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Incorporation of nio into sio2, tio2, al2o3, and na4.2ca2.8(si6o18) matrices: Medium effect on the optical properties and catalytic degradation of methylene blue

Abstract

The medium effect of the optical and catalytic degradation of methylene blue was studied in the NiO/SiO2, NiO/TiO2, NiO/Al2O3, and NiO/Na4.2Ca2.8(Si6O18) composites, which were prepared by a solid-state method. The new composites were characterized by XRD (X-ray diffraction of powder), SEM/EDS, TEM, and HR-TEM. The size of the NiO nanoparticles obtained from the PSP-4-PVP (polyvinylpyrrolidone) precursors inside the different matrices follow the order of SiO2 > TiO2 > Al2O3 . However, NiO nanoparticles obtained from the chitosan precursor does not present an effect on the particle size. It was found that the medium effect of the matrices (SiO2, TiO2, Al2O3, and Na4.2Ca2.8(Si6O18)) on the photocatalytic methylene blue degradation, can be described as a specific interaction of the NiO material acting as a semiconductor with the MxOy materials through a possible p-n junction. The highest catalytic activity was found for the TiO2 and glass composites where a favorable p-n junction was formed. The isolating character of Al2O3 and SiO2 and their non-semiconductor behavior preclude this interaction to form a p-n junction, and thus a lower catalytic activity. NiO/SiO2 and NiO/Na4.2Ca2.8(Si6O18) showed a similar photocatalytic behavior. On the other hand, the effect of the matrix on the optical properties for the NiO/SiO2, NiO/TiO2, NiO/Al2O3, and NiO/Na4.2Ca2.8(Si6O18) composites can be described by the different dielectric constants of the SiO2, TiO2, Al2O3, Na4.2Ca2.8(Si6O18) matrices. The maxima absorption of the composites (¿max) exhibit a direct relationship with the dielectric constants, while their semiconductor bandgap (Eg) present an inverse relationship with the dielectric constants. A direct relationship between ¿max and Eg was found from these correlations. The effect of the polymer precursor on the particle size can explain some deviations from this relationship, as the correlation between the particle size and absorption is well known. Finally, the NiO/Na4.2Ca2.8(Si6O18) composite was reported in this work for the first time. Diaz, C.; Valenzuela, M.L.; Cifuentes-Vaca, O.; Segovia, M.; Laguna-Bercero, M.A.

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Incorporation of nio into sio2, tio2, al2o3, and na4.2ca2.8(si6o18) matrices: Medium effect on the optical properties and catalytic degradation of methylene blue

Author: Diaz, C.; Valenzuela, M.L.; Segovia, M.; Cifuentes-Vaca, O.; Laguna-Bercero, M.A.
Year: 2020
DOI: 10.3390/nano10122470
Source: https://zaguan.unizar.es/record/99085/files/texto_completo.pdf
nanoma e ials
A icle
Inco po a ion o NiO in o SiO2, TiO2, Al2O3,
and Na4.2Ca2.8(Si6O18) Ma ices: Medium E ec on
he Op ical P ope ies and Ca aly ic Deg ada ion o
Me hylene Blue
Ca los Diaz 1,*, Ma ía L. Valenzuela 2, Olga Ci uen es-Vaca 3, Ma jo ie Sego ia 1and
Miguel A. Laguna-Be ce o 4,*
1Depa amen o de Química, Facul ad de Química, Uni e sidad de Chile, La Palme as 3425, Nuñoa,
Casilla 653, 7800003 San iago de Chile, Chile; [email p o ec ed]
2
Ino ganic Chemis y and Molecula Ma e ial Cen e , Facul ad de Ingenie
í
a, Ins i u o de Ciencias Qu
í
micas
Aplicadas, Uni e sidad Au ónoma de Chile, A . El Llano Sube caseaux 2801, San Miguel,
8910060 San iago de Chile, Chile; [email p o ec ed]
3Depa amen o Ciencias Químicas, Facul ad de Ciencias Exac as, Uni e sidad And es Bello,
Sede Concepción, Au opis a Concepción-Talcahuano, 7100 Talcahuano, Chile; [email p o ec ed]
4Ins i u o de Nanociencia y Ma e iales de A agón (INMA), CSIC-Uni e sidad de Za agoza,
50009 Za agoza, Spain
*Co espondence: [email p o ec ed] (C.D.); malaguna@uniza .es (M.A.L.-B.)
Recei ed: 13 No embe 2020; Accep ed: 3 Decembe 2020; Published: 10 Decembe 2020


Abs ac :
The medium e ec o he op ical and ca aly ic deg ada ion o me hylene blue was s udied in
he NiO/SiO
2
, NiO/TiO
2
, NiO/Al
2
O
3
, and NiO/Na
4.2
Ca
2.8
(Si
6
O
18
) composi es, which we e p epa ed
by a solid-s a e me hod. The new composi es we e cha ac e ized by XRD (X- ay di ac ion o powde ),
SEM/EDS, TEM, and HR-TEM. The size o he NiO nanopa icles ob ained om he PSP-4-PVP
(poly inylpy olidone) p ecu so s inside he di e en ma ices ollow he o de o SiO
2
>TiO
2
>Al
2
O
3
. Howe e , NiO nanopa icles ob ained om he chi osan p ecu so does no p esen an
e ec on he pa icle size. I was ound ha he medium e ec o he ma ices (SiO
2
, TiO
2
, Al
2
O
3
,
and Na
4.2
Ca
2.8
(Si
6
O
18
)) on he pho oca aly ic me hylene blue deg ada ion, can be desc ibed as a
speci ic in e ac ion o he NiO ma e ial ac ing as a semiconduc o wi h he MxOyma e ials h ough
a possible p-n junc ion. The highes ca aly ic ac i i y was ound o he TiO
2
and glass composi es
whe e a a o able p-n junc ion was o med. The isola ing cha ac e o Al
2
O
3
and SiO
2
and hei
non-semiconduc o beha io p eclude his in e ac ion o o m a p-n junc ion, and hus a lowe ca aly ic
ac i i y. NiO/SiO
2
and NiO/Na
4.2
Ca
2.8
(Si
6
O
18
) showed a simila pho oca aly ic beha io . On he
o he hand, he e ec o he ma ix on he op ical p ope ies o he NiO/SiO
2
, NiO/TiO
2
, NiO/Al
2
O
3
,
and NiO/Na
4.2
Ca
2.8
(Si
6
O
18
) composi es can be desc ibed by he di e en dielec ic cons an s o he
SiO
2
, TiO
2
, Al
2
O
3
, Na
4.2
Ca
2.8
(Si
6
O
18
) ma ices. The maxima abso p ion o he composi es (
λmax
)
exhibi a di ec ela ionship wi h he dielec ic cons an s, while hei semiconduc o bandgap (E
g
)
p esen an in e se ela ionship wi h he dielec ic cons an s. A di ec ela ionship be ween
λmax
and E
g
was ound om hese co ela ions. The e ec o he polyme p ecu so on he pa icle size
can explain some de ia ions om his ela ionship, as he co ela ion be ween he pa icle size and
abso p ion is well known. Finally, he NiO/Na
4.2
Ca
2.8
(Si
6
O
18
) composi e was epo ed in his wo k
o he i s ime.
Keywo ds: nickel oxide; pho oca alysis; chi osan; poly inylpy olidone; op ical p ope ies
Nanoma e ials 2020,10, 2470; doi:10.3390/nano10122470 www.mdpi.com/jou nal/nanoma e ials
Nanoma e ials 2020,10, 2470 2 o 17
1. In oduc ion
Me al oxide nanopa icles a e widely used in many applica ions such as coa ings, ca alysis,
elec ode ma e ials, o senso s [
1
]. I is impo an o ema k ha hei physical and chemical p ope ies
a e s ongly in luenced by hei agglome a ion [
2
]. In his sense, i is well known ha he inco po a ion
o me al oxides on o ine suppo ma e ials wi h high su ace a eas could help p e en pa icle
agglome a ion and also imp o e hei eac i i y and s abili y [3,4].
NiO is a p- ype semiconduc o wi h E
G
=3.5 eV p esen ing mul iple p ac ical applica ions [
4
–
6
].
Howe e , hei band gap can be modi ied by doping wi h o he me al oxide semiconduc o s, and hus
changing hei pho oca aly ic p ope ies [
5
,
6
]. NiO has been widely used in ca alysis, ba e y ca hodes,
uel cell elec odes, elec och omic ilms, elec ochemical supe capaci o s, o magne ic ma e ials [
4
–
6
].
In his sense, Bonomo e al. [
7
] ecen ly epo ed on he elec ochemical and op o-elec ochemical
p ope ies o nanos uc u ed NiO o pho ocon e sion applica ions. Al hough hese applica ions a e
de e mined by hei band-gap, which depend on he en i onmen [
8
,
9
], no sys ema ic s udies ha e
been epo ed ega ding he e ec o he medium on he band-gap beha io [
10
–
12
]. In his sense, i is
well known ha he dielec ic medium a ec s he op ical p ope ies o nanopa icles, as p e iously
obse ed o Au and Ag sys ems [
10
]. The op ical p ope ies o Au nanopa icles embedded in o
TiO
2
, Z O
2
, and Al
2
O
3
ha e been also s udied quali a i ely [
10
]. In addi ion, he e ec o SiO
2
, TiO
2
,
and Z O
2
suppo s was ecen ly analyzed showing ha MoO
3
/SiO
2
is he mos e icien epoxida ion
ca alys [12].
The Na
4.2
Ca
2.8
(Si
6
O
18
) compound (combei e) is a c ys alline phase no mally ob ained om he
usion o p ecu so Na
2
O
·
CaO
·
SiO
2
glasses [
13
–
15
]. In his sense, he e a e no epo ed me al oxides
using Na4.2Ca2.8(Si6O18) as a solid ma ix.
In p e ious wo ks, we ha e epo ed a me hod o p epa e me al and me al oxide nanos uc u ed
ma e ials om a he mal ea men o he Chi osan (MLn)xand PS-co-4-PVP (MLn)xmac omolecula
complexes [
16
–
18
]. The me hod consis s o wo s eps: (1) Fo ma ion o bo h mac omolecula complexes
by a sol en assis ed eac ion be ween he espec i e polyme and he me allic sal ; and (2) a he mal
p ocess o he solid unde ai a mosphe e.
The M
◦
and M
x
O
y
nanos uc u es can be easily inco po a ed in o SiO
2
ma ices using a simila
app oach by di e en he mal ea men s o he solid-s a e p ecu so s: Chi osan (ML
n
)
x/
/SiO
2
and
PS-co-4-PVP (ML
n
)
x/
/SiO
2
a o ding M
x
O
Y
//SiO
2
composi es [
19
,
20
]. This me hod can be also used o
p epa e NiO//M
x
O
y
composi es using SiO
2
, TiO
2
, Al
2
O
3
, o Na
4.2
Ca
2.8
(Si
6
O
18
) ma ices. Al hough a
ew me hods we e p oposed o p epa e NiO/SiO
2
[
4
,
21
,
22
], NiO/TiO
2
[
6
,
23
–
25
], NiO/Al
2
O
3
[
26
–
29
]
composi es, none o hem is as gene al and simple as he one desc ibed he e. As o he Na
4.2
Ca
2.8
(Si
6
O
18
)
case, al hough his pa icula composi ion has no been epo ed, simila nickel oxide doped wi h silica
ma ices ha e been success ully syn hesized ia a sol–gel p ocess [
30
]. Fu he mo e, his solid s a e
me hod has been used o o he sys ems [
31
]. A summa y o he p oposed ab ica ion ou e is shown
in Figu e 1[13].
Nanoma e ials 2020, 10, x FOR PEER REVIEW 2 o 17
1. In oduc ion
Me al oxide nanopa icles a e widely used in many applica ions such as coa ings, ca alysis,
elec ode ma e ials, o senso s [1]. I is impo an o ema k ha hei physical and chemical
p ope ies a e s ongly in luenced by hei agglome a ion [2]. In his sense, i is well known ha he
inco po a ion o me al oxides on o ine suppo ma e ials wi h high su ace a eas could help
p e en pa icle agglome a ion and also imp o e hei eac i i y and s abili y [3,4].
NiO is a p- ype semiconduc o wi h E
G
= 3.5 eV p esen ing mul iple p ac ical applica ions [4–6].
Howe e , hei band gap can be modi ied by doping wi h o he me al oxide semiconduc o s, and
hus changing hei pho oca aly ic p ope ies [5,6]. NiO has been widely used in ca alysis, ba e y
ca hodes, uel cell elec odes, elec och omic ilms, elec ochemical supe capaci o s, o magne ic
ma e ials [4–6]. In his sense, Bonomo e al. [7] ecen ly epo ed on he elec ochemical and
op o-elec ochemical p ope ies o nanos uc u ed NiO o pho ocon e sion applica ions. Al hough
hese applica ions a e de e mined by hei band-gap, which depend on he en i onmen [8,9], no
sys ema ic s udies ha e been epo ed ega ding he e ec o he medium on he band-gap beha io
[10–12]. In his sense, i is well known ha he dielec ic medium a ec s he op ical p ope ies o
nanopa icles, as p e iously obse ed o Au and Ag sys ems [10]. The op ical p ope ies o Au
nanopa icles embedded in o TiO
2
, Z O
2
,
and Al
2
O
3
ha e been also s udied quali a i ely [10]. In
addi ion, he e ec o SiO
2
, TiO
2
, and Z O
2
suppo s was ecen ly analyzed showing ha MoO
3
/SiO
2
is he mos e icien epoxida ion ca alys [12].
The Na
4.2
Ca
2.8
(Si
6
O
18
) compound (combei e) is a c ys alline phase no mally ob ained om he
usion o p ecu so Na
2
O⋅CaO⋅SiO
2
glasses [13–15]. In his sense, he e a e no epo ed me al oxides
using Na
4.2
Ca
2.8
(Si
6
O
18
) as a solid ma ix.
In p e ious wo ks, we ha e epo ed a me hod o p epa e me al and me al oxide
nanos uc u ed ma e ials om a he mal ea men o he Chi osan (ML
n
)
x
and PS-co-4-PVP (ML
n
)
x
mac omolecula complexes [16–18]. The me hod consis s o wo s eps: (1) Fo ma ion o bo h
mac omolecula complexes by a sol en assis ed eac ion be ween he espec i e polyme and he
me allic sal ; and (2) a he mal p ocess o he solid unde ai a mosphe e.
The M°
and M
x
O
y
nanos uc u es can be easily inco po a ed in o SiO
2
ma ices using a simila
app oach by di e en he mal ea men s o he solid-s a e p ecu so s: Chi osan (ML
n
)
x/
/SiO
2
and
PS-co-4-PVP (ML
n
)
x/
/SiO
2
a o ding M
x
O
Y
//SiO
2
composi es [19,20]. This me hod can be also used o
p epa e NiO//M
x
O
y
composi es using SiO
2
, TiO
2
, Al
2
O
3
, o Na
4.2
Ca
2.8
(Si
6
O
18
) ma ices. Al hough a ew
me hods we e p oposed o p epa e NiO/SiO
2
[4,21,22], NiO/TiO
2
[6,23–25], NiO/Al
2
O
3
[26–29]
composi es, none o hem is as gene al and simple as he one desc ibed he e. As o he
Na
4.2
Ca
2.8
(Si
6
O
18
) case, al hough his pa icula composi ion has no been epo ed, simila nickel
oxide doped wi h silica ma ices ha e been success ully syn hesized ia a sol–gel p ocess [30].
Fu he mo e, his solid s a e me hod has been used o o he sys ems [31]. A summa y o he
p oposed ab ica ion ou e is shown in Figu e 1 [13].
In addi ion, he e ec o he di e en ma ices on he op ical p ope ies will also be s udied and
discussed.
Figu e 1. Schema ic ep esen a ion o he p epa a ion me hod o me allic M° and me al oxides M
x
O
y
nanopa icles inside M’
x
O´
y
ma ices.
Figu e 1.
Schema ic ep esen a ion o he p epa a ion me hod o me allic M
◦
and me al oxides M
x
O
y
nanopa icles inside M0xO0yma ices.
Nanoma e ials 2020,10, 2470 3 o 17
In addi ion, he e ec o he di e en ma ices on he op ical p ope ies will also be s udied
and discussed.
2. Ma e ials and Me hods
NiCl
2·
6H
2
O, e ae hyl o hosilica e (TEOS), chi osan, poly(s y ene-co-4- inilpy idine) PS-co-4-PVP,
e hyl alcohol, ace ic acid, and dichlo ome hane we e supplied om Sigma-Ald ich and we e used
as ecei ed.
2.1. P epa a ion o he NiO/SiO2, NiO/TiO2, NiO/Al2O3Composi es
SiO
2
was p epa ed acco ding o he li e a u e p ocedu es [
19
,
20
]. B ie ly, e ae hoxysilane (TEOS),
e hanol, and ace ic acid we e mixed in a mola a io o 1:4:4 wi h wa e (nanopu e milli-Q), and added
o e he dichlo ome hane solu ion o he p e iously p epa ed chi osan (NiCl
2·
6H
2
O)
x
and PS-co-4-PVP
(NiCl
2·
6H
2
O)
x
. The mix u e was s i ed o 3 days. The ob ained gel was d ied a 100
◦
C unde a
acuum. The chi osan (NiCl
2·
6H
2
O)
x
//SiO
2
and PS-co-4-PVP (NiCl
2·
6H
2
O)
x
//SiO
2
p ecu so s we e
inally calcined a 800 ◦C o 2 h unde ai .
2.2. P epa a ion o he Chi osan (NiCl2·6H2O)x//TiO2and PS-co-4-PVP (NiCl2)x//TiO2P ecu so s
TiO
2
was p epa ed acco ding o he li e a u e p ocedu es [
19
,
20
]. B ie ly, i anium e a-isop opoxide
(Ti(OC
3
H
7
)
4
, TTIP) e hanol and ace ic acid we e mixed in a mola a io o 1:4:4 wi h wa e
(nanopu e milli-Q), and added o e he dichlo ome hane solu ion o he p e iously p epa ed chi osan
(NiCl
2·
6H
2
O)
x
and PS-co-4-PVP (NiCl
2·
6H
2
O)
x
. The mix u e was s i ed o 3 days. The ob ained
gel was d ied a 100
◦
C unde a acuum. The solid chi osan (NiCl
2·
6H
2
O)
x/
/TiO
2
and PS-co-4-PVP
(NiCl2·6H2O)x//TiO2p ecu so s we e calcined a 800 ◦C o 2 h unde ai .
2.3. P epa a ion o he Chi osan (NiCl2·6H2O)x//Al2O3and PS-co-4-PVP (NiCl2)x//Al2O3P ecu so s
Al
2
O
3
was p epa ed acco ding o he li e a u e p ocedu es [
27
–
30
]. B ie ly, AlCl
3,
e hanol,
and ace ic acid we e mixed in a mola a io o 1:4:4 wi h wa e (nanopu e milli-Q), and added o e
he dichlo ome hane solu ion o he p e iously p epa ed chi osan (NiCl
2·
6H
2
O)
x
and PS-co-4-PVP
(NiCl
2·
6H
2
O)
x
. The mix u e was s i ed o 3 days. The ob ained gel was d ied a 100
◦
C unde a
acuum. The solid chi osan (NiCl
2·
6H
2
O)
x
//Al
2
O
3
and PS-co-4-PVP (NiCl
2·
6H
2
O)
x
//Al
2
O
3
p ecu so s
we e calcined a 800 ◦C o 2 h unde ai .
2.4. P epa a ion o he P ecu so s: Chi osan (NiCl2·6H2O)x//NiO/Na4.2Ca2.8(Si6O18) and PS-co-4-PVP
(NiCl2)x//NiO/Na4.2Ca2.8(Si6O18)
The compounds we e p epa ed acco ding o he li e a u e p ocedu es [
28
]. B ie ly, e ae hoxysilane
(TEOS), e hanol, and ace ic acid we e mixed in a mola a io o 1:4:4 wi h wa e (nanopu e milli-Q),
hen Na
2
O, CaO, and SiO
2
solids (in mol% o 14:1.5:73) we e added o e he dichlo ome hane solu ion
o he p e iously p epa ed chi osan (NiCl
2·
6H
2
O)
x
and PS-co-4-PVP (NiCl
2·
6H
2
O)
x
. The mix u e
was s i ed o 3 days. The ob ained gel was d ied a 100
◦
C unde a acuum. The solid chi osan
(NiCl
2·
6H
2
O)
x
//Na
2
O CaO SiO
2
and PS-co-4-PVP (NiCl
2·
6H
2
O)
x
//Na
2
O CaO SiO
2
p ecu so s we e
calcined a 800 ◦C o 2 h unde ai .
The coo dina ion o he polyme was con i med by IR analysis, as he b oad
ν
(OH)+
ν
(NH)
band obse ed a 3448 cm
−1
o ee chi osan becomes un olded upon coo dina ion, shi ing in he
ange o 3345–3393 cm
−1
. On he o he hand, he
ν
(py) band is shi ing o high equencies upon
coo dina ion [16–18].
Finally, polyme -me al complexes we e placed in o a box u nace (lab ech) using a py olysis
empe a u e o 180
◦
C o he p ecu so complexes and 800
◦
C o he polyme complexes. Addi ional
expe imen al condi ions a e summa ized in Table 1.
Nanoma e ials 2020,10, 2470 4 o 17
Table 1. Composi ion o he py oly ic p oduc s om he espec i e p ecu so s.
P ecu so P ecu so Fo mula Ma ix Composi e Composi e
Numbe
(1) Chi osan·NiCl2(chi osan) - NiO C1
(2) PSP-4-PVP·NiCl2(PVP) - NiO C2
(3) Chi osan·NiCl2SiO2NiO/SiO2C3
(4) PSP-4-PVP·NiCl2SiO2NiO/SiO2C4
(5) Chi osan·NiCl2TiO2NiO/TiO2C5
(6) PSP-4-PVP·NiCl2TiO2NiO/TiO2C6
(7) Chi osan·NiCl2Al2O3NiO/Al2O3C7
(8) Chi osan·NiCl2Na4.2Ca2.8(Si6O18)
NiO/Na
4.2
Ca
2.8
(Si
6
O
18
)
C8
2.5. Cha ac e iza ion
IR spec a we e eco ded wi h a FT-IR Jasco 4600 spec opho ome e (Jasco Inc., Eas on, MD, USA).
Scanning elec on mic oscopy (SEM) was pe o med on a JEOL 5410 scanning elec on mic oscope
(JEOL L d., Tokyo, Japan). Elemen al mic oanalysis was pe o med by ene gy dispe si e X- ay (EDS)
analysis using a NORAN Ins umen mic o-p obe a ached o he SEM (The mo Scien i ic, Wal ham,
MA, USA). High- esolu ion ansmission elec on mic oscopy (HR-TEM) was pe o med using a
JEOL 2000FX TEM mic oscope (JEOL L d., Tokyo, Japan)a 200 kV o cha ac e ize he a e age pa icle
size, dis ibu ion, and elemen al and c ys al composi ion. EDS analysis was pe o med in indi idual
pa icles in o de o disc imina e NiO om he ma ix. A e age pa icle sizes we e calcula ed using he
Digi al Mic og aph so wa e (Ga an, Inc., Pleasan on, CA, US). Me hylene blue (MB) was used as a
model compound o es he pho oca aly ic p ope ies a 655 nm unde UV-Vis illumina ion (Shimadzu
UV-2600 spec opho ome e , Shimadzu Coo po a ion, Kyo o, Japan) using a xenon lamp (150 W)
posi ioned 20 cm away om he pho o eac o in a 330–680 nm ange a oom empe a u e, o a oid he
sel -deg ada ion and he mal ca aly ic e ec s o ca ionic dye. Suspensions we e s i ed in he da k o
60 min o es ablish an adso p ion/deso p ion equilib ium, a e which he pho oca aly ic discolo a ion
o MB was ini ia ed.
3. Resul s and Discussion
3.1. Composi e NiO/SiO2
The X- ay di ac ion pa e n o he as-syn hesized NiO/SiO
2
composi e o he ma e ial om he
chi osan p ecu so is shown in Figu e 2a. All he e lec ion peaks o he XRD pa e n can be indexed o
NiO and SiO
2
phases [
19
] (JPDS no. 03-065-2901 o NiO and JPDS no. 01-088-1535 o SiO
2
). The b oad
ea u e appea ing a 22
◦
co esponds o amo phous silica [
19
]. Simila X- ay di ac ion pa e ns o
NiO om he PVP p ecu so we e ob ained.
The SEM analysis (Figu e 2b) shows i egula pa icle agglome a es, as ypically obse ed om
he p epa a ion o nanopa icles using he solid-s a e he mal ou e [
30
]. F om he TEM analysis,
he agglome a ion o NiO nanopa icles embedded in o a mesh o SiO
2
can be obse ed in Figu e 2c,
whe e hese agglome a es a e composed o used NiO nanopa icles. The size o hese nanopa icles
a e in he ange o 14 nm wi h a mean size o 25 nm (Figu e 2c). De ailed HR-TEM images in Figu e 2e,
show a homogeneous dispe sion o NiO o e he silica ne wo k. Howe e , i was no possible o
acqui e high esolu ion images in o de o s udy he in e aces be ween NiO and he di e en ma ices.
In any case, as also con i med by SEM-EDS mapping (Figu e 2g), he e is a uni o m dis ibu ion o
NiO and SiO
2
pa icles. Simila esul s we e obse ed o NiO ob ained om he PVP p ecu so
(see Supplemen a y Ma e ials, Figu e S1). The only di e ence is ha NiO pa icles a e bigge in size ca.
100 nm.
Nanoma e ials 2020,10, 2470 5 o 17
Nanoma e ials 2020, 10, x FOR PEER REVIEW 5 o 17
Figu e 2. (a) XRD pa e n; (b) SEM image; (c) TEM image; (d) pa icle his og am; (e, ) HRTEM
images; and (g) SEM elemen mapping o he py oly ic NiO compound ob ained using he chi osan
p ecu so .
The SEM analysis (Figu e 2b) shows i egula pa icle agglome a es, as ypically obse ed om
he p epa a ion o nanopa icles using he solid-s a e he mal ou e [30]. F om he TEM analysis, he
agglome a ion o NiO nanopa icles embedded in o a mesh o SiO
2
can be obse ed in Figu e 2c,
whe e hese agglome a es a e composed o used NiO nanopa icles. The size o hese nanopa icles
a e in he ange o 14 nm wi h a mean size o 25 nm (Figu e 2c). De ailed HR-TEM images in Figu e
2e, show a homogeneous dispe sion o NiO o e he silica ne wo k. Howe e , i was no possible o
acqui e high esolu ion images in o de o s udy he in e aces be ween NiO and he di e en
ma ices. In any case, as also con i med by SEM-EDS mapping (Figu e 2g), he e is a uni o m
dis ibu ion o NiO and SiO
2
pa icles. Simila esul s we e obse ed o NiO ob ained om he PVP
Figu e 2.
(
a
) XRD pa e n; (
b
) SEM image; (
c
) TEM image; (
d
) pa icle his og am; (
e
,
) HRTEM images;
and (
g
) SEM elemen mapping o he py oly ic NiO compound ob ained using he chi osan p ecu so .
3.2. NiO/TiO2
Figu e 3shows he XRD pa e n o he NiO/TiO
2
nanocomposi e om he chi osan p ecu so ,
whe e he ana ase phase and NiO a e obse ed as single phases. Using his me hod, he pu e TiO
2
ana ase phase was ob ained, in con as wi h o he solu ion me hods, whe e a mix u e o ana ase
and u ile in he NiO/TiO
2
composi e was ob ained [
22
]. The NiO/TiO
2
composi e shows a “co on”
ype mo phology om he chi osan p ecu so (Figu e 3b), whe eas he mo phology om he PVP
p ecu so p esen s a mo e densi ied s uc u e, as shown in Figu e 3c. The SEM-EDS mapping, shown in

Nanoma e ials 2020,10, 2470 6 o 17
Figu e 2g, indica es an homogeneous dis ibu ion o NiO and TiO
2
. Simila esul s we e ob ained o
he NiO/TiO2 om he PVP p ecu so (see Supplemen a y Ma e ials, Figu e S2).
Nanoma e ials 2020, 10, x FOR PEER REVIEW 6 o 17
p ecu so (see Supplemen a y Ma e ials, Figu e S1). The only di e ence is ha NiO pa icles a e
bigge in size ca. 100 nm.
3.2. NiO/TiO
2
Figu e 3 shows he XRD pa e n o he NiO/TiO
2
nanocomposi e om he chi osan p ecu so ,
whe e he ana ase phase and NiO a e obse ed as single phases. Using his me hod, he pu e TiO
2
ana ase phase was ob ained, in con as wi h o he solu ion me hods,
whe e a mix u e o ana ase and
u ile in he NiO/TiO
2
composi e was ob ained [22]. The NiO/TiO
2
composi e shows a “co on” ype
mo phology om he chi osan p ecu so (Figu e 3b), whe eas he mo phology om he PVP
p ecu so p esen s a mo e densi ied s uc u e, as shown in Figu e 3c. The SEM-EDS mapping,
shown in Figu e 2g, indica es an homogeneous dis ibu ion o NiO and TiO
2
. Simila esul s we e
ob ained o he NiO/TiO
2
om he PVP p ecu so (see Supplemen a y Ma e ials, Figu e S2).
The TEM analysis (Figu e 3d,e) p esen s a “spide web” TiO
2
ne wo k whe e he NiO nuclea es
o ming agglome a ed nanopa icles. They p esen a mean pa icle size o 25 nm (Figu e 2 ). A
simila TEM analysis was obse ed o NiO/TiO
2
ob ained om he PVP p ecu so (Figu e S1b and
Supplemen a y Ma e ials, Figu e S2).
Figu e 3. (a) XRD pa e n; (b) SEM image o NiO om chi osan and (c) om PVP; (d,e) TEM images
o NiO om chi osan and ( ) hei his og am; and (g) SEM mapping elemen o NiO om he
chi osan p ecu so .
Figu e 3.
(
a
) XRD pa e n; (
b
) SEM image o NiO om chi osan and (
c
) om PVP; (
d
,
e
) TEM images
o NiO om chi osan and (
) hei his og am; and (
g
) SEM mapping elemen o NiO om he
chi osan p ecu so .
The TEM analysis (Figu e 3d,e) p esen s a “spide web” TiO
2
ne wo k whe e he NiO nuclea es
o ming agglome a ed nanopa icles. They p esen a mean pa icle size o 25 nm (Figu e 2 ).
A simila TEM analysis was obse ed o NiO/TiO
2
ob ained om he PVP p ecu so (Figu e 3b and
Supplemen a y Ma e ials, Figu e S2).
3.3. NiO/Al2O3
Figu e 4a shows he XRD pa e n o he NiO/Al
2
O
3
composi e om he chi osan p ecu so whe e
he co esponding peaks o γ-Al2O3and NiO can be obse ed.
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3.3. NiO/Al
2
O
3
Figu e 4a shows he XRD pa e n o he NiO/Al
2
O
3
composi e om he chi osan
p ecu so
whe e he co esponding peaks o γ-Al
2
O
3
and NiO can be obse ed.
Figu e 4. (a) XRD pa e n o NiO/Al
2
O
3
om he chi osan p ecu so ; (b) SEM image o NiO om
chi osan and (c) om PVP; (d) TEM image o NiO om chi osan and (e) om PVP; ( ) EDS mapping
o NiO om chi osan.
Figu e 4.
(
a
) XRD pa e n o NiO/Al
2
O
3
om he chi osan p ecu so ; (
b
) SEM image o NiO om
chi osan and (
c
) om PVP; (
d
) TEM image o NiO om chi osan and (
e
) om PVP; (
) EDS mapping o
NiO om chi osan.
The e ec o he polyme empla e on he mo phology can be obse ed in Figu e 4b,c. The chi osan
p ecu so induces a “co on” ype mo phology, while he PVP p ecu so also combines dense and
Nanoma e ials 2020,10, 2470 8 o 17
i egula zones. Figu e 4 shows an elemen al mapping image demons a ing ha NiO is well dispe sed
inside Al2O3. A comple e cha ac e iza ion is shown in Supplemen a y Ma e ials, Figu e S3.
As obse ed o he NiO/TiO
2
sys em, he TEM analysis (Figu e 4e) shows a “spide web” ne wo k
o Al
2
O
3
whe e he NiO nuclea es o m agglome a es. The his og am (Supplemen a y Ma e ials,
Figu e S3) shows a pa icle mean size o 17 nm. The HRTEM image o he NiO/Al
2
O
3
om he PVP
p ecu so is shown in Supplemen a y Ma e ials, Figu e 3c, whe e i can be obse ed ha he medium
pa icle size is 32 nm.
3.4. NiO/Na4.2Ca2.8(Si6O18)
The XRD pa e n o he NiO/Na
4.2
Ca
2.8
(Si
6
O
18
) composi e p epa ed om he chi osan p ecu so
indica es he o ma ion o NiO inside he glass Na
4.2
Ca
2.8
(Si
6
O
18
) (see Figu e 5a). The XRD pa e n
is in ag eemen wi h hose epo ed in he li e a u e [
13
–
15
]. The obse ed mo phology is simila o
he one p e iously epo ed [
13
–
15
] (see Figu e 5b,c), also p esen ing a uni o m dis ibu ion o NiO
inside he Na
4.2
Ca
2.8
(Si
6
O
18
) (Figu e 5d). Simila conclusions can be deduced o he PVP p ecu so
(see Supplemen a y Ma e ials, Figu e S4).
Nanoma e ials 2020, 10, x FOR PEER REVIEW 8 o 17
The e ec o he polyme empla e on he mo phology can be obse ed in Figu e 4b,c. The
chi osan p ecu so induces a “co on” ype mo phology, while he PVP p ecu so also combines
dense and i egula zones. Figu e 4 shows an elemen al mapping image demons a ing ha NiO is
well dispe sed inside Al
2
O
3
. A comple e cha ac e iza ion is shown in Supplemen a y Ma e ials,
Figu e S3.
As obse ed o he NiO/TiO
2
sys em, he TEM analysis (Figu e 4e) shows a “spide web”
ne wo k o Al
2
O
3
whe e he NiO nuclea es o m agglome a es. The his og am (Supplemen a y
Ma e ial, Figu e S3) shows a pa icle mean size o 17 nm. The HRTEM image o he NiO/Al
2
O
3
om
he PVP p ecu so is shown in Supplemen a y Ma e ials, Figu e 3c, whe e i can be obse ed ha he
medium pa icle size is 32 nm.
3.4. NiO/Na
4.2
Ca
2.8
(Si
6
O
18
)
The XRD pa e n o he NiO/Na
4.2
Ca
2.8
(Si
6
O
18
) composi e p epa ed om he chi osan p ecu so
indica es he o ma ion o NiO inside he glass Na
4.2
Ca
2.8
(Si
6
O
18
) (see Figu e 5a). The XRD pa e n is
in ag eemen wi h hose epo ed in he li e a u e [13–15]. The obse ed mo phology is simila o he
one p e iously epo ed [13–15] (see Figu e 5b,c), also p esen ing a uni o m dis ibu ion o NiO
inside he Na
4.2
Ca
2.8
(Si
6
O
18
) (Figu e 5d). Simila conclusions can be deduced o he PVP p ecu so
(see Supplemen a y Ma e ials, Figu e S4).
Figu e 5. (a) XRD pa e n o NiO inside Na
4.2
Ca
2.8
(Si
6
O
18
); (b) and (c) SEM images; and (d) EDS
mapping by an elemen o he composi e NiO/Na
4.2
Ca
2.8
(Si
6
O
18
).
Figu e 5.
(
a
) XRD pa e n o NiO inside Na
4.2
Ca
2.8
(Si
6
O
18
); (
b
) and (
c
) SEM images; and (
d
) EDS
mapping by an elemen o he composi e NiO/Na4.2Ca2.8(Si6O18).
Nanoma e ials 2020,10, 2470 9 o 17
A summa y o he medium pa icle sizes o NiO included in o he di e en ma ices is p esen ed
in Table 2, whe e he e ec o he ma ix and ha o he polyme p ecu so s on he inal pa icle sizes
can be obse ed.
Table 2. Nanopa icle size o he composi es.
Composi e P ecu so Fo mula Pa icle Size (nm) Re e ence
NiO Chi osan·NiCl2>50 [17]
NiO PSP-4-PVP·NiCl2>50 [17]
NiO/SiO2Chi osan·NiCl225 This wo k
NiO/SiO2PSP-4-PVP·NiCl2100 This wo k
NiO/TiO2Chi osan·NiCl225 This wo k
NiO/TiO2PSP-4-PVP·NiCl263 This wo k
NiO/Al2O3Chi osan·NiCl230 This wo k
NiO/Al2O3Chi osan·NiCl217 This wo k
NiO/Na4.2Ca2.8(Si6O18) Chi osan·NiCl2No measu ed This wo k
The nanopa icle size o NiO ob ained om he PVP p ecu so inside he ma ices ollow he
o de o SiO
2
>TiO
2
>Al
2
O
3
, while ha o he NiO om he chi osan p ecu so does no p esen a
signi ican e ec on he nanopa icle size.
3.5. Pho oca aly ic Beha io
Al hough he main applied p ope y o NiO is in he ield o elec ochemis y as Li-ion ba e ies [
32
]
and supe capaci o s applica ions, [
33
] i s applica ion as a pho oca aly ic ac i i y owa d o ganic dyes
ha e also been sugges ed [
34
]. In any case, epo s on he pho oca aly ic ac i i y owa d o ganic dyes
using NiO/ma ices a e sca ce. Yu e al. [
6
] ound a highe pho oca aly ic ac i i y o NiO/TiO
2
han o
pu e NiO, owa ds he pho odeg ada ion o p-chlo ophenol. Rega ding he pho oca aly ic e iciency
when using composi es, impo an pa ame e s o be conside ed include he o ma ion o hie a chical
po ous s uc u es, he dispe sion o he ca aly ic semiconduc o on he ma ix su ace, and he p-n
junc ion in a NiO/M
x
O
y
composi e, whe e a new band gap will be o med wi h a mos a o able alue
o he pho odeg ada ion chemical p ocesses.
3.6. NiO
Me hylene blue (MB) is ex ensi ely used as an o ganic dye in colo ing pape , empo a y hai
colo an , dyeing co ons, and coa ing o pape s ock [
35
]. The emo al o his haza dous dye is
conside ed as one o he g owing equi emen s in ecen yea s. The pho oca aly ic expe imen s we e
ca ied on he sample wi h de ini e dye concen a ion unde da k condi ions and UV i adia ion.
The band-gap o he NiO is 5.0 and 5.2 eV, when i is p epa ed om chi osan and PVP p ecu so s,
espec i ely. Fo he semiconduc o me al oxides, hei band gap alue dic a es hei pho oca aly ic
ac i i y [
35
,
36
]. Fo his eason, he band gap o he C
3
–C
8
composi es was de e mined. These alues a e:
5.0, 5.2, and 5.4 eV o he NiO/SiO
2
, NiO/TiO
2
, NiO/Al
2
O
3
composi es, espec i ely, all ob ained om
he chi osan p ecu so s. The alues o he PVP p ecu so a e: 5.5 eV, 5.2 eV o he NiO/SiO
2
, NiO/TiO
2
composi es, espec i ely. Those alues do no change signi ican ly, and a e sligh ly highe han hose
epo ed p e iously, which can be due o hei bigge pa icle sizes [
34
] (see Supplemen a y Ma e ials,
Figu e S5).
The changes in he abso p ion spec a o he MB aqueous solu ion exposed o UV ligh o
a ious imes in he p esence o NiO a e shown in Supplemen a y Ma e ials, Figu e S6. The peak a
655 nm is cha ac e is ic o me hylene blue and dec eases wi h he i adia ion ime. Figu e 6shows
he plo o ime s. concen a ion o me hylene blue measu ed as C/C
o
o NiO a ising om bo h
Nanoma e ials 2020,10, 2470 16 o 17
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