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Characterization and Differentiation between Olive Varieties through Electrical Impedance Spectroscopy, Neural Networks and IoT

Abstract

Electrical impedance has shown itself to be useful in measuring the properties and characteristics of agri-food products: fruit quality, moisture content, the germination capacity in seeds or the frost-resistance of fruit. In the case of olives, it has been used to determine fat content and optimal harvest time. In this paper, a system based on the System on Chip (SoC) AD5933 running a 1024-point discrete Fourier transform (DFT) to return the impedance value as a magnitude and phase and which, working together with two ADG706 analog multiplexers and an external programmable clock based on a synthesized DDS in a FPGA XC3S250E-4VQG100C, allows for the impedance measurement in agri-food products with a frequency sweep from 1 Hz to 100 kHz. This paper demonstrates how electrical impedance is affected by the temperature both in freshly picked olives and in those processed in brine and provides a way to characterize cultivars by making use of only the electrical impedance, neural networks (NN) and the Internet of Things (IoT), allowing information to be collected from the olive samples analyzed both on farms and in factories

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Characterization and Differentiation between Olive Varieties through Electrical Impedance Spectroscopy, Neural Networks and IoT

Author: Madueño Luna, José Miguel; Madueño Luna, Antonio; Hidalgo Fernández, Rafael E.
Publisher: MDPI
Year: 2020
DOI: 10.3390/s20205932
Source: https://idus.us.es/bitstreams/defad3c7-6e14-4ace-bd39-b295eee65d38/download
senso s
A icle
Cha ac e iza ion and Di e en ia ion be ween Oli e
Va ie ies h ough Elec ical Impedance Spec oscopy,
Neu al Ne wo ks and IoT
JoséMiguel Madueño Luna 1,* , An onio Madueño Luna 2
and Ra ael E. Hidalgo Fe nández 3
1G aphics Enginee ing Depa men , Uni e si y o Se ille, 41013 Se ille, Spain
2Ae ospace Enginee ing and Fluid Mechanical Depa men , Uni e si y o Se ille, 41013 Se ille, Spain;
[email p o ec ed]
3G aphics Enginee ing and Geoma ics Depa men , Uni e si y o Có doba, 14014 Có doba, Spain;
[email p o ec ed]
*Co espondence: [email p o ec ed]
Recei ed: 20 Sep embe 2020; Accep ed: 16 Oc obe 2020; Published: 20 Oc obe 2020


Abs ac :
Elec ical impedance has shown i sel o be use ul in measu ing he p ope ies and
cha ac e is ics o ag i- ood p oduc s: ui quali y, mois u e con en , he ge mina ion capaci y in seeds
o he os - esis ance o ui . In he case o oli es, i has been used o de e mine a con en and
op imal ha es ime. In his pape , a sys em based on he Sys em on Chip (SoC) AD5933 unning a
1024-poin disc e e Fou ie ans o m (DFT) o e u n he impedance alue as a magni ude and phase
and which, wo king oge he wi h wo ADG706 analog mul iplexe s and an ex e nal p og ammable
clock based on a syn hesized DDS in a FPGA XC3S250E-4VQG100C, allows o he impedance
measu emen in ag i- ood p oduc s wi h a equency sweep om 1 Hz o 100 kHz.
This pape
demons a es how elec ical impedance is a ec ed by he empe a u e bo h in eshly picked oli es
and in hose p ocessed in b ine and p o ides a way o cha ac e ize cul i a s by making use o only he
elec ical impedance, neu al ne wo ks (NN) and he In e ne o Things (IoT), allowing in o ma ion o
be collec ed om he oli e samples analyzed bo h on a ms and in ac o ies.
Keywo ds:
elec ical impedance; SoC AD5933; a i icial neu al ne wo ks (ANNs); in e ne o hings
(IoT); empe a u e
1. In oduc ion
1.1. The E ec o Tempe a u e
Tempe a u e a ec s he ex u e o ui and ege ables, bo h aw [
1
] and cooked [
2
], and i also
a ec s hei elec ical pa ame e s such as he elec ical impedance o hei pulp. A wide a ie y o
p ocedu es and equipmen [
3
,
4
] exis o ob ain a ious pa ame e s associa ed wi h he pulp o hese
ui s and ege ables (pene a ion esis ance, iscosi y, e c.)
In he case o oli es, he e a e no s udies explici ly analyzing he in luence o empe a u e on
he ui , especially in i s elec ical pa ame e s, al hough i s e ec is known in ce ain mechanized
oli e p ocessing p ocedu es. This is he case, o example, in he indus ial oli e pi ing p ocess [
5
],
which is done by au oma ic machines whe e clamps a e used o ap he oli e, while a punch needle
goes h ough he clamps and, consequen ly, he oli es, causing hem o be de-s oned. This ype o
machine eaches a conside able pi ing speed, which ob iously means a minimum cos pe uni o ui
de-s oned. Howe e , he e y clamps ha hold he ui in place and he de-s oning ool cause b eakage
in a conside able numbe o oli es du ing no mal ope a ion, which can be o he o de o 14%, especially
Senso s 2020,20, 5932; doi:10.3390/s20205932 www.mdpi.com/jou nal/senso s
Senso s 2020,20, 5932 2 o 20
in he “Go dal Se illana” oli e a ie y. While he p oduc i i y o hese pi ing machines makes hem
mo e cos -e ec i e despi e he pe cen age o oli e b eakage compa ed o p e ious de-s oning sys ems,
hese machines p esen a se ious p oblem, as he pe cen age o b oken oli es is qui e conside able.
While mechanical solu ions educing he pe cen age o oli e b eakage in such de-s oning machines
do no exis , i has been p o en ha cooling he oli es p io o pi ing minimizes he p oblem o he
poin ha , wi h adequa e e ige a ion, he pe cen age o b oken oli es du ing he pi ing p ocess is o
he o de o 2%, o he “Go dal Se illana” oli e a ie y p e iously ci ed.
Fu he mo e, he cu en consume end o lowe sal and acidi y [
6
] means ha a signi ican
p opo ion o he oli es de e io a e du ing he ime hey spend in e men e s. A e a ew mon hs a an
a e age empe a u e o 25
◦
C, he p obabili ies o ha ing a signi ican loss o p oduc in he pi ing
p ocess a e e y high, due o a loss in i mness in he oli es, especially he la ge ones, which a e he
mos in demand on he ma ke . By cooling o empe a u es close o 7
◦
C (in some cases i eaches
0◦C
,
depending on he cooling sys em and he cos s he company wan s o ake on in he p ocess), i is
possible o inc ease he i mness o he oli es while main aining all o hei cha ac e is ics, he eby
educing he loss o p oduc due o he oli es ha ing a mo e igid ex u e. In addi ion, his cu s down
on he hou s he machine is wo king, meaning a dec ease in machine jams and hou s when he punch
needles a e s opped.
One way o cha ac e izing he s a e o he oli es p io o de-s oning would be by doing an
elec ical impedance measu emen on a ep esen a i e sample. As will be demons a ed in his s udy,
he elec ical
impedance o he oli e pulp is no only a ec ed by he oli e a ie y o he ype o
indus ial p ocessing (g een “Se illana S yle” o black “Cali o nian S yle” oli es) [
7
], bu also by he
empe a u e. Fo his eason, cha ac e izing his elec ical pa ame e e sus he empe a u e (especially
be ween 7
◦
C and 0
◦
C) o a gi en ype o indus ial p ocessing would show whe he o no oli es a e
ap be o e pi ing.
1.2. Elec ical Impedance: Measu emen
The de e mina ion o elec ical p ope ies is used in a wide ange o disciplines and indus ies [
8
].
In he ag i- ood sec o , he use o elec ical conduc i i y is applied o he de e mina ion o di e se
cha ac e is ics in ag i- ood p oduc s [
9
,
10
] such as os sensi i i y, eezing ole ance, mois u e con en ,
and seed ge mina ion [
11
]. The use o elec ical impedance spec oscopy is a echnique ha can p o ide
e y good esul s in he ma u i y s age o ui and ege ables. In his pape , we a e going o ocus on a
Sys em on Chip (SoC) capable o a complex impedance measu emen : he SoC AD5933 [12].
Impedance is a pa ame e o g ea impo ance o he cha ac e iza ion o ci cui s and elec onic
componen s [
13
], as well as he ma e ials used in hei p oduc ion. Impedance (Z) is gene ally de ined
as he o al opposi ion a de ice o ci cui o e s o he low o an al e na ing cu en (AC) o a speci ic
equency, and i is ep esen ed as a complex numbe wi h a g aphic ep esen a ion on a complex
plane. An impedance ec o consis s o he eal pa ( esis ance, R) and he imagina y pa ( eac ance,
X). Impedance can be exp essed by using he ec angula coo dina es in he o m o R +j
·
X, o in he
pola o m as a magni ude and phase angle: |Z|∠Ø [14].
The ins umen s mos commonly used o measu e impedance a e: he LCR me e o LCR b idge
and he impedance analyze . The i s p o ides a simple and exac impedance measu emen o
a speci ic equency alue. Howe e , o componen s o he han pu e induc o s (L), capaci o s
©
,
o esis o s (R), i is inadequa e o de e mine alue. In hese cases, an impedance analyze is used
o measu e and g aphically ep esen he complex impedance o he de ice being es ed o e a
ange o equencies [
15
]. As hey a e high cos de ices [
16
,
17
], he eason why designs using LCR
me e s (which a e cheape ) exis , is o ob ain a sys em impedance analyze combining i wi h i ual
ins umen a ion [12,18].
The e a e a ious con igu a ions o he design o impedance measu ing b idges such as
Sche ing [
19
] and he Maxwell b idge [
20
]. The di icul y wi h hese is ha hey need o ha e
he balance condi ion. Mo eo e , hey a e gene ally used o pu e induc i e o capaci i e impedance
Senso s 2020,20, 5932 3 o 20
measu emen s. In o de o ob ain he complex impedance, elec onic me hods a e used, such as he
ec o al me hod and he me hod using wo quad a u e sinusoidal wa es [
21
,
22
].Ano he way o
measu e he complex impedance is he h ee- ol age me hod [
23
]; howe e , his equi es ol ages o
be aised o he squa e, which makes he measu emen e o s g ea e , in addi ion o he ac ha i
equi es e y p ecise ins umen s o un he measu emen s.
An Impedance/Gain-Phase analyze [
24
] is a measu ing ins umen o g ea alue o he s udy
and design o elec onic ci cui s. This powe ul de ice is capable o ob aining diag ams sepa a ely,
bo h in magni ude and in phase o any ne wo k o elec onic ci cui which has an inpu and an ou pu .
Wi h his in o ma ion, i is possible, o example, o ob ain he ans e unc ion o a speci ic ci cui ,
al hough i s implemen a ion is no known.
An Impedance/Gain-Phase analyze should be capable o ob aining a eliable ampli ude and
phase diag ams co esponding o a speci ic ci cui . In bo h cases, hese a iables will be ep esen ed
acco ding o equency. These ypes o analyze s mus be capable o gene a ing a sinusoidal signal and
di ec ly applying i o he inpu o he ne wo k o be measu ed. Thus, a equency sweep is done on
he ne wo k wi h a speci ic c i e ion ega ding he ini ial, in e media e, inal equency alues, numbe
o poin s, linea o loga i hmic sweep, e c., which is no mally selec ed by he use . To gene a e he
magni ude diag am, i is necessa y o ind he quo ien be ween he ampli udes o he ne wo k ou pu
and inpu o each o he alues o be measu ed in he equency sweep. Fu he mo e, in o de o do
he phase diag am, i is necessa y o ob ain he phase di e ence be ween he ne wo k ou pu and
inpu signals again o each o he equency alues. The e o e, i is ob ious ha in o de o build an
impedance/gain-phase analyze , a sine wa e gene a o is necessa y, a he e y leas , o gene a e a
ci cui equency sweep capable o measu ing ampli ude and o ano he ci cui capable o measu ing
he phase di e ence be ween wo signals.
1.3. P e ious Examples o he Use o Elec ical Impedance in Oli e P oduc ion and O he F ui s
Elec ic conduc i i y has been used (only i s magni ude) o cha ac e ize di e en oli e a ie ies
(Olea eu opa L.) [
25
], speci ically, ou di e en cul i a s: “Picual”, “Manzanilla de Se illa”, “Hojiblanca”
and “Go dal Se illana” wi h he objec i e o es ablishing a ui ma u i y index and, hus o de e mining
he op imal ime o ha es ing based on pa ame e s such as oil yield and quali y, demons a ing ha he
conduc i i y inc eased wi h ui ma u i y and ha each a ie y had an a e age cha ac e is ic elec ic
conduc i i y alue in he las s ages o ma u a ion. P e ious s udies ha e ocused in pa icula on
de e mining ma u i y indexes and quali y pa ame e s [
7
,
26
,
27
], o on ways o slowing he ma u a ion
pe iod, abo e all in climac e ic ui s, wi h he aim o leng hening he pe iod be ween ha es ing and
comme cial consump ion [28].
1.4. Neu al Ne wo ks (NN) o Adjus men and So ing
A i icial neu al ne wo ks a e compu a ional models inspi ed by he beha io obse ed in hei
biological coun e pa s [
29
]. Thei use is widesp ead in an abundance o ields. Focusing on he able
oli e, we can see hei use in [30] o in [31].
In his s udy, we a e going o use wo ypes o neu al ne wo k. On he one hand, a neu al ne wo k
o adjus men [
32
] o e alua e he e ec i eness o his echnique in gene a ing a alid impedance
beha io mode o oli e pulp and, on he o he hand, a neu al ne wo k o so ing [
33
] o dis inguish
be ween oli e a ie ies a di e en empe a u es.
1.5. The In e ne o Things (IoT)
The use o he IoT is widely ex ended nowadays and he e a e nume ous cases ( o example [
34
–
38
])
in p ecision ag icul u e, i iga ion, empe a u e con ol, moni o ing o he ag icul u al p oduc ion
p ocess, in au oma ed oli e chain p ocesses, o in he ope a ion o he pi ing, slicing, and s u ing
machines hemsel es (DRR) [
30
,
31
]. This pape shows he de elopmen o equipmen based on he
Senso s 2020,20, 5932 4 o 20
SoC AD5933 [
12
] which, oge he wi h a neu al ne wo k and an IoT sys em, allows o he analysis o
he s a e o he oli es on he a m o in he ac o y be o e pi ing.
The gene al objec i e se ou by his pape is o de elop an elec ical impedance measu emen
sys em adap ed o able oli es, making use o he SoC AD5933. In o de o do his, wo asks a e going
o be done:
(1)
Impedance modeling h ough neu al ne wo ks o wo a ie ies o oli es (“Go dal Se illana”
and “Hojiblanca”), cu ed in caus ic soda and e men ed in b ine (an indus ial p ocess known as
“Es ilo Se illano”).
(2)
Classi ica ion ia neu al ne wo ks o each oli e a ie y a h ee empe a u es (25
◦
C, 7
◦
C, and
0◦C).
To his end, hese sys ems will be de eloped:
•
A speci ic de ice wi h he SoC AD5933 [
12
], ha includes an I
2
C communica ion in e ace [
39
],
an ex e nal DDS gene a o based on a FPGA XC3S250E-4VQG100C [
40
] o conduc a comple e
sweep om 1 Hz o 100 kHz and wo ADG706 analog mul iplexe s [
41
] o se he impedance
ange o be measu ed. This de ice is con olled by a 32-bi ARM CORTEX M3 AT91SAM 3
×
8 E
mic ocon olle wo king a 84 MHz [42].
•The sys em con ol so wa e using Ma lab p og aming language [43].
•IoT communica ion is based on [44] o gene a e a da abase wi h he ial esul s.
2. Ma e ials and Me hods
2.1. Oli e Va ie ies and Indus ial P ocess Used
The oli e ui (Olea eu opaea L.) [
25
] is an o oid d upe whose size oscilla es om 0.6 o 2 cm
in diame e and om 1 o 4 cm in leng h. This size depends on he a ie y (see Figu e 1 in [
25
]),
he ege a i e
s a e o he ee, he en i onmen al condi ions, and he cul i a ion echniques [
45
].
We used
samples o 100 un ipe oli es om oli e o cha ds (200 ees ha
−1
, Se ille, Spain), unde
i iga ion and non-limi ing nu ien condi ions wi h mechanical ha es ing, and samples o 100 oli es
in b ine om a ac o y in Se ille. In his wo k we used wo a ie ies: “Hojiblanca” and “Go dal
Se illana” eshly picked in class 0, 1, and 2 [
46
] and p ocessed in b ine he “Es ilo Se illano” way.
This ype o oli e, seasoned his way, is p ocessed in ou s ages [47–49]:
•Lye ea men in NaOH 2–4% (p/ ) o 6–12 h
•Rinsed in wa e (12–15 h)
•Fe men ed in b ine (10–12% (p/ ) o 60–300 days)
•Pi ed and s u ed o sliced.
2.2. The SoC AD5933 o Measu e Impedance
Acco ding o he SoC AD5933 da ashee [
12
], “ he AD5933 is a high p ecision impedance con e e
combining an in eg a ed equency gene a o wi h a 12-bi and 1 MSPS analogue- o-digi al con e e
(ADC)”. The impedance o he de ice unde es (DUT) is sampled by he in e nal ADC and is p ocessed
wi h a disc e e Fou ie ans o m (DFT)” [
50
]. The ou pu exci a ion ol age and he measu emen
equency a e o ally p og ammable. Communica ion is done ia an I2C in e ace.
Re iewing he a ailable bibliog aphy con i ms ha he SoC AD5933 has signi ican biological
applica ions, such ha i has been used o moni o he g ow h o cell cul u es [
51
,
52
] in measu emen s
in isola ed cells [
53
], de ec ion o blood clo ing [
54
], biosenso applica ions [
55
], and bio-impedance
measu emen s [
56
–
60
]. Likewise, i is used in he moni o ing o “ echnical objec s”, o example,
o co osion
analysis in s eel s uc u es [
61
,
62
]. In o de o ob ain comp ehensi e in o ma ion abou
he elec ical p ope ies o a measu ed objec and o use a sui able impedance spec um analysis me hod
(equi alen ci cui modelling), impedance mus be measu ed a a wide ange o equencies [63].
Senso s 2020,20, 5932 5 o 20
In Table 1, he echnical da a o a ious impedance me e s based on he SoC AD5933 a e shown.
Only h ee o he de ices desc ibed allow impedance we e o be measu ed in mo e han h ee o de s o
magni ude o equency. The impedance ange measu ed is ypically om 10
Ω
o mo e han
10 MΩ
.
Howe e , in many cases, i does no gi e he exac ange. The majo i y o he impedance me e s
men ioned equi e addi ional analog on -ends o p o ide an adequa e in e ace be ween he SoC
AD5933 and he de ice unde es (DUT) [64].
Table 1. Lis o elec ical impedance me e s based on he SoC AD5933 ( aken om [64]).
Au ho Pu pose F equency Range Impedance Range Maximum E o
C. J. Chen e al. [
51
]
Moni o ing Cell
Cul u es Se o 10 Hz No speci ied No speci ied
T. Schwa zenbe ge
e al. [52]
Moni o ing Cell
Cul u es 100 Hz–100 kHz No speci ied 2%–magni ude,
2%–a gumen
M. H. Wang e al.
[53] (uses an
AD5934)
Measu ing Isola ed
Cells 0.1 Hz–100 kHz 100 Ω–10 MΩA ound 10% o
cell measu emen
J. B oede s e al.
[55]
Biosenso
Applica ion 10 Hz–100 kHz 10 Ω–5 MΩNo speci ied
P. Bogónez-F anco
e al. [57]
Bioimpedance
Moni o 100 Hz–200 kHz 10 Ω–1 kΩ2.5%–magni ude,
4.5%–a gumen
J. Fe ei a e al. [
58
]
Bioimpedance
Elec odes In
Clo hing
5 kHz–450 kHz No speci ied 0.7%– esis ance,
17%– eac ance
C. Ma go e al. [59]
“Embedded”
applica ions o
bioimpedance
1 kHz–100 kHz No speci ied. No
da a
2.5%–magni ude,
1.3%–a gumen
A. Melwin y K.
Rajaseka an [60]
Body composi ion
measu emen s Se o 50 kHz No speci ied 2% (no speci ied)
J. Hoja y G. Len ka
[61,62]
Objec moni o ing
echnique 0.01 Hz–100 kHz 10 Ω–10 GΩ1.6%–magni ude,
0.6%–a gumen
O he au ho s [
65
–
67
] p oposed modi ica ions in he o iginal opology p o ided by he
manu ac u e wi h he use o a mul iplex sys em o adjus he ange o he impedance measu emen ,
al hough his does no include changes in he sou ce clock inpu in o he SoC AD5933. In [
68
] he
ope a ion o he SoC AD5933, he ha dwa e and so wa e de eloped, and he IoT sys em a e desc ibed.
2.3. Neu al Ne wo ks o Modeling and So ing
Two ypes o neu al ne wo ks we e used om he Ma lab lib a ies:
•
A neu al ne wo k o adjus men , “ i ne ” [
32
], allows a desc ip ion o he e olu ion o he complex
impedance in he pulp o 2 a ie ies o oli es o be ob ained. I is a conside able imp o emen
o e he Hayden model [69].
•
A so ing ne wo k, “pa e nne ” [
33
], o dis inguish be ween 6 cases (2 a ie ies and 3 empe a u es)
in un ipe and ano he 6 cases (2 a ie ies and 3 empe a u es) in oli es p ocessed he “Es ilo
Se illano” way.
3. Resul s
Th ee e i ica ion es s o he de eloped ha dwa e ha e been ca ied ou (Sec ions 3.1–3.3) as well
as a s udy on he e ec o a ie y on elec ical impedance in un ipe oli es (Sec ion 3.4) and on oli es in
b ine (Sec ion 3.5). A model wi h neu al ne wo ks on he e olu ion o impedance in un ipe and b ined
oli es o he wo a ie ies s udied in Sec ion 3.6. and a classi ie based on neu al ne wo ks capable o
dis inguishing be ween 6 di e en cases in un ipe oli es was ained (Sec ion 3.7.1), in b ined oli es
(Sec ion 3.7.2), and inally (Sec ion 3.8) he IoT sys em used is shown.

Senso s 2020,20, 5932 6 o 20
3.1. Impedance Me e Ve i ica ion Tes ing: DUT Made Up o a Pu e Resis ance o 10 kΩ
A es has been done using a pu e esis ance o 10 K
Ω
, he esul s a e in Figu e 1. The objec o he
es is o make su e ha he equipmen is wo king co ec ly. As can be seen, he answe is he same in
bo h he magni udes as in he phase h oughou he sweep om 1 Hz o 100 kHz.
Figu e 1.
Pola diag am: Comple e sweep om 1 Hz o 100 kHz wi h ZIN =10 K
Ω
(Magni ude 10 k
Ω
,
Phase 0◦).
3.2. Impedance Me e Ve i ica ion Tes ing: DUT Comp ised o a SERIAL RLC Ci cui
We conduc ed a es on he SERIAL RLC ci cui wi h an induc ance o L =56 mH, C =1500 pF
and R =5.1 k
Ω
, wi h Zcal =10 k, ZBF =10 k, Range 1: 2 Vpp, PGA =
×
1, Mul iplie =
×
1 om 1 Hz o
100 kHz (see Tables 1 and 2 in [68]).
Fo he es , h ee elemen s we e connec ed in se ies o build a ypical RLC ci cui . The heo e ical
esonance equency is:
o=
1
2·π·√L·C
=
1
2·π·p56 ×10−3×1500 ×10−12
=17365.22 Hz (1)
A low equency p edomina es he capaci i e pa wi h nega i e phases ha end o
−
90
◦
. In he
p oximi y o he esonance zone, he phase ended o ze o and om ha momen he induc i e pa
began o p edomina e, he phase in ha case posi i e ends o 90
◦
. The heo e ical and expe imen al
esul s a e shown in Figu e 2. The small disc epancies be ween heo e ical and expe imen al da a a e
due o he ole ance o he componen s used in he eal es .
Senso s 2020,20, 5932 7 o 20
Figu e 2.
Pola diag am o he es wi h SERIAL RLC ci cui be ween 1 Hz and 100 KHz. The blue
alues a e measu ed and he ed ones a e heo e ical.
3.3. Impedance Me e Ve i ica ion Tes ing: DUT Comp ised o a PARALLEL RLC Ci cui
The es on he PARALLEL RLC ci cui wi h an induc ance o L =56 mH, C =1500 pF and
R=5.1 kΩ
, wi h Zcal =10 k, ZBF =10 k, Range 1: 2 Vpp, PGA =
×
1, Mul iplie =
×
1 om 1 Hz o
100 kHz (see Tables 1 and 2 in [68]).
Fo his es , h ee elemen s ha e been connec ed in pa allel o build a ypical RLC ci cui in
pa allel. The heo e ical equency will be he same as in he p e ious es .
The heo e ical and expe imen al esul s a e shown in Figu e 3. Once again, he di e ences a e
due o he ole ance o he componen s used.
Figu e 3.
Pola diag am o he es wi h he PARALLEL RLC ci cui be ween 1 Hz and 100 kHz. The
blue alues a e measu ed and he ed ones a e heo e ical.
Senso s 2020,20, 5932 8 o 20
3.4. Tes on Un ipe Oli es: The E ec o Oli e Va ie y on Elec ic Impedance
This s udy has deal wi h oli e samples om he “Go dal Se illana” and “Hojiblanca” a ie ies,
shown in Figu e 4, om wo oli e ees si ua ed side by side and he e o e subjec o he same
en i onmen al and wa e ing condi ions. These samples we e ha es ed on he same day a he same
ime (16/06/2019).
Figu e 4.
(
a
) “Go dal Se illana” and (
b
) “Hojiblanca” oli e a ie ies du ing he elec ical
impedance measu emen .
In Figu e 5, he e olu ion o he impedance p o ile ob ained (an a e age o 100 es s) appea s
p esen ed as i s componen s X-R o un ipe oli es o bo h a ie ies a h ee empe a u es: 0
◦
C (blue),
7◦C (yellow), and 25 ◦C ( ed).
As can be seen, hey p esen a cha ac e is ic p o ile di e en ia ed bo h by empe a u e and
maximum alues, he “Hojiblanca” being he one wi h highe alues in bo h componen s X, R, and
he eby he module Z, bo h a 0
◦
C and 7
◦
C, while a 25
◦
C i s p o ile is simila o he “Go dal
Se illana”.
P e ious es s ha e demons a ed ha hese impedance p o iles do no adjus well o models o
he ype desc ibed [
70
] (see Figu e 3b o said ci a ion) wi h minimum a X close o ze o. Con e sely,
in un ipe oli es a a low equency, he e a e high alues in bo h R and X ( ed ci cles on he g aphs).
Likewise, wo ela i e minimums can be obse ed in he eac ance X alue (g een diamonds) a 7
◦
C
and 25
◦
C. The end on he g aph o 0
◦
C sugges s ha a equencies o e 100 kHz i would also exis
in his case.
Senso s 2020,20, 5932 9 o 20
Figu e 5.
E olu ion o he impedance in (
a
) un ipe “Go dal Se illana” and (
b
) “Hojiblanca” a ie ies a
3 empe a u es: 0 ◦C, 7 ◦C, and 25 ◦C (a e age o 100 es s). The ed ci cles co esponds o =1 Hz.
One o he p oblems ha some imes appea s is dis inguishing be ween he un ipe a ie ies,
due o
he ac ha hei ou wa d appea ance and size cause doub . This es demons a ed how hese a ie ies
(un ipe) a ec he elec ical impedance he same as he es o he pa ame e s (especially empe a u e).
This sys em would allow he sample a ie y o oli e o be iden i ied om he elec ical impedance
wi hou using o he cha ac e ized pa ame e s.
In Figu e 6, he impedance spec um o bo h a ie ies is shown oge he (in pola diag am).
Each one
has a cha ac e is ic p o ile a each empe a u e and he maximum di e ence is ound a low
equencies, which could se e o dis inguish be ween un ipe oli e a ie ies as is also indica ed in [
25
].
Figu e 6.
F equency sweep o measu e he elec ical impedance o he “Go dal Se illana” and
“Hojiblanca” a ie ies when un ipe (a e age alues om 100 es s).
3.5. Tes on P ocessed Oli es: The e ec he Oli e Va ie y Has on Elec ical Impedance in Oli es P ocessed he
“Es ilo Se illano” Way
Jus as wi h un ipe oli es, i is some imes di icul o dis inguish be ween p ocessed a ie ies
because o hei shape, size, and special colo (due o he chemical p ocesses hey unde go) and hey
Senso s 2020,20, 5932 16 o 20
On he o he hand, o each hese esul s, he design o a ha dwa e has been chosen ha has
allowed us o ob ain he maximum bene i s o he SoC AD5933:
•
A ci cui implemen ing an SoC AD5933 has been de eloped wi h all he pe iphe al elemen s
necessa y o i o un. This p o o ype includes a pai o ADG706 analog mul iplexe s in o de o
con e he ange in he impedance module o be measu ed.
•
In o de o achie e he maximum esolu ion in he DFT, a DDS based on an FPGA has been used
o gene a e a clock signal o be p og ammed a will acco ding o he limi s o he equency sweep
o be ca ied ou du ing he impedance measu emen .
•
P og amming he main applica ion has been done in Ma lab. In o de o con ol all o he elemen s,
an ARM CORTEX M3 (AT91SAM3X8E) mic ocon olle has been used wi h an A duino DUE,
implemen ing all o he i mwa e necessa y o con ol he ha dwa e. Las ly, he Picoblaze ou ine
con ol embedded in he FPGA o he DDS has been implemen ed in ASM.
•
The esis ance es s and he RLC se ies/pa allel ci cui s ha e shown ha he sys em wo ks p ope ly.
•
The e is a unc ional limi a ion o he chip whe e he in e nal DSP speed is p opo ional o he
clock speed applied ex e nally. In hese ci cums ances, o he low equency measu emen ( om
1 Hz o 30 Hz), a 25 kHz clock has been used which, compa ed o he equency used (16 MHz),
makes he measu emen p ocess 640 imes slowe a low equencies.
•
The ci cui buil is expe imen al and, in o de o use i di ec ly on he a ms whe e he c op
is loca ed, a e sion capable o wi hs anding hose wo king condi ions ough o be p oduced.
Likewise, he applica ion should be an app, o example on a cell phone o a able , whe e i could
connec o he compu e ia Blue oo h.
•
One possible op ion is o implemen all he ou ines h ough a mic ocon olle embedded in he
FPGA, using a p og amable mic ocon olle di ec ly in C ( o example, Mic oblaze) in his case.
•Finally, among he u u e a eas o wo k, we a e conside ing:
•
Inc easing he equency ange o 25 MHz (likely on a sys em which allows i o go o e
100 kHz
)
wi h he objec i e o seeing i , a e ha poin , hey a e s anda d applica ion models like in
Hayden’s.
•S udying o he oli e a ie ies o comme cial ele ance like “Manzanilla” o “Cace eña” oli es.
•S udying o he indus ial ea men s like he oxidized black oli e (Cali o nia s yle).
•
Running an analysis which co ela es he b eakage pe cen age in DRR machines di ec ly wi h he
measu ed impedance alue o di e en a ie ies, p ocesses, and empe a u es.
Fu u e s udies will include he applica ion o his me hodology in o he ui s such as oma o
o che y.
Au ho Con ibu ions:
Concep ualiza ion, A.M.L.; Da a cu a ion, J.M.M.L.; In es iga ion, A.M.L. and R.E.H.F.;
Supe ision, J.M.M.L., A.M.L. and R.E.H.F.; Valida ion, J.M.M.L., A.M.L. and R.E.H.F. All au ho s ha e ead and
ag eed o he published e sion o he manusc ip .
Funding: This esea ch ecei ed no ex e nal unding.
Con lic s o In e es : The au ho s decla e no con lic o in e es .
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