mic omachines
E a um
E a um: De Te esa, J.M. e al. Compa ison be ween
Focused Elec on/Ion Beam-Induced Deposi ion a
Room Tempe a u e and unde C yogenic Condi ions.
Mic omachines 2019, 10, 799
JoséMa ía De Te esa 1,2,* , Pablo O ús1, Rosa Có doba 3and Pa ick Philipp 4
1
Ins i u o de Ciencia de Ma e iales de A ag
ó
n (ICMA, CSIC-Uni e sidad de Za agoza) and Depa amen o de
Física de la Ma e ia Condensada, Facul ad de Ciencias, Uni e sidad de Za agoza, Calle Ped o Ce buna 12,
50009 Za agoza, Spain; po us@uniza .es
2
Labo a o io de Mic oscop
í
as A anzadas (LMA), Ins i u o de Nanociencia de A ag
ó
n (INA), Edi icio de I+D,
Campus Río Eb o, 50018 Za agoza, Spain
3Ins i u o de Ciencia Molecula , Uni e si a de València, Ca ed á ico JoséBel án 2, 46980 Pa e na, Spain;
osa.co [email p o ec ed]
4Ad anced Ins umen a ion o Ion Nano-Analy ics (AINA), MRT Depa men , Luxembou g Ins i u e o
Science and Technology (LIST), 41 ue du B ill, L-4422 Bel aux, Luxembou g; [email p o ec ed]
*Co espondence: de e esa@uniza .es
Recei ed: 17 Janua y 2020; Accep ed: 19 Janua y 2020; Published: 18 Feb ua y 2020
In Sec ion 3.1 (page 4) [1], on he ou h line, i says “C/cm2”. I should be changed o “µC/cm2”.
The edi o ial o ice would like o apologize o any incon enience caused o he au ho s and eade s.
Re e ences
1.
De Te esa, J.M.; O
ú
s, P.; C
ó
doba, R.; Philipp, P. Compa ison be ween Focused Elec on/Ion Beam-Induced
Deposi ion a Room Tempe a u e and unde C yogenic Condi ions. Mic omachines
2019
,10, 799. [C ossRe ]
[PubMed]
©
2020 by he au ho s. Licensee MDPI, Basel, Swi ze land. This a icle is an open access
a icle dis ibu ed unde he e ms and condi ions o he C ea i e Commons A ibu ion
(CC BY) license (h p://c ea i ecommons.o g/licenses/by/4.0/).
Mic omachines 2020,11, 211; doi:10.3390/mi11020211 www.mdpi.com/jou nal/mic omachines
