scieee Science in your language
[en] (orig)

Dynamic replication : the core of a truly non-intrusive SRAM-based FPGA structural concurrent test methodology

Abstract

The increasing use of reconfigurable computing platforms, employing SRAM-based FPGAs, opens exciting new possibilities since they enable the reutilization of same hardware resources to implement speed-critical computational tasks, without interrupting system operation. Nevertheless, larger dies and the use of smaller submicron scales in the manufacturing of this new kind of FPGAs increase the probability of lifetime operation failures, requiring new test / fault tolerance methods capable of assuring the reliability of the system. Structural concurrent test procedures become particularly important in this context, since it is now possible to replicate and release for test internal FPGA resources, concurrently with but not affecting system operation. A new dynamic replication process of active Configurable Logic Blocks (CLBs) is presented in this paper, which enables the implementation of a truly non-intrusive structural component test approach. The experimental results presented prove the effectiveness of this solution.

Read accessible full text

Dynamic replication : the core of a truly non-intrusive SRAM-based FPGA structural concurrent test methodology

Author: Manuel G. Gericota,Gustavo R. Alves,Miguel L. Silva,José M. Ferreira
Year: 2002
Source: https://repositorio-aberto.up.pt/bitstream/10216/84940/2/67581.pdf
3 d IEEE La in Ame ican Tes Wo kshop. Mon e ideo, U uguay, Feb ua y 10-13, 2002
70
Dynamic Replica ion: The Co e o a T uly Non-In usi e SRAM-based FPGA
S uc u al Concu en Tes Me hodology
Manuel G. Ge ico a, Gus a o R. Al es
Depa men o Elec ical Enginee ing — ISEP
Rua D . An ónio Be na dino de Almeida
4200-072 Po o - PORTUGAL
{mgg, gal es}@dee.isep.ipp.p
Miguel L. Sil a, José M. Fe ei a
Dep. o Compu e s and Elec ical Enginee ing — FEUP
Rua D . Robe o F ias
4200-465 Po o - PORTUGAL
{mlms, jm }@ e.up.p
Abs ac ♦
♦♦
♦
The inc easing use o econ igu able compu ing
pla o ms, employing SRAM-based FPGAs, opens
exci ing new possibili ies since hey enable he
eu iliza ion o he same ha dwa e esou ces o
implemen speed-c i ical compu a ional asks, wi hou
in e up ing sys em ope a ion.
Ne e heless, la ge dies and he use o smalle
submic on scales in he manu ac u ing o his new kind o
FPGAs inc ease he p obabili y o li e ime ope a ion
ailu es, equi ing new es / aul - ole ance me hods
capable o assu ing he eliabili y o he sys em.
S uc u al concu en es p ocedu es become
pa icula ly impo an in his con ex , since i is now
possible o eplica e and elease o es in e nal FPGA
esou ces, concu en ly wi h — bu no a ec ing —
sys em ope a ion. A new dynamic eplica ion p ocess o
ac i e Con igu able Logic Blocks (CLBs) is p esen ed in
his pape , which enables he implemen a ion o a uly
non-in usi e s uc u al concu en es app oach. The
expe imen al esul s p esen ed p o e he e ec i eness o
his solu ion.
1. In oduc ion
The ad en o a new kind o SRAM-based FPGAs
(Field P og ammable Ga e A ays) capable o
♦ This wo k is suppo ed by he Po uguese Founda ion o Science and
Technology (FCT), unde con ac POCTI/33842/ESE/2000
implemen ing as un- ime pa ial econ igu a ion (e. g.
he Vi ex amily om Xilinx), enabling he dynamic
cus omiza ion o ha dwa e unc ions o a pa icula sys em
o applica ion concu en ly wi h sys em ope a ion,
conside ably ein o ced he ad an ages o he use o
complex con igu able logic de ices in econ igu able
compu ing pla o ms.
Un o una ely, he smalle submic on scales used in he
manu ac u ing o hese de ices inc ease he h ea o
elec omig a ion, due o highe elec onic cu en densi y
in me al aces. Also, he co esponding lowe h eshold
ol ages make hem mo e suscep ible o gamma pa icle
adia ion. Radia ion in e e ence is much mo e likely wi h
la ge dies, inc easing he p obabili y o ailu e [1-2].
A e la ge pe iods o ope a ion, ce ain de ec s, namely
hose ela ed o small manu ac u ing impe ec ions no
de ec ed by p oduc ion es ing, become exposed,
eme ging as ei he s uck-a aul s o ansien aul s [3].
A highe FPGA eliabili y le el can he e o e only be
achie ed h ough he con inuous es o all i s blocks
h oughou sys em li e ime, and by he in oduc ion o
aul ole ance ea u es. In [4] he au ho s p oposed a new
me hodology o dynamically o a e and ee- o - es he
CLBs in an FPGA, wi hou dis u bing sys em ope a ion,
and p esen ed some e ec i e esul s conce ning he
adop ed s a egy o implemen he o a ion scheme.
Equally impo an in his me hodology is he eplica ion o
ac i e CLBs, i.e. hose CLBs ha a e pa o a unc ional
block ac ually being used by he sys em. In o de o ee
he CLBs o be es ed, hei unc ion mus be eplica ed in
CLBs p e iously es ed, in a way ha mus be comple ely
anspa en o he sys em.
3 d IEEE La in Ame ican Tes Wo kshop. Mon e ideo, U uguay, Feb ua y 10-13, 2002
71
In his pape a new eplica ion s a egy is p oposed,
which enables he comple e implemen a ion o a uly
non-in usi e s uc u al es o he FPGA CLBs o
pe manen ailu es ha may e en ually eme ge du ing
sys em li e ime. The p oposed s a egy does no equi e
he usage o any FPGA I/O pins, since i euses he IEEE
1149.1 in as uc u e [5] o access he con igu a ion
esou ces and o apply / cap u e es ec o s. While es ing
he a ious CLBs, ou p ocedu e also es s a signi ican
ac ion o all a ailable ou ing esou ces.
This pape is o ganized as ollows: ecen ly p oposed
app oaches o he es o SRAM-based FPGAs a e i s
e iewed, ollowed by a gene al desc ip ion o he
s uc u al concu en es solu ion en isaged o he FPGA
CLBs. The o a ion s a egy employed o ee he CLBs
and he adop ed es app oach a e b ie ly e iewed. The
ollowing sec ion de ails he eplica ion mechanism and
p esen s expe imen al esul s. In he end, some di ec ions
o u he esea ch a e in oduced.
2. Backg ound
Di e en o -line es me hodologies o SRAM-based
FPGAs ha e been p oposed in ecen publica ions,
employing a di e si y o Buil -In Sel -Tes (BIST)
s a egies o ex e nal es p ocedu es. An FPGA es
app oach based on BIST echniques, p esen ed in [6-7],
exploi s he ep og ammabili y o FPGAs in o de o se
up he BIST logic, which exis s only du ing o -line
es ing. Tes abili y is achie ed wi hou any a ea o e head
o pe o mance penal y, since he BIST logic is elimina ed
when he ci cui is econ igu ed o no mal ope a ion. A
di e en BIST a chi ec u e, based on he same s a egy,
was also p oposed o enable aul diagnosis [8-10].
An o -line es based on a non-BIST app oach,
a ge ed o es he FPGA CLBs, is p esen ed in [11-12].
In o de o achie e 100% aul co e age a CLB le el,
di e en es con igu a ions a e se up sequen ially, wi h
se ies o es ec o s being applied o each o hem
h ough he FPGA I/O Blocks (IOBs).
Since aul -de ec ion la ency is much la ge in o -line
es s a egies, hese app oaches a e unsa is ac o y in
highly aul -sensi i e, mission-c i ical applica ions, and as
a consequence a e es ic ed o manu ac u ing es .
In o de o o e come hese limi a ions, on-line es
me hods based on a scanning me hodology we e p esen ed
in [3, 13-15]. The basic concep unde lying hese me hods
consis s o ha ing only a ela i ely small po ion o he
chip being es ed o -line (ins ead o he whole chip as in
p e ious p oposals), while he es con inues i s no mal
ope a ion. I he unc ionali y o a column o FPGA CLBs
can be eplica ed on ano he po ion o he de ice, hen i
can be aken o -line and es ed o aul s in a anspa en
manne (i.e. wi hou in e up ing he sys em unc ionali y).
This aul scanning p ocedu e hen mo es on o copy and
es ano he column o CLBs, sweeping h ough he whole
FPGA, sys ema ically es ing o aul s. In his app oach,
known as Ro ing STARs, he whole sys em mus be
s opped in o de o eplica e he columns. Since
econ igu a ion is pe o med h ough he Bounda y Scan
(BS) in as uc u e, econ igu a ion ime is long, and i
seems likely ha hal ing he sys em will dis u b i s
ope a ion. The new pa ial and dynamic econ igu a ion
ea u es a e no en i ely exploi ed by his app oach,
possibly because dynamic eplica ion o an en i e column
would cause oo many dis u bances o he sys em
ope a ion.
The concu en es app oach p oposed in his pape
euses some o he p e ious concep s, bu elimina es hei
d awbacks by using a much smalle uni o es – he CLB.
The eplica ion o each CLB is accomplished wi hou
hal ing he sys em, e en i he CLB is ac i e.
The use o he BS es in as uc u e o access FPGA
con igu a ion memo y, and o apply he es ec o s and
cap u e he esponses in each CLB, b ings he addi ional
bene i o a educed o e head a boa d le el, since no
o he esou ces ( han hose o he FPGA i sel ) a e used.
Being applica ion-independen , and o ien ed o es he
FPGA s uc u e, he p oposed s a egy gua an ees FPGA
eliabili y a e many econ igu a ions, hus helping o
ensu e he co ec ope a ion h oughou he sys em
li e ime.
3. The p oposed FPGA concu en es
solu ion
In he as majo i y o econ igu able ha dwa e
sys ems, mul iple independen ha dwa e blocks
dynamically sha e he same FPGA de ice a he same
ime. Ne e heless, 100% usage o he FPGA esou ces is
ha dly e e achie ed, so a ew blocks will always be ee.
The DRAFT (Dynamically Ro a e And F ee o Tes )
me hod p esen ed in [4] is based in a scanning echnique
whe e empo a ily unused FPGA CLBs a e s uc u ally
es ed wi hou dis u bing sys em ope a ion, aking
ad an age o he dynamic and pa ially econ igu able
ea u es o e ed by new FPGAs.
Using a dynamic eplica ion and o a ion mechanism,
CLBs cu en ly being used by a gi en applica ion can
ha e hei unc ionali y dynamically eplica ed in one o
he CLBs al eady es ed. A e ans e ing i s
unc ionali y, he eplica ed CLB is ee o be es ed.
Ca ying ou a o a ion scheme ha co e s he whole
FPGA, his solu ion gua an ees ha he whole FPGA can
be es ed, wi hou dis u bing he sys em ope a ion,
p o ided ha a leas one unused CLB is a ailable in he
3 d IEEE La in Ame ican Tes Wo kshop. Mon e ideo, U uguay, Feb ua y 10-13, 2002
72
cu en implemen a ion. The in oduc ion o aul
ole ance ea u es will howe e equi e mo e han one
unused CLB, since a pool o spa e esou ces has o be
con inuously a ailable o eplace hose e en ually ound
de ec i e. Unlike Buil -In Sel -Repai (BISR) echniques
used in manu ac u ing, ou solu ion is able o dynamically
ole a e aul s in he ield. In his way, he sys em can s ill
ope a e in he p esence o aul y CLBs, and dependabili y
is imp o ed wi h easonably low ha dwa e edundancy
and no ex a cos .
4. Ro a ing and es ing
The o a ion s a egy ollowed in o de o ee CLBs
o es should ha e a minimum in luence (p e e ably
none) in he sys em ope a ion, as well as a educed
o e head in e ms o econ igu a ion cos . This cos
depends on he numbe o econ igu a ion ames needed
o eplica e and ee each CLB, since a g ea numbe o
ames would imply a longe es ime and la ge memo y
esou ces. The impac o his p ocess in he o e all sys em
ope a ion is due o a ia ions on ci cui iming, because o
ou ing adjus men s. I he e- ou ing p ocedu e o igina es
a pa h delay highe han he p e ious maximum, he
sys em’s maximum equency o ope a ion is educed and
he o e all sys em pe o mance deg ades.
Th ee possibili ies we e conside ed o es ablishing he
o a ion ule o he ee CLB, among he en i e CLB a ay:
andom, ho izon al and e ical o a ion [4].
The andom s a egy was ejec ed o h ee main
easons:
- i gene a es longe pa hs (and hence inc eases pa h
delays);
- i pu s oo much s ess in he limi ed ou ing
esou ces, by dispe sing g oups o CLBs assigned o
a same unc ion;
- i has unp edic able aul co e age la ency, which is
no accep able.
The second s a egy, ho izon al o a ion, is illus a ed
in igu e 1-a). The ee- o - es CLB (in whi e) would
o a e along a ho izon al pa h co e ing all CLBs in he
a ay. The eplica ion p ocess would ake place be ween
neighbo ing CLBs, due o sca ci y o ou ing esou ces
and o highe pa h delays. The same ule applies as well o
he e ical o a ion s a egy illus a ed in igu e 1-b),
whe e he CLB unde es o a es along a e ical pa h.
Simula ions pe o med wi h he las wo s a egies,
using Vi ex Xilinx FPGAs, o e a subse o 14 ITC’99
Benchma k Ci cui s om he Poli écnico di To ino [16],
ha e shown ha he e ical o a ion s a egy achie es
lowe cos s in e ms o econ igu a ion ile sizes. The size
ob ained by he applica ion o he ho izon al s a egy was
a ound 20% highe han wha was ob ained by he
applica ion o he e ical s a egy o he same ci cui
implemen a ions.
a) Ho izon al s a egy b) Ve ical s a egy
CLB
CLB
CLB
CLB
CLB CLB
CLB
CLB
CLB
CLB
CLB
CLB
CLB
CLB CLB
CLB
CLB
CLB
Figu e 1. Dynamic o a ion o he ee CLB
The in luence o bo h o a ion s a egies o e he
maximum equency o ope a ion was subs an ially
di e en , mainly due o a pai o dedica ed pa hs pe CLB
ha p opaga e ca y signals e ically o adjacen CLBs.
When he o a ion p ocess b eaks a dedica ed ca y pa h,
due o he inse ion o he ee CLB, he p opaga ion o
his ca y signal be ween he nea es adjacen CLBs
(abo e and below) is e-es ablished h ough gene ic
ou ing esou ces, inc easing he pa h delay. I he
implemen ed ci cui has one o mo e o hese ca y
signals, he ho izon al o a ion would b eak all he ca y
ne s, inc easing pa h delays, bu he e ical o a ion
would only b eak hose in he op o bo om o he CLB
columns. The e ical o a ion s a egy is he e o e
p e e able, i we conside only he deg ada ion in he
maximum equency o ope a ion.
When no ca y signals a e used, wo o he ac o s mus
be conside ed: i) he numbe o signals wi h high anou ,
and ii) he placemen shape ( ec angula , squa e, ci cula ,
e c.) and o ien a ion (ho izon al, e ical) o he ci cui s
implemen ed inside he FPGA. In ec angula / ho izon al
implemen a ions, and when many high anou signals a e
p esen , he ho izon al s a egy becomes p e e able, since
he maximum equency o ope a ion is less deg aded ( his
could be a mo e impo an ac o han econ igu a ion ile
size when dealing wi h high-speed applica ions).
The BS in as uc u e is also eused o access he CLBs
du ing he es p ocess. In o de o c ea e he es model o
he Vi ex CLB s uc u e, some es ic ions had o be
imposed:
- he ca y logic would no be es ed, because i is no
possible o access he CLB ca y inpu and ou pu
po s di ec ly (only by passing h ough he e ically
adjacen CLBs);
- he use o LUTs (Look-Up Tables) as Dis ibu ed
RAM would no be ini ially conside ed.
Each VIRTEX CLB comp ises wo slices exac ly
equal. In o al, he CLB es model has 13 inpu s ( es
ec o s a e applied o bo h slices o each CLB
simul aneously) and 12 ou pu s (six om each slice).
Tes ec o s a e applied and esponses cap u ed
h ough he BS in as uc u e, wi h he ou pu s o he CLB
3 d IEEE La in Ame ican Tes Wo kshop. Mon e ideo, U uguay, Feb ua y 10-13, 2002
73
unde es being ou ed o unused BS egis e cells
associa ed o he IOBs. Howe e , and since he
applica ion o es ec o s h ough he BS egis e would
a ec he alues p esen a each FPGA inpu , an
al e na i e Use Tes Regis e mus be used ( he Vi ex
amily enables he de ini ion o wo use egis e s
con olled h ough he BS in as uc u e), as shown in
igu e 2. This Use Tes Regis e comp ises 13 cells,
co esponding o he equi ed numbe o CLB es
con igu a ion inpu s.
M
U
X
Ou
Bypass egis e
Ins uc ion egis e
Con igu a ion egis e
In
TDO
TDI
...
CLB
unde es
Use Tes Regis e
Figu e 2. Tes o a CLB
The numbe o CLBs occupied by his egis e (se en),
associa ed o he CLB needed o pe o m he o a ion, a e
he only ha dwa e o e head implied by ou p oposed es
me hodology. This accoun s o 0,7% o he CLB
esou ces in a Xilinx XCV200, a medium size complexi y
FPGA (a ay size = 28x42 CLBs). Since he ou pu s o
each slice a e cap u ed independen ly, aul loca ion can
be esol ed o a single slice.
As he implemen a ion s uc u e o he CLBs
mul iplexe s and lip- lops was no known, we conside ed
a hyb id aul model [11]. The analysis o he Vi ex CLB
es model s uc u e led us o conclude ha ou es
con igu a ions we e enough o exe cise all possible CLB
aul s. Since econ igu a ion h ough he BS in as uc u e
is slow, his small numbe o es s eps is a good measu e
o ou educed es ime.
The back-and- o h dynamic ee-CLB o a ion ac oss
he chip implies a a iable es la ency. The ime o again
each a gi en CLB al e na es be ween a maximum and a
minimum alue (acco ding o he o a ion di ec ion),
depending on he size o he de ice:
- he maximum aul de ec ion la ency is gi en by:
)(2)2)#((# es econ columns owsscan CLBCLB
MAX
+××−×=
τ
- he minimum aul de ec ion la ency is in u n gi en
by:
)(2 es econ scan
min
+×=
τ
whe e:
econ : ime needed o comple e a CLB eplica ion
es : ime needed o es a ee CLB
The maximum aul la ency ob ained expe imen ally in
essays pe o med wi h he XCV200, a a BS ope a ion
equency o 30MHz, was 48 seconds.
A e a comple e back-and- o h dynamic ee-CLB
o a ion, he ini ial ou ing is es o ed, and he e o e no
cumula i e pe o mance deg ada ion esul s by
con inuously epea ing his p ocess.
In ou app oach, he con igu a ion memo y is
conside ed aul ee and will no be es ed. Howe e , he
same es in as uc u e could be used o pe o m a
eadback o he con igu a ion da a ha was loaded in o he
FPGA, helping o de ec aul s in he con igu a ion
elemen s. Wi h his aim, a eadback and compa e so wa e
applica ion, capable o pe o ming ull eadback
con igu a ion memo y h ough he S anda d BS es access
po , was de eloped. The eadback ile is compa ed wi h
he o iginal con igu a ion ile, in sea ch o di e ences
indica ing he exis ence o possible aul s in he
con igu a ion memo y.
5. A no el eplica ion p ocess
The o a ion mechanism implies he eplica ion o
ac i e CLBs. This ask is no i ial due o wo majo
issues: i) con igu a ion memo y o ganiza ion, and
ii) in e nal s a e in o ma ion.
The con igu a ion memo y can be isualized as a
ec angula a ay o bi s, which a e g ouped in o one-bi
wide e ical ames ex ending om he op o he bo om
o he a ay. One ame is he a omic uni o con igu a ion
— i is he smalles po ion o he con igu a ion memo y
ha can be w i en o o ead om. These ames a e
g ouped oge he in o la ge uni s called columns. Each
CLB column has a co esponding con igu a ion column,
wi h mul iple ames, ha mixes in e nal CLB
con igu a ion in o ma ion, ou ing in o ma ion and s a e
in o ma ion. The con igu a ion p ocess is a sequen ial
mechanism ha spans h ough some o he whole CLB
con igu a ion columns. When eplica ing an ac i e CLB,
i s inpu and ou pu signals (as well as hose in i s eplica)
may c oss se e al columns be o e eaching i s sou ce o
des ina ion. Any econ igu a ion ac ion mus he e o e
ensu e ha he signals om he eplica ed CLB a e no
b oken be o e being o ally e-es ablished om i s eplica.
Also impo an , o a oid ou pu gli ches, he unc ionali y
o he CLB eplica mus be pe ec ly s able be o e i s
ou pu s a e connec ed o he sys em. A se o expe imen s
3 d IEEE La in Ame ican Tes Wo kshop. Mon e ideo, U uguay, Feb ua y 10-13, 2002
74
pe o med wi h a XCV200 demons a ed ha he only
possible solu ion is o di ide he eplica ion p ocess in
wo phases, as illus a ed in igu e 3. In he i s phase, he
in e nal con igu a ion o he CLB is eplica ed and he
inpu s o bo h CLBs a e placed in pa allel. Due o he
low-speed cha ac e is ics o he (BS) in e ace, he
econ igu a ion ime is ela i ely long when compa ed
wi h he sys em speed o ope a ion. The e o e, he ou pu s
o he CLB eplica will be pe ec ly s able be o e being
connec ed o he ci cui , in he second phase. Bo h CLBs
mus emain in pa allel o a leas one sys em clock cycle
o a oid ou pu gli ches.
1s phase 2nd phase
- Rou ing a ay
eplica ed
CLB
CLB
eplica
eplica ed
CLB
CLB
eplica
In
In
In
In Ou
Ou Ou
Ou
Figu e 3. Two-phase CLB eplica ion p ocess
Ano he majo equi emen o he success o he
eplica ion p ocess is he co ec ans e o s a e
in o ma ion. I he cu en CLB unc ion is pu ely
combina ional, a simple ead-modi y-w i e con igu a ion
p ocedu e will su ice o accomplish he eplica ion
p ocess. Howe e , in he case o a sequen ial unc ion, he
in e nal s a e in o ma ion mus be p ese ed and no w i e-
-ope a ions shall be los du ing he eplica ion p ocess. In
Vi ex FPGA amily, i is possible o ead he alue o a
egis e , bu no o pe o m a di ec w i e ope a ion.
Mo eo e , when dealing wi h ac i e CLBs, s a e
in o ma ion may change be ween he ead and w i e o a
egis e , causing a cohe ency p oblem. By his eason, no
ime gap be ween he wo ope a ions may exis . As a
consequence, he use o empo a y ans e pa hs [13] is
no easible wi h ac i e CLBs. An addi ional
econ igu a ion s ep, in o de o se up he ans e pa h
be ween bo h CLB’s lip- lops, would be needed. The
econ igu a ion o he CLB eplica a e he ans e o i s
unc ionali y would c ea e an unaccep able ime gap
be ween s a e in o ma ion ans e al and i s ac i a ion.
When dealing wi h synch onous ci cui s, a wo-phase
eplica ion p ocess may sol e his p oblem. Be ween he
i s and he second phase, he CLB eplica has he same
inpu s as he eplica ed CLB and acqui es he s a e
in o ma ion, e en i he sys em equency o ope a ion is
an o de o magni ude lowe han he BS in as uc u e
equency used o econ igu a ion pu poses. The
acqui ed s a e in o ma ion is co ec , despi e any aul ha
may a ec he eplica ed CLB lip- lops, since i is
ob ained di ec ly om he inpu s, ins ead o being
ans e ed om hose (e en ually aul y) lip- lops ( his
me hod is no applicable o asynch onous ci cui s).
Se e al expe imen s made using synch onous ci cui s
ha e shown he e ec i eness o his me hod in he
eplica ion o ac i e CLBs. No loss o s a e in o ma ion o
he p esence o ou pu gli ches was epo ed, and he
eplica ion ime is independen o he unc ion
implemen ed by he CLB.
The success ul es o he CLB eplica assu es i s good
unc ionali y, bu he eplica ed CLB could be aul y.
When he inpu s and ou pu s o bo h CLBs a e placed in
pa allel, we may be in e connec ing nodes wi h di e en
ol age le els. Due o he in e nal impedance o he
ou ing swi ches, his appa en “sho -ci cui ” beha es as a
ol age di ide , limi ing he cu en low in he
in e connec ion. The e o e, no damage esul s o he
FPGA, as p o ed by ex ensi e expe imen al essays. Since
we a e dealing wi h digi al ci cui s, he analog alue
esul ing om he ol age di ide ends in a well de ined
alue (logic 0 o logic 1) when i goes h ough a bu e
du ing he ou ing o a he inpu o he nex CLB o IOB.
No logic alue ins abili y was epo ed du ing he essays.
Each CLB has h ee ou ing a ays associa ed: wo
local a ays (inpu and ou pu ); and one global a ay. The
ou ing esou ces in hese a ays may be unidi ec ional o
bi-di ec ional, as indica ed in igu e 4. No ou ing
esou ces a e a ailable in he local a ays o es ablish
di ec in e connec ions wi h o he CLBs, so he
in e connec ions equi ed in he eplica ion p ocess can
only be done h ough he global ou ing a ay.
Inpu ou ing a ay
Ou pu ou ing a ay
Slice 1 Slice 0
CLB
Global
ou ing a ay
Figu e 4. CLB ou ing esou ces
Only unidi ec ional ou ing esou ces a e a ailable
be ween local and global ou ing a ays, as seen in
igu e 4. Fo pa alleling inpu s, in e connec ion segmen s
be ween global a ays may be unidi ec ional ( om he
eplica ed CLB inpu s owa ds he CLB eplica inpu s), o
bi-di ec ional. Conce ning he ou pu s, in e connec ion
segmen s be ween global a ays may also be
unidi ec ional ( om he CLB eplica ou pu s owa ds he
eplica ed CLB ou pu ), o bi-di ec ional, as illus a ed in

3 d IEEE La in Ame ican Tes Wo kshop. Mon e ideo, U uguay, Feb ua y 10-13, 2002
75
igu e 5. O he wise, since signals do no p opaga e
backwa ds, no signals will be p esen ed a he inpu s o
he CLB eplica, and he ou pu s o bo h CLBs will no be
placed in pa allel. As a esul , ou pu gli ches will occu
when CLB eplica ed ou pu s a e disconnec ed om he
sys em and no signals will be p opaga ed o he es o he
ci cui .
eplica ed
CLB
CLB
eplica
- Local ou ing a ay
- Global ou ing a ay
- Manda o y di ec ionali y
- Op ional bi-di ec ionali y
In
In
Ou
Ou
Figu e 5. Replica ion CLB in e connec ion
Since no aul a any o he eplica ed CLB inpu s may
p opaga e backwa ds, he logic alues p esen ed a he
inpu s o he CLB will no be a ec ed by he
in e connec ion, e en i he eplica ed CLB is aul y. As
such, all CLB eplica inpu s will always e lec he co ec
alues and hence he s a e in o ma ion i acqui es is
co ec as well. As a consequence, and a e he
eplica ion p ocess, he ou pu s o he CLB eplica always
display he co ec alue, au oma ically co ec ing any
aul y beha io .
5. Conclusion
This pape p esen ed a no el eplica ion p ocess o
eplica e ac i e CLBs wi hou dis u bing hei ope a ion.
The p oposed p ocedu e enables he implemen a ion o a
uly non-in usi e s uc u al concu en es me hodology
o pa ial and dynamically econ igu able SRAM-based
FPGAs, wi h he ollowing ad an ages:
1. The es me hod is comple ely sys em- anspa en ;
2. The o e head a chip le el is e y low;
3. Tes pa e n gene a ion has low complexi y because
i is done o only a single CLB;
4. Faul loca ion is esol ed o a single CLB slice;
5. Faul ole ance may be added as a complemen o he
p oposed solu ion;
6. The dependabili y o sys ems based on his ype o
FPGAs is imp o ed.
Suppo o sys em designe s h ough he whole p ocess
implied also he de elopmen o speci ic so wa e ools
o he au oma ic gene a ion o pa ial econ igu a ion
bi s eams om hei comple e coun e pa s, o simpli y
FPGA econ igu a ion ope a ions h ough he BS
in as uc u e.
Re e ences
[1] F. Hanchek, S. Du , “Me hodologies o Tole an ing Cell
and In e connec Faul s in FPGAs”, IEEE T ansac ions on
Compu e s, Vol. 47, No. 1, pp. 15-33, Jan. 1998.
[2] J. Lach, H. W. Mangione-Smi h, M. Po konjak, “Low
O e head Faul -Tole an FPGA Sys ems”, IEEE T ansac ions
on VLSI Sys ems, Vol. 6, No. 2, pp. 212-221, June 1998.
[3] N. R. Shnidman, H. W. Mangione-Smi h, M. Po konjak,
“On-Line Faul De ec ion o Bus-Based Field P og ammable
Ga e A ays”, IEEE T ansac ions on VLSI Sys ems, Vol. 6,
No. 4, pp. 656-666, Dec. 1998.
[4] M. G. Ge ico a, G. R. Al es, J. M. Fe ei a, “Dynamically
Ro a e And F ee o Tes : The Pa h o FPGA Concu en Tes ”,
2nd IEEE La in-Ame ican Tes Wo kshop, pp. 180-185,
Feb. 2001.
[5] IEEE S anda d Tes Access Po and Bounda y Scan
A chi ec u e (IEEE S d 1149.1), IEEE S d. Boa d, May 1990.
[6] C. S oud, S. Konala, P. Chen, M. Ab amo ici, “Buil -In
Sel -Tes o Logic Blocks in FPGAs (Finally, A F ee Lunch:
BIST Wi hou O e head!)”, P oc. o he 14 h IEEE VLSI Tes
Symposium, pp. 387-392, Ap il 1996.
[7] C. S oud, E. Lee, S. Konala, M. Ab amo ici, “Using ILA
Tes ing o BIST in FPGAs”, P oceedings o he In e na ional
Tes Con e ence, pp. 68-75, Oc . 1996.
[8] C. S oud, E. Lee, M. Ab amo ici, “BIST-Based Diagnos ic
o FPGA Logic Blocks”, P oceedings o he In e na ional Tes
Con e ence, pp. 539-547, No . 1997.
[9] M. Ab amo ici, C. S oud, “BIST-Based De ec ion and
Diagnosis o Mul iple Faul s in FPGAs”, P oceedings o he
In e na ional Tes Con e ence, Oc . 2000.
[10] M. Ab amo ici, C. S oud, “BIST-Based Tes and
Diagnosis o FPGA Logic Block”, IEEE T ansac ions on VLSI
Sys ems, Vol. 9, No. 1, pp. 159-172, Feb. 2001.
[11] W. K. Huang, F. J. Meye , X. Chen, F. Lomba di, “Tes ing
Con igu able LUT-Based FPGA's”, IEEE T ansac ions on VLSI
Sys ems, Vol. 6, No. 2, pp. 276-283, June 1998.
[12] W. K. Huang, F. J. Meye , F. Lomba di,, “An app oach o
de ec ing mul iple aul y FPGA logic blocks”, IEEE
T ansac ions on Compu e s, Vol. 49, No. 1, pp. 48-54,
Jan. 2000.
[13] M. Ab amo ici, C. S oud, S. Wijesu iya, C. Hamil on, V.
Ve ma, “On-Line Tes ing and Diagnosis o FPGAs wi h Ro ing
STARs”, P oceedings 5 h IEEE In e na ional On-Line Tes ing
Wo kshop, pp. 2-7, July 1999.
[14] M. Ab amo ici, C. S oud, C. Hamil on, S. Wijesu iya, V.
Ve ma, “Using Ro ing STARs o On-Line Tes ing and
Diagnosis o FPGAs in Faul -Tole an Applica ions”,
P oceedings o he In e na ional Tes Con e ence, pp. 973-982,
Sep . 1999.
[15] M. Ab amo ici, C. S oud, B. Skaggs, J. Emme ,
“Imp o ing On-Line BIST-Based Diagnosis o Ro ing
STARs”, P oceedings 6 h IEEE In e na ional On-Line Tes ing
Wo kshop, July 2000.
[16] Poli écnico di To ino ITC’99 benchma ks, a ailable a
h p://www.cad.poli o.i / ools/i c99.h ml