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High frequency multipurpose SiC MOSFET driver

Abstract

This article describes a new multipurpose Silicone-Carbide (SiC) Metal Oxide Semiconductor Field Effect Transistor (MOSFET) driver, which was designed and manufactured for a high frequency operating SiC transistor as a semiconductor switching device of power converters. The design of the introduced driver enables to adjust the output voltage levels easily by choosing the integrated linear voltage stabilizers with suitable output parameters used for Printed Circuit Board (PCB) mounting. The voltage insulation of the proposed driver between the primary control side and the secondary output side is performed by MGJ6D12H24MC muRata Ps DC-DC converter with a declared dv/dt immunity 80 kV/1000 ms at 1.6 kV and by IX3180 IXYS High Speed gate driver optocouplers with a declared 10 kV/1000 ms minimum common mode rejection at 1.5 kV. The voltage insulation of these coupling elements is accompanied by safety gaps on the PCB. These insulation features enable the proposed driver to work on high frequencies as a high-side transistor of H-bridges as same as in other power converter topologies with a high frequency and high voltage stress of the insulation border. The proposed driver also provides the possibility of tripping the signal, when the short circuit of the controlled power transistor occurs.

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High frequency multipurpose SiC MOSFET driver

Author: Strossa, Jan
Publisher: Vysoká škola báňská - Technická univerzita Ostrava
Year: 2021
DOI: 10.15598/aeee.v19i3.4159
Source: https://dspace.vsb.cz/bitstreams/4f2bc239-ceaa-4bd9-a52c-9fcef18f29b0/download
POWER ENGINEERING AND ELECTRICAL ENGINEERING VOLUME: 19 |NUMBER: 3 |2021 |SEPTEMBER
High F equency Mul ipu pose SiC MOSFET D i e
Jan STROSSA , Vladisla DAMEC , Ma in SOBEK , Daniel KOURIL ,
Jakub BACA
Depa men o Elec onics, Facul y o Elec ical Enginee ing and Compu e Science,
VSB–Technical Uni e si y o Os a a, 17. lis opadu 2172/15, 708 00 Os a a, Czech Republic
[email p o ec ed], ladisla[email p o ec ed], ma in.sob[email p o ec ed], daniel.k[email p o ec ed], [email p o ec ed]
DOI: 10.15598/aeee. 19i3.4159
A icle his o y: Recei ed Ma 11, 2021; Re ised Ap 24, 2021; Accep ed May 12, 2021; Published Sep 30, 2021.
This is an open access a icle unde he BY-CC license.
Abs ac . This a icle desc ibes a new mul ipu pose
Silicone-Ca bide (SiC) Me al Oxide Semiconduc o
Field E ec T ansis o (MOSFET) d i e , which was
designed and manu ac u ed o a high equency ope -
a ing SiC ansis o as a semiconduc o swi ching de-
ice o powe con e e s. The design o he in oduced
d i e enables o adjus he ou pu ol age le els eas-
ily by choosing he in eg a ed linea ol age s abiliz-
e s wi h sui able ou pu pa ame e s used o P in ed
Ci cui Boa d (PCB) moun ing. The ol age insula-
ion o he p oposed d i e be ween he p ima y con-
ol side and he seconda y ou pu side is pe o med by
MGJ6D12H24MC muRa a Ps DC-DC con e e wi h
a decla ed d /d immuni y 80 kV/1000 ms a 1.6 kV
and by IX3180 IXYS High Speed ga e d i e op ocou-
ple s wi h a decla ed 10 kV/1000 ms minimum com-
mon mode ejec ion a 1.5 kV. The ol age insula ion
o hese coupling elemen s is accompanied by sa e y
gaps on he PCB. These insula ion ea u es enable
he p oposed d i e o wo k on high equencies as
a high-side ansis o o H-b idges as same as in o he
powe con e e opologies wi h a high equency and
high ol age s ess o he insula ion bo de . The p o-
posed d i e also p o ides he possibili y o ipping
he signal, when he sho ci cui o he con olled
powe ansis o occu s.
Keywo ds
D i e , high swi ching equency, MOSFET,
mul ipu pose d i e , o e shoo , SiC.
1. In oduc ion
Mode n Silicone-Ca bide (SiC) Me al Oxide Semicon-
duc o Field E ec T ansis o s (MOSFET) can be
used in powe con e e applica ions wo king wi h high
swi ching equencies in a ange om ens o kHz up
o MHz. High swi ching equency wi h a combina ion
o low ansis o swi ching cha ge b ings a possibili y
o as swi ching wi h low powe losses [1] and [2]. This
leads o low swi ching losses due o as ansis o open-
ing and closing and low consumed powe o con ol
he ansis o due o low ga e cha ge [3] and [4].
The equi emen s o a p ecise ga e-sou ce ol age
con ol a ise om accomplish he p ecise swi ching
s a ed abo e [5]. Fas ise and all imes o he ga e-
sou ce ol age a e necessa y o a as swi ching and
ela ed low swi ching loss achie emen [6]. The ela ed
as swi ching enables he con e e o wo k wi h high
con ol dynamics, which is o en equi ed wi hin con-
ol algo i hms [7]. The s eady le els o he ga e-sou ce
ol age, mainly he posi i e le el o he swi ched-on
s a e, a e demanded o be close o he maximum
a ing alues o he used powe ansis o o elimi-
na e he conduc ion and leakage losses [8]. These e-
qui emen s o igina e especially in a necessi y o p e-
cise une up he d i e ou pu esis ance in high ol -
age con e e applica ions. I is caused by he wa e
impedance o he cable line applied be ween he d i e
and con olled ansis o and he ansis o inpu ca-
paci y [9], [10], and [11]. This adjus men is usually
necessa y because o he ga e-sou ce ol age o e shoo
o igina ed a he end o he con ol signal ising edge
and he alling edge, espec i ely. Gene ally, i is de-
manded o de elop a mul ipu pose d i e adjus able
o he speci ic applica ion.
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The high ol age s ess o insula ion bo de be ween
he p ima y and seconda y pa s o he d i e is o ig-
ina ed in some applica ions. Tha can be seen espe-
cially in H-b idges whe e he powe ansis o is d ain
connec ed o he s eady poin o powe ol age wi h
e e ence o he con ol sys em g ound. This ol age
s ess is mo e s enuous wi h a as e swi ching and
highe swi ched ol age due o capaci y cu en low-
ing ia he insula ion bo de and s essing he isola ing
dielec ic.
In gene al, ela i ely high swi ching equencies and
ela ed as ise and all imes o swi ched semicon-
duc o s a e achie able wi h he mode n MOSFETs.
Howe e , i means p ecisely une up he d i e bu e
ou pu esis i i y acco ding o he ou pu cable in-
duc ance, he MOSFET inpu capaci y, and he e-
la ed ga e-sou ce ol age o e shoo . The o e shoo is
highe wi h a highe ising and alling ga e-sou ce ol -
age slopes. High swi ching equencies o he applica-
ions, whe e he ansis o sou ce e minal changes i s
elec ic po en ial wi h changing he swi ch s a e means
high insula ion bo de s ess. In gene al, many d i e s
a e comme cially a ailable, and many d i e designs
we e al eady published, see [12], [13], [14], [15], [16],
[17], [18], [19], and [20].
The goal o he pape is o p esen a mul ipu pose
d i e concep wi h a ew no el po en ials acco ding
o he ollowing speci ic applica ion equi emen s:
•easy se up o he s eady on and o s a e ou pu
ol age le els,
•easy se up o he ou pu esis ance o une i up
acco ding o he ou pu cable impedance,
•high d /d insula ion bo de immuni y up
o 1.7 kV·µs−1,
•signal ip ex ension,
•ex ension o ans e ing he in o ma ion abou
d ain-sou ce ol age p esence,
•possibili y o use he de ice no as a ansis o
d i e , bu as an insula ed ol age de ec o .
All he men ioned ea u es should be easible by
choosing he app op ia e PCB assembly. This makes
he d i e easy o elease o a speci ic applica ion.
Mo eo e , i ep esses he isk o mal unc ion o less
eliable pa s, such as po en iome e s. These pa s a e
no used in he p oposed concep .
2. P oposed D i e Concep
2.1. Gene al Desc ip ion
The p oposed d i e PCB con ains 3 po s a he p i-
ma y side and a g oup o 3 e minals a he sec-
onda y side, each one o one MOSFET pin, see Fig. 1.
The i s p ima y po J1 con ains he powe supply
e minals o 9.6–18 V DC wi h he nega i e pole con-
nec ed o he signal g ound. This po also con ains
an inpu signal o d i ing he con olled ansis o and
i is eady o ace he con olled ansis o sho ci -
cui de ec ion ip signal oo.
J1
DC
DC
In e nal insula ed
powe supply
Inpu
po
Seconda y side ol age
le els gene a o
2x 24 VDC
-15 V DC
-5 V DC
15 V DC
20 V DC
SOURCE
GATE
GATE
Resis o s
GATE Low-
side in eg a ed
d i e
IXDN609SI
MGJ6D12H24MC
Op o
-couple
IX3180
Compa a o . – posi i e
Compa a o . – nega i e
DRAIN
R-cascade
IX3180
IX3180
J4
J5
T ip o -s a e
sup esss
Insula ion gap
Fig. 1: P oposed d i e simpli ied block diag am.
The nex 2 p ima y po s con ain ou pu signals
o he seconda y d ain-sou ce ol age de ec ions, po
J4 eac s on posi i e ol age, po J5 on nega i e.
Each o hese po s has an independen powe supply
on he p ima y side, which is gal anically insula ed.
I can wo k wi h di e en ol age signal s a e le els
acco ding o he connec ed sys em, he ol age adjus -
men is possible wi hin he choice o PCB moun ing
combina ion.
I is also possible o nega e he ou pu signal
a he p ima y side o he posi i e d ain-sou ce ol -
age de ec ion, which can be bene icial mainly i his
signal is used as a ip unc ion. The posi i e d ain-
sou ce ol age de ec o ou pu can be aced in he po
J1 wi h a common signal g ound as same as in po
J4 wi h an independen g ound sys em. In gene al,
he posi i e d ain-sou ce ol age de ec ion can be used
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as a ip unc ion - in his case, he de ec o ou pu
is supp essed when he ou pu ansis o is in an o
s a e. This is pe o med o a oid he alse aul de-
ec ion caused by he p esence o de ec ed ol age on
he swi ched-o semiconduc o . I he supp ession is
no pe o med, he de ec o ou pu jus ollows he de-
ec ed ol age.
2.2. Seconda y Side Powe Supply
Sys em
The p oposed concep con ains a DC-DC
MGJ6D12H24MC muRa a Ps auxilia y sou ce
which p o ides he high du/d immuni y gal anic
insula ion o he powe supply sys em. The uni
o seconda y side powe supply s abiliza ion gene a es
4 ol age le els, which a e assumed o −15 V, −5V,
+15 V and +20 V, as de aul s.
The le els +/−15 V a e aced on o powe supplies
o as ope a ional ampli ie s, which a e used as com-
pa a o s wi hin he uni s o d ain-sou ce ol age de-
ec ions, i hese unc ions a e eleased. The seconda y
side o he d i ing signal op ocouple powe supply is
supplied asymme ically, +15 V/−5V, so he le el
+15 V is also used he e. The e is cu en ly no ex-
pec a ion o demand o change he +/−15 V alues,
bu i could be demanded, e.g. in he case o he used
ope a ional ampli ie s change. In his case, i can be
adjus ed by changing he ela ed e e ence esis o s se-
ies nea he linea ol age egula o s o by changing
hese egula o s, which a e used in he TO-252-3 and
SOT-89 package, espec i ely. I he d ain-sou ce ol -
age de ec ions a e no used, PCB moun ing he −15 V
egula o is no necessa y.
The de aul le els assumed as −5V, +20 V a e used
as ol ages, which a e swi ched a he ga e ou pu .
These should be se acco ding o he applied powe
ansis o on- and o -s a e nominal ol age le els and
he o e shoo o he ga e-sou ce ol age on he applied
ansis o a he end o he ansien swi ching p o-
cesses.
These ol age le els a e gene a ed by he linea ol -
age egula o s wi h no e e ence esis o s and wi h
he signal g ound connec ed di ec ly o he seconda y
g ound. This g ound is also connec ed o he ansis o
sou ce po en ial.
The ol age egula o s a e used in he TO-252 pack-
age and belong o he well-known LM78xx and LM79xx
se ies, espec i ely. I is necessa y o se hese ol age
le els by choosing he app op ia e ol age egula o s.
The nominal o and on-s a e powe MOSFET an-
sis o s ga e-sou ce ol ages a e usually asymme ical
wi h a lowe nega i e le el. Because o ha , he sec-
onda y g ound connec ed o he ou pu ansis o
sou ce is no connec ed o he middle o he DC-DC
insula ion auxilia y sou ce ou pu , e en hough hese
2×24 V DC ou pu s a e connec ed in se ies.
The seconda y side g ound is connec ed o he ou -
pu o ano he −5V DC linea ol age egula o , which
mo es he e e ence g ound om he middle o 2×24 V
abou 5V down. This ensu es ha he e a e a ailable
c. +29 V and −9V as he inpu s o he s eady s a e
ga e-sou ce ol age egula o s.
Seconda y side ol age le els
gene a o
D i ing sys em
Isola ion gap
T ipping sys em/posi i e
d ain-sou ce ol age
de ec ion sys em
Nega i e d ain-sou ce
ol age de ec ion sys em
D ain inpu
up o 1700 V,
R cascade
Fig. 2: P oposed d i e PCB design layou , Eagle expo , blue
colo - bo om ias, ed colo - op ias.
2.3. D i ing Sys em
The d i ing sys em con ains he cascaded op ocou-
ple IX3180, an in eg a ed low-side MOSFET d i e
IXDN609SI and esis i e bu e o pa allel package
1210 esis o s. Fas ec i ying bypass diode o coupling
he pa allel esis o s wi h o he esis o s o he nega-
i e ou pu ol age is also ins alled.
The men ioned elemen s also con ain an ou pu
o supp ess he ip ou pu o do no signalize he ail,
when he powe ansis o is in he o -s a e. I is no
necessa y o moun pa s o all he ou pu esis o s
PCB pads. Howe e , i is impo an o une he o al
alue acco ding o he applied MOSFET and he line
cable be ween he powe ansis o and he d i e ou -
pu [9]. I is also impo an o ind an op imal esis-
o s combina ion acco ding o he powe loss limi a ion
o hese elemen s.
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2.4. T ipping Sys em/D-S Vol age
De ec ion
The ipping sys em/posi i e D-S ol age de ec o is
based on he inpu R-cascade 10 ×1206 package. This
cascade couples he DRAIN inpu e minal, see Fig. 1,
wi h a pai o diodes in an i-se ies, which g ound
he R-cascade ia SOURCE e minal, see Fig. 1.
The an i-se ies diodes limi he ol age be ween
he ou pu o he R-cascade and he sys em g ound.
This ol age is aced o compa a o based on ope a-
ional ampli ie ADA4627. The compa ison e e ence
mus be se by he ela ed pai o esis o s. The p o-
posed PCB layou o he compa a o ou pu con ains
pads o placing he esis o and he capaci o o
he low pass il e ing a he compa a o ou pu .
The inpu R-cascade also o igina es he RC low pass
il e oge he wi h diodes PN-junc ions pa asi ic ca-
paci ies. Choice o an op imal combina ion o inpu
esis i i y and he g ounding diodes hen can be used
o il e ing he inpu signal.
The main ea u e o he p oposed posi i e D-S ol -
age de ec o sys em is he possibili y o uning up
he sensi i i y wi hin a ew le els. Fi s ly, he low pass
il e o igina ed by he inpu R-cascade and he ela ed
diodes can be used o supp ess he noise ecei ed by
he ope a ional ampli ie . Secondly, he low-pass il e ,
o igina ed by he RC elemen o R1and C1, can be
used o supp ess some as ansien peaks a he op-
e a ional ampli ie ou pu , see Fig. 3.
DRAIN
10x1206
SOURCE
– 15 V
+ 15 V
T ipping supp ess
Op ocouple
RREF1
RREF2
RH
DD1
DD2
RD1
RD2
RD10
R1
R2
C1
DT1
Fig. 3: T ipping sys em/posi i e D-S ol age de ec o sys em
simpli ied ci cui diag am.
Se ing up he e e ence esis o s RREF 1and RREF 2
a ec s he e e ence compa ison le el and he inpu
signal- o-noise a io oo.
3. P oposed D i e P o o ype
The d i e p o o ype was ealized o d i ing SiC
C2M0045170D MOSFET manu ac u ed by CREE, Inc.
The ou pu esis i i y was se o app oxima ely 3.33 Ω
o posi i e G-S ol age and 2.22 Ω o nega i e ol age,
using 9×20 Ω esis o s. The s eady posi i e ou pu
ol age was se o +20 V, he s eady nega i e ou pu
ol age was se o −5V.
Fig. 4: Moun ed p oposed d i e PCB.
4. Ob ained Resul s
The p oposed d i e was applied o es on o S ep-
down con e e based on he s a ed C2M0045170D
MOSFET using up o 1000 V swi ched ol age and
wi h he in e connec ion o he powe ansis o
o he p oposed d i e ia coaxial app oxima ely 20 cm
long cable.
Fig. 5: Tes ed d i e p o o ype applica ion.
In Fig. 7 and Fig. 8, he esponses ob ained
wi hin he i s d i e es a e p esen ed. The es
was pe o med wi hou ol age a he powe ci cui .
The swi ching equency up o 500 kHz was achie ed,
o dina y ol age scope p obes we e used.
The ob ained u n-on delay was app ox. 150 ns and
u n - o delay was app ox. 220 ns, see Fig. 8. The low
o e shoo s can be seen wi hin he eached ga e-sou ce
ol age cu e, see Fig. 7 and Fig. 8.
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CIN
UIN
DL
RL
LL
C2M0045170D
Fig. 6: Tes ing powe ci cui diag am.
Fig. 7: D i e p o o ype esponse, no ol age a he powe ci -
cui , inpu d i e signal ol age 1:1 (V) - iole cu e,
eached G-S ol age di ec ly on he powe ansis o 1:1
(V) - blue cu e.
Fig. 8: De ailed d i e p o o ype esponse, no ol age
a he powe ci cui , inpu d i e signal ol age 1:1
(V) - iole cu e, eached G-S ol age di ec ly on
he powe ansis o 1:1 (V) - blue cu e.
I is impo an no o exceed he swi ched MOS-
FET absolu e maximum a ing, which is passed, bu
he inal o e shoo s a e di e en because o he e e se
ans e capaci ance impac , see Fig. 12 and Fig. 13.
The esponses measu ed ia he p obes men ioned
in App. A and App. B a e shown in Fig. 9, Fig. 10,
Fig. 11, Fig. 12, and Fig. 13. The nominal ou pu
capaci ance o he used C2M0045170D MOSFET is
171 pF. The nominal ol age p obe inpu capaci y
is less han 5.5pF ( he d ain connec ed ol age p obe
inpu e minal is no connec ed o he loa ing ol age
po en ial, so he e is no inpu capaci y impac ). As can
be seen, he connec ed ol age p obe inpu capaci y
is much lowe han he MOSFET ou pu capaci y, so
he minimal impac on o he measu ed ansien s a e
can be supposed.
Fig. 9: Ob ained one-pulse swi ching p ocess a UIN = 1000 V,
d ain-sou ce ol age 1:100 (V) - blue cu e, d ain cu -
en 100 mV/A (V) - iole cu e.
Fig. 10: Ob ained swi ching-on p ocess de ail a UIN = 1000 V
- d ain-sou ce ol age 1:100 (V) - blue cu e, d ain
cu en 100 mV/A (V) - iole cu e.
The p oposed p o o ype was es ed ia one-pulse,
which occu ed o 25 µs. The swi ching pulse p ocess
can be seen in Fig. 9, whe e he d ain-sou ce ol age
alls down a he beginning o he swi ching-on p o-
cess, and he d ain cu en lowing h ough he RL
load begins exponen ially g owing up a he same ime.
This is in p og ess un il he beginning o he swi ching-
o p ocess, when he d ain cu en alls down o ze o
and he d ain-sou ce ol age g ows o UIN alue o e
he swi ching-o o e shoo .
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Fig. 11: Ob ained swi ching o p ocess de ail a UIN = 1000 V
- d ain-sou ce ol age 1:100 (V) - blue cu e, d ain
cu en 100 mV/A (V) - iole cu e.
Fig. 12: Ob ained swi ching on p ocess de ail a UIN = 1000 V
- ga e-sou ce ol age measu ed di ec ly on powe an-
sis o (V).
Fig. 13: Ob ained swi ching o p ocess de ail a UIN =
1000 V, ga e-sou ce ol age measu ed di ec ly on
powe ansis o (V).
The highly smoo hed quasi-pe iodic mul i-ha monics
d ain cu en oscilla ions can be obse ed wi hin
he scoped cu es, see Fig. 10 and Fig. 11, which ep-
esen he de ails o he swi ching-on and swi ching-o
p ocesses. These oscilla ions a e caused by a pa asi ic
LC ci cui gene a ed by he induc ance o he wi es
be ween he powe MOSFET sou ce and he load and
by he P-N junc ion capaci y o he load diode DL(see
Fig. 6).
Howe e , he d ain cu en oscilla es sho ly a e
he swi ching-on p ocess is o e , bu he powe an-
sis o pe ec ly swi ches-on wi h no oscilla ions wi hin
he swi ching p ocess. I can be seen in Fig. 10
om he cu e o he d ain-sou ce ol age, which oscil-
la es sligh ly nea he s eady s a e ol age d op alue.
The ob ained ise ime in Fig. 10 is app ox. 40 ns,
which is close o he nominal alue o 20 ns. The nomi-
nal u n-on delay is 65 ns. The used ol age p obe ise
ime is less han 14 ns, which demons a es he possi-
bili y o moni o ing his cu e co ec ly by he p obe.
The d ain cu en quasi-pe iodic oscilla ions can be
also obse ed a he swi ching o -p ocess, see Fig. 11,
bu he d ain-sou ce ol age cu e ises con inuously,
wi hin 20 ns, which is close o he nominal all ime
o 18 ns.
Figu e 12 and Fig. 13 show he ga e-sou ce ol age
measu ed wi hin he same swi ching-on and swi ching-
o p ocess, espec i ely, as i is e lec ed wi hin Fig. 10
and Fig. 11. Some ansposi ions o he d ain cu en
oscilla ions o he ga e-sou ce ol age, can be obse ed
he e, see Fig. 12 and Fig. 13.
Howe e , he o e shoo o he ising slope does no
exceed 25 V, which is he applied MOSFET absolu e
maximum a ing, see Fig. 12.
The alling slope wi hin he swi ching-o p ocess
does no exceed −10 V, which is he used MOSFET
absolu e maximum a ing, see Fig. 13.
5. Conclusion
A new SiC MOSFET d i e is p esen ed in he pape .
I was disco e ed ha he uned up ealized d i e p o-
o ype is able o ich he nominal alues o ise and all
imes o he assigned con olled powe ansis o , e en
hough he e was no e o o localize he d i e as close
as possible o he con olled ansis o . The app ox.
20 cm long coaxial cable was used in his case. Despi e
he ela ed wi e induc ance, he used MOSFET ga e-
sou ce ol age absolu e maximum a ings we e no ex-
ceeded. The s eady s a es ga e-sou ce ol ages we e
se o he ansis o ecommended alues.
The ob ained esul s a e e y bene icial
om he p ac ical poin o iew, because i is
no usually possible o loca e he d i e absolu ely
208 ©2021 ADVANCES IN ELECTRICAL AND ELECTRONIC ENGINEERING
POWER ENGINEERING AND ELECTRICAL ENGINEERING VOLUME: 19 |NUMBER: 3 |2021 |SEPTEMBER
nea he d i en powe ansis o acco ding o he con-
e e cons uc ion aspec s. The p oposed solu ion
enables o wo k nea he ansis o limi s and also wi h
he use o a cable be ween he d i e and he powe
ansis o .
The supp essed cu en oscilla ions can be obse ed
a he ends o he swi ching p ocesses. These a e
o igina ed by he esponse o he pa asi ic LC el-
emen o he es ing ci cui . Al hough hese os-
cilla ions a e ans e ed on o ga e-sou ce ol age,
he swi ching p ocesses a e con inuous, which can be
seen om he cu es o he d ain-sou ce ol age.
Acknowledgmen
This wo k was suppo ed by he S uden G an Com-
pe i ion o VSB–Technical Uni e si y o Os a a unde
p ojec SP2021/70 and by he Minis y o Educa ion,
You h and Spo s o he Czech Republic unde p ojec
LTE220001 - E-Town.
Au ho Con ibu ions
J.S. and V.D. c ea ed he concep ualiza ion and o -
mula ed he main ideas o he p oposed de ice includ-
ing he applica ion equi emen s leading o he main
goals. M.S. and D.K. p epa ed he p o o ype design
and wo ked coope a ing wi h V.D. wi hin he p o o-
ype building-up p ocess. J.B. and M.S. pe o med
es ing and inal unning up he p o o ype o ge he
p esen ed ob ained esul s. D.K. and J.B. pe o med
he s a e o he a in es iga ion and J.S. pe o med he
c i ical e i ica ion o he ob ained esul s and w o e
he pape d a iáncluding he o iginal d a p epa a-
ion, and edi ing.
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Abou Au ho s
Jan STROSSA was bo n in P ague, Czech Republic.
He ecei ed his M.Sc. deg ee in Applied Elec onics
om he VSB–Technical Uni e si y o Os a a in 2018.
He is cu en ly a Ph.D. s uden a he Depa men
o Elec onics, Facul y o Elec ical Enginee ing
and Compu e Science, VSB–Technical Uni e si y
o Os a a, and wo ks o Siemens Mobili y Aus ia,
GmbH, R&D a he same ime. His esea ch in e es s
include powe elec onics in he ield o so swi ching
mul ipo DC-DC con e e s.
Vladisla DAMEC was bo n in Ka ina, Czech
Republic. He ecei ed he M.Sc. and Ph.D. deg ees
in Elec onics and Elec ical machines, appa a us and
d i es om VSB–Technical Uni e si y o Os a a,
Czech Republic, in 2000 and 2003, espec i ely. He
wo ks cu en ly o Siemens Mobili y Aus ia, GmbH,
R&D and as an assis an p o esso a Depa men
o Elec onics by VSB–Technical Uni e si y o Os a a
a same ime. His esea ch in e es s include powe
elec onics in he ield o la ge elec ic d i es.
Ma in SOBEK was bo n in F ydek-Mis ek,
Czech Republic, in 1983. He ecei ed he M.Sc. and
Ph.D. deg ees in Elec onics and Elec ical machines,
appa a us and d i es om VSB–Technical Uni e si y
o Os a a, Czech Republic, in 2008 and 2012, espec-
i ely. He wo ks cu en ly as an assis an p o esso
210 ©2021 ADVANCES IN ELECTRICAL AND ELECTRONIC ENGINEERING
POWER ENGINEERING AND ELECTRICAL ENGINEERING VOLUME: 19 |NUMBER: 3 |2021 |SEPTEMBER
a Depa men o Elec onics by VSB–Technical
Uni e si y o Os a a. His cu en esea ch in e es s
a e mic op ocesso con ol sys ems, digi al elec onics,
powe elec onics and elec ic d i es.
Daniel KOURIL was bo n in Os a a, Czech
Republic. He ecei ed his M.Sc. deg ee in Applied
Elec onics om he VSB–Technical Uni e si y o Os-
a a in 2017. His esea ch ocused on he Ha dwa e
de elopmen o a mode n p ocesso con ol sys ems
in he ield o elec ic con olled d i es o he use wi h
GA and ANN-based algo i hms.
Jakub BACA was bo n in F ydek-Mis ek, Czech
Republic. He ecei ed his M.Sc. in Applied Elec onics
om he VSB–Technical Uni e si y o Os a a in 2017.
He is cu en ly a Ph.D. s uden a he Depa men
o Elec onics, Facul y o Elec ical Enginee ing
and Compu e Science, VSB–Technical Uni e si y
o Os a a. His main esea ch in e es is cu en ly
ocused on a i icial neu al ne wo ks and hei use
in he ield o elec ic d i es, especially o senso less
con ol o induc ion machine d i es.
Appendix A Used D ain
Cu en P obe
LEM PR50
•Bandwid h BW = 50 MHz.
•Rise ime <7ns.
•Delay ime d<25 ns.
Appendix B Used D ain-Sou ce
Vol age P obe
Teledyne LeC oy AP031
•Bandwid h BW = 25 MHz.
•Rise ime <14 ns.
•Inpu capaci ance d<5.5pF each inpu e minal
o g ound.
©2021 ADVANCES IN ELECTRICAL AND ELECTRONIC ENGINEERING 211