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Automatic segmentation of the secondary austenite-phase island precipitates in a superduplex stainless steel weld metal

Abstract

Duplex and superduplex stainless steels are class of materials of a high importance for engineering purposes, since they have good mechanical properties combination and also are very resistant to corrosion. It is known as well that the chemical composition of such steels is very important to maintain some desired properties. In the past years, some works have reported that gama 2 precipitation improves the toughness of such steels, and its quantification may reveals some important information about steel quality. Thus, we propose in this work the automatic segmentation of gama 2 precipitation using two pattern recognition techniques: Optimum-Path Forest (OPF) and a Bayesian classifier. To the best of our knowledge, this if the first time that machine learning techniques are applied into this area. The experimental results showed that both techniques achieved similar and good recognition rates.

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Automatic segmentation of the secondary austenite-phase island precipitates in a superduplex stainless steel weld metal

Author: Victor H. C. Albuquerque,Rodrigo Y. M. Nakamura,João P. Papa,Cleiton C. Silva,João Manuel R. S.Tavares
Year: 2011
Source: https://repositorio-aberto.up.pt/bitstream/10216/56793/2/60284.pdf
Au oma ic Segmen a ion o he Seconda y Aus eni e-phase Island
P ecipi a es in a Supe duplex S ainless S eel Weld Me al
Vic o H. C. Albuque que1& Rod igo Y. M. Nakamu a2& Jo˜
ao P. Papa2
Clei on C. Sil a3&Jo˜
ao Manuel R. S. Ta a es4
1Uni e sidade de Fo aleza, Cen o de Ciˆ
encias Tecnol´
ogicas, Fo aleza, B azil
2Depa amen o de Compu ac¸ ˜
ao, UNESP - Uni Es adual Paulis a, Bau u, B azil
3Depa amen o de Engenha ia Me al´
u gica e Ma e iais, Uni e sidade Fede al do Cea ´
a, Fo aleza, B azil
4Uni e sidade do Po o, Faculdade de Engenha ia, Po o, Po ugal
Duplex and supe duplex s ainless s eels a e class o ma e ials o a high impo ance o enginee ing pu poses,
since hey ha e good mechanical p ope ies combina ion and also a e e y esis an o co osion. I is known
as well ha he chemical composi ion o such s eels is e y impo an o main ain some desi ed p ope ies.
In he pas yea s, some wo ks ha e epo ed ha γ2p ecipi a ion imp o es he oughness o such s eels, and
i s quan i ica ion may e eals some impo an in o ma ion abou s eel quali y. Thus, we p opose in his wo k
he au oma ic segmen a ion o γ2p ecipi a ion using wo pa e n ecogni ion echniques: Op imum-Pa h Fo es
(OPF) and a Bayesian classi ie . To he bes o ou knowledge, his i he i s ime ha machine lea ning
echniques a e applied in o his a ea. The expe imen al esul s showed ha bo h echniques achie ed simila
and good ecogni ion a es.
1 INTRODUCTION
Duplex and supe duplex s ainless s eels a e a impo -
an class o ma e ials o enginee ing, which ha e an
excep ional co osion esis ance and good mechani-
cal p ope ies combina ion (Nilsson 1992). The suc-
cess o hese alloys is associa ed o he mic os uc-
u al balance o phases, in which e i e and aus eni e
ha e app oxima ely he same p opo ions. All hese
cha ac e is ics ha e mo i a ed he use o duplex and
supe -duplex s ainless s eels in a wide a ie y o in-
dus ial sec o s, such as chemical ones, pe ochemical
and oil & gas (Ta a es e al. 2010; Bas os e al. 2007).
The balance o phases is in luenced by he chemi-
cal composi ion o he alloys, and also by he cooling
a e expe imen ed du ing i s p oduc ion (Hemme and
G ong 1999; Hemme e al. 2000). Howe e , depend-
ing on he manu ac u ing p ocess, his p opo ion can
be changed and hen he p ope ies deg aded. One o
he mos impo an p ocesses used in he manu ac u -
ing and epai ing o pipes and equipmen s o indus-
ial applica ions is he welding, in which he s eel is
subjec ed o a high cooling a e. The high empe a u e
eached du ing he welding cycle causes he aus en-
i e dissolu ion, and consequen ly one may obse e an
inc easing in he e i e con en , ha ming he ough-
ness and duc ili y (Ko ecki and Hilkes 1994; He z-
man e al. 1997). In mul ipass welding, he ehea ed
zone by deposi ion o subsequen weld beads causes,
as main mic os uc u al changes, he dissolu ion o
ch omium ni ides and also he p ecipi a ion o sec-
onda y aus eni e (γ2) (Rami ez e al. 2004; Rami ez
e al. 2003).
Some wo ks ha e epo ed ha γ2p ecipi a ion im-
p o es he oughness o he duplex and supe -duplex
s ainless s eels (Lippold and Al-Rumaih 1997; Lee
e al. 1999). On he o he hand, he low ch omium,
molybdenium and ni ogencon en s o he γ2a e
ha m ul o co osion esis ance (Nilsson and Wilson
1993; Nilsson e al. 1995). Based on hese aspec s,
i is e y impo an o quan i y he amoun o γ2in
welded join s, especially in usion zone, in o de o
imp o e he weld quali y. Howe e , his quan i ica ion
is no s aigh o wa d, mainly because he seconda y
aus eni e o med is mo e e iden when he p ecipi-
a es a e loca ed inside he e i e g ain, wi h needles
shape and also wi h he p esence o γ2islands. Thus,
he quan i ica ion o such islands is usually ca ied ou
by manual ope a ions using all pu pose image analy-
sis so wa es, demanding a long ime and use expe i-
ence.
1
In his pape , we p opose he au oma ic segmen a-
ion o γ2islands using machine lea ning echniques,
ocusing on he Op imum-Pa h Fo es (OPF) (Papa,
Falc˜
ao, and Suzuki 2009) and a Bayesian classi-
ie (Duda, Ha , and S o k 2000). As a as we know,
his is he i s ime ha OPF is applied in o his do-
main, as well as any o he compu a ional echnique,
once ha hese p ecipi a es ha e ne e been au oma -
ically segmen ed up o da e.
The emainde o he pape is o ganized as ollows.
Sec ion 2 e isi s he classi ie s, and Sec ion 4 discuss
he expe imen al esul s. Finally, Sec ion 5 s a es he
conclusions.
2 MACHINE LEARNING BACKGROUND
This sec ion add esses a e iew abou he pa e n
ecogni ion echniques applied.
2.1 Op imum-pa h Fo es classi ie
The OPF classi ie wo ks by modeling he p oblem o
pa e n ecogni ion as a g aph pa i ion in a gi en ea-
u e space. The nodes a e ep esen ed by he ea u e
ec o s and he edges connec all pai s o hem, de in-
ing a ull connec edness g aph. This kind o ep esen-
a ion is s aigh o wa d, gi en ha he g aph does no
need o be explici ly ep esen ed, allowing us o sa e
memo y. The pa i ion o he g aph is ca ied ou by a
compe i ion p ocess be ween some key samples (p o-
o ypes), which o e op imum pa hs o he emaining
nodes o he g aph. Each p o o ype sample de ines i s
op imum-pa h ee (OPT), and he collec ion o all
OPTs de ines de op imum-pa h o es , which gi es
he name o he classi ie (Papa, Falc˜
ao, and Suzuki
2009).
The OPF can be seen as a gene aliza ion o he
well known Dijks a’s algo i hm o compu e op imum
pa hs om a sou ce node o he emaining ones (Dijk-
s a 1959). The main di e ence elies on he ac ha
OPF uses a se o sou ce nodes (p o o ypes) wi h any
pa h-cos unc ion. In case o Dijks a’s algo i hm, a
unc ion ha summed he a c-weigh s along a pa h
was applied. Fo OPF, we used a unc ion ha gi es
he maximum a c-weigh along a pa h, as explained
be o e.
Le Z=Z1∪Z2be a da ase labeled wi h a unc-
ion λ, in which Z1and Z2a e, espec i ely, a aining
and es se s such ha Z1is used o ain a gi en classi-
ie and Z2is used o assess i s accu acy. Le S⊆Z1a
se o p o o ype samples. Essen ially, he OPF classi-
ie c ea es a disc e e op imal pa i ion o he ea u e
space such ha any sample s∈Z2can be classi ied
acco ding o his pa i ion. This pa i ion is an op i-
mum pa h o es (OPF) compu ed in ℜnby he image
o es ing ans o m (IFT) algo i hm (Falc˜
ao, S ol i,
and Lo u o 2004).
The OPF algo i hm may be used wi h any smoo h
pa h-cos unc ion which can g oup samples wi h sim-
ila p ope ies (Falc˜
ao, S ol i, and Lo u o 2004). Pa -
icula ly, we used he pa h-cos unc ion max, which
is compu ed as ollows:
max(⟨s⟩) = {0i s∈S,
+∞o he wise
max(π· ⟨s, ⟩) = max{ max(π),d(s, )},(1)
in which d(s, )means he dis ance be ween samples
sand , and a pa h πis de ined as a sequence o ad-
jacen samples. As such, we ha e ha max(π)com-
pu es he maximum dis ance be ween adjacen sam-
ples in π, when πis no a i ial pa h.
The OPF algo i hm assigns one op imum pa h
P∗(s) om S o e e y sample s∈Z1, o ming an
op imum pa h o es P(a unc ion wi h no cycles
which assigns o each s∈Z1 Si s p edecesso P(s)
in P∗(s)o a ma ke nil when s∈S. Le R(s)∈S
be he oo o P∗(s)which can be eached om P(s).
The OPF algo i hm compu es o each s∈Z1, he cos
C(s)o P∗(s), he label L(s) = λ(R(s)), and he p e-
decesso P(s).
The OPF classi ie is composed o wo dis inc
phases: (i) aining and (ii) classi ica ion. The o me
s ep consis s, essen ially, in o inding he p o o ypes
and compu ing he op imum-pa h o es , which is he
union o all OPTs oo ed a each p o o ype. A e ha ,
we pick a sample om he es sample, connec i o all
samples o he op imum-pa h o es gene a ed in he
aining phase and we e alua e which node o e ed he
op imum pa h o i . No ice ha his es sample is no
pe manen ly added o he aining se , i.e., i is used
only once. The nex sec ions desc ibe in mo e de ail
his p ocedu e.
2.1.1 T aining
We say ha S∗is an op imum se o p o o ypes when
OPF algo i hm minimizes he classi ica ion e o s o
e e y s∈Z1.S∗can be ound by exploi ing he
heo e ical ela ion be ween minimum-spanning ee
(MST) and op imum-pa h ee o max (All`
ene, Au-
dibe , Coup ie, Cous y, and Ke i en 2007). The ain-
ing essen ially consis s in inding S∗and an OPF clas-
si ie oo ed a S∗.
By compu ing an MST in he comple e g aph
(Z1,A), we ob ain a connec ed acyclic g aph whose
nodes a e all samples o Z1and he a cs a e undi-
ec ed and weigh ed by he dis ances dbe ween ad-
jacen samples. The spanning ee is op imum in he
sense ha he sum o i s a c weigh s is minimum
as compa ed o any o he spanning ee in he com-
ple e g aph. In he MST, e e y pai o samples is con-
nec ed by a single pa h which is op imum acco ding
2
o max. Tha is, he minimum-spanning ee con ains
one op imum-pa h ee o any selec ed oo node.
The op imum p o o ypes a e he closes elemen s o
he MST wi h di e en labels in Z1(i.e., elemen s ha
all in he on ie o he classes). By emo ing he
a cs be ween di e en classes, hei adjacen samples
become p o o ypes in S∗and OPF can compu e an
op imum-pa h o es wi h minimum classi ica ion e -
o s in Z1. No e ha , a gi en class may be ep esen ed
by mul iple p o o ypes (i.e., op imum-pa h ees) and
he e mus exis a leas one p o o ype pe class.
2.1.2 Classi ica ion
Fo any sample ∈Z2, we conside all a cs connec -
ing wi h samples s∈Z1, as hough we e pa o he
aining g aph. Conside ing all possible pa hs om S∗
o , we ind he op imum pa h P∗( ) om S∗and la-
bel wi h he class λ(R( )) o i s mos s ongly con-
nec ed p o o ype R( )∈S∗. This pa h can be iden-
i ied inc emen ally by e alua ing he op imum cos
C( )as:
C( ) = min{max{C(s),d(s, )}},∀s∈Z1.(2)
Le he node s∗∈Z1be he one ha sa is ies Equa-
ion 2 (i.e., he p edecesso P( )in he op imum pa h
P∗( )). Gi en ha L(s∗) = λ(R( )), he classi ica ion
simply assigns L(s∗)as he class o . An e o occu s
when L(s∗)=λ( ).
2.2 Bayesian Classi ie
Le p(ωi|x)be he p obabili y o a gi en pa e n x∈
ℜn o belong o class ωi,i= 1,2,...,c, which can be
de ined by he Bayes Theo em (Jaynes 2003):
p(ωi|x) = p(x|ωi)P(ωi)
p(x),(3)
whe e p(x|ωi)is he p obabili y densi y unc ion o
he pa e ns ha compose he class ωi, and P(ωi)co -
esponds o he p obabili y o class he ωii sel .
A Bayesian classi ie decides whe he a pa e n x
belongs o he class ωiwhen:
p(ωi|x)> p(ωj|x), i,j = 1,2,... ,c, i =j, (4)
which can be ew i en as ollows by using Equa ion 3:
p(x|ωi)P(ωi)> p(x|ωj)P(ωj), i,j = 1,2, ...,x, i =j
(5)
As one can see, he Bayes classi ie ’s decision unc-
ion di(x) = p(x|ωi)P(ωj)o a gi en class ωis ongly
depends on he p e ious knowledge o p(x|ωi)and
P(ωi),∀i= 1,2,...,c. The p obabili y alues o
P(ωi)a e s aigh o wa d and can be ob ained by cal-
cula ing he his og am o he classes, o ins ance.
Howe e , he main p oblem is o ind he p obabil-
i y densi y unc ion p(x|ωi), gi en ha he only in-
o ma ion we ha e is a se o pa e ns and i s co e-
sponding labels. A common p ac ice is o assume ha
he p obabili y densi y unc ions a e Gaussian ones,
and hus one can es ima e hei pa ame e s using he
da ase samples (Duda, Ha , and S o k 2000). In he
n-dimensional case, a Gaussian densi y o he pa e ns
om class ωjcan be calcula ed by:
p(x|ωi) = γexp[−1
2(x−µj)TC−1
i(x−µj)],(6)
in which
γ=1
(2π)n/2|Ci|1/2,(7)
and µiand Cis and o , espec i ely, o he mean and
he co a iance ma ix o class ωi. These pa ame e s
can be ob ained by conside ing each pa e n x ha be-
longs o class ωiusing:
µi=1
Ni∑
x∈ωi
x(8)
and
Ci=1
Ni∑
x∈ωi
(xxT−µiµT
i),(9)
in which Nimeans he numbe o samples om class
ωi.
3 MATERIALS AND METHODS
In o de o e alua e he pe o mance o he ma-
chine lea ning algo i hms o au oma ic iden i ica-
ion o he seconda y aus eni e islands in mic os uc-
u e o supe duplex s ainless s eels, mul ipass welds
we e pe o med using gas me al a c welding p ocess
(GMAW). A es ing bench wi h an indus ial obo
and an elec onic welding powe supply was used o
p oduce he sample. The alloy used was he UNS
S32750 (SAF 2507) supe duplex s ainless s eel pipes
wi h 19 mm hickness as base me al and as ille me al
was AWS ER 2594.
Samples o me allog aphic e alua ion we e ex-
ac ed om welded join s and con en ionally p e-
pa ed h ough mechanical g inding and polishing us-
ing silicon ca bide sandpape and diamond pas , e-
spec i ely. An elec ochemical e ching o e eal he
mic os uc u e was ca ied ou using an aqueous solu-
ion wi h 40% ol. o ni ic acid (HNO3) and applying
a po en ial o 2.0 V du ing 40 seconds.
We used op ical mic oscopy images wi h 200×and
1000×o magni ica ions. These images we e p e i-
ously labeled by a echnician in o posi i e (γ2islands)
3
and nega i e (backg ound) samples. Figu e 1 displays
hese images.
(a) (b)
(c) (d)
Figu e 1: Mic oscopic images used in he expe i-
men s: o iginal images wi h magni ica ions o (a)
200×and (c) 1000×, and he espec i ely manual
segmen a ions in (b) and (d).
Now, imagine an in e ac i e classi ica ion ool in
which he use can selec same posi i e and nega-
i e samples in o de o classi y he emaining image.
A e ha , he use may wan o e ine he classi ica-
ion p ocess by ma king ano he se o samples, and
hen o execu e he p ocess again. In mos applica-
ions, one know ha he e ec i eness o classi ica ion
is s ongly ela ed wi h he aining se size, since we
ha e mo e in o ma ion o ain he classi ie . In his
wo k, we would like o simula e his use beha io
by andomly selec ing some samples o aining, and
hen o classi y he emaining image. The pe cen ages
used o aining we e: 30% and 50%.
In his wo k, each pixel o be classi ied was de-
sc ibed by a ex u e ke nel a ound i s neighbo hood
and also by i s g ay alue. In o de o ex ac ex u e
in o ma ion, we applied he Gabo il e (Feich inge
and S ohme 1997), which can be ma hema ically
o mula ed as ollows:
G(x,y,θ,γ,σ,λ,ψ) = ex′2+y′2σ2
2σ2cos(2πx′
λ+ψ),
(10)
whe e x′=xcos(θ) + ysin(θ)and y′=xsin(θ) +
ycos(θ). In he abo e equa ion, λmeans he sinu-
soidal ac o , θ ep esen s he o ien a ion angle, ψis
he phase o se , σis he Gaussian s anda d de ia ion
and γis he aspec spa ial a io.
The main idea o Gabo il e is o pe o m a con-
olu ion be ween he o iginal image Iand Gθ,γ,σ,λ,ψ
in o de o ob ain a Gabo - il e ed ep esen a ion as:
ˆ
Iθ,γ,σ,λ,ψ =I∗Gθ,γ,σ,λ,ψ,(11)
in which ˆ
Iθ,γ,σ,λ,ψ deno es he il e ed image. Thus,
one can ob ain a il e bank o Gabo il e ed images
by a ying i s pa ame e s. We used a con olu ion il e
o size 3×3wi h he ollowing Gabo pa ame e s ha
we e empi ically chosen and based on ou p e ious
expe ience:
•6di e en o ien a ions: θ= 0◦,45◦,90◦,135◦,
225◦and 315◦;
•3spa ial esolu ions: λ= 2.5,3and 3.5. No ice
ha , o each one o λ alues, we applied di -
e en alues o σ, say ha σ= 1.96,1.40 and
1.68;
•ψ= 0 and
•γ= 1.
Once we ge he Gabo - il e ed images (one can see
ha we ha e 6×3 = 18 images), we hen compu e
he ex u e ea u es a pixel pas he se o co espond-
ing g ay alues among hese images. Thus, each pixel
is desc ibed by 19 ea u es, being 18 o hem ela ed
wi h ex u e and he emaining one is he o iginal g ay
alue. A e classi ica ion p ocess, we applied a 3×3
mode il e in o de o pos -p ocessing he image.
In ega d o he pa e n ecogni ion echniques, o
OPF we used he LibOPF (Papa, Suzuki, and Falc˜
ao
2009), which is a ee ool o he design o classi ie s
based on o op imum-pa h o es . Fo Bayesian clas-
si ie (BC) we used ou own implemen a ion.
4 EXPERIMENTAL RESULTS
We desc ibe in his sec ion he esul s ob ained. Fig-
u es 2 and 3 display, espec i ely, he images classi-
ied wi h BC and OPF.
In o de o emphasize he impo ance o mode il e ,
Figu e 4 displays he image o Figu e 1a classi ied
by BC wi h and wi hou mode il e . No ice ha he
image in Figu e 4b is equal o he image o Figu e 2a.
One can see ha he esul s ob ained using 30% o
he whole image o aining a e be e when we used
he BC classi ie in case o Figu e 1a. Using 50% he
esul s appea o be simila . In ega d o Figu e 1c,
bo h classi ie s achie ed close esul s using 30% and
50% o aining. I is impo an o shed ligh o e
ha , o bo h echniques, he mode il e played an
impo an ole o il e he images a e classi ica ion.
Table 1 displays he ecogni ion a es o Figu es1a.
One can see ha BC ou pe o med OPF using 30%
o he whole image o aining, while OPF ou pe -
o med BC he second case, i.e., using 50% o he
samples o ain he classi ie s. Table 2 displays he
ecogni ion a es o Figu e1c.
4
(a) (b)
(c) (d)
Figu e 2: Classi ied images wi h BC using: (a) 30%
and (b) 50% o aining and (c) 30% and (d) 50% o
aining. The images (a)-(b) and (c)-(d) e e , espec-
i ely, o he o iginal images in Figu e 1a and Fig-
u e 1c.
(a) (b)
(c) (d)
Figu e 3: Classi ied images wi h OPF using: (a) 30%
and (b) 50% o aining and (c) 30% and (d) 50% o
aining. The images (a)-(b) and (c)-(d) e e , espec-
i ely, o he o iginal images in Figu e 1a and Fig-
u e 1c.
Classi ie T aining % Accu acy
OPF 30 68.51%
BC 30 69.14%
OPF 50 77.31%
BC 50 75.96%
Table 1: Recogni ion a es o he image in Figu e 1a.
The mos accu a e classi ie s a e bolded.
The OPF classi ie achie ed be e esul s han BC
(a) (b)
Figu e 4: Figu e 1a classi ied: (a) wi hou and (b) wi h
he mode il e .
Classi ie T aining % Accu acy
OPF 30 70.62%
BC 30 69.85%
OPF 50 79.13%
BC 50 82.41%
Table 2: Recogni ion a es o he image in Figu e 1c.
The mos accu a e classi ie s a e bolded.
using 30% o aining, while he la e ou pe o med
in case o 50%. Howe e , one can see ha he esul s
a e e y simila o bo h classi ie s using 30% and
50% o aining in he employed images.
5 CONCLUSIONS
This pape was conce ned on he p oblem o γ2island
segmen a ion, which can p o ide impo an in o ma-
ion abou s eel’s quali y and mechanical p ope ies.
In o de o do ha , we applied wo supe ised pa e n
ecogni ion echniques, Op imum-Pa h Fo es (OPF)
and a Bayesian classi ie (BC), on wo labeled images
wi h 200×and 1000×o magni ica ions, espec i ely.
Aiming o simula e an use beha io o selec posi-
i e and nega i e samples, we conduc ed expe imen s
wi h 30% and 50% o he whole images o ain-
ing, o u he classi y he emaining pixels. The ain-
ing samples we e andomly chosen, and desc ibed by
hei g ay alues and ex u e ea u es. In ega d o
ecogni ion a es, bo h classi ie s achie ed simila e-
sul s. A mode il e was applied o enhance he quali y
o images a e classi ica ion.
Thus, we may conclude ha he esul s we e e y
p omising, since his was he i s wo k ha add essed
he p oblem o au oma ic segmen a ion o γ2islands
in seconda y aus eni e-phase p ecipi a es.
Acknowledgmen s
The au ho s a e g a e ul o FAPESP g an
#2009/16206-1. The i s au ho hanks Na ional
Council o Resea ch and De elopmen (CNPq) and
Cea ense Founda ion o he Suppo o Scien i ic
and Technological De elopmen (FUNCAP) o
p o iding inancial suppo h ough a DCR g an o
UNIFOR .
5

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ene, C., J. Y. Audibe , M. Coup ie, J. Cous y,
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