luence on he equi ed
BIC senso a ea. This is illus a ed
in
igu e 2, which
shows wo di e en pa i ions o a CUT wi h a wo-di-
mensional a ay s uc u e in ol ing h ee cell ypes.
Pa i ion
1
has an a e age maximum
iDD
in
each g oup
smalle han pa i ion
2
as he h ee cells C1, C2, C3
will no swi ch
in
pa allel; hus, using pa i ion 2, he
swi ching de ices ha e o be g ea e o gua an ee he
same limi s o he i ual ail pe u ba ion, and pa i ion
1
should be p e e ed.
Finding good pa i ions o
IDDQ
es abili y is a
complex p oblem whe e disc iminabili y be ween aul y
and aul ee cu en , a ea o e head, delay deg ada ion
and es applica ion ime ha e o be conside ed. In his
pape we p opose an e olu i e op imiza ion me hod o
minimizing a cos unc ion subjec o es ic ions. The
cons ain s a e disc iminabili y and i ual ail pe u ba-
ion. The cos unc ion is ob ained by weigh ing es ima-
o s o he di e en cos s in ol ed
in
he ade-o .
These es ima o s make an app op ia e ade-o be -
ween accu acy and compu a ion complexi y and a e
e alua ed using pa ame e ized elec ical le el in o ma-
ion o he a ge echnology. The es o he pape is
o ganized as ollows. Sec ion
2
s a es o mally he pa -
i ioning p oblem and i s cons ain s. Sec ion
3
de-
sc ibes he es ima o s used in he cos unc ion. Sec ion
4 su eys he e olu ion op imiza ion algo i hm. The ex-
pe imen al esul s discussed
in
sec ion
5
show he
su-
Pa i ion
1
;
BIC-Senso
a
BIC-Senso
I
BIC-Senso
I
Pa i ion
2
Figu e
2:
Two pa i ions
illus a ing
he impac
o
he g oup
shape
in
BIC
senso a ea.
2.
P oblem s a emen and cons ain s.
To se -up o mally he pa i ioning p oblem, he
CUT is modelled by a di ec ed g aph
C
=
(G,
T),
whe e
G
is he se o ga es and
T
includes he connec ions
among he ga es.
.4
pa i ion
Il
o
G
is a collec ion
{MI,
...,
Mk}
o disjoin g oups o ga es (modules) co-
e ing
G
(U;"=,
M,
=
G).
Each ga e is comple ely
included
in
one g oup, hence no ansis o g oup is spli
among g oups, a oiding po en ial la chup p oblems
[11,14]. Le
IDDQ,~~
be he minimum de ec i e IDDQ
cu en which has o be de ec ed and le
IDDQ,~,,
be
he maximum non-de ec i e cu en o module
M,
The
disc iminabili y o
M,
is de ined as
'DDQ. h
2d.
IDDQ.nd.1
4
(4
1
=
Fo he easibili y o an
IDDQ
es ,
d
>
1
is equi ed,
574
and a ypical alue is 10. This es ic ion can be ex-
p essed by a cons ain e alua ion unc ion de ined on
he se o all possible pa i ions
P
as :
P
-+
(0,l) wi h
K
V
d(Mi)
2
d
i=l
(n)
=
1
The o he a ge s conce ning speed and a ea can be
desc ibed by a global cos unc ion
C
on each pa i-
ion. I is de ined as
C:
P
-+
R
in
e ms o he ela i e
weigh s
ai
o he me ics
ci:
n
i=l
The pa ame e s de ined abo e allow es ablishing
he global cos unc ion o op imiza ion in he design
space Speed-A ea-Tes abili y acco ding o di e en
p io i ies e lec ed on he alues o he weigh ac o s
ai.
Cons ain s and cos s lead o a pa i ioning p oblem
as ollows:
Pa i ioning P oblem PART-IDDQ
:
Find a pa i-
ion
ll*
sa is ying he cons ain s
(Il*)
and a he
same ime minimizing he global cos unc ion
c(n*).
In gene al, his p oblem is NP-ha d, and heu is ics
o ind accep able solu ions a e p oposed. In addi ion,
he p ecise e alua ion o he cons ain s and he cos
unc ions a e elec ical le el p oblems which a e no
sol able
in
accep able ime excep o e y small ci -
cui s. In he nex sec ion, app oxima e es ima ing p o-
cedu es a e p esen ed using he ga e le el desc ip ion
o he CUT and he a ge cell lib a y.
3
Maximum cu en and cos es ima o s
In his sec ion a se o es ima o s o he a iables
necessa y o e alua e he cons ain s and cos s a logic
le el a e p oposed. A a ge cell lib a y ully cha ac e-
ized a elec ical le el is assumed a ailable.
3.1
A pe u ba ion o he Vi ual G ound (Vi ual VDD)
is
caused by he inco po a ion o he I~SQ
(IDDQ)
BIC
senso s. This a ia ion o he powe supply ol age cau-
ses a educ ion o he noise immuni y ma gins. In addi-
ion, ci cui s wi h memo y elemen s may loose he
memo ized in o ma ion. The wo s pe u ba ion occu s
du ing swi ching when he cu en is maximal. A con-
s ain pu on his ol age d opping is usual o choosing
he size o he BIC senso s. The ol age d opping de-
pends on he maximum ansien cu en
D,,,,,j
h ough module
Mi
and on he senso a ea.
Fo each module
Mi
he maximum ansien cu en
A ea o e head due o
BIC
sensing.
is es ima ed by he maximum numbe o
ga es o modules swi ching simul aneously. In o de o
es ima e a alue a logic le el we assume ha all
ga es loca ed a he same dep h on di e en pa hs,
swi ch in a way ha hei maximum cu en s add. This
is a pessimis ic assump ion as we do no conside pa hs
possibly blocked. This simpli ies he p oblem, and only
he possible pa hs o all ansi ions and he maximum
simul anei y o ansi ions a e iden i ied. Fo each ga e
gi
all possible
Li
ansi ion pa hs and he imes o
ansi ion
..
a i al a e de e mined. In his way a se o in-
ege s i, i,.
.
.,
&
,
...,
'pL, is compu ed indica ing he
possible imes o ansi ions a he ga e
gi
o each
pa h
Pk,
whe e
k:=
1
,...,
Li.
An uppe limi o
max(iDD} o a g oup
Mi
o ga es is compu ed by
1
The es ima e o
DD,mm,,
is app oxima e and
pessimis ic, bu is compu a ionally e icien enough o
allow explo a ion o a la ge numbe o pa i ions
in
easonable amoun s o CPU ime.
Le
Rs,~
be he ON esis ance o he BIC senso o
Mi,
he maximum i ual ail pe u ba ion can be ap-
p oxima ed by
Rs,i
*
DD,m,,i.
The maximum i ual
ail pe u ba ion
o
each module is limi ed o a gi en
p ede ined alue
,
yielding
*
Since he equi emen s o
a e ypically e y
s ingen (be ween
l00mV
and
300mV)
he impac o
he easible
Rs,~
on he delay o he CUT ends o be
small. Then, o simpli y he op imiza ion p oblem we
ake:
*
..
I
Rs,i
=
,
l4iIK.
The senso a ea cos es ima o is compu ed using an
a ea model o he o m
4
+A,
I
Rs
o each BIC
senso , whe e he e m
4
accoun s o he de ec ion
ci cui y and he e m
AI
I
Rs
accoun s o he sensing
elemen and he bypass de ice. This gi es
DD,
max,i
As
all componen s o he objec i e unc ion should
ha e simila ange and a ia ion o op imiza ion
easons
we
ac ually compu e
CI
(II):=
log(A)
515
3.2
Delay o e head due o BIC senso s.
The delay o e head cos is compu ed as:
whe e
D
is he delay o he ci cui wi hou BIC senso s
and
DBIC
is he delay o he ci cui wi h BIC senso s.
Bo h delays a e compu ed using a longes pa h algo-
i hm. The ga e delays
DBIc(g, )
( hese delays a e
ime g id unc ions) used o
DBIC
a e ob ained om
he nominal ga e delays (wi hou BIC senso )
D(g)
and deg ada ion ac o s
6(g, )
as
The ga e delay deg ada ion ac o
6(g, )
is ob-
ained using a second o de elec ical ne wo k model
ha ing as pa ame e s
Rs
( he BIC senso
ON
esi-
s ance),
Cs
( he pa asi ic capaci ance a he i ual
ail node),
Cg
( he equi alen capaci ance a he ou -
pu o
g),
Rg
(an a e age equi alen ON esis ance o
he discha ging ne wo k o a ga e o he CUT), and
n( )
( he ac i i y-numbe o simul aneously swi ching
ga es a ime
).
Wi h hese assump ions he exp es-
sion o he ga e delay deg ada ion becomes
The in e connec ion cos s a e di ided in o cos s o
linking he BIC senso s o he ga es wi hin each mo-
dule, and he cos s o connec ing he BIC senso s o
all modules by he es clock and es ou pu . The mo-
dule in e connec ion cos s ake in o accoun he di i-
cul y
in
sensing ga es placed in emo e loca ions. The
sepa a ion pa ame e
S(gj,gj)
o wo ga es
gj
and
gj
is he minimum numbe o nodes a e sed when going
om
gj
o
gj in
he
undi ec ed
g aph
o he logic ci -
cui .
I
S(gj,gj)
exceeds a ce ain pa ame e say
p,
o
i
no pa h exis s be ween
gj
and
gj,
we se
The sepa a ion pa ame e
S(M)
o a module
M
is
de ined as he sum o he sepa a ion pa ame e s o all
ga e pai s:
S(gi,gj):=
P.
R;
.Rj EM
In ui i ely, he pa ame e dec eases
i
many nodes o
S(M)
a e connec ed, and i is minimum i
M
is a
clique o he undi ec ed ci cui g aph.
The o e all in e connec ion cos o a pa i ion
El
o
K
g oups o ga es
Mk
whe e
k
=
1,.
.
.,
K
can be es i-
ma ed by:
K
S(n)
=
S(Mk
>.
k=l
As
a cos unc ion we use
c3
(El):
=
log(
S(
n)).
The calcula ion ime o his me ic g ows quad a-
ically wi h he numbe o ga es o each pa i ion g oup
Mk.
Since,
in
p ac ice, he numbe o ga es o a pa -
i ion g oup is ela i ely small he p oblem is no oo
se e e.
As
also he senso s mus be in e connec ed by he
es clock line and he es signal line we use
~,(n):=
K.
3.4
Tes applica ion cos s.
The es applica ion ime o a p ecompu ed es ec-
o se o he global CUT is es ima ed. Since he p opo-
sed pa i ioning app oach does no modi y he logic
s uc u e, he es ec o se needed o achie e a ce -
ain quali y goal, does no change. Howe e , he ime
equi ed o each ec o may be signi ican ly di e en
due o di e en IDDQ
se ling
imes
o di e en pa i-
ions.
Fo he es applica ion ime we use
we e
DiIc
is he sum o
DBIc
and a e m
A(zi)
ac-
coun ing o he
iDD
decay ime and he sensing ime,
es ima ed om SPICE le el simula ions as a unc ion
o he BIC senso ime cons an
ZS,~
=
Rs,iCs,i
((2s.;
is
he pa asi ic capaci ance a he i ual ail o g oup
Mi
).
4
Pa i ioning Algo i hm
Looking o a pa i ion ha sa is ies condi ion
(n)
and minimizes he cos unc ion is a e y complex, NP-
ha d op imizing p oblem, and i is impossible o
e alua e he cos unc ion
C(n)
o all he pa i ions.
Also
e alua ing
C(n)
o a single pa i ion is a he
complex as
i
a ies be ween
O(n)
and
O(m;)
whe e
mi
is he size o a module.
Hence a heu is ic algo i hm is needed which
e alua es jus a mode a e numbe o pa i ions bu is
no caugh
in
a local minimum.
A
a ie y o algo i hms
has been p oposed o such kind o p oblems ( o ce-d i-
en, simula ed annealing, Mon e Ca lo, gene ic, e. g.),
in
his pape an e olu ion-based algo i hm is applied.
576
4.1
Sol ing
combina o ial p oblems by
e olu ion based algo i hms
Fo
con olling he op imiza ion s eps an e olu ion-
based algo i hm is adap ed [17,18,19]. A single cycle o
such an algo i hm consis s o h ee s eps epea ed su i-
cien ly o en: ecombina ion, mu a ion, and selec ion.
Recombina ion:
A
popula ion consis s o a numbe
o indi iduals called pa en s which co espond o pa i-
ions in ou case. These pa en s p oduce descendan s by
ecombining hei a ibu es. In ou case
i
u ned ou
ha his s ep should be simpli ied such ha jus one pa-
en is su icien o a child, and ecombina ion is jus
duplica ion.
Mu a ion: The child pa i ions a e modi ied an-
domly co esponding o ce ain ules. These ules en-
su e ha he modi ied pa i ion is s ill
in
he neighbou -
hood o he o iginal one.
Selec ion: The indi iduals p oduced
so
a a e
e alua ed. The bes o hem a e he pa en s in he nex
cycle.
The con e gence o his p ocedu e depends on he
s a popula ion, and on he se o con ol pa ame e s
used.
4.2
Adap a ion o PART-IDDQ
The s a pa i ions a e de e mined by simpli ying
he cos unc ion such ha jus
cl(l7)
(a ea o e head)
and
cz(Il)
(delay o e head) a e conside ed. Fi s he
app op ia e module size is es ima ed. This can be done
by e alua ing
cl(Il)
and c,(Il) by a e age numbe s
o he equi ed pa ame e s and by abs ac ion om
s uc u al in o ma ion. Then ga es a e clus e ed o mo-
dules as ollows: s a ing om a ga e close o a p ima y
inpu ga e, chains a e o med owa ds a p ima y ou pu .
The p ocess s ops i his pa h eaches a p ima y ou pu ,
o i he e is no ee ga e anymo e,
o
i he maximum
module size is eached. Modules a e o med as long as
he e a e ee ga es. Using di e en chains he equi ed
numbe o s a pa i ions is cons uc ed.
The e olu ion cycle is con olled by a se o pa a-
me e s as p oposed in
[
18,193
:
CL:
Numbe o pa en s
h:
Numbe o child en pe pa en
x:
Numbe o Mon e Ca lo descendan s
0:
Maximum li e ime
m:
Maximum numbe o ga es o be
mo ed
E:
Va ia ion o m
The e olu ion cycle s a s wi h
p
di e en s a pa -
i ions
Ill,.
. .
,
Ilp
.
Child en a e gene a ed by copying
each o he pa en indi iduals
A
imes, and by mu a-
ion a e wa ds.
The mu a ion scheme o each o he
(p*A)
de-
scendan s is as ollows: A module
Mi a
om he pa -
i ion
I?:=
{M:,
...,Mii}
is selec ed, and he numbe
mbpu,& y
o i s bounda y ga es is de e mined. A ga e o
Mi a
is a bounda y ga e i i is di ec ly connec ed o a
ga e ou side
Mi a .
As a uni o mly dis ibu ed andom
a iable we selec he ac ual numbe
mmo e
E
{I
,...,
min{m,m~ounda y)) o ga es o be mo ed.
The
m,,,,
ga es a e chosen andomly, and pu in o he
a ge module hey a e connec ed wi h. I hey a e
connec ed wi h se e al a ge modules a andom one is
chosen.
In addi ion o hese
(p*A)
mu a ed child en,
(p
*x)
Mon e-Ca lo
child en a e gene a ed. Again,
each pa en indi idual is copied
x
imes. A andom
numbe o ga es o a andom module
AIs a
is mo ed
in o a andom module
M a ee .
The andom a ia ion o
hese descendan s is highe compa ed wi h mu a ions,
and hey educe he p obabili y o being caugh in a lo-
cal minimum. I all ga es o
M,,,
a e mo ed, his
module is dele ed. A e ga e mo ing, cos s a e ecom-
pu ed jus o he modi ied modules, and he global
cos s
o
he pa i ion a e upda ed. As no he en i e cos
unc ion has o be ecompu ed, he pa i ions gene a ed
his way can be e alua ed e y e icien ly.
A e exchanging ga es, he s ep wid h o mu a ion
m
is ecompu ed o each descendan . The new
m
is
subjec o no mal dis ibu ion wi h a iance
E
a ound
he
m
o s ep be o e. This scheme esul s in
(1
+
A
+
x)
*
p
pa i ions. Du ing selec ion, all pa en
indi iduals olde han
o
gene a ions a e dele ed. Ou
o he emaining ones, he
p
pa i ions wi h bes cos
unc ions a e selec ed as pa en s o he nex cycle.
i
4.3
Example
The pa i ioning s eps a e illus a ed using he
ISCAS85 benchma k ci cui C17 as an example [16].
Fi s s a pa i ions
Ill,.
.
.
,
lIp
ha e o be cons uc ed
as desc ibed abo e, igu e
4
shows pa i ion
Ill.
The
ecombina ion s ep c ea es pa i ion
Il:
by duplica ing
Ill.
Du ing mu a ion
Ms a
:=
(4,6) is selec ed an-
domly, and he bounda y ga es
Sboud:=
{g4,&} a e
de e mined. Randomly
m,,,,
=
1 and g4 as ga es o be
mo ed a e chosen. Wi h
M a ge
=
(2,3) he descendan
is shown in igu e 4. Du ing he nex gene a ion he al-
go i hm c ea es pa i ion
Il:,
M,,,:
=
(2,3,4) is selec-
ed and he bounda y se becomes
Sbound
=
{g2, g3, g4
1
.
Then ga e
g3
mo es o module (6) ( igu e
5).
Fo he
las s ep he algo i hm selec s module (3,6) o
n:.
Now bo h ga es g3, g4 mo e o hei speci ic des ina-
ion-modules and module
(3,6)
becomes emp y. A e
hese 3 gene a ions he pa i ion
Il
consis s o wo
modules (1,3,5), (2,4,6) and is he op imum pa i ion
o C17.
511

I5 I4 I3 I2 I1
02
03
I5 I4 I3 I2 I1
02
03
I5
I4 I3 I2 I1
02
03
Figu e
5:
IIi
=
{(1,5)(2,4)(3,6)],
II
=
{(1,3,5)(2,4,6)}
5
Expe imen al Resul s
In his sec ion we p esen a s aigh o wa d me hod
o s anda d pa i ioning, and we compa e he esul s
o
he me hods discussed
so
a .
The p ocess o s anda d pa i ioning s a s wi h a
ga e as nea o a p ima y inpu as possible. New ga es
a e added un il a speci ied size o he module is gene-
a ed, he module size can be de e mined elec ically
as desc ibed in sec ion 3, in
ou
case
we
ake he num-
be s ob ained by he e olu ion based algo i hm. The
new ga e added is ha ga e whose pa h leng h o all
he ga es al eady clus e ed gi es a minimum sum. I
he e a e mul iple choices, a ga e o his se is selec ed
such ha he pa h leng hs o all he ga es no ye
clus e ed gi e a maximum sum.
A
pa i ion gene a ed
his way con ains modules such ha hei ga es a e
connec ed mos closely.
5.1
Pa i ioning he
ISCASS5
Ci cui s
As
all componen s o
he
cos unc ion should ha e
simila ange and a ia ion o op imiza ion easons and
in
o de o ob ain IDDQ- es able ci cui s wi h minimal
a ea-o e head which s ill sa is y pe o mance equi e-
men s, he ollowing weigh ac o s we e chosen:
C(n)
=
9
*
c1
(n)
+
IO5
*
c2
(n)
+
c,(n)
+
c4
(n)
+
10
*
c5
(n)
The e olu ion-based algo i hm was applied o he
ISCAS85
ci cui s using his cos unc ion un il he e-
sul s con e ged o a s able alue. compu ing ime de-
pends on he s a popula ion, and is no de e minis ic.
Bu e en
o
he la ges ci cui con e gence was ob-
ained wi hin a ew hou s on a Sun Spa c wo ks a ion.
The esul s a e lis ed in able 1.
A
s anda d pa i ioning needs om 14.5% o 30.6%
mo e ha dwa e o BIC senso s han he op imal pa i-
ioning o he e olu ion based algo i hm, bu does no
show any imp o emen
in
sys em pe o mance and es
ci cui
11
C1908
1
C2670
I
C3540
I
C5315
I
C6288
I
C7522
#modules
II
2
I
3
I
4
I
6
I
5
I
6
a ea o BIC senso s
senso a ea o e head
s anda d 1.08E+6 5.67E+5 2.79E+6 2.87E+6 9.19E+5 5.65E+6
8.27E+5 4.95E+5 2.27E+6 2.29E+6 7.30E+5 4.72E+6
o s an- 30.6% 14.5% 22.9% 25.3% 25.9% 19.7%
e olu ion
5.95E-2
e olu ion 5.94E-2
Table
1
:
Resul s
o
s anda d
pa i ioning
and
e olu ion-based pa i ioning.
578
pe o mance. Delays and applica ion imes a e gi en as
pe cen age how he inco po a ion o BIC senso s slows
down pe o mance. The a ea o he BIC senso s is gi en
in
uni s whose ac ual size depends on echnology.
As
echnology mapping is no ca ied ou
so
a wi ing is
no conside ed. Since bo h in case o he s anda d and
he e olu ion-based app oach he numbe o modules is
he same, he ac ual ou ing cos s a e no expec ed o
di e signi ican ly.
6.
Conclusions
Pa i ioning c i e ia a e es ablished o guiding he
au oma ed design o IDDQ- es able ci cui s. They a e
exp essed by a mul i- a ge objec i e unc ion o be op-
imized by an e olu ion-based algo i hm. Ci cui ex a
delay, a ea o e head o he BIC senso s, connec i i y
cos s o he es ci cui y, and he es applica ion ime
a e conside ed as cos c i e ia. The pa ame e s a e
es ima ed based on logical as well as elec ical le el
in o ma ion o he a ge cell lib a y o be used
in
he
echnology mapping phase o he syn hesis p ocess. Fo
he benchma k ci cui s in es iga ed, he inal design is
supe io o esul s o a s anda d pa i ioning.
So
a only
esyn hesis o including BIC senso s has been conside-
ed. Nex s ep is con olling he logic syn hesis p oce-
du e such ha he p esen ed cos unc ion is conside ed
a he ea ly beginning.
7.
Glossa y
BIC:
CUT,
C:
n:
gi:
M:
n:={Gi,
...,
GK}:
d:
:
P
-+
(0,l):
ai
:
CI
:
C:
:
Li
:
:
ASj
6SlC
:
buil -in cu en senso
ci cui unde es
numbe o ga es o CUT
ga e numbe
i
g oup o ga es (module)
pa i ion, disjoin g oup
o
ga es
disc iminabili y o aul y and
aul - ee case
cons ain s
weigh ac o
cos unc ion
global cos unc ion
maximum i ual g ound
pe u ba ion
ansi ion pa h
ansi ion ime o pa h j
a ea o BIC senso i
delay wi h connec ed BIC
senso
delay wi hou BIC senso
o ced sepa a ion pa ame e
numbe o pa en s
h:
x:
0:
m:
E:
Re e ences
numbe o child en pe pa en
numbe o Mon e Ca lo
descendan s
maximum li e ime
maximum numbe o ga es o
be mo ed
a ia ion o m
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580