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Capacitance and Inductance Matrices for Multistrip Structures in Multilayered Anisotropic Dielectrics

Abstract

In this paper we present a unified variational approach to determine the capacitance and inductance matrices of generalized multistrip systems embedded in a multilayered iso/anisotropic dielectric lossless medium. The analysis is carried out in the spectral domain to take advantage of previously obtained recurrence relations which calculate the Green's function in the spectral domain. The method leads to a low-order system of linear equations, which is shown explicitly. Examples and comparison with previously published results have been included.

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Capacitance and Inductance Matrices for Multistrip Structures in Multilayered Anisotropic Dielectrics

Author: Medina Mena, Francisco; Horno Montijano, Manuel
Publisher: Institute of Electrical and Electronics Engineers
Year: 1987
DOI: 10.1109/TMTT.1987.1133798
Source: https://idus.us.es/bitstreams/c373a886-c637-4328-9945-f125404b6f5c/download
1002 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOL. MTT-35, NO. 11, NOVEMBER 1987
Capaci ance and Induc ance Ma ices o
Mul is ip S uc u es in Mul ilaye ed
Aniso opic Dielec ics
FRANCISCO MEDINA AND MANUEL HORNO, MEMBER, IEEE
Ab. ac —In his pape we p esen auni ied a ia ional app oach o
de e mine he capaci ance and induc ance ma ices o gene alized mul i-
s ip sys ems embedded in amul ilaye ed iso/aniso opic dielec ic lossless
medium. The analysis is ea ned ou in he spec a domain o ake
ad an age o p e iously ob ained ecu ence ela ions which calcula e he
G een’s unc ion in he spec al domain. The me hod leads o alow-o de
sys em o linea equa ions, which is shown explici ly. Examples and
compa ison wi h p e iously published esul s ha e been included.
I. INTRODUCTION
T
HE PHYSICAL beha io o uni o m mul iconduc o
ansmission lines when hey a e used in he design o
high- equency elec ical il e s and couple s is well unde -
s ood [1]. I is also well known ha a he low- equency
end o he spec um, aquasi-TEM app oxima ion can be
assumed e en when inhomogeneous and/o aniso opic
dielec ics a e in ol ed [2, 3]. Unde his assump ion, he
p oblem educes o he de e mina ion o he Maxwell
capaci ance ma ix o he sys em. Pa icula in e es has
been ocused on he plana s uc u es used in MIC ech-
nology. Nume ous pape s dealing wi h quasi-s a ic p opa-
ga ion in wo- o h ee-conduc o s ip sys ems can be
ound in he li e a u e [4–8]. The mo e gene al p oblem o
de e mining he Maxwell capaci ance ma ix o agene -
alized mul is ip sys em has been ea ed o homogeneous
[9] and nonhomogeneous [10] media. Howe e , o plana
s uc u es embedded in amul ilaye ed dielec ic medium,
he spec al-domain analysis seems o be especially sui -
able [11, 12]. Recen ly an e icien ecu ence algo i hm o
ob ain he G een’s unc ion in he spec al domain associ-
a ed wi h an aniso opic mul ilaye ed dielec ic medium
has been used o analyze se e al coplana [13] and non-
coplana [14] s uc u es. Simila wo k dealing wi h iso-
opic dielec ics has also been ecen ly published [15]. The
aim o he p esen pape is o apply a ia ional analysis in
he spec al domain in o de o ob ain he capaci ance and
induc ance ma ices ha cha ac e ize amul is ip sys em
o he ype shown in Fig. 1. The me hod leads o a
low-o de sys em o linea equa ions whose coe icien s
and independen e ms a e explici ly shown in he wo k.
Manusc ip ecewed Ap il 20, 1987; e ised July 2, 1987. This wo k
was suppo ed by he Comisin Aseso a de In es igaci6n Clen i ica y
T4cnica (P ey. 3028/83), Spain.
The au ho s a e wi h he Depa amen o de Elec ncldad yElec onics,
Facul ad de Fisica, U u e sidad de Se illa, 41012, Se illa, Spain.
IEEE Log Numbe 8716592,
@
~——––— ~–———=
I%%1
I
ig H, I
LO_______ ———______L ________— d
63
(a)
@
~= ——————
—– ——– ———–––– ——– ——— ——–~
,E% H% I
JL
.“ .
‘ ..
]q‘
HI
L—— ———_J_______________________J
IbI
(b)
Fig. 1. (a) C oss sec ion o gene ic mul ilaye ed coplana s ip lines. (b)
C oss sec ion o agene al noncoplana mul is ip sys em. Uand B
deno e elec ic wall, magne ic wall, o o~en bounda : L and R
deno e elec ic o magne ;c wall. ‘J
The choice o basis unc ions is discussed and se e al
examples a e in oduced o show he me hod’s s eng h.
II. STATEMENT OF THE PROBLEM:
SPECTRAL ANALYSIS
Conside asys em o s ip lines in as a i ied lossless
dielec ic egion enclosed in ase o ec angula bounda y
condi ions. Conduc o s can be coplana (Fig. l(a)) o
0018-9480/87/1100-1002$01.00 01987 IEEE
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MEDINA AND HORNO; CAPACITANCE AND INDUCTANCE MATRICES
non-coplana (Fig. l(b)) s ips. The op and bo om shields
can be conside ed elec ic walls, magne ic walls, o open
bounda ies. So, open geome ies can be simula ed by
choosing an open bounda y in he op shield and aking
“b“ in Fig. 1la ge enough. The pe mi i i y o he j h
dielec ic laye is adiagonal enso ~j. (I is impo an o
ake in o accoun he dielec ic aniso opy om ap ac ical
and heo e ical poin o iew [16].) I nonmagne ic ma e i-
als (p, =p~)a e assumed, he p oblem will be educed o,
he de e mina ion o he capaci ance ma ix o he s uc-
u es unde conside a ion wi h ([ C,j]) and wi hou ([C:])
subs a es [3]. These wo-dimensional elec os a ic p ob-
lems can be eadily o mula ed in he spec al domain
ins ead o wo king in he space domain [13] –[15]. The i s
s ep in he solu ion p ocess is o de e mine G een’s unc-
ion in he spec al domain associa ed wi h he s uc u e.
When se e al dielec ic laye s a e in ol ed, his ask may
become e y edious. Ne e heless, e y simple ecu ence
exp essions o de e mine G een’s scala unc ion o
coplana s uc u es [13] (Fig. l(a)) and G een’s unc ion
ma ix o noncoplana ones [14] (Fig. l(b)) ha e been
published. In his way, he Fou ie ans o ms o he
po en ial unc ion ~, and he su ace cha ge ~, on he
in e aces whe e he s ips a e loca ed a e ela ed ia
~( z)=G.(lZ) -Fs( z) (coplana s ips) (la)
[~(n)] =[G,.(n)] [p,(n)] (noncoplana s ips).
(lb)
These ela ions will be used in he ollowing pa ag aphs
o de i e he induc ance and capaci ance ma ices.
HI. VARIATIONAL ANALYSIS
In amul iconduc o sys em such as he one desc ibed in
he p e ious sec ion, cha ges and po en ials on he s ips
a e ela ed by means o he ma ices [C] and [P] in he
ollowing way:
[Q,]=[c,, ][L]
[K] =[~,,][Q,] [8,] -1=[c,,]. (2)
The i, j h elemen o he [C] ma ix is he ee cha ge pe
uni leng h on he i h conduc o when all conduc o s
excep he j h one a e g ounded and he j h conduc o is
cha ged o apo en ial o 1V. Hence, he elemen s o [C]
can be de e mined by ela ing he cha ge on he conduc-
o s o hei po en ials. Howe e , in ou wo k, we will ake
adi e en app oach, one based on ene gy calcula ions. In
his way, we can ake ad an age o he a ia ional na u e
o he ene gy exp essions. Fo an a bi a y dis ibu ion o
cha ges on he s ips, he elec os a ic ene gy s o ed in he
sys em pe uni leng h can be exp essed as
u=+[Q,][~,J][Qj] =+i[Izl[c ,][TJl (3)
No e ha [P] can be exp essed in e ms o he elec o-
s a ic ene gy o di e en si ua ions in he ollowing way:
P,, =2U’’/Q:
P,, =(UiJ– U“- UjJ)/Q,Q,, i+j (4)
1003
whe e U‘J is he elec os a ic ene gy s o ed in he sys em
pe uni leng h when all conduc o s excep he i h and j h
ones a e isola ed and discha ged and he i h and j h
conduc o s suppo cha ges Q, and Qj, espec i ely. Now,
()
ou p oblem is he e alua ion o he ene gy o he N+“c
di e en dis ibu ions o cha ges necessa y o compu e ill
he elemen s o he [P] ma ix (and consequen ly he [C]
ma ix).
The elec ic ene gy can be exp essed in he Fou ie
domain as ollows:
u=: g’[F+’z)]’[ i$ (n)][ i (n)]
n—1
(5)
M=numbe o in e aces wi h conduc ing s ips
(M= 1 o coplana s ip5)
s, =l,. ... M
whe e P,(n) is he Fou ie ans o m o he su ace cha ge
densi y on he j h in e ace ( he exp essions (1) ha e been
used in (5)). Aknowledge o hese dis ibu ions o cha ges
is only possible in e y limi ed cases. Howe e , he s a-
iona y na u e o (5) allows us o apply Ri z’s minimiza-
ion p ocedu e o ob ain a e y accu a e es ima ion o U.
Le n~be he numbe o conduc ing s ips lying on he
s h in e ace. The su ace cha ge densi y can be expanded
in ase o basis unc ions:
(0 elsewhe e
(6)
whe e
b
J()
p:. x.U!x=l
and
b
~()
P:p x.dx=O.
The a ia ional coe icien s a~P a e ob ained by minimi-
za ion o he elec os a ic ene gy in (5) (Ri z’s p ocedu e).
This p ocess leads o he ollowing sys em o linea equa-
ions:
Mn, #
whe e he coe icien ma ix is exp essed in e ms o he
Fou ie ans o ms o he basis unc ions in he ollowing
way: m
and he independen e ms column is ela ed o he pa -
icula dis ibu ion o cha ged and isola ed s ips o be
conside ed o each ene gy calcula ion. To de e mine he
in e se o he capaci ance ma ix om (4), i is clea ha
we mus only conside cases wi h one o wo s ips cha ged
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1004 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOL. MTT-35, NO. 11, NOVEMBER 1987
I“s
~ss —II
.’ 1(
‘~... ––—— b1
I1
Fig, 2. De ail o he s h in e ace o he s uc u es in Fig. 1.
and he es isola ed and wi hou cha ge. The e o e, i he
l h s ip o he u h in e ace and he m h s ip o he u h
in e ace a e cha ged, he independen e ms o he equa-
ion sys em will be gi en by
(9)
n=l
Once (7) is sol ed, he elec ic ene gy pe uni leng h can
be compu ed om he ollowing exp ession:
Exp ession (10) is e alua ed o all possible alues o
~,~=l,... ,Mand 1,m=1,. . . . n,; he [P] coe icien s
can hen be ob ained by using (4). This p ocess mus be
ca ied ou o he s uc u e wi h and wi hou dielec ic
laye s o ob ain [Ci,] and [C;]. In his way, he capaci ance
and induc ance ma ices a e ob ained and he sys em is
comple ely cha ac e ized unde aquasi-TEM ope a ion.
IV. TRIAL FUNCTIONS
Be o e gene a ing nume ical esul s, a good choice o
ial unc ions is necessa y. Di e en se s o basis unc-
ions ha e been conside ed in his wo k. F om his s udy,
we conclude ha an adequa e choice o ial unc ions
mus ake in o accoun he singula i ies o he cha ge
dis ibu ions a he edges o he s ips.
A e y simple se o unc ions is o conside acons an
e m co e ing he o al cha ge on he s ip and wo e ms
o he singula i ies a he edges (see Fig. 2):
[1
h(x) =; FL(x)= 1-2 “j)
sT
~—
-&i 3
w:
,2(+=(A-k’ (11)
This choice is good enough o yield e y accu a e esul s
o coplana s ip s uc u es. This ac has been concluded
om sys ema ic compa isons wi h p e iously published
esul s and wi h he da a gene a ed by using amo e
comple e se o basis unc ions such as he ollowing one
(Fig. 2): {1 1/2
2
p:o(x)=— W$’
[1
~_ (XL) 2
(Wy;)
Hp (-L))
P:p(x) =;P:o(x)” Cos —’ x x :
-COS(;)JO(;)). (12)
In agene al case in ol ing b oadside couplings, he
cha ge dis ibu ion is mo e complica ed and one mus use
he expansion in (12) o ob ain good esul s. The con e -
gence o he Fou ie se ies is slowe wi h hese unc ions,
bu he accu acy in ce ain cases is imp o ed subs an ially.
In o de o imp o e he con e gence, he asymp o ic pe -
o mance o he se ies appea ing in (8) and (9) has been
conside ed in he compu e p og ams. In his way, he
numbe o Fou ie e ms necessa y o ob ain he desi ed
accu acy is d as ically educed and bo h choices o ial
unc ions a e sui able o quick calcula ions. CPU ime is
less han one second pe conduc o s ip o mul is ip
s uc u es on a VAX1 1/780 compu e .
V. NUMERICAL RESULTS
The heo y p esen ed in his pape was used o w i e a
compu e p og am which p o ides he capaci ance and
induc ance ma ices o asys em o coupled s ips em-
bedded in amul ilaye ed iso opic o aniso opic medium.
F om hese ma ices, mode impedances and phase eloci-
ies a e eadily ob ained [3]. In o de o check he esul s,
we analyzed se e al pa icula s uc u es p e iously s udied
by o he au ho s. In he ollowing pa ag aphs, we show
hese compa isons and some new esul s.
In o de o show he e ec o a good choice o basis
unc ions we compa e ou esul s wi h he ones epo ed
by Koul and Bha [12]. (These au ho s p o ide ‘a use ul
me hod o analyze awide a ie y o symme ical s iplike
s uc u es on aniso opic subs a es.) In Fig. 3we compa e
he esul s ob ained in [12] o he in e elec ode capaci-
ance o acoplana s uc u e (elec o-op ic modula o )
wi h he ones calcula ed by means o he me hod in his
pape . We show wo cu es by using he ial unc ions in
(12) wi h n=Oand n=5. In bo h cases we ound a e y
good ag eemen o na ow s ips. Howe e , asigni ican
disc epancy is obse ed o wide ones. In ou opinion, is
disc epancy is due o he ac ha he ial unc ion used in
[12] canno con enien ly ep esen he cha ge dis ibu ion
on wide s ips. These cu es we e also compu ed by using
(11) and he disc epancy was less han 0.5 pe cen o all
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MSDINA AND HORNO: CAPACITANCE AND INDUCTANCE MATRICES
w(}D)
1005
Lo 80 120 160 . .. .
...
S.mn
~“’””4
..”, --
‘oo .7
,Ooc
40 80 120 160 20
s(pm)
Fig. 3. In e elec ode capaci ances o elec o-op ic modula o as a
unc ion o he wid h o he s ips and hei sepa a ion. ---- and —
a e he esul s epo ed in [12]. –.– .– ep esen ou compu a ions wi h
one basis unc ion, and . . . . ep esen ou compu a ions wi h i e
basis unc ions.
dimensions. This ac con i ms ha (11) is a good se o
basis unc ions o coplana s ips.
The s uc u es shown in Fig. 4(a) and (b) we e analyzed
by Ki azawa and Mi a [7] and by Ki azawa and Hayashi
[8]. The e ec i e dielec ic cons an s o Cand n modes o
hese s uc u es a e ep esen ed in Figs. 5 and 6. As we can
see, he esul s in [7] and [8] a e in good ag eemen wi h
ou da a.
Table Icompa es ou da a wi h hose ob ained by Wei
e al. [10] o he case o wo coupled mic os ip lines
be ween wo g ound planes in ahomogeneous and iso-
opic medium. Table II shows he esul s ob ained o a
s uc u e wi h h ee s ips embedded in a h ee-laye ed
dielec ic medium be ween wo g ound planes. This s uc-
u e was also s udied by Wei e al. in [10]. We compa e
bo h esul s in Table II. Signi ican di e ences a e de-
ec ed, bu hese a e wi hin he ma gin o e o gi en in
[10].
Mo e exac calcula ions we e p e iously epo ed by
Kammle on mul iconduc o s uc u es in ahomogeneous
and iso opic medium [9]. In Table III, we show he esul s
ob ained in he analysis o apai o asymme ical coupled
s ips be ween wo g ound planes. An excellen ag eemen
(wi hin +0.002 in all cases) was ound. (I mus be em-
phasized ha he Kammle esul s a e exac o wi hin
~0.001.) These da a we e gene a ed wi h he ial unc-
ions in (12). A ypical disc epancy o 1pe cen o 5
pe cen was obse ed by using (11). Howe e , he se o
I
(a)
I)’
h
Zd
h
i
(b)
Fig. 4. (a) C oss-sec iona iew o asymme ical coupled s ip lines. (b)
C oss-sec ionaJ iew o b oadside-coupled s ip lines o unequa wid h.
12.0 ,
n
----- ------- --------- --------- --------- —--..-=
P...-....
10.0 COUPLED STRIPS WITH OVERLAY
L—C-mode p esen wo k
8.0 ‘--’~’/
+!
~b---
u
,0 /cOu’’’:_::::::::>>>~##=#=”z”==z”==
-------------
---------------
------------
---------
---.” -_
4.0 .-.. ......... ............ ~
ICOUPLED SUSPENDED STRIPS
2.0 L..—dL_LL_LL—L—_J
0.1 1.0 4.0
Fig. 5. Quasi-s a ic cha ac e is ics e sus W2 WI, (The dimensions and
dielec ic cons an s ha e been akcn mn [7j:)
basis unc ions in (11) allows us o ob ain e y good esul s
in he case o coplana s uc u es. In his way, Table IV
compa es ou esul s o he case o se e al mul iconduc-
o , coplana s uc u es wi h hose epo ed in [9]. The
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1006 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOL. MTT-35, NO. 11, NOVEMBER 1987
8.0, TABLE II
VALUES OF THE CAPACITANCE AND INDUCTANCE COEFFICIENTS
FOR THREE COUPLED STRIP LINES IN ATHREE-LAYERED DIELECTRIC
BETWEEN GROUND PLANES AND COMPARISON WITH THE DATA
REPORTED IN [10]
h
6.0
l
—P esen wo k
~e , ll .Re . [81
o2 4 6 8
SI!J ~
!- .6 ~.15
J’s
Ej. 4.2 E. ‘-. 2~ ~
1—.6< .2
I4x
(a)
Re . (10 )
0.4900 x10 -9
4.5737 x10 -12
-0.6457 x10-10
0.2459 x10
-0.6138 x10::0
0.2865 x10 -9
0.7773 x10-’0
-0.1036 x10 -12
-0.7193 x10-”
0.5212 x10-10
-0.9766 x10 -11
0.3676 x10-’0
P esen win-k Di e ence
140 h‘cl -9
0.5115 x10
-12
–0.5929 x10
-0.6972 x. 10-10
0.2572 X10-9
–0.6659 x10 –lo
0.2977 x10 -9
0.8110 x10-10
-0.1075 x10-’2
-0.7812 x,0-’1
-10
0.5445 x10
-0.1C158 x10-10
0.4040 x10-10
4.3 %
3.3 %
7.7 %
4.5 %
8.1 %
3.8 %
c11
c12
c13
c22
C23
c33
c011
c012
c013
c022
c023
c033
L11
L12
L13
’22
L23
L33
c
60
SINGLE SIJSPENDED
sTRIPLINES
. — W=W1
s
— —— w~= W2
4.2 %
3.7 %
6.2 %
4.4 %
8.9 %
4.1 %
04 6 e
S/wl
(b)
Fig. 6. (a) E ec i e dielec ic cons an e sus S/ W1. (b) Cha ac e is ic
impedances e sus ,S/ WI. (Dimensions and dielec ic cons an s ha e
been aken om [8].)
-6
0.1456 x10
-8
0.5630 x10
0.2s44 x10-7
0.2240 x10 *
0.5762 X10 -7
-6
0.3065 x10
-6
0.1403 x10
o.58a7 xlC 4
-7
0.2862 X10
0.2157 X10+
-7
0.5%15 x10
0.2963 x10 -6
3.9 %
4.5 %
0.6 %
3.8 %
1.0 %
3.4 %
TABLE I
VALUES OF THE CAPACITANCE AND INDUCTANCE
COEFFICIENTS FOR Two COUPLED MICROSTRIP
LINES BETWEEN Two GROUND PLANES IN ATABLE III
ASYMMETRICAL BROADSIDE-COUPLED STRSPSBETWEEN GROUND
PLANES: COMPA USON WITH THE CAPACITANCE COEFFICIENTS
REPORTED BY IQMLER [9]
HOMOGENEOUS MEDIUM AND COMPABJSON WITH
THE DATA REPORTED IN [10].
1
-3 +’+ ,’:;3
1.5
Re . ~10~ P esen wo k
–9 -9
Cll 0.5356 X10 0.5320 x10
c-0.9250 x10-11 -0.1008 x10 -1(
12
c0.7834 X10 -9 0.7790 x10 -9
22
c0.5466 x10-10 0.5600 x10-1(
011
c-0.9439 . 10-12 -0.1062 x10-’”
012
c022 0.7994 x10-’0 0.8200 x10-1[
L0.2033 X10-6 0.1987 X10-6
11 -8 -8
’12 0.2401 X10 0.2570 X10
-6 -6
L22 0.1390 x10 0.1357 x10
3
)
)
1
3
‘2
1.0
0.8
0.6
0.5
0.4
0,3
0.2
0.1 I
0.05
–4
C1l/.o
9.136
8.862
8.434
8.179
7.904
7.611
7.300
6.956
6.746
c12/ o
-5.355
-4.743
-3.953
-3.518
–3.064
-2,592
-2.100
-1.561
-1.234
C2240
9.136
7.760
6.301
5.558
4,807
4.048
3.268
2.424
1.916
.
c/.
11 ~
‘1
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
I
*I●
c12/e oC22]’0
I
–5.352 9.133
-4.742 7.759
–3.953 6.301
–3.518 5.557
-3.063 4.807
–2.592 4.046
-2.099 3.264
-1.561 2.423
-1.235 1.915
9.133
8.860
8.434
8.179
7.903
7.610
7.299
6.956
6.746
w~e ence ~9] P esen wo k
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MEDINA AND HORNO: CAPACITANCE AND INDUCTANCE MATMCES 1007
TABLE IV
CAPACITANCE COEFFICIENTS COMPUTED FOR SEVERAL COPLANAR
CONFIGURATIONS AND COMPARISON WITH RESULTS IN
KAWLER [9]
—. —
— — —
P esen wo k (Re . [$
cll/s O=2.4617 (2.4618)
C1lAO =2.8878 (2.8!388)
c12/c ~=-1 .0372 (-1 .0379;
cll/Fo =2.8903, (2.8914)
C22/E ~=3.2908 (3.2915)
C121E ~=-1 .0060 (-1 .0064)
C13/E ~=-0.0834 (-0.0841)
C1l/FO =2. E!904 (2.8914)
C22/C0 =3.2921 (3.2938)
CJFO =-1 .0057 (-1 .0061)
C231F0 =-0.9766 (-0.9767)
C131C0 =-0.0788 (-0.0795)
C141E0 =-0.0124 (-0.0125)
C1l/sO =2.8904 (2.8914)
C22/E0 =3:2921 (3,2939)
c33/co =3.2943 (3.2961)
CIZ/CO =-1 .0057 (-1 .0061)
C2J=0 :-0.9763 (-0.9764)
c13/Eo =-0.0789 (-0.0794)
c24/F ~=-0.0745 (-0.0751)
c14/co =-0.0117 (-0.0117)
c15/Eo .-0.0020 (.0.0020)
di e ence is less han 0.05 pe cen o he wo s o he
cases s udied.
Finally, ano he con igu a ion was analyzed wi h ou
me hod, one consis ing o a h ee-line symme ical couple
wi h a wo-laye ed aniso opic subs a e: sapphi e (h z)
and py oli ic bo on ni ide (P.B.N.) (h J. Special couple
s uc u es such as his one a e o en equi ed in communi-
ca ion sys ems and o he mic owa e applica ions. In hese
s uc u es, he quasi-TEM modes (A, B, C) can be
p opaga ed [4]–[6]. Fig. 7 ep esen s he dependence o he
mode cha ac e is ics on he a io hi/h. I can be no iced
ha he e a e wo alues o hi/h ha equalize he mode
phase eloci ies. This in e es ing esul is aconsequence o
he combined e ec o he geome y o he s uc u e and
he use o aniso opic subs a es [17].
VI. CONCLUSIONS
In his pape he au ho s ha e discussed he analysis o
shielded mul iconduc o s ip lines embedded in amul i-
laye ed aniso opic medium by employing a a ia ional
echnique in Fou ie ’s disc e e domain. The calcula ion o
8.0
7.0
6.0
5.0
4.0
3.0
l E=5.12; E=
xl 3.40 (P. B.N
yl
mode AE== 9.40 ;EY2 .11-60
(sapphi e)
.2 .d .6 .8 hi/h
Fig. 7. A, B, and Cmode e ec i e dielec ic cons an s o h ee s ips
on wo aniso opic dielec ic laye s as a unc ion o he ela i e
hickness o each-laye .
he capaci ance and induc ance ma ices o lossless con-
igu a ions is achie ed by compu ing he elec ic ene gy
pe uni leng h o he s uc u es. The Rayleigh-Ri z p oce-
du e has been applied o op imize he solu ion using
adequa e ial unc ions. The me hod is nume ically e y
e icien and can be easily implemen ed in acompu e
p og am.
The numbe o aniso opic dielec ic laye s and conduc-
o s ips is no longe adi icul y because he G een’s
unc ion ma ix is e alua ed by means o a e y simple
ecu ence algo i hm. Some examples ha e’ been included
o illus a e he s eng h o he me hod and i s accu acy.
The p opaga ion modes o h ee lines wi h wo aniso opic
laye s ha e been s udied as apa icula applica ion.
REFERENCE5
[1]
[2]
[3]
[4]
K. D. Ma x, “P opaga ion modes, equi alen ci cui s, and cha -
ac e is ic e mina ions o mul iconduc o ansmission lines wi h
inhomogeneous dielec ics,” IEEE T ans. Mic owa e Theo y Tech.,
ol. MTT-21, pp. 450–457, July 1973.
I. V, Linden, “On he quasi-TEM modes in inhomogeneous muRi-
conduc o ansmission linesj’ IEEE T ans. Mic owa e Theo y
Tech., ol. MTT-29, pp. 812-817, Aug. 1981.
R. Ma qw$s and M. Homo, “P opaga ion o quasi-s a ic modes in
aniso opic ansmission lines: Applica ion o MIC lines,” IEEE
T ans Mzc owaue Theo~ Tech., ol. MTT33, pp. 927-932, Oc .
1985.
D. Pa lidis and H. L. Ha nagel, “The design and pe o mance o
h ee-hne mic os lp couple s,” IEEE T ans. Mic owa e Theosy
Tech., ol. MTT-24, pp. 631-640, Oc . 1976.
Au ho ized licensed use limi ed o: Uni e sidad de Se illa. Downloaded on July 21,2020 a 15:35:50 UTC om IEEE Xplo e. Res ic ions apply.
1008
[5]
[6]
[7]
[8]
[9]
[10]
[11]
[12]
[13]
[14]
[15]
[16]
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOL. MTT-35, NO. 11, NOVEMBER 1987
V. K. T ipa hi, “On he analysis o symme ical h ee-line mic o-
s ip ci cui s,” IEEE T ans. Mic owa e Theo y Tech., ol. MTT-25,
pp. 726-729, Sep . 1977.
V, K, T ipa hi, “The sca e ing pa ame e s and di ec ional couple
analysis o cha ac e is ically e mina ed h ee-line s uc u es in an
inhomogeneous medium,” IEEE T ans. Mic owa e Theo y Tech.,
ol. MTT-29, ) ). 22–26, Jan. 1981.
T. Ki azawa and R. Mi a, “Ana ysis o asymme ic coupled
s iplinesj” IEEE T ans. Mic owa e Theo y Tech., ol. MTT-33, pp.
643-646, July 1985.
T. Ki azawa and Y. Hayashi, “Analysis o unsymme ical b oad-
side-coupled s iplines wi h aniso opic subs a es,” IEEE T ans.
Mic wwaue Theo y Tech., ol. MTT-34, pp. 188-191, Jan. 1986.
D. W, Kammle , “Calcula ion o cha ac e is ic admi ances and
coupling coe icien s o s ip ansmission lines,” IEEE T ans.
Mic owa e Theo~ Tech., ol. MTT-16, pp. 925-937, No . 1968.
C. Wei, R. F. Ba ing on, J. R. Mau z, and T. K. Sa ka , “Mul i-
conduc o ansmission lines in mul ilaye ed dielec ic media,”
IEEE T ans. Mic owa e Theo p Tech., ol. MTT-32, pp. 439-450,
. .
Ap . 1984.
Yu Chang and Chang-Yu Wu, “Ex ension o Chang-Chang’s
me hod o analysis o gene alised mul ilaye and mul iconduc o
ansmission-line sys em; Eiec on. Le ., ol. 7, no. 2, pp. 45-47,
Jan. 1971.
S. K. Koul and B. Bha , “Gene alized ana ysis o mic os ip-like
ansmission lines and coplana s ips wi h aniso opic subs a es
o MIC, elec oop ic modula o and SAW applica ion,” IEEE
T ans. Mic owa e Theo y Tech., ol. MTT-31, pp. 1051–1059, Dec.
1983.
P. Medina and M. Homo, “Uppe and lowe bounds on mode
capaci ances o ala ge class o aniso opic mul ilaye ed mic o-
s ip-like ansmission lines,” P oc. Insl. Elec. Eng., p . H, ol. 132,
no. 3, pp. 157–163, June 1985.
F. Medina and M. Homo, “De e mina ion o G een’s unc ion
ma ix o mul iconduc o and aniso opic mul idielec ic plana
ansmission lines,” IEEE T ans. Mic owa e Theoiy Tech., ol.
MTT-33, pp, 933-940, lc . 1985.
A. Sawicki and K. Sachse, “Lowe and uppe bound calcula ions
on he capaci ance o mul iconduc o p in ed ansmission line
using he spec al domain app oach and a ia ional me hod,” IEEE
T ans. Mic owa e Theo y Tech., ol. MTT-34, pp. 236-244, Feb.
1986.
N. G. Alexopoulos, ‘<In eg a ed-ci cui s uc u es on aniso opic
subs a es,” IEEE T ans. Mic owa e Theo~ Tech., ol. MTT-33,
Pp. 847–881, C)c . 1985.
[17] N. G. Alexopoulos, S. Ke ne , and C. M. K owne, “Dispe sionless
coupled mic os ip o e used silica-like aniso opic subs a es,”
Elec on. Le e , ol. 12, no. 22, pp. 579-580, Oc . 28, 1976.
F ancisco Medina was bo n in Pue o Rea , Spain,
on No embe 9, 1960. He ecei ed he
Licencia u a deg ee in physics om he Uni e -
si y o Se ille, Spain, in 1983.
He is cu en ly Assis an P o esso o Elec-
ici y and Magne ism in he Depa men o
Elec ici y and Elec onics, Uni e si y o Se ille,
whe e he is s udying o he Ph.D. deg ee. His
cu en in e es is in mul iconduc o plana
ansmission lines and MIC design.
*
Manuel Homo (M75) was bo n in Te e del
Campo (Ja+n), Sps in, on June 29, 1947. He
ecei ed he deg ee o Licenciado in physics in
1969 and he deg ee o Doc o en Ciencias in
Physics in 1972, bo h om he Uni e si y o
Se illa, Spain.
Since Oc obe 1969 he has been wi h he De-
pa men o Elec ici y and Elec onics a he
Uni e si y o Se illa, whe e he became an Assis-
an P o esso in 1970, Associa e P o esso in
1975, and P o esso in 1986. His main ields o
in e es include bounda y a ue p oblems in elec omagne ic heo y, wa e
p opaga ion h ough aniso opic media, and mic owa e in eg a ed ci -
cui s He is p esen ly engaged in he analysis o plana ansmission lines
embedded in aniso opic ma e ia s, mul iconduc o ansmission lines,
and plana slow-wa e s uc u es.
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