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Vibrodiagnostics Faults Classification for the Safety Enhancement of Industrial Machinery

Abstract

The current digitization of industrial processes is leading to the development of smart machines and smart applications in the field of engineering technologies. The basis is an advanced sensor system that monitors selected characteristic values of the machine. The obtained data need to be further analysed, correctly interpreted, and visualized by the machine operator. Thus the machine operator can gain a sixth sense for keeping the machine and the production process in a suitable condition. This has a positive effect on reducing the stress load on the operator in the production of expensive components and in monitoring the safe condition of the machine. The key element here is the use of a suitable classification model for data evaluation of the monitored machine parameters. The article deals with the comparison of the success rate of classification models from the MATLAB Classification Learner App. Classification models will compare data from the frequency and time domain, the data source is the same. Both data samples are from real measurements on the CNC vertical machining center (CNC-Computer Numerical Control). Three basic states representing machine tool damage are recognized. The data are then processed and reduced for the use of the MATLAB Classification Learner app, which creates a model for recognizing faults. The article aims to compare the success rate of classification models when the data source is a dataset in time or frequency domain and combination.</p>

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Vibrodiagnostics Faults Classification for the Safety Enhancement of Industrial Machinery

Author: Zuth, Daniel; Blecha, Petr; Marada, Tomáš; Huzlík, Rostislav; Tůma, Jiří; Maradová, Karla; Frkal, Vojtěch
Publisher: MDPI
Year: 2021
DOI: 10.3390/machines9100222
Source: https://dspace.vut.cz/bitstreams/176ab946-a249-4b48-915e-a7b7e678705f/download
machines
A icle
Vib odiagnos ics Faul s Classi ica ion o he Sa e y
Enhancemen o Indus ial Machine y
Daniel Zu h 1,* , Pe Blecha 1, Tomas Ma ada 1, Ros isla Huzlik 1, Ji i Tuma 1, Ka la Ma ado a 1
and Voj ech F kal 2


Ci a ion: Zu h, D.; Blecha, P.;
Ma ada, T.; Tuma, J.; Huzlik, R.;
Ma ado a, K.; F kal, V.
Vib odiagnos ics Faul s Classi ica ion
o he Sa e y Enhancemen o
Indus ial Machine y. Machines 2021,
9, 222. h ps://doi.o g/10.3390/
machines9100222
Academic Edi o : An onio J. Ma ques
Ca doso
Recei ed: 3 Sep embe 2021
Accep ed: 23 Sep embe 2021
Published: 30 Sep embe 2021
Publishe ’s No e: MDPI s ays neu al
wi h ega d o ju isdic ional claims in
published maps and ins i u ional a il-
ia ions.
Copy igh : © 2021 by he au ho s.
Licensee MDPI, Basel, Swi ze land.
This a icle is an open access a icle
dis ibu ed unde he e ms and
condi ions o he C ea i e Commons
A ibu ion (CC BY) license (h ps://
c ea i ecommons.o g/licenses/by/
4.0/).
1Facul y o Mechanical Enginee ing, B no Uni e si y o Technology, 616 69 B no, Czech Republic;
[email p o ec ed].cz (P.B.); [email p o ec ed].cz (T.M.); huzlik@ u b .cz (R.H.); [email p o ec ed].cz (J.T.);
[email p o ec ed].cz (K.M.)
2TOSHULIN, a.s., Wolke o a 845, 768 24 Hulin, Czech Republic; [email p o ec ed]
*Co espondence: [email p o ec ed].cz
Abs ac :
The cu en digi iza ion o indus ial p ocesses is leading o he de elopmen o sma
machines and sma applica ions in he ield o enginee ing echnologies. The basis is an ad anced
senso sys em ha moni o s selec ed cha ac e is ic alues o he machine. The ob ained da a need o
be u he analysed, co ec ly in e p e ed, and isualized by he machine ope a o . Thus he machine
ope a o can gain a six h sense o keeping he machine and he p oduc ion p ocess in a sui able
condi ion. This has a posi i e e ec on educing he s ess load on he ope a o in he p oduc ion o
expensi e componen s and in moni o ing he sa e condi ion o he machine. The key elemen he e is
he use o a sui able classi ica ion model o da a e alua ion o he moni o ed machine pa ame e s.
The a icle deals wi h he compa ison o he success a e o classi ica ion models om he MATLAB
Classi ica ion Lea ne App. Classi ica ion models will compa e da a om he equency and ime
domain, he da a sou ce is he same. Bo h da a samples a e om eal measu emen s on he CNC
e ical machining cen e (CNC-Compu e Nume ical Con ol). Th ee basic s a es ep esen ing
machine ool damage a e ecognized. The da a a e hen p ocessed and educed o he use o he
MATLAB Classi ica ion Lea ne app, which c ea es a model o ecognizing aul s. The a icle aims
o compa e he success a e o classi ica ion models when he da a sou ce is a da ase in ime o
equency domain and combina ion.
Keywo ds:
ib odiagnos ics; classi ica ion lea ne app; machine lea ning; MATLAB; Py hon; classi i-
ca ion model; unbalance
1. In oduc ion
The cu en de elopmen o Indus y 4.0 b ings, in addi ion o he digi iza ion o
p oduc ion, he collec ion o la ge amoun s o da a, which a e sui able o he use o a -
i icial in elligence me hods. Pa icula ly in he ield o echnical diagnos ics, his opens
possibili ies o he ea ly de ec ion s a e o an objec (machine) based on he measu ed da a,
which a e ob ained om di e en s anda d diagnos ic me hods (e.g., ib odiagnos ics,
he modiagnos ics o elec odiagnos ics) and i is possible o use special me hods o ech-
nical diagnos ics such as measu ing he magne ic ield o he machine [
1
]. I is he e o e
a mul i-pa ame e diagnos ic ha can mo e accu a ely de ec , iden i y, and localize he
eme ging aul , hanks o a combina ion o inpu da a om di e en a eas o diagnos ics.
Vib a ions a e an impo an ca ie o in o ma ion abou he condi ion o o a ing
equipmen and his ac is commonly used in he ield o ib odiagnos ics. This a icle
ocuses on he machining cen e and he e i is possible o use he ib odiagnos ic sys em
o de ec o he in o ma ion such as machining quali y o ool damage. Thus, unexpec ed
s a es can be de ec ed by a ib odiagnos ic signal, which may indica e a aul o a sa e y
isk. Howe e , hese signals a e unexpec ed and a simple e alua ion mechanism canno
be designed, o example, wi h he de ec ion o equen ailu es o o a y machines such
Machines 2021,9, 222. h ps://doi.o g/10.3390/machines9100222 h ps://www.mdpi.com/jou nal/machines
Machines 2021,9, 222 2 o 19
as misalignmen , unbalance, o bea ing damage. In hese cases, i is app op ia e o use
sel -lea ning a i icial in elligence me hods, i.e., hey can lea n o ecognize a aul condi ion
om his o ical da a o a speci ic machine o speci ic machining ope a ions.
In he de elopmen p ocess o sma machine ools capable o ope a ing wi hin he
amewo k o indus y 4.0, i is necessa y o implemen isk analysis al eady du ing
he machine design s age no only in e ms o po en ial damage o he heal h o he
machine ope a o (acco ding o ISO 12100 [
2
]), bu also in e ms o quali y managemen and
moni o ing o he capabili y o he manu ac u ing p ocess on he machine ool (acco ding
o ISO 9001 [
3
]). We can apply he good echnical p ac ice as desc ibed in IEC 31010 [
4
]
and hen implemen he necessa y diagnos ic ools in o he machine design o modi y his
machine design so ha he measu emen unce ain y o he senso sys em (acco ding o
ISO 3534-1 [
5
]) would no a ec he in e p e a ion o he measu ed da a and he subsequen
decision-making p ocesses in a nega i e way. A ypical example could be ea ly de ec ion
o ool damage and subsequen b inging he machine o a sa e s a e. B eaking and ejec ing
he ca bide inse om a ool holde can cause damage o he anspa en gua d o he
machine’s wo king a ea, and hus lead o a subsequen loss o i s sa e y unc ion, o i
may cause i e e sible damage o he machined su ace. The e o e, by ea ly de ec ion o
a machine aul , we can p o ec he heal h o he ope a o as well as educe he inancial
losses caused by poo p oduc ion o inc eased wea o he sma machine’s spindle.
This a icle will, he e o e, compa e classi ica ion me hods ha can de ec a speci ic
aul om eal da a, namely a missing inse on a machining ool, he absence o which
could ha e occu ed due o ool damage. A me hod will be used whe e p edic o s o
machine lea ning will be e alua ed in ad ance and hei choice is he e o e up o he expe .
The co ec choice o p edic o s has a majo impac on he classi ica ion success a e. The
au ho s o he wo k ha e al eady deal wi h he issue o e alua ing ib odiagnos ic signals
in [
6
–
8
]. The idea o using a i icial in elligence me hods in diagnos ics is desc ibed in
o he publica ions such as in [
9
–
12
] , whe e a i icial in elligence me hods a e used o he
ecogni ion o gea box aul s. Also, in he pape [
13
] au ho s ocus on he classi ica ion
using neu al ne wo ks in he plane a y gea . The a icle [
14
] uses a i icial in elligence
me hods o ecognize he shape o a o a y machine sha ’s o bi ; i is a pic u e classi ica ion
acco ding o he shape o sha o bi . The aim o his esea ch is o de e mine a as me hod
( eal- ime e alua ion) o he imely e alua ion o a ailu e ha would educe he sa e y o
he machine. Thus, he p ima y goal is no o diagnose he condi ion o he machine, such
as a bea ing o gea box ailu e, and o p edic esidual li e, bu o de ec ailu es ela ed o
machine sa e y and o wa n he ope a o immedia ely.
This a icle has se e al goals and hey a e:
•
Ve i y ha he missing inse on he ool is de ec able on he ib odiagnos ic signal
measu ed on he machine spindle.
• Selec and compa e p edic o s om ime and equency domains.
• E ec spindle speeds on he classi ica ion success a e.
• Selec and compa e he mos success ul classi ica ion me hods
• E alua e de ec ion success a e o aul - ee s a e
I is assumed ha he p ocess o da a collec ion and e alua ion akes place on an IPC
(Indus ial PC) compu e nea he machine ( o example IPC SIMATIC PC-based, whe e
one IPC will be p epa ed o each CNC machine), and he lea ning and model gene a ed
p ocess will ake place on a se e con aining comme cial so wa e such as MATLAB
(se e will be used o many CNC machines). Lea ning and expo ing he model is an
impo an ope a ion and will ake place unde s ic supe ision. The c ea ed MATLAB
model will be expo ed o he use o indi idual IPCs wi hou MATLAB.
The Py hon en i onmen also includes Machine Lea ning ools such as sciki [
15
] o
A ap used in [
16
], howe e in his case he ambi ions a e o be used in a sa e y en i onmen
and he au ho s he e ely on he p o essional Ma lab en i onmen . In he u u e, he abo e-
men ioned oolboxes will be used and es ed o e alua e he condi ion o he machine.
Machines 2021,9, 222 3 o 19
Py hon en i onmen is used o signal p ocessing, he MATLAB and Classi ica ion
Lea ne App [17] a e used o da a classi ica ion.
2. Expe imen al P ocedu e
The da a we e ob ained om he machine MCV 754 QUICK (Figu e 1), i is a h ee-axis
CNC (Compu e Nume ical Con ol) machining cen e, mo e in o ma ion can be ob ained
on he manu ac u e ’s websi e [
18
]. The ob ained da a a e om he measu ing ins umen
Mic olog CMXA48 and he measu emen pa ame e s a e in he Table 1.
Table 1. Measu emen pa ame e s o Mic olog CMXA48.
Measu emen Pa ame e s:
Analysis ype: Accele a ion ime domain
Uni s: g
F equency ange: 1000 Hz
Y-Axis uni s: g
WAV (Wa e o m Audio File Fo ma ) File Pa ame e s:
Bi s pe sample: 16
Samples pe second: 2560
A e age by es pe second: 10,240
Fo ma : PCM (Pulse Code Modula ion)
Figu e 1. CNC e ical machining cen e MCV 754.
The ins umen Mic olog uses a CMSS 2111 accele ome e senso ha has been a -
ached o he spindle wi h a magne . The posi ion o he senso on he machine is shown
in Figu e 2. Used ool H490 F90AX D040-4-16-12 has he possibili y o changing he ee h
(inse s), which a e ixed wi h a sc ew, as shown in Figu e 3. Th ee s a es/classes we e
chosen o he expe imen , namely:
•Class 0—Tool in he aul - ee s a e (Figu e 3-le )
•Class 1
—Tool wi hou inse (ca bide inse ), bu wi h sc ew-simula ion o damage
and b eakage o an inse (Figu e 3-middle)
•Class 2 —Tool wi hou inse and sc ew (Figu e 3- igh )
Machines 2021,9, 222 4 o 19
CMSS 2111 accele ome e
Figu e 2. Placemen o he CMSS 2111 accele ome e o he machine MCV 754.
Expec ed measu able changes a e caused by he unbalance o he ool when his
ib a ion is ansmi ed o he spindle. The ailu e o unbalance is cha ac e ized by an
inc ease in ib a ions in he egion o he i s ha monic equency. The unbalance is
desc ibed in he [19–21] and is di ided in o a s a ic unbalance and a dynamic unbalance.
The i s expe imen e i ied ha he missing inse was e lec ed in spindle ib a ions
a 700, 1050, and 1400 RPM. The esul s a e shown in Figu e 4, which shows he a ea a ound
he i s ha monic equency. The aim o his expe imen was o de e mine a which spindle
speeds he mani es a ions a e isible in he equency spec um and which speeds a e
sui able o da a collec ion in a machine lea ning da ase . F om he esul , i is e iden ha
a he speed 700 RPM he e ec o he unbalances in he equency domain is insigni ican ,
and he e o e unde ec able. Fo his eason, speeds we e selec ed o ob ain a da ase om
1000 o 1500 RPM.
Figu e 3.
The ool H490 F90AX D040-4-16-12 in aul - ee s a e-
Class 0
(
le
), wi hou he inse
Class 1 (middle) and wi hou he inse and wi hou he sc ew Class 2 ( igh ).
2.1. Da ase Ob ain
Fo each s a e/class, a se ies o da a was measu ed o di e en ope a ing speeds ha
a e wi hin he ecommended speed ange o he ool. Speci ically, he speed was om
1000 RPM o 1500 RPM a e he s ep o 50 RPM in wo epe i ions and 20 s is main ained a
each speed le el. The o al ime is he e o e 20
×
11
×
2 = app ox. 440 s o one s a e (class).
The speed se ing was p og ammed and s a ed o each s a e in he same way, Figu e 5
shows he ime eco d o he speed change o e ime. The aim is o ob ain da a a a wide
ange o ope a ing speeds. The da a we e cap u ed in a eco de mode, i.e., one long ime
eco d was ob ained, which was la e p ocessed in o indi idual samples, which o med a
da ase o machine lea ning.
Machines 2021,9, 222 5 o 19
10 15 20
0
2
4
Accele a ion (g)
10-4 C0 700RPM
FFT
1H
max(1H)
10 15 20
0
2
4
Accele a ion (g)
10-4 C1 700RPM
FFT
1H
max(1H)
10 15 20
F equency Hz
0
2
4
Accele a ion (g)
10-4 C2 700RPM
FFT
1H
max(1H)
15 20 25 30
0
2
4
10-4 C0 1050RPM
FFT
1H
max(1H)
15 20 25 30
0
2
4
10-4 C1 1050RPM
FFT
1H
max(1H)
15 20 25 30
F equency Hz
0
2
4
10-4 C2 1050RPM
FFT
1H
max(1H)
20 25 30 35 40
0
2
4
10-4 C0 1400RPM
FFT
1H
max(1H)
20 25 30 35 40
0
2
4
10-4 C1 1400RPM
FFT
1H
max(1H)
20 25 30 35 40
F equency Hz
0
2
4
10-4 C2 1400RPM
FFT
1H
max(1H)
Figu e 4.
The i s es o he e ec o he aul in equency domain (C0
−
C2 a e Class 0
−
Class 2,
1H— i s ha monic equency, max(1H)—maximum o he i s ha monic equency).
0 50 100 150 200 250 300 350 400
Time (s)
900
1000
1100
1200
1300
1400
1500
1600
Re olu ion pe Minu e (RPM)
RPM Measu emen o Da aSe
Figu e 5. The a ia ion o he spindle speed o e ime du ing he da ase ob ain.
2.2. P edic o s
P edic o s a e a bi a y pa ame e s, and hei alues (o combina ions he eo ) de e -
mine he p ope ies o he class being sea ched. I hese pa ame e s did no adequa ely
e lec he p ope ies o he class, he da a classi ica ion would no be success ul. An ex-
ample o he use o a p edic o is he known a ea o image da a p ocessing. The inpu is
in o ma ion abou indi idual pixels and a ull HD esolu ion (1920
×
1080) i is mo e han
2
×
10
6
pixels and each pixel con ains in o ma ion abou h ee colou s (RGB). This amoun
o da a is disp opo iona ely la ge and con ains a lo o useless in o ma ion, so he e is a
need o educe da a such as educing he numbe o colou s, edge de ec ion, and mo e. The
ou pu s o his educ ion a e p edic o s, which a e he inpu o a i icial in elligence, and
based on hei alues (and hei combina ions) i is possible o classi y indi idual classes.
The p ope ies o p edic o s should be:
• Clea ly desc ibe he class p ope ies (s a e)-imp o ed achie emen classi ica ion

Machines 2021,9, 222 6 o 19
• Low compu a ional complexi y-speeds up he p edic o calcula ion
• Low numbe o p edic o s-speeds up he lea ning and e alua ion p ocess
The inpu da a in ib odiagnos ics a e ime domain signals. In his pa icula case, he
sampling equency is 2560 Hz (sampling pe iod is app oxima ely 0.4 ms), which means
2560 alues e e y second o eco ding o one axis. I is, he e o e, necessa y o educe
his da a low and e alua e sui able p edic o s om i , which will be he inpu o a i icial
in elligence. The aim is o selec app op ia e p edic o s and compa e hei impac on he
success o da a classi ica ion.
2.3. Da a P ocessing and Selec ion o P edic o s
In his a icle, a me hod is chosen ha classi ies da a in o indi idual classes based on
p edic o s. The selec ion and calcula ion o p edic o s a e pe o med be o e he classi i-
ca ion o da a and he co ec choice o hese p edic o s has a signi ican impac on he
esul s o he classi ica ion and i is necessa y o know he issue and ha e expe ience wi h
simila expe imen s. The au ho o he a icle has al eady deal wi h his issue in [
7
,
8
] and
e i ied which p edic o s a e applicable o a simila ype o p oblem. This a icle will
compa e he classi ica ion successes o ime and equency domain p edic o s and hei
combina ions. I was also necessa y o choose he leng h o he ime signal and di ide he
esul ing samples. The imes o 0.25 s and 0.5 s we e chosen and again he ad an ages and
disad an ages o hese leng hs we e compa ed. The ollowing p edic o s we e used.
P edic o s om he ime domain:
•Speed-Cu en RPM du ing one sample
•RMS-Roo Mean Squa e o accele a ion ampli udes om one sample
•STD-The s anda d de ia ion o he accele a ion ampli udes om a single sample
•PCA
-P incipal Componen Analysis ealized wi h sciki lea n lib a y R2 (wi h pa am-
e e s n_componen s = 1 and explained_ a iance_ = 0) [22]
The esul is a ec o ha con ains 4 p edic o s o each sample (RPM, RMS, STD and
PCA); he alues in his ec o a e u he labelled as “T p edic o s”.
F equency domain p edic o s a e based on FFT (Fas Fou ie T ans o m) equency
analysis pe o med using he NumPy lib a y “S anda d FFTs” [
23
] and a ange o 4 o
100 Hz is used. The minimum alue o 4 Hz is de e mined by he minimum measu ing
ange o he senso used. The maximum alue o 100 Hz is he maximum alue o he
occu ence o he i s ha monic in all ope a ing speeds o he ool and any oo h equency.
The maximum ope a ing speed is 1432 RPM, he maximum oo h equency is he e o e
(1432 ×4)/60 = 95.47 Hz, he e o e he maximum equency o 100 Hz was chosen.
•Speed-Cu en RPM du ing one sample
•Spec um ene gy (eF)
-calcula ed as
∑A (i)2
o he 4–100 Hz ange, whe e
A (i)
a e ampli udes o spec al lines.
•A (i)
- he sequence o ampli udes o indi idual spec al lines o equencies 4–100 Hz
The esul is a ec o whose size a ies acco ding o he leng h o he signals used,
i.e., di ision in o indi idual samples. Fo example, i he signal is 0.25 s long and has a
sampling equency o 2560 Hz, he si ua ion is as ollows:
N= s· =2560 ·0.25 =640
Bin(∆ ) = s
N=2560
640 =4
Fo ange 4–100 Hz:
NBin = max − min
Bin =100 −4
4=24
Machines 2021,9, 222 7 o 19
Fo a 0.25 s signal ( 1), he ou pu will be a ec o con aining 26 (24 + 1 + 1) p edic o s
o each da a sample. The disad an age o such a sho signal is he equency esolu ion
(
Bin
) o 4 Hz, whe e his alue may be insu icien . Fu he mo e, signals wi h a leng h o
0.5 s will be compa ed. The e is he ollowing si ua ion
N= s· =2560 ·0.5 =1280
Bin(∆ ) = s
N=2560
1280 =2
Fo ange 4–100 Hz:
NBin = max − min
Bin =100 −4
2=48
Fo a 0.5 s signal ( 2), he ou pu will be a ec o con aining 50 (48 + 1 + 1) p edic o s
o each da a sample. Wi h his signal dis ibu ion, we ge a equency esolu ion
∆
(
Bin
)
o 2 Hz, which is mo e sui able han he p e ious case, bu we ge only hal o he samples
o machine lea ning om he limi ed eco ding.
The esul ing ec o o equency domain p edic o s con ains he measu ed RPM
alue, he calcula ed Spec um ene gy alue (labeled as eF) and he sequence o ampli udes
o indi idual spec al lines (A 1 o A 24 o 1 and A 1 o A 48 o 2), calcula ed using he
FFT unc ion, see Figu e 6. The alues in his ec o a e u he labelled as “F p edic o s”.
Bo h a ian s will be compa ed wi h each o he .
The de ailed da a p ocessing p ocedu e is as ollows:
Da a p ocessing (ou side MATLAB)
• Combina ion o ib a ion channel and acho channel da a
• Spli ing he signal acco ding o he selec ed ime ( 1 = 0.25 s o 2 = 0.5 s)
•
Checking whe he he change is no g ea e han 10 RPM du ing he du a ion ( 1 o
2) (elimina ion o ansien s)
• So ing he signal in o indi idual classes
•
P edic o calcula ion, o each sample (T- ime domain, F-F equency domain o FT-all
p edic o s)
•
Sa ing p edic o s o a ile acco ding o indi idual classes (p epa a ion o MATLAB)
P ocessed in MATLAB:
• Random mixing and me ging o da a o indi idual classes in o one da ase
• E alua ing in he en i onmen “Classi ica ion lea ne app”
• Gene a ing and sa ing he mos success ul model
Ve i ica ion o he gene a ed model:
• Randomly selec ed n samples om each class (selec ed n = 100 pe class)
• Accu acy and TPR (T ue posi i e a e) and FNR (False nega i e a e) e alua ed
• Resul s displayed and sa ed as he Con usion ma ix
Figu e 6.
Scheme o p edic o s calcula ion using IPC (“eF”—Spec um ene gy, “A 1” o “A n”— he
sequence o ampli udes o indi idual spec al lines).
Machines 2021,9, 222 8 o 19
3. Classi ica ion Me hods
Classi ica ion Lea ne App (CL) compa ed di e en classi ica ion me hods o de e -
mine which me hods a e app op ia e o he p oblem. This applica ion allows you o
compa e di e en me hods and hen selec and c ea e a model con aining he selec ed
me hod (chosen we e he mos success ul). The indi idual me hods a e desc ibed in mo e
de ail in [
24
]. Da ase s we e es ed on all me hods ha CL allows and hei success is in a
Tables 2–4. The numbe o epe i ions o he lea ning p ocess was 10 o each model, and he
in e al es ima e was calcula ed using “The Con idence in e al” [
25
] wi h
alpha = 0.05
.
Fu he mo e, he hype pa ame ic op imiza ion p o ided by Ma lab was e i ied. Each
winning model was subjec ed o hype pa ame ic op imiza ion wi h he same da ase , and
hese esul s a e shown in Table 5. Due o he ime consuming, only one epe i ion was
pe o med, he a e age imp o emen o he p edic ion accu acy wi h hype pa ame ic
op imiza ion is only 0.55%. Models wi hou hype pa ame ic op imiza ion we e used o
u he alida ion.
B ie ly, hese a e he ollowing classi ica ion me hods:
Table 2.
Resul ing success a e o classi ica ion o indi idual me hods o expe imen s wi h sample ime 1 (0.25 s). The bes
esul s a e ma ked in bold.
1R1T 1R1F 1R2T 1R2F 1R3T 1R3F 1R4T 1R4F
Fine ee 79.9 ± 0.55 69.9 ± 1.66 67.9 ± 1.14 80.1 ± 1.23 63.9 ± 0.95 94.1 ± 0.32 59.4 ± 0.60 73.2 ± 0.37
Medium ee 77.2 ± 0.89 59.4 ± 1.29 62.3 ± 0.89 79.2 ± 1.29 55.6 ± 1.15 94.1 ± 0.32 54.9 ± 0.40 67.1 ± 0.24
Coa se ee 76.8 ± 0.54 47.2 ± 1.08 57.6 ± 0.89 72.4 ± 0.97 51.6 ± 0.98 94.5 ± 0.46 52.9 ± 0.29 58.1 ± 0.42
Linea disc iminan 74.1 ± 0.30 60.1 ± 0.95 56.8 ± 0.30 74.1 ± 0.80 51.8 ± 0.62 95.0 ± 0.30 51.3 ± 0.18 64.3 ± 0.19
Quad a ic disc iminan 74.2 ± 0.52 69.1 ± 1.41 59.9 ± 0.20 81.4 ± 0.86 44.7 ± 0.93 95.6 ± 0.58 52.3 ± 0.07 69.5 ± 0.18
Gaussian Nai e Bayes 69.6 ± 0.68 57.5 ± 1.13 56.7 ± 0.38 73.7 ± 0.61 42.0 ± 0.65 91.1 ± 0.61 48.8 ± 0.12 59.2 ± 0.37
Ke nel Nai e Bayes 68.1 ± 0.51 60.3 ± 0.88 60.8 ± 0.61 77.0 ± 0.82 48.1 ± 0.82 94.0 ± 0.31 53.6 ± 0.16 64.1 ± 0.19
Linea SVM 73.0 ± 0.50 60.3 ± 0.80 57.1 ± 0.56 75.4 ± 0.93 51.9 ± 0.62 94.9 ± 0.51 52.1 ± 0.13 65.1 ± 0.23
Quad a ic SVM 73.5 ± 0.31 73.8 ± 1.06 59.9 ± 0.49 83.5 ± 0.50 48.9 ± 0.69 96.9 ± 0.28 51.2 ± 0.80 74.6 ± 0.26
Cubic SVM 73.0 ± 0.73 78.6 ± 1.11 60.2 ± 1.08 85.2 ± 0.59 34.9 ± 1.15 96.6 ± 0.31 35.5 ± 0.80 83.4 ± 0.35
Fine Gaussian SVM 73.8 ± 0.93 71.0 ± 1.20 65.3 ± 1.13 67.4 ± 1.07 55.9 ± 0.87 70.2 ± 1.80 61.7 ± 0.19 79.0 ± 0.65
Medium Gaussian SVM 71.7 ± 0.45 73.9 ± 0.64 60.5 ± 0.60 83.1 ± 0.71 50.7 ± 0.97 96.7 ± 0.48 57.6 ± 0.24 75.6 ± 0.27
Coa se Gaussian SVM 73.0 ± 0.44 57.2 ± 0.84 57.2 ± 0.54 71.4 ± 0.96 49.8 ± 0.87 93.5 ± 0.23 52.8 ± 0.13 65.4 ± 0.17
Fine KNN 82.2 ± 0.63 75.0 ± 1.24 78.7 ± 1.12 80.2 ± 0.94 74.5 ± 0.66 89.6 ± 0.59 77.5 ± 0.21 81.7 ± 0.29
Medium KNN 72.1 ± 0.72 53.5 ± 0.69 59.7 ± 0.78 64.8 ± 0.79 51.6 ± 0.86 81.4 ± 0.74 60.9 ± 0.32 67.7 ± 0.37
Coa se KNN 68.4 ± 0.30 44.9 ± 1.00 56.2 ± 0.59 65.5 ± 0.92 47.8 ± 0.83 75.2 ± 1.11 59.3 ± 0.18 64.5 ± 0.11
Cosine KNN 68.2 ± 0.98 55.7 ± 0.94 57.4 ± 1.06 63.0 ± 0.61 51.4 ± 1.57 81.2 ± 1.13 59.4 ± 0.30 66.6 ± 0.17
Cubic KNN 72.1 ± 0.73 55.4 ± 1.26 59.2 ± 0.94 64.0 ± 1.07 51.3 ± 1.10 78.1 ± 2.12 60.9 ± 0.23 66.8 ± 0.27
Weigh ed KNN 82.8 ± 0.40 76.1 ± 1.01 80.6 ± 1.24 81.8 ± 0.70 75.3 ± 0.84 89.4 ± 0.77 78.5 ± 0.31 82.6 ± 0.34
Boos ed T ees 79.0 ± 0.95 72.9 ± 1.12 65.2 ± 1.05 84.3 ± 0.90 61.5 ± 1.04 35.4 ± 0.00 57.0 ± 0.39 71.5 ± 0.31
Bagged T ees 84.1 ± 0.58 76.9 ± 1.13 78.8 ± 1.19 77.0 ± 1.00 75.7 ± 0.94 96.1 ± 0.39 78.4 ± 0.27 84.4 ± 0.33
Subspace Disc iminan 73.4 ± 0.42 59.6 ± 0.83 55.6 ± 0.61 73.0 ± 0.64 52.3 ± 0.44 95.3 ± 0.32 51.1 ± 0.11 63.2 ± 0.29
Subspace KNN 82.1 ± 0.67 72.6 ± 1.18 76.3 ± 1.16 74.8 ± 0.71 74.7 ± 0.98 84.3 ± 1.64 75.5 ± 0.25 77.4 ± 0.51
RUSBoos ed T ees 76.9 ± 0.58 64.1 ± 1.34 63.4 ± 0.97 82.4 ± 1.03 61.5 ± 1.57 66.6 ± 9.85 55.8 ± 0.41 68.4 ± 0.28
Machines 2021,9, 222 9 o 19
Table 3.
Resul ing success a e o classi ica ion o indi idual me hods o expe imen s wi h sample ime 2 (0.5 s). The bes
esul s a e ma ked in bold. No e: F-model ailed (one o mo e o he classes ha e singula co a iance ma ices).
2R1T 2R1F 2R2T 2R2F 2R3T 2R3F 2R4T 2R4F
Fine ee 81.8 ± 1.70 72.9 ± 1.79 65.5 ± 1.58 85.1 ± 1.39 63.3 ± 2.23 94.2 ± 0.60 62.6 ± 0.48 82.9 ± 0.81
Medium ee 81.6 ± 1.61 72.8 ± 1.67 62.4 ± 1.86 85.1 ± 1.39 60.3 ± 2.21 94.2 ± 0.60 58.1 ± 0.52 73.9 ± 0.74
Coa se ee 75.7 ± 0.78 55.2 ± 1.02 58.0 ± 1.12 79.4 ± 1.60 59.5 ± 1.69 94.1 ± 0.95 53.9 ± 2.25 60.9 ± 0.39
Linea disc iminan 76.9 ± 0.90 70.6 ± 2.28 55.1 ± 0.83 84.4 ± 1.46 59.0 ± 0.86 97.7 ± 0.31 54.5 ± 0.24 72.0 ± 0.17
Quad a ic disc iminan 72.3 ± 0.86 F 53.3 ± 0.75 F 50.5 ± 1.05 F 54.3 ± 0.31 83.2 ± 0.28
Gaussian Nai e Bayes 68.2 ± 0.67 67.2 ± 1.68 52.6 ± 1.17 74.2 ± 1.60 41.0 ± 0.59 85.4 ± 0.50 51.8 ± 0.31 64.5 ± 0.51
Ke nel Nai e Bayes 69.3 ± 0.99 77.8 ± 1.46 50.7 ± 0.77 84.6 ± 1.92 48.0 ± 1.22 98.4 ± 0.72 55.0 ± 0.27 74.4 ± 0.27
Linea SVM 74.2 ± 0.76 71.7 ± 0.78 55.7 ± 1.30 83.1 ± 1.35 59.9 ± 0.78 95.7 ± 0.43 55.7 ± 0.27 72.7 ± 0.28
Quad a ic SVM 77.4 ± 0.72 84.0 ± 1.87 55.4 ± 1.40 89.5 ± 0.84 61.6 ± 0.99 98.0 ± 0.50 56.6 ± 0.31 87.4 ± 0.33
Cubic SVM 76.8 ± 1.25 84.9 ± 1.76 54.0 ± 1.54 88.2 ± 0.83 54.8 ± 1.85 97.9 ± 0.67 39.3 ± 1.35 89.6 ± 0.31
Fine Gaussian SVM 78.6 ± 1.38 73.9 ± 1.65 64.9 ± 1.81 75.4 ± 2.42 64.0 ± 1.07 72.9 ± 1.47 63.9 ± 0.34 71.7 ± 0.34
Medium Gaussian SVM 76.7 ± 1.85 84.9 ± 1.95 56.2 ± 1.17 87.8 ± 1.30 62.1 ± 1.07 97.9 ± 0.49 60.9 ± 0.30 84.7 ± 0.30
Coa se Gaussian SVM 71.8 ± 1.07 58.1 ± 0.64 54.3 ± 0.91 72.0 ± 1.29 50.8 ± 1.18 81.7 ± 0.59 55.4 ± 0.21 70.0 ± 0.22
Fine KNN 86.2 ± 1.61 82.0 ± 2.13 78.4 ± 1.44 83.2 ± 1.52 74.7 ± 1.77 91.7 ± 1.19 78.3 ± 0.46 85.1 ± 0.40
Medium KNN 69.9 ± 1.28 59.3 ± 1.82 54.5 ± 1.62 70.8 ± 1.39 59.5 ± 2.03 85.1 ± 1.19 64.2 ± 0.21 73.6 ± 0.45
Coa se KNN 49.9 ± 1.05 53.9 ± 1.09 52.0 ± 1.21 54.9 ± 1.37 58.5 ± 0.95 72.0 ± 0.68 61.8 ± 0.24 68.3 ± 0.20
Cosine KNN 64.0 ± 0.91 62.5 ± 1.53 57.9 ± 1.09 67.6 ± 1.26 57.7 ± 1.73 84.2 ± 1.12 61.7 ± 0.33 73.5 ± 0.61
Cubic KNN 71.5 ± 1.23 59.1 ± 1.32 55.7 ± 1.14 69.4 ± 1.36 60.8 ± 1.43 79.9 ± 0.75 64.0 ± 0.39 72.5 ± 0.32
Weigh ed KNN 87.6 ± 1.61 81.7 ± 1.69 78.7 ± 1.41 84.3 ± 0.87 77.7 ± 1.68 91.5 ± 1.46 79.6 ± 0.40 86.2 ± 0.43
Boos ed T ees 87.1 ± 1.19 79.6 ± 1.29 70.6 ± 1.80 37.3 ± 0.00 70.3 ± 2.40 36.7 ± 0.00 60.3 ± 0.37 81.3 ± 0.38
Bagged T ees 88.4 ± 1.18 79.9 ± 1.18 77.2 ± 1.38 87.8 ± 1.22 77.4 ± 1.30 94.3 ± 1.21 79.8 ± 0.39 86.0 ± 0.41
Subspace Disc iminan 75.5 ± 0.86 71.6 ± 1.59 51.7 ± 0.80 84.1 ± 1.34 58.6 ± 1.13 96.9 ± 0.41 53.7 ± 0.20 71.1 ± 0.12
Subspace KNN 85.0 ± 1.59 73.4 ± 1.41 72.5 ± 2.22 78.3 ± 2.00 73.7 ± 1.97 85.5 ± 1.93 76.7 ± 0.36 79.7 ± 0.49
RUSBoos ed T ees 86.2 ± 1.44 77.7 ± 1.53 67.1 ± 1.56 47.9 ± 3.86 62.6 ± 2.08 76.0 ± 9.04 59.4 ± 0.34 77.6 ± 0.46
3.1. Classi ica ion T ees
Bina y decision ees o mul iclass lea ning [
26
]. This me hod is easy o in e p e
and as o da a p edic ion, has low memo y equi emen s, bu may no achie e su icien
p edic ion accu acy. Decision making akes place h ough a ee s uc u e om he begin-
ning ( oo ) o he inal class (lea es). The me hod was p obably i s published by J. Ross
Quinlan in 1975. The es ed a ian s a e:
• Fine ee
• Medium ee
• Coa se ee
3.2. Disc iminan Analysis
Regula ized linea and quad a ic disc iminan analysis [
27
]. This me hod is easy o
in e p e and as o da a p edic ion o la ge da ase s. Using “Quad a ic Disc iminan ”
inc eases memo y equi emen s. I is one o he me hods o N-dimensional s a is ical
analysis (mul i a ia e s a is ical analysis), whe e, based on he decision ule, objec s a e
di ided in o g oups acco ding o p obabili y densi ies. The me hod was p obably i s
published by Ronald Fishe in 1936. The es ed a ian s a e:
• Linea disc iminan
• Quad a ic disc iminan
Machines 2021,9, 222 16 o 19
Time Consump ion o P edic ion
The ime consump ion o he p edic ion is highly dependen on he pe o mance o he
compu ing uni ha will pe o m he p edic ion. In gene al, he ime-consuming p ocess is
he lea ning o he model, bu his ope a ion is only pe o med once when he sys ems a e
deployed o when a new da ase is a ailable o lea ning. Thus, he lea ning p ocess can
be e icien ly scheduled and is no c i ical o he unning o he sys em.
Mo e impo an is he p edic ion ime and he possible eac ion o he sys em o a
possible p oblem. The p edic ion ime consis s o wo s eps, namely da a p ep ocessing,
i.e., ex ac ion o p edic o s, and hen he p edic ion i sel . These imes we e es ed on a
pe sonal compu e wi h In el(R) Co e(TM) i7-2600 CPU @ 3.40 GHz, 16 GB RAM and a
simila con igu a ion is possible o he cu en IPC. Time was measu ed o 100 epe i ions
each ime o elimina e andom a ia ions in pe o mance. Measu ed ime includes only
compu a ion ime wi hou loading o sa ing da a om eco ding media. Winning models
o he mos challenging a ian s con aining all p edic o s ( ime and equency domain)
we e used. Fo expe imen T1R4, he winning model was “Bagged T ees” and he esul s
a e as ollows. The da a p ocessing ime o 100 epe i ions is 1.13 s and he p edic ion ime
o 100 epe i ions is 5.12 s, ha is, he a e age o al ime is (1.13 + 5.12)/100 = 0.0625 s i.e.,
62.5 ms. Fo T2R4 expe imen , he winning model was “Cubic SVM” and he esul s a e
as ollows. The da a p ocessing ime o 100 epe i ions is 2.04 s and he p edic ion ime
o 100 epe i ions is 1.43 s, ha is, he a e age o al ime is (2.04 + 1.43)/100 = 0.0347 s i.e.,
34.7 ms. The measu ed imes a e only app oxima e and depend on many ci cums ances,
also he e is a possibili y o op imizing he classi ie selec ion acco ding o i s p edic ion
ime. Fo ou pu poses, he achie ed imes a e su icien .
6. Implemen a ion o he T ained Model
The p ocedu e o implemen ing a ained model is as ollows. The model can be
gene a ed as a unc ion o MATLAB, o as sou ce code in C language, hen i is easy o
compile i o any pla o m. I s unc ion (abili y o classi y) does no change o e ime
because he e is no lea ning p ocess. Howe e , p o ided he condi ions ha e changed o
a new da ase is a ailable, i is possible o s a he lea ning p ocess again and ain he
model o he new da a.
Figu e 12 schema ically shows he possible connec ion o he se e wi h indi idual
clien s. Each IPC pe o ms da a collec ion and especially imely e alua ion based on a
ained model ha was lea ned in he MATLAB en i onmen on he se e and hen
expo ed. The p ocess is as ollows:
(a) Da a acquisi ion and lea ning p ocess
•
The se e eques s da a om indi idual IPCs and c ea es a da ase o c ea ing a clas-
si ica ion model (Da a is p edic o s-i e alua es IPCs, only p edic o s a e ansmi ed).
•
I he e is a su icien amoun o da a (o condi ions ha e changed, e c.), hen MATLAB
pe o ms lea ning and c ea es a ained classi ica ion model o a speci ic IPC and
expo s i o he C language ( his MATLAB allows).
• The ained model is sen o a speci ic IPC.
Indi idual machines and hei IPCs can be dis ibu ed anywhe e in di e en places
and he e will be only one se e wi h MATLAB, which will gene a e a model o a speci ic
machine and send i o a speci ic IPC. I necessa y, he MATLAB SW can be eplaced by
ano he sys em, howe e , he unc ionali y will be main ained and he change will be made
on only one se e .
(b) E alua ion p ocess
•
IPC pe o ms da a collec ion and p edic o calcula ion- his is a simple ope a ion
and can be pe o med in any p og amming language, o simplici y and a ailabili y
Py hon was chosen, which pe o ms s a is ical ope a ions and equency analysis.
•
Pe o ms classi ica ion using MATLAB c ea ed and ained model, which was ex-
po ed o C language (Py hon allows o un code in C language).

Machines 2021,9, 222 17 o 19
Such a opology and pa i ioning allows o easy changes on bo h he IPC and se e -
side, including changing he p og amming en i onmen .
As o he speci ic deploymen o moni o ing he machine, i is impo an o no e
ha nowadays i is no easy o implemen elemen s o a i icial in elligence in he sa e y
segmen , whe e i is necessa y o ce i y he so wa e and e i y i s unc ions. Howe e ,
i is possible o deploy a simila sys em only as an in o ma i e elemen ha would ale
he ope a o , bu no in e e e wi h he ope a ion o he machine. The use o a i icial
in elligence me hods is pa icula ly ad an ageous in he ield o echnical diagnos ics o
he e alua ion o mul iple c i e ia and ope a o ale s.
Figu e 12. IPC and se e loca ion opology.
7. Resul s and Discussions
Figu e 9summa izes he esul s in g aphical o m and exp esses he dependence o
he p edic o s on he spindle speed. Fo p edic o s om he equency domain, an inc ease
in success wi h inc easing speed is e iden due o a mo e p onounced mani es a ion o an
unbalance aul in he equency spec um (inc easing he i s ha monic). In con as , ime
domain p edic o s achie e a highe success a e a lowe speeds han equency domain
p edic o s. Thus, using all p edic o s ( ime and equency) inc eases he success a e a
lowe speeds and does no dec ease a highe speeds. The igu e also ocuses on he
de ec ion o a aul - ee s a e, i.e., assuming ha we modi y he classes only o he aul - ee
s a e (class0) and any aul s a e (class 1 o 2), hen i is ob ious ha he success o aul - ee
de ec ion will inc ease because we do no include misclassi ica ion be ween class 1 and
class 2, which a e simila . This is impo an i we only wan o de ec a aul - ee condi ion
and in any o he case, an ope a o wa ning is issued.
Impo an esul s a e shown in he Tables 2–4, which compa e he successes o indi-
idual classi ica ion me hods. Fu he mo e, Figu es 10 and 11 compa e he successes o he
classi ica ion o indi idual classes and he mos impo an is he compa ison in Figu e 9,
which shows he success o he classi ica ion and he success o aul - ee s a e de ec ion,
whe ewi h a ian R4 (TF mix- he combina ion o all speeds), 97% o 1 and 98% o 2
success a e is achie ed.
Machines 2021,9, 222 18 o 19
8. Conclusions
The a icle aimed o e i y he possibili ies o a i icial in elligence o he classi ica ion
o machine ool ailu e based on an expe imen om a eal machine. Ea ly de ec ion o
he diso de is an impo an ac o in p o ec ing he heal h and elimina ing damage. The
use o a i icial in elligence me hods b ings he possibili y o c ea ing uni e sal algo i hms,
which, hanks o he abili y o lea n, adap o a speci ic machine, and a speci ic phase
o machining.
The desc ibed me hod app oaches he possibili y o using a i icial in elligence o
da a classi ica ion, in his case o he classi ica ion o a ious machine s a es. A simila
me hod can be used o classi y any classes, whe e only a change o p edic o s ha desc ibe
he p oblem sough is needed.
The choice o p edic o s used is an impo an ac o which, oge he wi h he ope a ing
condi ions, in luences he success o he classi ica ion. Fu u e expe imen s will ocus on
he possibili y o de ec ing a aul condi ion o a ool du ing machining and will ocus on
ob aining a la ge da ase wi h di e en machining condi ions.
Au ho Con ibu ions:
Resou ces, So wa e, W i ing—o iginal d a , D.Z.; W i ing—o iginal d a ,
P.B.; Valida ion, Visualiza ion, T.M.; Resou ces, J.T.; W i ing— e iew and edi ing, R.H.; Valida ion,
K.M.; Resou ces, V.F. All au ho s ha e ead and ag eed o he published e sion o he manusc ip .
Funding:
This esea ch was suppo ed by he Minis y o Educa ion, You h and Spo s o he Czech
Republic and The Eu opean Union-Eu opean S uc u al and In es men s Funds in he ame o
Ope a ional P og amme Resea ch De elopmen and Educa ion-P ojec : Machine Tools and P ecision
Enginee ing (P ojec No. CZ.02.1.01/0.0/0.0/16_026/0008404).
Con lic s o In e es : The au ho s decla e no con lic o in e es .
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