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Testing Rogowski Coils with Merging Units for Smart Grids

Abstract

As smart grids incorporate renewable energy sources and advanced power electronics, ensuring accurate measurement systems becomes paramount due to the increased complexity and potential sources of disturbances. This article focuses on the laboratory calibration of Rogowski coils (RCs) and merging units (MUs), which are fundamental for measuring, controlling, and monitoring digital power systems. A comprehensive digital calibration system is introduced, utilizing precise, commercially available components such as a fluxgate current transducer and a National Instrument. The system assesses magnitude and phase displacement errors under various operating conditions, including abnormal scenarios. Additionally, the impact of uncertainty sources on the measurement chain analysis is discussed, with test results conforming to established standards. This research contributes to enhancing the accuracy and reliability of measurement systems in the context of evolving smart grids.

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Testing Rogowski Coils with Merging Units for Smart Grids

Author: Daboul, Mayada; Orságová, Jaroslava; Jurák, Viktor; Vrtal, Matěj
Publisher: MDPI
Year: 2023
DOI: 10.3390/en16217323
Source: https://dspace.vut.cz/bitstreams/e35e6eee-28b8-4141-83de-5badc132a045/download
Ci a ion: Daboul, M.; O ságo á, J.;
Ju ák, V.; V al, M. Tes ing Rogowski
Coils wi h Me ging Uni s o Sma
G ids. Ene gies 2023,16, 7323.
h ps://doi.o g/10.3390/en16217323
Academic Edi o : Vaidyana han
K ishnamu hy
Recei ed: 2 Oc obe 2023
Re ised: 23 Oc obe 2023
Accep ed: 26 Oc obe 2023
Published: 28 Oc obe 2023
Copy igh : © 2023 by he au ho s.
Licensee MDPI, Basel, Swi ze land.
This a icle is an open access a icle
dis ibu ed unde he e ms and
condi ions o he C ea i e Commons
A ibu ion (CC BY) license (h ps://
c ea i ecommons.o g/licenses/by/
4.0/).
ene gies
A icle
Tes ing Rogowski Coils wi h Me ging Uni s o Sma G ids
Mayada Daboul *, Ja osla a O ságo á, Vik o Ju ák and Ma ˇej V al
Depa men o Elec ical Powe Enginee ing, Facul y o Elec ical Enginee ing and Communica ion, B no
Uni e si y o Technology, CZ-61600 B no, Czech Republic; o sago a@ u b .cz (J.O.); [email p o ec ed] (M.V.)
*Co espondence: [email p o ec ed]
Abs ac :
As sma g ids inco po a e enewable ene gy sou ces and ad anced powe elec onics,
ensu ing accu a e measu emen sys ems becomes pa amoun due o he inc eased complexi y and
po en ial sou ces o dis u bances. This a icle ocuses on he labo a o y calib a ion o Rogowski coils
(RCs) and me ging uni s (MUs), which a e undamen al o measu ing, con olling, and moni o ing
digi al powe sys ems. A comp ehensi e digi al calib a ion sys em is in oduced, u ilizing p ecise,
comme cially a ailable componen s such as a luxga e cu en ansduce and a Na ional Ins umen .
The sys em assesses magni ude and phase displacemen e o s unde a ious ope a ing condi ions,
including abno mal scena ios. Addi ionally, he impac o unce ain y sou ces on he measu emen
chain analysis is discussed, wi h es esul s con o ming o es ablished s anda ds. This esea ch
con ibu es o enhancing he accu acy and eliabili y o measu emen sys ems in he con ex o
e ol ing sma g ids.
Keywo ds:
low-powe cu en ans o me ; Rogowski coil; me ging uni ; IEC 61850-9-2; p ecision
ime p o ocol; calib a ion p ocedu e
1. In oduc ion
Ad anced echnologies, including digi al sys ems and communica ion s anda ds, ha e
pa ed he way o he e olu ion o powe sys ems in o sma g ids. These sma g ids
play a c ucial ole in mode n aul de ec ion, measu emen , and con ol applica ions [
1
].
Ensu ing he eliabili y and sa e y o hese sys ems is now hea ily elian on he accu a e
and apid measu emen o elec ical pa ame e s such as cu en , ol age, and equency.
Sma g ids a e ans o ming he managemen and con ol o powe sys ems by imple-
men ing in eg a ed dis ibu ion con ol sys ems ha ely on sma senso s and elec onic
de ices. This ma ks a depa u e om adi ional app oaches, o e ing mo e e icien and
ad anced ways o moni o and egula e elec ical dis ibu ion [2].
Sma g id senso s p o ide eal- ime, accu a e, and eliable da a o measu ing, moni-
o ing, and sa egua ding he ne wo k. In Medium-Vol age (MV) sma subs a ions, hese
senso s con e high ol age and cu en in o a mo e manageable ange, emo ing he
necessi y o ol age di ide s o cu en shun s. This simpli ies measu emen sys ems and
enhances accu acy. Moni o ing ol age and cu en om hese senso s is undamen al o
assessing powe quali y [3].
Low-powe cu en ans o me s (LPCTs) a e being widely implemen ed in he MV
sma g id o ansmi digi al cu en da a di ec ly om cables o moni o ing, p o ec ion,
and managemen sys ems.
LPCTs a y acco ding o hei wo king p inciple, which includes bu is no limi ed o
RCs, luxga es, and shun esis o s.
This wo k places pa icula emphasis on RC cu en senso s, one o he mos p omi-
nen ypes o LPCTs. RCs ha e inc easingly supplan ed adi ional cu en ans o me s in
a ious applica ions, including powe sys em cu en measu emen o p o ec i e elay-
ing [4,5], aul loca ion de ec ion [6,7], and cap u ing as ansien s [8].
Ene gies 2023,16, 7323. h ps://doi.o g/10.3390/en16217323 h ps://www.mdpi.com/jou nal/ene gies
Ene gies 2023,16, 7323 2 o 13
The digi al subs a ion cu en ly uses an LPCT wi h a digi al ou pu ha has a commu-
nica ion in e ace o is inco po a ed wi h he MU. Low-Powe Ins umen T ans o me s
(LPITs) a e used in conjunc ion wi h MUs as a measu ing ool in upg aded MV ne wo k
moni o ing sys ems because o hei high lexibili y and low cos .
The MU implemen s IEC 61850 s anda ds a he p ocess le el. I digi alizes ol age and
cu en da a om ans o me s (LPVTs o LPCTs) in o sampled alues (SV), imes amps
hem, and sends hem o e an E he ne p ocess bus [9].
Despi e hei ad an ages, RC measu emen accu acy can be a ec ed by ac o s like
empe a u e, conduc o posi ion, and ex e nal dis u bances. Consequen ly, i is essen ial
o calib a e he RC o ma ch eal-wo ld measu emen condi ions. Calib a ion iden i ies
e o s like a ios and phase e o s, imp o ing senso pe o mance in measu emen s and
p o ec ion, educing isks, and a oiding ope a ional delays and imp ope ac ions. Mo e-
o e , calib a ing RCs wi h digi al ou pu in ol es assessing MU pe o mance speci ica ions,
as he accu acy o elec ical pa ame e measu emen s is closely ied o he iming p ecision
o SV measu emen s [9].
Fi s ly, he calib a ion o RCs is ypically able o de e mine he a io e o and phase
e o o he LPCT du ing he adi ional calib a ion p ocedu e by compa ing he ou pu o
he ans o me unde es wi h ha o he e e ence ans o me a e applica ion o he
same exci a ion cu en o he p ima ies o he wo ans o me s.
Simila ly, RCs wi h digi al ou pu s can be calib a ed wi h some necessa y modi ica-
ions. The digi al ou pu o he RC is ma hema ically compa ed wi h he ou pu o he
e e ence ans o me , which mus be digi ized. The ma hema ical compa ison is based
on he con e sion o he compa ed signals in o he equency domain by Fas Fou ie
T ans o m (FFT). The a io and displacemen e o s o he senso unde calib a ion a e
e alua ed o he undamen al equency o o he equencies.
Va ious calib a ion me hods o RCs a e a ailable and can be ound in he lis ed
e e ences. Fo ins ance, in e e ence [
10
], calib a ion o RCs is ca ied ou o assess he
in luence o empe a u e, humidi y, and posi ioning on powe quali y accu acy, bu hese
calib a ion me hods a e p ima ily designed o RCs wi h analogue ou pu .
Calib a ing RCs wi h digi al ou pu was in oduced in [
11
,
12
] using 16-bi digi al
ol me e s ins ead o highe esolu ion equipmen . This calib a ion p ocess is ela i ely
s aigh o wa d bu may no o e su icien accu acy and can be cos ly due o he equi e-
men o wo sampling ol me e s o digi izing compa a i e signals.
The widesp ead use o RCs alongside MUs in subs a ions o c ea e digi al in e aces
has made i c ucial o e alua e he pe o mance o his combina ion o compa ibili y
and unc ionali y. Su p isingly, he calib a ion o RCs wi h digi al ou pu using MUs has
ecei ed limi ed esea ch a en ion, e en hough many s udies ha e ocused on calib a ing
MUs independen ly.
Fo example, e e ences [
9
,
13
,
14
] p o ided a calib a ion me hod o MUs by compa -
ing each measu emen sample om he MU wi h hose om a e e ence digi ize . This
calib a ion p ocess necessi a es p ecise de ice synch oniza ion. Synch oniza ion is accom-
plished h ough he use o he Ne wo k Time P o ocol (NTP) and Pulses Pe Second (PPS)
p o ocols, which can p o ide accu acy in he o de o mic oseconds. Fu he imp o emen s
in iming accu acy can be achie ed by using o he p o ocols like he P ecision Time P o ocol
(PTP) [15], also known as IEEE 1588 [16].
In ligh o he p eceding in o ma ion, his pape in oduces a calib a ion app oach o
measu ing he RC + MU. This app oach is inspi ed by he li e a u e ha explo es calib a ing
he LPCT + MU [17–19].
The calib a ion p esen ed in [
17
] was achie ed using a b oad dynamic ange Da a
Acquisi ion (DAQ) sys em wi h a 24-bi analogue- o-digi al (A/D) con e e . Howe e , i
equi ed he addi ion o a signal con e e o adap he Re e ence T ans o me (RT) signal
o he DAQ ca d inpu ange, which may sligh ly educe he calib a ion sys em’s accu acy
due o he in oduc ion o addi ional de ices.
Ene gies 2023,16, 7323 3 o 13
Re e ence [
19
] imp o ed he compa a o me hod by eplacing a con en ional ans-
o me wi h a s anda d cu en senso in he e e ence channel. Ye , o coun e accu acy
issues ela ed o magne ic sa u a ion, hey added an addi ional clamp-shaped senso
wi hou a magne ic co e, inc easing design complexi y.
The key con ibu ion o his s udy lies in he assessmen o accu acy achie ed by
u ilizing a high-sensi i i y and high-p ecision e e ence senso , e en a high measu ed
cu en le els, as opposed o adi ional cu en ans o me s. Addi ionally, we del e
in o he necessa y implemen a ion p e equisi es, including compliance wi h he IEEE
1588 p o ocol o p ecise ime synch oniza ion. The calib a ion p ocess encompasses
bo h s eady-s a e and abno mal condi ions, ensu ing a comp ehensi e assessmen o he
sys em pe o mance.
Finally, i should be men ioned ha he accu acy o he calib a ion can be a ec ed by
sou ces o unce ain y ela ed o he equipmen used, i.e., he highe he accu acy o he
de ices included in he calib a ion sys em, he be e he accu acy class in he calib a ion
sys em. The unce ain y calcula ion can be pe o med using Mon e Ca lo simula ion [
20
]
o acco ding o he ISO guide e e ed o as GUM [
21
]. The Mon e Ca lo me hod is a
p obabilis ic modelling and simula ion echnique ha employs p obabili y dis ibu ions o
inpu a iables o es ima e unce ain y. I excels in handling complex and unce ain sys ems
by di ec ly simula ing he measu emen p ocess. In con as , GUM o e s a sys ema ic
app oach o es ima e and exp ess unce ain y in measu emen s, employing a combina ion
o analy ical and s a is ical me hods. I en ails iden i ying sou ces o unce ain y, assessing
hei impac s, and p opaga ing hese unce ain ies h ough ma hema ical models.
In his pape , we diligen ly assessed he po en ial con ibu ions o unce ain y and
hei implica ions on he calib a ion esul s, adhe ing o he GUM guidelines ins ead o
eso ing o he Mon e Ca lo simula ion [20].
2. Digi al LPCT in he MV Subs a ion
Subs a ion au oma ion sys ems ha e signi ican ly ad anced in ecen yea s due o
he o al digi aliza ion o all in o ma ion collec ed, communica ed, and p ocessed a
he subs a ion.
The digi al elec ical signal acquisi ion echnology based on an elec onic ans o me
is no longe eliable o su icien o sa is y he ansi ion needs o sma subs a ions o a
widesp ead powe sys em. Combining ans o me s and MUs is a p ac ical al e na i e o
sampling cu en s/ ol ages and sha ing hem wi hin he sma subs a ion.
The h ee-phase cu en o he dis ibu ion line in he MV subs a ion is now being
measu ed using LPCTs. The co e componen s o he digi al LPCT include an analogue
senso and a signal MU.
The choice o LPCT senso o MV cu en measu emen s is in luenced by wo key
ac o s: he accu acy class and he p ice. MV senso s ypically ha e an accu acy class limi o
1%, al hough he e a e ins ances whe e 0.5% o e en 0.2% accu acy is necessa y, especially
o a i me e ing applica ions. Among he a ailable op ions, Ins umen T ans o me s
(ITs), RCs, and shun esis o s eme ge as op choices o use in MV ne wo ks due o hei
balanced pe o mance in e ms o accu acy and cos conside a ions.
The non-linea i y o cu en ans o me s (CTs) and he cons ained ope a ing ange
imposed by he magne ic sa u a ion pose signi ican challenges when used in MV applica-
ions. Shun esis o s also ha e he d awback o no o e ing su icien and eliable gal anic
isola ion. RCs a e he p e e ed ype o LPCTs due o hei bene icial cha ac e is ics, includ-
ing simplici y o measu emen and he absence o he necessi y o open he MV connec ion
while adding o emo ing he senso . RCs a e an AC measu ing ansduce made up o
uni o mly wounded coils ha ing a nonmagne ic co e. The coil is used o measu e cu en
by w apping i a ound he conduc o ha holds he cu en .
The absence o an i on co e in he RC elimina es he sa u a ion e ec , esul ing in a
linea ela ionship be ween he measu ed p ima y cu en and he seconda y ol age. The
ou pu ol age is di ec ly p opo ional o he de i a i e o he p ima y cu en .
Ene gies 2023,16, 7323 4 o 13
Because he RC ou pu ol age is p opo ional o he u ns’ a ea, RC inaccu acy may
a ise o se e al easons, including:
•
Non-Uni o m Tu n Densi y: The wi e used o c ea e he coil is ex emely hin, leading
o a ia ions in he densi y o u ns.
•
Incomple e Closu e: The coil may no be en i ely closed, impac ing he de ec ion o
he ou pu ol age Us.
•
Tu n I egula i y: I egula i ies in he a angemen o u ns a e especially p onounced
nea he coil end and a e o en he p ima y sou ce o inaccu acy.
Due o all hese es ic ions, he RC sensi i i y is no independen o i s ela i e posi ion
and inclina ion. Mo eo e , pa asi ic capaci ances, including conduc o - o-coil, u n- o- u n,
and ou pu cable- o-g ound capaci ance, all ha e an impac on he equency esponse o
he RC. This in luence can limi he bandwid h o he RC senso . Hence, manu ac u e s
should calib a e hese senso s be o e eleasing hem o he ma ke o educe he possibili y
o inaccu acies.
In digi al subs a ions, he RC senso connec ed o he MV connec o measu es cu -
en s. These analogue cu en measu emen s a e subsequen ly ga he ed, digi ized, and
ansmi ed o me e ing o p o ec ion sys ems h ough an MU. The MU se es as a physical
in e ace ha links p ocess equipmen (e.g., ans o me s and senso s) o bay-le el de ices
(including moni o ing and p o ec ion sys ems). Acco ding o IEC 61850-2 [
22
], MU is mean
o cap u e cu en and ol age signals om ans o me s/senso s and con e hem in o
he s anda d digi al ou pu o ma . The me ging uni s can be equipped wi h analogue
inpu s o connec ion o con en ional CT/VT o wi h analogue inpu s plus bina y I/O o
connec ion o senso s.
IEC 61869-13 [
23
] de ines he a ed analogue inpu s as 1/5 A and 100–200 V o CTs
and VTs, espec i ely. Addi ionally, he s anda d de ines he a ed bina y inpu s as
22.5 mV,
150 mV, and 225 mV o LPCTs and 3.25 V o LPVTs.
IEC 61869-9 de ines sample a es as 4.8 kHz o measu ing and p o ec i e applica ions
and 14.4 kHz o quali y measu emen applica ions.
The MU suppo s he p ocess bus (IEC 61850-9-2 LE [
24
]) by ans e ing sampled
alues o measu ed cu en s/ ol ages in he o m o da a packe s o e he Local A ea
Ne wo k (LAN). This allows o he ins alla ion o me e ing sys ems in he con ol oom
and he use o he E he ne ne wo k o ad anced subs a ion da a ansmission.
MU con ains an inbuil eal- ime clock ha is used o imes amp he measu ed da a.
The eal- ime clock may be ee- unning o synced om an ex e nal signal such as PPS,
bu he bes is he PTP. Due o he imes amps embedded in each SV, he IED ecei e can
dis inguish and a ange all SV packe s a i ing om a single MU o e en mul iple MUs in
ch onological o de be o e p ocessing hem.
I should be no ed ha he digi al ou pu o en lags he inpu signal due o imes amp
delay. Addi ionally, encapsula ing he sampled alue in o E he ne da a may esul in a
delay known as MU p ocess delay ime. Thus, inco ec MU da a esul in inaccu a e sha ed
in o ma ion wi h simul aneous IEDs leading o inaccu a e elec ical powe measu emen
and he c i ical unc ion ailu e o he p o ec ion sys em.
The IEC 61850-5 [
25
] s anda d o sma g ids ou lined he ime p ecision c i e ia o
he ime ag o e en s and ime-synch onized measu emen s in i e ime pe o mance
classes, T1 o T5, anging om 1 ms o 1 µs as shown in Table 1.
Table 1. Time synch oniza ion classes.
Time Class Synch oniza ion Accu acy
T1 1 ms
T2 0.1 ms
T3 ±25 µs
T4 ±4µs
T5 ±1µs
Ene gies 2023,16, 7323 5 o 13
The a ia ions among IEDs s em om he synch oniza ion p o ocols used. These
p o ocols synch onize he IED clock wi h he ne wo k and main ain i s accu acy o a
speci ic p ecision.
Ne wo k-based synch oniza ion p o ocols, such as he Ne wo k Time P o ocol (NTP)
and he Simple Ne wo k Time P o ocol (SNTP), o e insu icien synch oniza ion accu acies
o 10−1ms, making hem unsui able o synch onizing all IED subs a ions.
The mos demanding subs a ion applica ions, such as he IEC 61850-9-2 p ocess bus,
can be me by he IEEE 1588 ne wo k-based ime synch oniza ion p o ocol ha has sub-
mic osecond accu acy.
The bene i o PTP synch oniza ion is ha i elimina es he equi emen o addi ional
wi es ha a e ypically equi ed wi h he IRIG-B o PPS and ins ead uses he E he ne
ne wo k o communica e wi h he synch oniza ion signal [
16
]. PTP is able o au oma ically
iden i y and co ec he dynamic ne wo k ime delays o each da a packe ha may ha e
ex a delay om ne wo k componen s such as swi ches. Due o he anspa en clock
in oduced by IEEE 1588, he ime equi ed o pass h ough he swi ch is measu ed, and
he clock ecei ing he PTP message is in o med o his ime.
Howe e , synch oniza ion inaccu acy can occu o a ew easons, such as he synch o-
niza ion signal being co up ed wi hin he MU o no being able o each he sou ce ( he
GPS ecei e ). Thus, he MU digi al ou pu may lag he inpu signal due o a imes amping
delay. Addi ionally, encapsula ing he sampled alue in o E he ne da a may esul in a
delay known as MU p ocess delay ime. When he ime o he MU da a is inco ec , i can
lead o inaccu a e sha ed in o ma ion wi h simul aneous IEDs and cause inco ec elec ical
powe measu emen . This, in u n, can lead o he c i ical unc ion ailu e o he p o ec ion
sys em. Hence, i is c ucial o pe o m MU calib a ion egula ly. This calib a ion helps
es ima e synch oniza ion pa ame e s and compensa es o any possible e o s, ensu ing
accu a e esul s.
3. Digi al LPCT Calib a ion
I is impo an o unde s and ha he eadings o a de ice o a ce ain quan i y can
a y o e ime due o se e al ac o s such as empe a u e, humidi y, powe supply ol age,
and elec omagne ic in e e ence. Also, sudden changes in he inpu quan i y can a ec he
ins umen pe o mance du ing and a e hose changes. The e o e, he measu ed cu en
may no be a pe ec sine wa e. Thus, i is c ucial o ha e a acking p ocess o he cu en
measu ing chain.
T aceabili y is de ined as a con inuous chain o pe missible compa isons ha bind he
measu ing de ice o na ional o in e na ional ins umen s anda ds.
In gene al, compa ing he LPCT wi h a s anda d cu en measu ing ins umen in
a labo a o y se ing is c i ical o ensu e he accu acy o he cu en measu emen . The
objec i e o ou ine LPCT accu acy calib a ion is o alida e he eliabili y o i s pe o mance
in e ms o accu acy and bandwid h a e a pe iod o ope a ion. The calcula ion o he a io
di e ence and phase di e ence is used o assess accu acy calib a ion.
The LPCT pe o mance can a y unde he in luence o di e en ypical ac o s. Cali-
b a ion becomes mo e challenging when he LPCT is subjec o he simul aneous in luence
o mul iple ac o s [10].
3.1. Calib a ion Me hod
The aim o his s udy is o enhance ou unde s anding o he accu acy and pe o mance
o RC when used in conjunc ion wi h an MU. To achie e his, he wo k p oposes a simple
calib a ion me hod o RCs wi h a digi al ou pu ha can be used in an academic o
indus ial en i onmen . An app op ia e calib a ion in as uc u e has been es ablished o
assess he accu acy o he digi al cu en a he nominal cu en as well as a alues abo e
and below he nominal cu en . I is no ewo hy ha , in he pu sui o p ecise ope a ing
condi ions, we made e o s o main ain consis en ambien empe a u e and humidi y
le els. Fu he mo e, o minimize he po en ial impac o elec omagne ic in e e ence on

Ene gies 2023,16, 7323 6 o 13
he RC pe o mance, we inc eased he dis ance be ween he RC and he e e ence senso
and implemen ed shielding measu es a ound nea by ex e nal conduc o s.
The calib a ion s uc u e diag am is shown in Figu e 1, and i comp ises he ollowing:
•
Cu en gene a o (Omic on CMC 356): I p o ides a sinusoidal analogue cu en
signal, which ep esen s he high cu en o be measu ed.
•
Calib a ion channel: I consis s o an RC and an MU. The comme cial RC is an
80/150 mV
(a 50 Hz) ansduce , used o MV measu emen pu poses wi h accu acy
class 0.5. The MU gene a es SVs a e ecei ing he analogue cu en measu ed by he
RC senso .
•
S anda d channel: I consis s o a Re e ence Cu en T ansduce (RCT) and a highly
accu a e e e ence digi ize 24-bi esolu ion ADC. The e e ence senso is a comme cial
luxga e ansduce ha has he ollowing ea u es: Nominal inpu cu en 600 A,
ans o ma ion a io 1500:1. The digi ize consis s o an NI PXI-4472 digi izing module
and an NI PXI-6682 iming boa d. The NI PXI-4472 ea u es a 24-bi a chi ec u e,
±10 V inpu , and a sampling a e o 102.4 kS/s.
•
The calib a ion pla o m: This is a se o compu e p og ams ha cap u e and analyze
digi al ou pu om channels, as well as an e o calcula ion algo i hm based on he
di e en ial me hod.
•
GPS synch oniza ion ecei e : I gene a es he ime synch oniza ion signal o accu a e
synch oniza ion be ween sampling equipmen by uning i s clock oscilla o ia PPS o
PTP p o ocols.
•
PTP ne wo k: This is a LAN con igu ed wi h PTP and is used as a synch oniza ion
sou ce as well as a sha ing ne wo k o ansmi he da a o he MU and PXI o he
calib a ion pla o m o e o calcula ion.
Ene gies 2023, 16, 7323 6 o 13
3.1. Calib a ion Me hod
The aim o his s udy is o enhance ou unde s anding o he accu acy and pe o -
mance o RC when used in conjunc ion wi h an MU. To achie e his, he wo k p oposes a
simple calib a ion me hod o RCs wi h a digi al ou pu ha can be used in an academic
o indus ial en i onmen . An app op ia e calib a ion in as uc u e has been es ablished
o assess he accu acy o he digi al cu en a he nominal cu en as well as a alues
abo e and below he nominal cu en . I is no ewo hy ha , in he pu sui o p ecise op-
e a ing condi ions, we made effo s o main ain consis en ambien empe a u e and hu-
midi y le els. Fu he mo e, o minimize he po en ial impac o elec omagne ic in e e -
ence on he RC pe o mance, we inc eased he dis ance be ween he RC and he e e ence
senso and implemen ed shielding measu es a ound nea by ex e nal conduc o s.
The calib a ion s uc u e diag am is shown in Figu e 1, and i comp ises he ollow-
ing:
• Cu en gene a o (Omic on CMC 356): I p o ides a sinusoidal analogue cu en
signal, which ep esen s he high cu en o be measu ed.
• Calib a ion channel: I consis s o an RC and an MU. The comme cial RC is an 80/150
mV (a 50 Hz) ansduce , used o MV measu emen pu poses wi h accu acy class
0.5. The MU gene a es SVs a e ecei ing he analogue cu en measu ed by he RC
senso .
• S anda d channel: I consis s o a Re e ence Cu en T ansduce (RCT) and a highly
accu a e e e ence digi ize 24-bi esolu ion ADC. The e e ence senso is a comme -
cial luxga e ansduce ha has he ollowing ea u es: Nominal inpu cu en 600
A, ans o ma ion a io 1500:1. The digi ize consis s o an NI PXI-4472 digi izing
module and an NI PXI-6682 iming boa d. The NI PXI-4472 ea u es a 24-bi a chi ec-
u e, ±10 V inpu , and a sampling a e o 102.4 kS/s.
• The calib a ion pla o m: This is a se o compu e p og ams ha cap u e and analyze
digi al ou pu om channels, as well as an e o calcula ion algo i hm based on he
diffe en ial me hod.
• GPS synch oniza ion ecei e : I gene a es he ime synch oniza ion signal o accu-
a e synch oniza ion be ween sampling equipmen by uning i s clock oscilla o ia
PPS o PTP p o ocols.
• PTP ne wo k: This is a LAN con igu ed wi h PTP and is used as a synch oniza ion
sou ce as well as a sha ing ne wo k o ansmi he da a o he MU and PXI o he
calib a ion pla o m o e o calcula ion.
Figu e 1. S uc u e o he measu emen bench o he calib a ion o he es se .
RC calib a ion is based on high cu en loop gene a ion employing a coaxial bus ba
wi h bo h an RC and RCT o educe unce ain ies caused by conduc o posi ion. The RC
Figu e 1. S uc u e o he measu emen bench o he calib a ion o he es se .
RC calib a ion is based on high cu en loop gene a ion employing a coaxial bus ba
wi h bo h an RC and RCT o educe unce ain ies caused by conduc o posi ion. The RC
ou pu is connec ed o an MU ha c ea es cu en SVs based on he IEC 61850-9-2 LE
s anda d a a a e o 80 samples/second. The MU sends cu en SVs o he PTP-LAN
ne wo k wi h imes amps a he ele an sampling ime. Simila ly, he RCT ou pu is
digi ized and acqui ed h ough he NI PXI-4472 Da a Acquisi ion Boa d (DAB). The NI PXI-
4472 ADC clock oscilla o is also d i en by PTP, allowing o imp o ed signal digi iza ion
and enhancing compa ison alidi y.
On he calib a ion pla o m, he e is a se o compu e so wa e ha cap u es cu en
samples o MU and DAB samples.
•
The Sampled Value Analyze (SVA 0.93) so wa e was c ea ed and de eloped a he
B no Uni e si y o Technology o he high-accu acy cap u e o SV packe s, decoding
and eco ding hem o a ile, and p o iding eal- ime wa e o ms o measu ed cu en .
Ene gies 2023,16, 7323 7 o 13
The eco ding ile con ains he SV ID, MAC des ina ion, MAC sou ce, and sample
imes amps. SVA can also show he s a us o da a loss.
•
The Lab View g aphical p og am can acqui e da a, eco d da a, and display he
wa e o m o he RCT cu en . LabView may addi ionally cap u e he MU signal
in synch onized mode. The eco ding ile con ains sample imes amps o he RCT
digi ized signal.
•
The MATLAB p og am is used o c ea e he essen ial analysis ool equi ed o execu e
he LPCT e o calcula ion algo i hm.
3.2. Calib a ion Algo i hm
The algo i hm o es ima e he composi e e o o an LPCT wi h a digi al ou pu is based
on he a ia ions be ween each measu emen sample o he synch onized MU and RC. The
composi e e o o he measu ing chain can be exp essed acco ding o IEC61869-9 [
26
] as:
εc%=
u
u
u
u
u
u
N
∑
n=1iX(n)−iR(n)2
N
∑
n=1iR(n)2·100 (1)
whe e iX(n) is he ac ual ins an aneous alue o he MU a he sampling ime;
iR(n) is he ac ual ins an aneous alue o he RC a he sampling ime;
Nis he nominal sample a e (samples pe second) di ided by he undamen al
equency (Hz).
Mo eo e , he ampli ude e o is simply calcula ed using he a io o he di e ence
be ween he oo mean squa e (RMS) o he cu en signal measu ed by he MU and
RC o he RMS o he cu en measu ed by he RC du ing each pe iod. Howe e , he
de e mina ion o he phase e o is sligh ly mo e complex. Thus, he Fas Fou ie T ans o m
(FFT) should be pe o med on MU and RC samples.
IEC61869-9 de ined he a io/phase e o o he measu ing chain using FFT on he
samples as:
→
ε(s) =
√2
N
N
∑
n=1iX(n)−iR(n)e−j2πn
Nk
sN−1
∑
n=1iR(n)2
(2)
whe e →
ε(s)is he a io e o and he phase e o o he measu ing chain;
kis he numbe o ha monics being measu ed (k= 1 o he undamen al).
The FFT algo i hm s a s by subdi iding he o iginal se o measu emen da a, which
consis s o da a ga he ed synch onously om he MU and RC a a sampling a e o
4 kHz,
in o nsubwindows wi h 97.5% o e lap con aining
80 samples
(each pe iod con-
ains
80 samples,
so ha each subsequen pe iod has an o e lap o 78 samples om he
p e ious pe iod).
The ampli ude/phase o he undamen al ha monic o each signal is ob ained by
pe o ming FFT analysis a each subwindow. The ampli ude/phase di e ences o each
pe iod a e de e mined using he di e en ia ion me hod be ween he wo alues ha a e
gi en by he FFT a he signal equency componen (50 Hz) o bo h he MU and RC.
A e calcula ing he di e ences o each pe iod in he measu emen windows, he
di e ences a e a e aged o e nwindows, which gi es he inal alues o he ampli ude/
phase e o s.
Ra ioE o =1
N
N
∑
n=1 I1 ms,X(n)−I1 ms,R(n)
I1 ms,R(n)!·100% (3)
Ene gies 2023,16, 7323 8 o 13
PhaseE o =1
N
N
∑
n=1
(ϕ1X(n)−ϕ1R(n))(4)
whe e I
1 ms,X(n)
and I
1 ms,R(n)
a e he RMSs o he i s ha monic o he cu en signal o he
MU and RC, espec i ely, a he n h sub-window;
ϕ1X(n)
and
ϕ1R(n)
a e he phases o he i s ha monic o he cu en signal o he MU
and RC, espec i ely, a he n h sub-window;
Nis he o al numbe o subwindows.
Simila ly, he algo i hm is also capable o es ima ing ype-A measu emen unce ain-
ies, because he mean and s anda d de ia ions o he ampli ude and phase e o s can also
be compu ed [14].
3.3. Ta ge Unce ain y o LPCT Calib a ion
The e o ep esen s he di e ence be ween he measu ed alue and he ue o
e e ence alue. Unce ain y exp esses he eliabili y o he measu ed alue. Unce ain y is
o en desc ibed as a ange o in e al wi h a co esponding con idence le el o p obabili y.
I indica es how ce ain i is ha he eal alue alls wi hin ha speci ied ange. The
unce ain y alue consis s o se e al elemen s ha a e es ima ed using a ious s a is ical
dis ibu ions o he measu emen da a. These elemen s include sys ema ic and andom
in luences on he measu emen s.
Acco ding o [
27
], he le el o unce ain y necessa y o he calib a ion o LPCT is
iden i ied by he accu acy class o he calib a ed ansduce i sel .
IEC 61869-6 de ined ha each accu acy class o he LPCT has limi s ha should no be
exceeded by he a io/phase e o , wi hou men ioning any a ge unce ain y o he e o
measu emen s [28].
Linea i y, empe a u e and empo al s abili y, s anda d calib a ion, and o he ac o s
ha ha e a signi ican impac on LPCT e o measu emen s mean ha he p obabili y dis-
ibu ion o he unce ain y ha impac s he calcula ed a io/phase e o can be conside ed
no mal [29].
The unce ain y sou ces o igina e om e e y de ice used o LPCT calib a ion, and he
e ec s o hese sou ces p opaga e h oughou he measu emen chain, causing inaccu acies
in he a io/phase e o assessmen . The ollowing sou ces o unce ain y a e he key
ac o s ha limi he accu acy o he measu emen in ou calib a ion se up.
•
Unce ain y induced by he RCT a io and phase e o : The RCT should ha e an
accu acy class ha is app op ia ely lowe han ha o he RC o be calib a ed. The
con ibu ion o RCT is he ampli ude e o o
±
0.05% and he phase e o o 0.35 m ad.
•
The unce ain y caused by he e e ence analogue- o-digi al con e e o PXI gain and
phase e o . The con ibu ion o PXI-4472 is he ampli ude e o
±
0.025% and he
phase e o 0.4 m ad.
•
The unce ain y caused by he digi al alue cap u e p og ams. The con ibu ion o
SVA is he ampli ude e o o 4.7 ×10−6and he phase e o o 0.1 m ad.
A ype-B e alua ion can be used o es ima e each o he abo e-men ioned elemen s.
3.4. Unce ain y Calcula ion
The unce ain y analysis in his wo k is calcula ed by linea e o p opaga ion acco d-
ing o he ollowing equa ions.
uc(y) =
u
u
N
∑
i=1
c2
i·u2(xi)(5)
wi h u
c
(y) being he s anda d unce ain y, c
i
a e he sensi i i y coe icien s, and u(x
i
)a e he
s anda d unce ain ies o he inpu quan i ies Xi.
Ene gies 2023,16, 7323 9 o 13
The e o e, he s anda d measu emen unce ain ies o he LPCT calib a ion uc o
measu emen s a nominal cu en and 50 Hz a e calcula ed by:
uc(y) = qu2(RCT) + u2(PXI) + u2(SVA)(6)
wi h u(RCT),u(PXI), and u(SVA) being he indi idual s anda d unce ain ies o unce ain y
sou ces.
The expanded unce ain y o he desi ed con idence le el can be calcula ed as
U=k·uc(y)(7)
wi h kbeing he co e age ac o ha can be k= 2 o he co e age p obabili y o 95.45% o
k= 3 o he co e age p obabili y o 99.73%.
4. Resul s
The linea i y measu emen o he LPCT made up o RC + MU was pe o med unde
no mal and abno mal ope a ing condi ions.
The desc ibed p ocedu e was used o calcula e he e o s o he measu ing chain a
he p ima y cu en s o 16 A, 40 A, 80 A, and 96 A wi h a equency o 50 Hz.
Du ing each es , whe e a single cu en alue is applied o bo h senso s simul ane-
ously, digi al samples o he measu ed cu en gene a ed by bo h channels a e eco ded o
a pe iod o no less han 6 s. Each measu emen consis s o 4000 samples o a
200 ms
win-
dow wi h a leas 300 epe i ions. Then, he MATLAB en i onmen was used o calcula e
he e o s be ween Fou ie - ans o med cu en signals.
The e o s be ween he samples o he wo cu en signals a e calcula ed acco ding o
Equa ions (3) and (4).
Following he applica ion o he FFT algo i hm and subsequen pa i ioning o he
measu emen da a in o subwindows, a minimum o 11,960 alues we e ob ained o each
measu ed cu en . Subsequen ly, 11,960 alues we e iden i ied o bo h phase e o and
angle e o .
Due o he signi ican olume o alues ep esen ing di e ences be ween he wo
cu en signals, i became impe a i e o u ilize s a is ical analysis o he calcula ion o
mean e o and s anda d de ia ion.
The ini ial esul s we e de i ed om es s conduc ed unde s eady-s a e condi ions,
whe e he measu ed cu en was main ained a he nominal le el (80 A) and he equency
a he nominal a e (50 Hz). Subsequen ly, he es ima ed P obabili y Densi y Func ion (PDF)
o he a io e o
ε
% can be obse ed in Figu e 2a, and he es ima ed PDF o he phase
e o
δ
is shown in Figu e 2b. The e o s o his measu ing chain a e a a io e o o
−
0.26%,
phase e o o 0.021 ad, and composi e e o o 2.2%.
Ene gies 2023, 16, 7323 10 o 13
(a) (b)
Figu e 2. His og am o he e o s a nominal cu en . (a) PDF o a io e o ; (b) PDF o he phase
e o .
In acco dance wi h he Cen al Limi Theo em, i can be in e ed om hese da a ha
he PDFs end o ollow a no mal dis ibu ion, assuming ha he measu emen p ocess is
linea .
I is essen ial o highligh ha he dis ibu ion o he phase e o appea s o be no -
mal, which is in con as o he assump ion o a uni o m dis ibu ion o en made when
employing he Mon e Ca lo me hod [29].
To p o ide a mo e comp ehensi e iew o he es esul s, he expe imen was dupli-
ca ed unde abno mal ope a ing condi ions. This in ol ed using cu en alues ha ex-
ceeded he nominal cu en by 120% and lowe cu en s, speci ically 5% and 50% below
he nominal cu en . Subsequen ly, he e o s o each measu emen we e calcula ed, and
he summa ized esul s can be ound in Table 2.
Table 2 indica es ha a cu en s diffe en om he nominal cu en , he e o is ela-
i ely g ea e compa ed o when he cu en is a he nominal alue.
I is wo h no ing ha he unce ain y men ioned in Table 2 indica es ha he o al
unce ain y is caused by he measu ing de ices and he measu emen chain (RC + MU).
Table 2. Resul s o measu emen chain e o s.
Cu en Quan i y Mean Value S anda d De ia ion
16 A
50 Hz
ε% −0.17 0.22
Δ [ ad] 0.022 0.0021
40 A
50 Hz
ε% −0.162 0.125
Δ [ ad] 0.0216 0.00122
80 A
50 Hz
ε% −0.16 0.12
Δ [ ad] 0.021 0.0012
96 A
50 Hz
ε% −0.18 0.08
Δ [ ad] 0.021 0.0008
Fo unce ain y calcula ion, he e o s ha could con ibu e o unce ain y, ob ained
om he manu ac u e ’s b ochu es o each de ice, we e conside ed.
The unce ain y in he measu emen p ocess was calcula ed acco ding o Equa ion
(6). The ex ended s anda d unce ain y o measu emen caused by measu emen equip-
men is calcula ed as:
222
() 2 ( ) ( ) ( )
333
RCT SVA
PXI
c
uy
εε
ε
=⋅ + + (8)
whe e εRCT, εPXI, and εSVA a e he maximum e o s o he RCT, PXI, and SVA, espec i ely.
Figu e 2.
His og am o he e o s a nominal cu en . (
a
) PDF o a io e o ; (
b
) PDF o he
phase e o .