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Development of an intelligent computer vision system for identification, characterization and analysis of yarn quality

Pereira, Filipe Alexandre Sousa

Abstract

Portugal é um país com uma forte tradição da indústria têxtil e, mesmo no contexto de mudanças no mercado, as empresas portuguesas continuam a perseguir o nível de excelência que lhes permite sobreviver num mundo mais complexo e exigente. Na indústria têxtil, a qualidade do produto final está diretamente relacionada com a qualidade do fio e, portanto, é essencial fazer uma avaliação precisa das características de acordo com certos parâmetros predefinidos. Há uma evolução dos dispositivos que avaliam a qualidade do fio, no entanto, ainda têm limitações, como alto custo, dimensão e peso, assim como resolução e precisão limitadas na determinação de certos parâmetros do fio. O objetivo principal desta tese é desenvolver algoritmos de deep learning para identificar e caracterizar a pilosidade do fio, além de criar algoritmos para caracterizar e analisar outros parâmetros de qualidade do fio usando visão computacional. A estratégia foi, em primeiro lugar, projetar um protótipo mecatrónico que permitisse a captura direta de imagens ou vídeos de alta qualidade do enrolamento do fio, e também uma análise e classificação das pilosidades do fio. O protótipo permite obter outras características inerentes à análise da qualidade do fio, como: massa linear, diâmetro, volume, direção da torção, passo da torção, desvio médio de massa, coeficiente de variação, coeficiente de pilosidade, desvio médio de pilosidade e desvio padrão. Esta tese de doutoramento introduz, como uma das principais contribuições, uma nova abordagem de deep learning utilizando um algoritmo otimizado baseado no YOLOv5s6 (You only look once) para caracterizar diferentes tipos de pilosidade do fio. Os resultados mostram que o algoritmo proposto melhora significativamente o desempenho do modelo, com um aumento de 5-6% na métrica mAP0.5 (mean average precision at 0.5 intersection over union (IoU)) e um aumento de 11-12% na métrica mAP0.5:0.95 em comparação com o algoritmo YOLOv5s6 padrão. A abordagem melhora efetivamente todas as métricas analisadas para a caracterização da pilosidade do fio. A implementação bem-sucedida deste trabalho pode aumentar a eficiência produtiva da indústria têxtil e contribuir para a criação de produtos de alto valor acrescentado.

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July 2024 Uni e sidade do Minho Escola de Engenha ia Filipe Alexand e de Sousa Pe ei a De elopmen o an in elligen compu e ision sys em o iden i ica ion, cha ac e iza ion and analysis o ya n quali y De elopmen o an in elligen compu e ision sys em o iden i ica ion, cha ac e iza ion and analysis o ya n quali y Filipe Alexand e de Sousa Pe ei a UMinho | 2024 Filipe Alexand e de Sousa Pe ei a De elopmen o an in elligen compu e ision sys em o iden i ica ion, cha ac e iza ion and analysis o ya n quali y PhD Thesis Doc o al P og am in Elec onics and Compu e s Enginee ing specializing in Con ol, Au oma ion and Robo ics Wo k conduc ed unde he guidance o P o esso Doc o Filomena Ma ia da Rocha Menezes de Oli ei a Soa es P o esso Doc o Ví o Hugo Mendes da Cos a Ca alho P o esso Doc o Rosa Ma ia Cas o Fe nandes Vasconcelos July 2024 i DIREITOS DE AUTOR E CONDIÇÕES DE UTILIZAÇÃO DO TRABALHO POR TERCEIROS Es e é um abalho académico que pode se u ilizado po e cei os desde que espei adas as eg as e boas p á icas in e nacionalmen e acei es, no que conce ne aos di ei os de au o e di ei os conexos. Assim, o p esen e abalho pode se u ilizado nos e mos p e is os na licença abaixo indicada. Caso o u ilizado necessi e de pe missão pa a pode aze um uso do abalho em condições não p e is as no licenciamen o indicado, de e á con ac a o au o , a a és do Reposi ó iUM da Uni e sidade do Minho. Licença concedida aos u ilizado es des e abalho A ibuição CC BY h ps://c ea i ecommons.o g/licenses/by/4.0/ ii ACKNOWLEDGEMENTS I am using his oppo uni y o exp ess my g a i ude o e e yone who suppo ed me h oughou he de elopmen and w i ing o he p esen wo k. I am hank ul o hei aspi ing guidance, in aluably cons uc i e c i icism, and iendly ad ice du ing he p ojec wo k. In pa icula , I would like o gi e my hanks o: o My supe iso P o esso Doc o Filomena Soa es, o he uncondi ional suppo , guidance, and eedom o pu sue my ideas. o My ad iso P o esso Doc o Vi o Ca alho, o his help, ad ice, supe ision, and excellen eedback. He cons an ly allowed his hesis o be my own wo k bu guided me in he igh di ec ion whene e necessa y. All he ad ice and guidance he ga e me was in aluable and I since ely hank him. o My co-supe iso P o esso Doc o Rosa Vasconcelos, o he help, ad ice, supe ision, and excellen eedback. All he ad ice she ga e me was e y impo an . o My o me s uden and colleague Leand o Mon eneg o o his aluable knowledge in machine lea ning. I am e e nally g a e ul o his aluable obse a ions ega ding he wo k ca ied ou . o P o esso Doc o José Mendes Machado o his help, ad ice, supe ision, and excellen eedback. o P o esso Doc o Manuel Ca los Felguei as o his ision and en husiasm, and o sha ing his opinion on aspec s ela ed o he opic. o My pa en s o p o iding uncondi ional suppo and con inued encou agemen h oughou my yea s. o My wi e and child en o hei uncondi ional suppo in he s udy and also in he esea ch and w i ing p ocess o he Thesis. This achie emen would no ha e been possible wi hou hem. FUNDING This wo k has been suppo ed by FCT – Fundação pa a a Ciência e Tecnologia in he scope o he p ojec : UIDB/04077/2020 and UIDB/00319/2020. iii STATEMENT OF INTEGRITY I he eby decla e ha ing conduc ed his academic wo k wi h in eg i y. I con i m ha I ha e no used plagia ism o any o m o undue use o in o ma ion o alsi ica ion o esul s along he p ocess leading o i s elabo a ion. I u he decla e ha I ha e ully acknowledged he Code o E hical Conduc o he Uni e si y o Minho. Uni e si y o Minho, 30 h July 2024 Full name: Filipe Alexand e de Sousa Pe ei a Signa u e: ____________________________________________________________________ i RESUMO Po ugal é um país com uma o e adição da indús ia êx il e, mesmo no con ex o de mudanças no me cado, as emp esas po uguesas con inuam a pe segui o ní el de excelência que lhes pe mi e sob e i e num mundo mais complexo e exigen e. Na indús ia êx il, a qualidade do p odu o inal es á di e amen e elacionada com a qualidade do io e, po an o, é essencial aze uma a aliação p ecisa das ca ac e ís icas de aco do com ce os pa âme os p ede inidos. Há uma e olução dos disposi i os que a aliam a qualidade do io, no en an o, ainda êm limi ações, como al o cus o, dimensão e peso, assim como esolução e p ecisão limi adas na de e minação de ce os pa âme os do io. O obje i o p incipal des a ese é desen ol e algo i mos de deep lea ning pa a iden i ica e ca ac e iza a pilosidade do io, além de c ia algo i mos pa a ca ac e iza e analisa ou os pa âme os de qualidade do io usando isão compu acional. A es a égia oi, em p imei o luga , p oje a um p o ó ipo meca ónico que pe mi isse a cap u a di e a de imagens ou ídeos de al a qualidade do en olamen o do io, e ambém uma análise e classi icação das pilosidades do io. O p o ó ipo pe mi e ob e ou as ca ac e ís icas ine en es à análise da qualidade do io, como: massa linea , diâme o, olume, di eção da o ção, passo da o ção, des io médio de massa, coe icien e de a iação, coe icien e de pilosidade, des io médio de pilosidade e des io pad ão. Es a ese de dou o amen o in oduz, como uma das p incipais con ibuições, uma no a abo dagem de deep lea ning u ilizando um algo i mo o imizado baseado no YOLO 5s6 (You only look once) pa a ca ac e iza di e en es ipos de pilosidade do io. Os esul ados mos am que o algo i mo p opos o melho a signi ica i amen e o desempenho do modelo, com um aumen o de 5-6% na mé ica mAP0.5 ( mean a e age p ecision a 0.5 in e sec ion o e union (IoU)) e um aumen o de 11-12% na mé ica mAP0.5:0.95 em compa ação com o algo i mo YOLO 5s6 pad ão. A abo dagem melho a e e i amen e odas as mé icas analisadas pa a a ca ac e ização da pilosidade do io. A implemen ação bem-sucedida des e abalho pode aumen a a e iciência p odu i a da indús ia êx il e con ibui pa a a c iação de p odu os de al o alo ac escen ado. PALAVRAS-CHAVE: Deep Lea ning , De ei os do Fio, Pilosidades, P ocessamen o de Imagem, Qualidade do Fio. ABSTRACT Po ugal has a s ong adi ion in he ex ile indus y, e en unde he con ex o ma ke and demands changes, he Po uguese companies con inue pu suing he excellence le el ha makes hem su i e in a mo e complex and challenging wo ld. In he ex ile indus y, he quali y o he inal p oduc is di ec ly ela ed o he quali y o he ya n and he e o e i is essen ial o make an accu a e assessmen o he ya n cha ac e is ics, acco ding o ce ain p e-es ablished pa ame e s. The e is a signi ican e olu ion o he de ices ha e alua e he quali y o he ya n, howe e , hese de ices s ill ha e se e al limi a ions such as high cos , la ge dimension, and weigh , as well as limi ed esolu ion and p ecision in de e mining ce ain pa ame e s o he ya n. The main goal o his hesis is o de elop deep lea ning algo i hms o iden i y and cha ac e ize ya n hai iness, as well as o c ea e algo i hms o cha ac e izing and analyzing o he ya n quali y pa ame e s using compu e ision. The s a egy was, i s , o design a mecha onic p o o ype ha allows o he di ec cap u e o high-quali y images o ideos o ya n winding, and also o he analysis and classi ica ion o ya n hai iness. I also allows o ob ain o he cha ac e is ics inhe en o he analysis o he ya n quali y, such as: linea mass, diame e , olume, wis di ec ion, wis s ep, a e age mass de ia ion, coe icien o a ia ion, hai iness coe icien , a e age hai iness de ia ion and s anda d de ia ion. This hesis in oduces, as one o he main achie emen s, a no el deep lea ning app oach using an op imized algo i hm based on YOLO 5s6 (You only look once) o cha ac e ize di e en ypes o ya n hai iness. The esul s show ha he p oposed algo i hm signi ican ly imp o es he model pe o mance, wi h a 5-6% inc ease in mAP0.5 (mean a e age p ecision a 0.5 in e sec ion o e union (IoU)) me ic and an 11-12% inc ease in he mAP0.5:0.95 me ic compa ed o he s anda d YOLO 5s6 algo i hm. The app oach e ec i ely enhances all analyzed me ics o ya n hai iness cha ac e iza ion. The success ul implemen a ion o his wo k can inc ease he p oduc i e e iciency o he ex ile indus y and con ibu e o he de elopmen o high added alue p oduc s. KEYWORDS: Deep Lea ning, Faul s, Hai iness, Image P ocessing, Ya n Quali y. i LIST OF CONTENTS Acknowledgemen s .............................................................................................................................. ii Resumo.............................................................................................................................................. i Abs ac ............................................................................................................................................... Lis o Con en s .................................................................................................................................. i Lis o Figu es ..................................................................................................................................... xi Lis o Tables ..................................................................................................................................... xix Abb e ia ions ..................................................................................................................................... xxi 1. In oduc ion ................................................................................................................................ 1 1.1 F amewo k .......................................................................................................................... 2 1.2 Objec i es ........................................................................................................................... 6 1.3 De elopmen me hodology .................................................................................................. 7 1.4 Main con ibu ions o he wo k ............................................................................................. 8 1.5 Thesis S uc u e ................................................................................................................ 13 2. Theo e ical Concep s ................................................................................................................ 15 2.1 Ya n cha ac e iza ion ......................................................................................................... 16 2.1.1 Linea mass and diame e ......................................................................................... 16 2.1.2 Speci ic olume ......................................................................................................... 17 2.1.3 Hai iness ................................................................................................................... 17 2.1.4 Ya n wis , wis o ien a ion, and wis s ep ................................................................. 18 2.1.5 Types o aul s in ya n ................................................................................................ 19 2.2 S a is ical Pa ame e s o Ya n ............................................................................................ 20 2.2.1 Mean De ia ion o Mass ............................................................................................. 20 2.2.2 Coe icien o Va ia ion ............................................................................................... 20 2.2.3 Hai iness Coe icien .................................................................................................. 20 2.2.4 Hai iness Mean De ia ion .......................................................................................... 21 2.2.5 Hai iness S anda d De ia ion ..................................................................................... 21 2.3 Spec al Analysis ............................................................................................................... 21 2.4 Image P ocessing & Compu e Vision ................................................................................ 22 2.4.1 Uni a y elemen and colo scales ............................................................................... 22 xiii Figu e 59 –Con usion Ma ix o Bina y Classi ica ion [63]. ................................................................ 58 Figu e 60 – An example o he p ecision- ecall cu e [64]. ................................................................. 59 Figu e 61 – An example o he p ecision- ecall cu e [65]. ................................................................. 60 Figu e 62 – An example o he p ecision- ecall cu e [69]. ................................................................. 62 Figu e 63 – Sub- a ian s o YOLO 5 [56]. ......................................................................................... 64 Figu e 64 – Ne wo k s uc u e o YOLO 5s6 - (A): The comple e s uc u e wi h backbone, neck, and head modules. (B, C): Two unique a ia ions o CSP blocks (C3); (D): CBS - Con olu ional Ba ch No maliza ion laye and SILU (sigmoid linea uni s) ac i a ion unc ion; (E): O he blocks wi h CBS; (F) - Two dis inc bo leneck blocks] [76]. .................................................................................................................... 66 Figu e 65 – C3 Module om YOLO 5s6 [76]. ................................................................................... 67 Figu e 66 – SPPF Module om YOLO 5s6 [76]. ................................................................................ 67 Figu e 67 – Schema ic ep esen a ion o he ac i a ion unc ion [79]. ................................................ 68 Figu e 68 - SiLU ac i a ion unc ion [79] . .......................................................................................... 69 Figu e 69 - Ac i a ion unc ion GeLU [80]. ......................................................................................... 71 Figu e 70 - Compa ison o ac i a ion unc ions [81]. .......................................................................... 72 Figu e 71 – YOLO 5s6 Image Augmen a ion [82]. ............................................................................. 73 Figu e 72 - Flowcha o he me hod o de ec ing ya n pa ame e s and e alua ing ya n quali y [83]. .. 77 Figu e 73 - Sys em de ice o de ec ya n pa ame e s [83]. ................................................................ 77 Figu e 74 - a) New o eg ound image, b) ya n co e, c) hai iness [83]. ................................................ 78 Figu e 75 - An example o a ya n image wi h a nep de ec ob ained using he image acquisi ion sys em [87]. ................................................................................................................................................. 79 Figu e 76 - An example o a ya n image wi h a nep de ec ob ained using he image acquisi ion sys em [87]. ................................................................................................................................................. 80 Figu e 77 - Con usion ma ices ha o e insigh s in o he pe o mance o he model sys em [87]. ..... 81 Figu e 78 - Co on ya ns: he a chi ec u e o neu al ne wo k ac ion p ope ies [89]. ......................... 83 Figu e 79 - Blended ya ns: he a chi ec u e o neu al ne wo k ac ion p ope ies [89]. ....................... 83 Figu e 80 - Blended ya ns: he s uc u e o neu al ne wo k ac ion p ope ies [91]. ........................... 84 Figu e 81 - The s uc u al composi ion o he neu al ne wo k, including i s enaci y and elonga ion pe cen ages: (a) Ring ya n sys em (le ), (b) compac ya n sys em ( igh ) [91]. ................................... 84 Figu e 82 - The CVm% neu al ne wo k a chi ec u e o ing-spun and compac ya n sys ems [91] ....... 85 Figu e 83 - The neu al ne wo k a chi ec u es o impe ec ions: a) Ring-spun ya n sys em, b) Compac ya n sys em [91]. ............................................................................................................................. 85 xi Figu e 84 – a) A ya n in g ayscale (le ); b) Image a e linea iza ion using he OTSU algo i hm ( igh ) [97]. ........................................................................................................................................................ 92 Figu e 85 - a) G ay scale image (le ); b) Image wi h Gaussian il e ( igh ) [97]. ................................. 93 Figu e 86 - a) Image p io o he applica ion o he opening mo phological ope a ion (le ); b) Image subsequen o he implemen a ion o he opening mo phological ope a ion ( igh ) [97]. ..................... 93 Figu e 87 - a) Image a e he closing p ocess (le ); b) Isola ed co e image ( igh ) [97]. ..................... 94 Figu e 88 - Isola ed ou lines o he ya n. ............................................................................................ 96 Figu e 89 - Con ou s o he isola ed co e. .......................................................................................... 96 Figu e 90 - Con ou s o he isola ed hai iness. ................................................................................... 97 Figu e 91 - Sepa a ion o pa icles in single cable o ya n. ................................................................. 98 Figu e 92 - Sepa a ion o pa icles in Sepa a ion o pa icles in 2 cables o olded ya ns. .................... 98 Figu e 93 - Image a e he opening p ocess. ..................................................................................... 98 Figu e 94 - Image o isola ed pa icles. .............................................................................................. 99 Figu e 95 – S Viewe so wa e execu able [92]. ............................................................................... 100 Figu e 96 –A ailable pa ame e ca ego ies in S Viewe [92]. ............................................................ 100 Figu e 97 – OMRON STC-MBS163U3V Came a [92]. ...................................................................... 101 Figu e 98 – Lens se al eady equipped wi h a ya n holde [92]. ....................................................... 101 Figu e 99 – Use in e ace [92]. ...................................................................................................... 102 Figu e 100 – Algo i hm Analysis Me hodology Flowcha [92]. ......................................................... 105 Figu e 101 - Imp o ed a chi ec u e based on YOLO 5s6 – YOLO 5s6-Hai iness [76]. ...................... 109 Figu e 102 - The CBG module in he op imized YOLO 5s6-Hai iness [104]. ..................................... 110 Figu e 103 - The CBG module employed in a ious o he blocks [104]. ........................................... 110 Figu e 104 - The CBG module is used in wo di e en ypes o bo leneck blocks [104]. ................... 110 Figu e 105 - Two dis inc ypes o CSP blocks (C3) [104]. ............................................................... 111 Figu e 106 - Di e ence be ween C3_x ( op) and C2 module (bo om) [104]. ................................... 113 Figu e 107 - The a chi ec u e o he Bo -T ans o me block. (a) Bo leneckT ans o me *x signi ies ha a o al o x Bo leneck T ans o me blocks a e s acked, and each Bo leneck T ans o me is depic ed in (b) [104].............................................................................................................................................. 115 Figu e 108 - MHSA Laye used in he Bo - ans o me Block [106]. ................................................. 116 Figu e 109 – V-Model o he Design o a Mecha onic Sys em - VDI 2206 [110]. ............................. 125 Figu e 110 – a) O e end wi hd awal; b) Side wi hd awal [97]. ........................................................ 131 x Figu e 111 – a) Ya n ballooning ep esen a ion; b) Ya n guide posi ion abo e conical package apex ep esen a ion [97]. ........................................................................................................................ 131 Figu e 112 – a) Pa allel package; b) C oss wound package [97]. ..................................................... 132 Figu e 113 – Random winding: a) g oo ed d um; b) ya n guide [97]................................................ 133 Figu e 114 – Illus a ion o p ecision winding [97]. .......................................................................... 133 Figu e 115 – S ep-p ecision winding and depic ion o he luc ua ion in coil angle ac oss phases [97]. ...................................................................................................................................................... 134 Figu e 116 – Illus a ion o a lexible winding sys em [97]. ............................................................... 135 Figu e 117 – Di e en ypes o ce amic ya n guides [97]. ............................................................... 136 Figu e 118 – Ya n guide olle [97]. ................................................................................................ 136 Figu e 119 – Me hods o applying ension o a ya n [97]. ................................................................ 137 Figu e 120 – Ya n ensione s: a) addi i e; b) mul iplica i e; c) mul iplica i e sel -adjus ing (le e ension); d) mul iplica i e sel -adjus ing (ball ension) [97]. ............................................................................ 138 Figu e 121 – Au oma ic ension con ol me hod employing a ya n posi i e o e eed sys em [97]. .... 139 Figu e 122 – F on al schema ic iew o he machine: 1) Box; 2) Bobbin suppo ; 4) Guide suppo ; 6) Bobbin; 9) Fi s posi i e ya n eede (PYF); 11) Second PYF; 12) PYF suppo ; 13) Too hed bel ; 14) Too hed bel ; 19) Came a; 20) Se omo o suppo ; 21) Ring ligh ; 22) Guide suppo on lens; 24) Lens; 26) Came a suppo ; 27) Sliding base se omo o ; 28) Sliding base PYF; 31) Suppo block; 33) G oo ed d um; 34) Fla bel ; 38) G oo ed d um suppo ; 40) Fla pulley; 43) S uc u al beam; 47) Lens suppo ; 49) Ya n guide; 50) Guidance subsys em co e senso [97]. ........................................................... 141 Figu e 123 – Pa h o he ya n du ing winding [97]. ......................................................................... 142 Figu e 124 – Cinema ic chain: 1) Too hed bel and pulley se be ween se omo o and second PYF; 2) Too hed bel and pulley se be ween i s and second PYF; 3) Fla bel and pulley se be ween se omo o and winding subsys em; A Sliding suppo o i s PYF; B Sliding suppo o se omo o [97]. ........... 143 Figu e 125 – Au oma ion sys em ep esen a ion: 1) 2 pole ci cui b eake ; 2) 1 pole ci cui b eake (× 2); 3) Powe socke o ya n illumina ion; 4) Powe supply (24 V DC); 5) Se omo o d i e ; 6) Se omo o ; 7) Posi i e ya n eede 1; 8) ya n unwinding senso elay (24 V DC); 9) Ya n guidance senso elay; 10) Posi i e ya n eede 2; 11) Ya n winding senso elay; 12) Guidance subsys em co e senso ; 13) Eme gency bu on; 14) PLC; 15) Local HMI (Human-Machine In e ace); 16) Local Compu e ; 17) NI OPC Se e ; 18) LabVIEW [97]. .............................................................................................................. 144 Figu e 126 – a) Local HMI loca ion (le ); b) Local HMI sc een o ya n quali y es de ined by ime and eloci y ( igh ) [97]. ........................................................................................................................ 145 x i Figu e 127 – Ya n quali y es sa ed da a [97]. ............................................................................... 146 Figu e 128 – Kinema ic chains ((A) and (B) a e Se omo o s [92]. .................................................. 146 Figu e 129 – Ope a ing Modes Coo dina ion Flowcha . .................................................................. 150 Figu e 130 – Tes p epa a ion mode lowcha . ............................................................................... 153 Figu e 131 – Flowcha o he es mode (pa 1). ........................................................................... 155 Figu e 132 – Flowcha o he es mode (pa 2). ........................................................................... 156 Figu e 133 – Flowcha o he es e mina ion mode. ..................................................................... 158 Figu e 134 – Flowcha o he s op mode (pa 1). .......................................................................... 159 Figu e 135 – Flowcha o he s op mode (pa 2). .......................................................................... 160 Figu e 136 – Flowcha o he manual mode. .................................................................................. 162 Figu e 137 – Ou line o he p ocess o ansla ing G a ce in o Ladde Diag am. .............................. 164 Figu e 138 - Indus ial cloud Talk2M wi h Flexy 205 [120]............................................................... 165 Figu e 139 - P o o ype’s mechanical sys em [97]. ........................................................................... 167 Figu e 140 - Au oma ion sys em’s ha dwa e [97]. ........................................................................... 167 Figu e 141 - Th ee ypes o ya n es ed [92]. ................................................................................... 174 Figu e 142 - Con ou s o he ya n ha ha e been isola ed (Co on ya n wi h an a e age linea mass o 56.4 ex) [92]. ................................................................................................................................. 177 Figu e 143 - Image o pu ple h ead wi h isola ed pa icles. ............................................................. 178 Figu e 144 - Mass spec og am by p o o ype [92]. .......................................................................... 183 Figu e 145 - Mass spec og am g aph gene a ed by he USTER TESTER 3 [92]. .............................. 183 Figu e 146 – Hai iness spec og am by p o o ype [92]. ................................................................... 184 Figu e 147 - Hai iness spec og am g aph gene a ed by he USTER TESTER 3 [92]. ........................ 184 Figu e 148 - Anno a ions in a ya n image we e made using LabelME, wi h loop ibe s ma ked in g een and p o uding ibe s ma ked in ed. The image is o co on ya n wi h an a e age linea mass o 56.4 ex and a magni ica ion ac o o 20x. ................................................................................................... 185 Figu e 149 - Visualiza ion o he da ase includes: (a) The numbe o anno a ions pe class; (b) Visualiza ion o he loca ion and size o each bounding box; (c) The s a is ical dis ibu ion o he bounding box posi ions; (d) The s a is ical dis ibu ion o he bounding box sizes. ............................................ 187 Figu e 150 - An example o a ya n image wi h he p esence o loop ibe s and a con using appea ance. This image is o co on ya n wi h an a e age linea mass o 56.4 ex, aken wi h a magni ica ion ac o o 20x. ............................................................................................................................................... 188 x ii Figu e 151 - Da a augmen a ion o he da ase used in he s udy (Co on ya n wi h an a e age linea mass o 56.4 ex, wi h a magni ica ion ac o o 20x). ............................................................................... 189 Figu e 152 – Numbe o epochs - mAP_0.5. ................................................................................... 191 Figu e 153 – Numbe o epochs - mAP_0.5:0.95. ........................................................................... 192 Figu e 154 – Numbe o epochs - p ecision. .................................................................................... 192 Figu e 155 – Numbe o epochs - ecall. ......................................................................................... 193 Figu e 156 – Va ious alues o lea ning a e in Yolo 5s6 – Hai iness Imp o ed - mAP_0.5. ............. 195 Figu e 157 – Va ious alues o lea ning a e in Yolo 5s6 – Hai iness Imp o ed - mAP_0.5:0.95. ..... 195 Figu e 158 – Va ious alues o lea ning a e in Yolo 5s6 – Hai iness Imp o ed - mAP_0.5. ............. 196 Figu e 159 – Va ious alues o lea ning a e in Yolo 5s6 – Hai iness Imp o ed - mAP_0.5. ............. 196 Figu e 160 - Pe o mance me ics o he YOLO 5s6-Hai iness app oach. ........................................ 199 Figu e 161 - Pe o mance me ics o he p oposed YOLO 5s6-Hai iness app oach. ......................... 200 Figu e 162 - Pe o mance me ics o he p oposed YOLO 5s6-Hai iness app oach. ......................... 202 Figu e 163 - P oposed YOLO 5s6-Hai iness a chi ec u e app oach. ................................................. 211 Figu e 164 - Tes esul s compa ing he p oposed op imized YOLO 5s6-Hai iness ( igh image) wi h he de aul YOLO 5s6 (le image) a a 0.2 con idence h eshold (Co on ya n wi h an a e age linea mass o 56.4 ex, magni ied by a ac o o 20x). ........................................................................................... 212 Figu e 165 - Tes esul s compa ing he p oposed op imized YOLO 5s6-Hai iness ( igh image) wi h he de aul YOLO 5s6 (le image) a a 0.3 con idence h eshold (Co on ya n wi h an a e age linea mass o 56.4 ex, magni ied by a ac o o 20x). ........................................................................................... 213 Figu e 166 - Tes esul s compa ing he p oposed op imized YOLO 5s6-Hai iness ( igh image) wi h he de aul YOLO 5s6 (le image) a a 0.5 con idence h eshold (Co on ya n wi h an a e age linea mass o 56.4 ex, magni ied by a ac o o 20x). ........................................................................................... 213 Figu e A.1-1 - Field o View Visualiza ion [128] ................................................................................ 241 Figu e A.2-1 - Highe Hie a chy G a ce - Coo dina ion o Ope a ing Modes [128] ............................. 243 Figu e A.2-2 - G a ce A – Pa 1 ..................................................................................................... 244 Figu e A.2-3 - G a ce A – Pa 2 ..................................................................................................... 245 Figu e A.2-4 - G a ce A – Pa 3 ..................................................................................................... 245 Figu e A.2-5 - G a ce B .................................................................................................................. 246 Figu e A.2-6 - G a ce A - Tes Mode ................................................................................................ 246 Figu e A.2-7 - G a ce B - Tes Mode – Pa 1 .................................................................................. 247 Figu e A.2-8 - G a ce B - Tes Mode – Pa 2 .................................................................................. 247 x iii Figu e A.2-9 - G a ce C - Tes Mode ................................................................................................ 248 Figu e A.2-10 - G a ce o Tes Te mina ion Mode – Pa 1 .............................................................. 249 Figu e A.2-11 - G a ce o Tes Te mina ion Mode – Pa 2 .............................................................. 250 Figu e A.2-12 - G a ce o Tes Te mina ion Mode – Pa 3 .............................................................. 251 Figu e A.2-13 - G a ce o S op Mode – Pa 1 ................................................................................. 252 Figu e A.2-14 - G a ce o S op Mode – Pa 2 ................................................................................. 253 Figu e A.2-15 - Manual Mode G a ce – G a ce A – Pa 1 ............................................................... 254 Figu e A.2-16 - Manual Mode G a ce – G a ce A – Pa 2 ............................................................... 254 Figu e A.2-17 - Manual Mode G a ce – G a ce A – Pa 3 ............................................................... 255 Figu e A.2-18 - Manual Mode G a ce – G a ce A – Pa 4 ............................................................... 255 Figu e A.2-19 - Manual Mode G a ce – G a ce C ............................................................................ 255 Figu e A.3-1- Highe Hie a chy G a ce - Coo dina ion o Ope a ing Modes ....................................... 256 Figu e A.3-2 - G a ce o Tes Mode - G a ce A – Pa 1 ................................................................... 256 Figu e A.3-3 - G a ce o Tes Mode - G a ce A – Pa 2 ................................................................... 257 Figu e A.3-4 - G a ce o Tes Mode - G a ce A – Pa 3 ................................................................... 258 Figu e A.3- 5 - G a ce o Tes Mode - G a ce A – Pa 4 .................................................................. 258 Figu e A.3- 6 - G a ce o Tes Mode - G a ce A – Pa 3 .................................................................. 258 Figu e A.3- 7 - G a ce o Tes Mode - G a ce C ............................................................................... 259 Figu e A.3- 8 - G a ce o S op Mode – Pa 1 .................................................................................. 259 Figu e A.3- 9 - G a ce o S op Mode – Pa 2 .................................................................................. 260 Figu e A.3- 10 - G a ce o Manual Mode ......................................................................................... 261 Figu e A.4- 1 - P ede ined sc eens o HMI ins alled on he machine body – Pa 1 .......................... 262 Figu e A.4- 2 - P ede ined sc eens o HMI ins alled on he machine body – Pa 2 .......................... 263 Figu e A.4- 3 - P ede ined sc eens o HMI ins alled on he machine body – Pa 3 .......................... 264 Figu e A.4- 4 - P ede ined sc eens o HMI ins alled on he machine body – Pa 4 .......................... 265 Figu e A.4- 5 - P ede ined sc eens o HMI ins alled on he machine body – Pa 5 .......................... 265 Figu e A.5- 1 - LabVIEW in e ace - Local compu e .......................................................................... 266 xix LIST OF TABLES Table 1 - A Compa ison o Cha ac e is ics Be ween P e iously P oposed Sys ems [92] ...................... 86 Table 2 - Came a echnical speci ica ions (Adap ed om [92]). ........................................................ 101 Table 3 - P ojec Pe o mance Speci ica ions ................................................................................... 128 Table 4 - Mo phological cha - g een cells: solu ions adop ed in he inal p o o ype [97]. ................. 140 Table 5 - A Compa ison o Cha ac e is ics Be ween P e iously P oposed Sys ems and he Case S udy [92] ................................................................................................................................................ 168 Table 6 - Resul s ob ained om he USTER TESTER 3 equipmen [92]............................................. 175 Table 7 - Pu ple Co on Ya n Image Analysis Resul s. ...................................................................... 175 Table 8 - Yellow Co on Ya n Image Analysis Resul s. ....................................................................... 176 Table 9 - Image Analysis Resul s o Whi e Polyes e Ya n. ................................................................ 176 Table 10 - Resul s o he ideo analysis o 1km o pu ple co on. .................................................... 180 Table 11 - Classi ica ion o he da ase based on a ious expe imen al condi ions - wi hou using da a augmen a ion echniques [113]. ..................................................................................................... 186 Table 12 - The de elopmen en i onmen . ....................................................................................... 189 Table 13 - So wa e ools en i onmen . ........................................................................................... 190 Table 14 - Pa ame e s se ings o he aining con igu a ion. ............................................................ 190 Table 15 - Pa ame e s se ings o he aining con igu a ion. ............................................................ 193 Table 16 - Pa ame e s se ings o he lea ning a e aining con igu a ion in Yolo 5s6 – Hai iness Imp o ed algo i hm. ....................................................................................................................................... 194 Table 17 - Pa ame e s se ings o he aining con igu a ion. ............................................................ 198 Table 18 - Pe o mance me ics inc ease (%) o he op imized YOLO 5s6-Hai iness algo i hm wi h augmen a ion and he YOLO 5s6 De aul model wi h augmen a ion. ................................................ 198 Table 19 - Me ics compa a ion esul s be ween YOLO 5s6 De aul wi h da a Augmen a ion and imp o ed YOLO 5s6-Hai iness wi h C2 and Bo -T ans o me Module. ............................................................ 204 Table 20 - Pe o mance compa ison o in oducing he C2 module in he di e en loca ions o he algo i hm. ....................................................................................................................................... 205 Table 21 - Me ics compa a ion esul s be ween Ac i a ion Func ions wi h da a Augmen a ion. ......... 206 Table 22 - Imp o ed YOLO 5s6 wi h ac i a ion unc ion GeLU. ........................................................ 207 Table 23 - Pe o mance compa ison o di e en head numbe s o MHSA. ........................................ 208 Table 24 - Pe o mance compa ison o di e en High Hype pa ame e s wi h YOLO 5s6 De aul . ...... 209 xx Table 25 - Pe o mance me ics compa ison be ween p oposed op imized YOLO 5s6-Hai iness and o he models wi h da a Augmen a ion. ..................................................................................................... 212 Table 26 - k- old C oss Valida ion wi h k = 10 in op imized YOLO 5s6-Hai iness wi h Augmen a ion.. 214 xxi ABBREVIATIONS ADAM Adap i e Momen Es ima ion ANN A i icial Neu al Ne wo k C2F Coa se o Fine CV Compu e Vision DL Deep Lea ning ELAN E icien Laye Agg ega ion Ne wo k GELU Gaussian E o Linea Uni HMI Human Machine In e ace HSV Hue Sa u a ion Value IP Image P ocessing MAE Mean Absolu e E o PLC P og ammable Logic Con olle RELU Rec i ied Linea Uni R-CNN Region Con olu ional Neu al Ne wo k R-FCN Region Fully Con olu ional Ne wo k RGB Red G een Blue SCADA Supe iso y Con ol and Da a Acquisi ion SGD S ochas ic G adien Descen SILU Sigmoid Linea Uni s SPPF Spa ial Py amid Pooling Fas TEX Linea Mass o Ya n YOLO You Only Look Once 1. INTRODUCTION O e iew This chap e p esen s he amewo k and impo ance o he ya n quali y analysis p oblem unde s udy. The objec i es o he wo k a e highligh ed, along wi h he de elopmen me hodology and he scien i ic con ibu ions o he wo k. Finally, he s uc u e o his hesis is p esen ed. 1.1 F amewo k 1.2 Objec i es 1.3 De elopmen me hodology 1.4 Main con ibu ions o he wo k 1.5 Thesis s uc u e Chap e 1 – In oduc ion ___________________________________________________________________________ 8 To answe he esea ch ques ions, he me hod used was quan i a i e, since eadings, measu emen s and compa isons o esul s we e ca ied ou ega ding he quali y and pe o mance o he sys em de eloped h oughou he a ious esea ch s ages [14]. Da a collec ion occu ed h ough he p oposed sys em de eloped. Thus, he quan i a i e me hod was conside ed he mos app op ia e because i was in ended o de e mine and e alua e he con inuous imp o emen o he de eloped p oposed sys em. Based on an inno a i e esul , whe e he e was a ans e o knowledge o echnology, g ounded on a eal con ex , an ac ion esea ch s a egy was adop ed [15]. To e alua e he pe o mance o he sys em de eloped, quan i a i e da a was used, and compa isons we e made wi h exis ing sys ems on he ma ke and e e ence sys ems in he ex ile indus y. 1.4 Main con ibu ions o he wo k The scien i ic con ibu ions achie ed while de eloping his wo k a e: 1. De elopmen /op imiza ion o ya n cha ac e iza ion me hods: • Inno a i e Me hodology: This wo k in oduces an inno a i e me hodology ha o e s a mo e p ecise me hod o examining/de e mining de ec s in ya n, pa icula ly ocusing on ya n hai iness. • Deep Lea ning: Deep lea ning was in eg a ed in o he exis ing algo i hms o he de ec ion and au oma ic classi ica ion o ya n hai iness ypes. This in eg a ion subs an ially enhanced he accu acy and classi ica ion capabili ies o he algo i hms. • Enhancemen s in Algo i hm Design: The de eloped algo i hm, YOLO 5s6 (You Only Look Once – e sion 5, model s6) - Hai iness [16], in oduced se e al key enhancemen s, including he in eg a ion o he C2 (coa se o ine) unc ion, a Bo - T ans o me module, he adop ion o he GeLU (Gaussian E o Linea Uni ) ac i a ion unc ion, and ine- uning o hype pa ame e s. These imp o emen s aimed o add ess scale, con ex ual challenges, cap u e spa ial in o ma ion, unde s and complex ela ionships wi hin images, and e ine he aining da a o be e pa e n cap u e. • Pe o mance Imp o emen : Expe imen al esul s showcased an inc eased pe o mance wi h he p oposed YOLO 5s6-Hai iness algo i hm. I ou pe o med he o iginal YOLO 5, demons a ing a 5-6% imp o emen in he mAP0.5 (mean A e age Chap e 1 – In oduc ion ___________________________________________________________________________ 9 P ecision a 0.5 In e sec ion o e Union (IoU)) me ic and an 11-12% inc ease in mAP0.5:0.95 me ic. This pe o mance enhancemen es ablishes i as a mo e e icien and high-pe o ming neu al ne wo k o ya n hai iness de ec ion, pa icula ly excelling in de ec ing complex classes like loop ibe s. 2. Ya n image da ase : • Da ase C ea ion: The da ase c ea ion p ocess was comple e and me iculous, consis ing o 684 images speci ically cap u ed o ya n hai iness analysis. These images we e anno a ed and classi ied in o wo ca ego ies: p o uding ibe s and loop ibe s. The numbe o anno a ions (11037) and images (684) p o ides a ich esou ce o aining and alida ing deep lea ning algo i hms o ya n de ec classi ica ion. • Anno a ion and Classi ica ion Me hodology: U iliza ion o LabelME so wa e [17], [18] in polygonal mode acili a ed p ecise anno a ion o loop ibe s (ma ked in g een) and p o uding ibe s (ma ked in ed) in he da ase images. This allowed o me iculous labeling, esul ing in an a e age o 16.1 anno a ions pe image. Addi ionally, he spli o he da ase in o aining (70%), alida ion (20%), and es (10%) se s ensu es a obus e alua ion o he model's pe o mance wi hou he use o augmen a ion echniques. • Visualiza ion and S a is ical Analysis o he Da ase : The da ase cha ac e iza ion p o ides comp ehensi e insigh s in o he dis ibu ion o anno a ions, bounding box posi ions, sizes, and s a is ical in o ma ion ega ding loop and p o uding ibe s. Visualiza ions o hai iness o e a clea unde s anding o he di e si y in bounding box posi ions and sizes, essen ial o aining models o ecognize objec s wi h a ying cha ac e is ics and placemen s. • Imbalance Iden i ica ion and Add essing: The da ase analysis highligh ed an imbalance be ween loop ibe s and p o uding ibe s. The complexi y o loop ibe s, hei di e se appea ances, sizes, and occlusions con ibu e o he challenges in de ec ion. This insigh can guide u u e esea ch o ocus on echniques ha speci ically add ess he complexi ies associa ed wi h de ec ing loop ibe s. • Da a Augmen a ion Techniques: To add ess he challenges iden i ied, da a augmen a ion echniques we e employed using a ious such as lipping, sa u a ion adjus men , blu , and noise addi ion we e applied o augmen he da ase , esul ing in an expanded da ase o 1644 images. This augmen ed da ase p o ides a di e se ange o image a ia ions o obus model aining and e alua ion. Chap e 1 – In oduc ion ___________________________________________________________________________ 10 • Da ase as a Pla o m o Imp o emen s: This da ase , anno a ed wi h 11037 de ailed ma kings ac oss 684 images, p esen s a aluable esou ce. I no only acili a es he de elopmen o mo e obus machine lea ning models speci ically designed o ya n hai iness de ec ion bu also opens pa hs o ad ancing he ield o deep lea ning in ex ile sciences. By p o iding clea anno a ions, s a is ical insigh s, and di e se augmen a ion echniques, his da ase s ands as a esou ce o u u e esea ch in ex ile enginee ing os e ing ad ancemen s in he analysis and unde s anding o ex ile de ec s. 3. De elopmen o algo i hms o image acquisi ion, p ocessing, and analysis: • Inno a i e Image Cap u e: The algo i hms enable he cap u e o in-mo ion images o he ya n p oduc ion p ocess, a capabili y no p e iously a ailable in exis ing comme cial sys ems. This ad ancemen may p o ide a dynamic and con inuous iew o he ya n p oduc ion p ocess. • Ad anced Image P e-p ocessing: The algo i hms inco po a e ad anced p e- p ocessing echniques o enhance he quali y o cap u ed images. This includes dis o ion co ec ion, noise elimina ion, and con as imp o emen , ensu ing p ecise da a collec ion o subsequen analysis. • Segmen a ion and De ec ion: The algo i hms can p ecisely segmen speci ic a eas o in e es in ya n images, such as he iden i ica ion and di e en ia ion o loop ibe s, p o uding ibe s, o o he cha ac e is ics, enabling accu a e de ec ion and analysis o hese a eas. • Spec al Analysis: Pe o ms spec al analysis based on ya n linea mass a ia ion and hai iness da a, u ilizing he Fas Fou ie T ans o m (FFT) o iden i y pe iodical i egula i ies in ya n. Resul s a e a ailable in he use in e ace. The echnological con ibu ions achie ed while de eloping his wo k a e: 1. De elopmen o a mecha onic de ice: • De elopmen o an Au oma ic Unwinding and Winding Sys em: This sys em in oduces an inno a i e app oach by c ea ing an au oma ic unwinding and winding sys em aimed a e i ying ya n quali y h ough image p ocessing. This non-des uc i e p o o ype allows o he ya n winding and unwinding wi hou damaging he ya n/bobbins. I has he abili y o accu a ely mo e he ya n in on o he came a lens, minimizing Chap e 1 – In oduc ion ___________________________________________________________________________ 11 ib a ions and suppo ing di e en ypes o ya n and bobbins wi hou causing any des uc i e e ec s o hem. • Enhanced Ve sa ili y and Po abili y: Unlike exis ing comme cial ya n quali y es ing machines ha a e la ge, complex, and expensi e, non-des uc i e p o o ype o e s enhanced e sa ili y and po abili y (weighs less han 30 kg and i s wi hin a compac box o less han 0.27 m³). I s design acili a es he es ing o a ious ypes o ya ns and bobbins wi h diame e s up o 160mm (ob ained in p ojec pe o mance speci ica ions), enabling ex ile companies o conduc on-si e analysis wi hou elying on ex e nal labo a o ies. • Moni o ing and Da a S o age: The sys em p o ides an in ui i e local Human- Machine In e ace (HMI) ha allows use s o con ol ya n quan i y and eloci y. I enables moni o ing and s o age o da a, ensu ing he access o s a is ical in o ma ion and assu ing use sa e y and sys em secu i y. • Image Analysis o Mo e Pa ame e s: Th ough he applica ion o image analysis echniques, he non-des uc i e p o o ype allows he analysis o mo e pa ame e s compa ed o exis ing comme cial al e na i es. Addi ionally, he p oposed sys em cap u es images and ideos in mo ion and collec s pa ame e s like numbe o cables, wis s ep, wis o ien a ion, and loose ibe s – ea u es which a e no p esen in he exis ing sys ems. • Inco po a ion o Mecha onic P inciples: The design and unc ioning o he sys em in ol es mecha onic p inciples, combining mechanical, au oma ion, and elec onic enginee ing aspec s o suppo he analysis o ya n quali y. I in eg a es a con ol sys em ha synch onizes ya n mo emen , main aining s abili y, and ensu ing accu acy du ing he unwinding and winding p ocesses. • Imp o ed Sys em Con ol and Use In e ac ion: The con olle a chi ec u e o he sys em inco po a es a P og ammable Logic Con olle (PLC) o sys em con ol o p o ide e icien and use - iendly ope a ion. Addi ionally, i includes a Supe iso y Con ol and Da a Acquisi ion (SCADA) sys em wi h a Local Human Machine In e ace (HMI) o moni o ing, sys em a iable con ol, and immedia e no i ica ion o signi ican e en s, such as eme gency, se omechanism anomaly, ya n b eak/absence. Chap e 1 – In oduc ion ___________________________________________________________________________ 12 2. Enhanced Ya n Analysis Capabili ies: • Acquisi ion o Va ious Ya n Pa ame e s: Facili a es acquisi ion o a ious ya n pa ame e s like diame e , linea mass, olume, wis di ec ion, wis s ep, numbe o cables, hai iness index, loose ibe s, hin places (-50%), hick places (+50%), neps (+200%), U (%), CV (%), and sH (%) – e en in mo ion, a ea u e absen in exis ing comme cial sys ems. • Cus omizable Analysis: Allows use s o ailo analysis pa ame e s (ya n ma e ial, dimensional ole ance, numbe o ya n sec ions). • Da a Collec ion and S o age: Collec s and s o es comp ehensi e da a o u u e s a is ical p ocessing. • Image and Video Visualiza ion: Allows isualiza ion o bo h images and ideos unde analysis. • Use Moni o ing o Image P ocessing Ope a ions: P o ides use moni o ing o image p ocessing ope a ions. 3. De elopmen o an applica ion o epo gene a ion: The p oposed sys em includes an applica ion ha p o ides s a is ical da a and gene a es comp ehensi e epo s. This applica ion plays a undamen al ole bo h in p ac ical use by he use and o u u e use in ex ile companies, o e ing access o s a is ical in o ma ion and acili a ing in o med decision-making. These unc ionali ies enhance he usabili y o he sys em, suppo ing e icien quali y con ol wi h he po en ial in op imizing he p oduc ion p ocesses wi hin he ex ile indus y. In summa y, scien i ic con ibu ions ocus on deep lea ning algo i hms (YOLO 5s6-Hai iness) and he build o a. ya n image da ase . Technological con ibu ions ocus on he de elopmen o a mecha onic de ice, and p ac ical applica ions ha enable he e ec i e implemen a ion o hese echnologies aiming o imp o e he quali y o he inal p oduc in he ex ile indus y. Bo h ypes o con ibu ions can ha e a signi ican impac in he indus y. Chap e 1 – In oduc ion ___________________________________________________________________________ 13 1.5 Thesis S uc u e This hesis is s uc u ed in o eigh chap e s. The second chap e , Theo e ical Concep s, p esen s he ex ile heo e ical concep s and he deep lea ning concep s o unde s and he wo k. The hi d chap e , Li e a u e Re iew, encompasses a li e a u e e iew in which a su ey o esea ch p ojec s cen e ed on he analysis o ya n is conduc ed. This chap e is subdi ided in o h ee pa s, he i s p esen ing a s a e o he a o sys ems ha use image p ocessing, compu e ision and a i icial in elligence, he second pa p esen ing a compa ison be ween he a ious sys ems and he hi d pa a c i ical e iew analysis. The ou h chap e , Image P ocessing and Compu e Vision Sys em o Ya n Analysis, p esen s he echniques used in he de eloped sys em ega ding image p ocessing and compu e ision o ya n analysis. Fu he mo e, he chap e del es in o he ha dwa e employed o image acquisi ion, alongside a desc ip ion o he in e ace so wa e de eloped. The i h chap e , Deep Lea ning Techniques o Ya n Hai iness Analysis, desc ibes he deep lea ning echniques used o analyzing and classi ying ya n hai iness. To his end, he imp o ed a chi ec u e o he YOLO 5s6 neu al ne wo k is p esen ed, including a speci ic discussion o he composi ion o he modules wi h an emphasis on he modi ied blocks. The six h chap e , Mecha onic P o o ype De elopmen , p esen s he design o he mecha onic p o o ype and he de ails o each pa ha cons i u es i , as well as he es s and esul s ob ained. In he se en h chap e , Expe imen al Resul s and Discussion, he expe imen al e i ica ion is p esen ed, and he esul s ob ained a e discussed, including a de ailed analysis o he c ea ed da ase and he e ec s o he changes implemen ed in he p oposed neu al ne wo k. The eigh h chap e , Conclusions and Fu u e Wo k, p esen s he main conclusions o he s udy, as well as some p oposals o u u e s eps, wi h he aim o con inuing he wo k, which may allow new lines o in es iga ion and/o possible echnological de elopmen s. Summa y o he chap e : This chap e p o ided an o e iew o he esea ch de eloped, as well as i s ele ance o socie y, which se ed as he mo i a ion behind his wo k. In his chap e , he me hodology ha aligns wi h he Chap e 1 – In oduc ion ___________________________________________________________________________ 14 esea ch ques ions was p esen ed, ollowing a posi i is philosophy wi h a deduc i e app oach. Roo ed in an inno a i e ou come wi h knowledge ans e o echnology wi hin a eal-wo ld con ex , an ac ion esea ch s a egy is adop ed. This s a egy in ol es an ac i e dynamic, aimed a achie ing he desi ed p o o ype, and quan i a i e da a was used o assess he pe o mance o he sys em. In his chap e , he amewo k, objec i es, de elopmen me hodology, p ima y scien i ic/ echnological con ibu ions o he wo k, and he s uc u e o he hesis we e p esen ed. 2. THEORETICAL CONCEPTS O e iew In his chap e , an o e iew o ya n cha ac e iza ion pa ame e s is p esen ed, p o iding a heo e ical ounda ion o unde s and he de eloped sys em. Addi ionally, a i icial in elligence concep s and he deep lea ning p inciples necessa y o comp ehending hei applica ion wi hin he wo k a e discussed. 2.1 Ya n Cha ac e iza ion 2.2 S a is ical Pa ame e s o Ya n 2.3 Spec al Analysis 2.4 Image P ocessing & Compu e Vision 2.5 Deep Lea ning Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 16 2.1 Ya n cha ac e iza ion This subchap e co e s a ious aspec s o ya n p ope ies, including linea mass, diame e , speci ic olume, hai iness, wis o ien a ion and s ep, de ec s, as well as se e al s a is ical pa ame e s [19], [20], [21], [22]. 2.1.1 Linea mass and diame e The connec ion be ween he diame e o a ya n and i s linea mass ep esen s a c ucial basis in ya n analysis, o e ing a simpli ied way o cha ac e iza ion. When he ya n assumes a cylind ical o m, i is geome ically es ablished ha he ya n diame e is di ec ly ela ed o he squa e oo o i s linea mass [19], [20], [21], [22], [23]. Figu e 2 p o ides a isual ep esen a ion o a ya n con igu a ion, demons a ing he obse able co ela ion be ween hese wo pa ame e s. Figu e 2 - Ya n con igu a ion [19]. The linea mass is exp essed in ex (g/km), and can be de e mined by Equa ion 1 [19], [20], [21], [22], [23]: 𝑡𝑒𝑥= 𝜙× 𝜌 × 𝜋 (𝑑 2)2×105 ↔𝑑= √4 × 𝑡𝑒𝑥/(𝜋× 105×𝜙×𝜌) (1) Whe e: • d is he ya n diame e (cm); • ex is he linea mass o he ya n (g/km); • ϕ is he po osi y; • ρ is he densi y o he ya n ma e ial (exp essed in g/cm3). Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 17 2.1.2 Speci ic olume The a angemen o he ibe s is e lec ed in he speci ic olume o he ya n, which is de e mined by he olume occupied by he ibe s and he in e s i ial spaces be ween hem, as depic ed in Equa ion 2 [19], [20], [21], [22], [23]: 𝑉𝑡=𝜋 𝑅2 𝑁 10−5 (2) whe e: • R is he ya n adius (mm); • N is he linea mass o he ya n (g/km); • V is he speci ic olume (cm3/g). 2.1.3 Hai iness Hai iness occu s when ce ain ibe s ex end ou wa d om he main body o he ya n, esul ing in some ibe s o ming loops and/o p o uding om he ya n co e. This p ope y signi ican ly impac s he appea ance, ex u e, and usabili y o he ex ile, making i a c i ical ac o o he inal p oduc quali y. De ec ing and measu ing his pa ame e equi es a complex analysis and gene ally canno be de ined by a single indica o . Typically, i is assessed by conside ing he numbe o ibe s ex ending beyond he ya n co e pe uni leng h. Fu he mo e, measu ing hai iness allows o he quan i ica ion o a ious s a is ical pa ame e s essen ial o cha ac e izing ya n quali y and, consequen ly, he ab ics quali y. These pa ame e s include, bu a e no limi ed o, he s anda d de ia ion o hai iness, hai iness index, and hai iness mean de ia ion. Figu e 3 p o ides a isual ep esen a ion o hese ibe s along he ya n, which can be u he ca ego ized in o p o uding ibe s and loop ibe s (hai iness wound a ound he ya n body) [19], [20], [21], [22]. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 24 Figu e 9 – Example o a complex colo in he RGB scale [32]. The HSV scale is also an addi i e polych oma ic scale whe e pixels a e g ouped in ios. Howe e , unlike RGB, each pixel ep esen s one o h ee colo p ope ies: hue, sa u a ion, and b igh ness [33], [34], [35]. • Hue: alue de e mines he ype o colo being ep esen ed (g een, ed, o ange, pu ple, e c.). • Sa u a ion: indica es how i id o in ense he colo will be. Fo ins ance, a sa u a ion alue o 255 wi h a ed hue ep esen s a ib an and p onounced ed, while a alue o 50 displays a mo e mu ed ed. • Value: de e mines how ligh o da k he ep esen ed colo will be. A high alue, o example, ep esen s a ligh e shade o ed, while a lowe alue indica es a da ke ed [33], [34], [35]. Figu e 10 p o ides a isual ep esen a ion o his scale. Figu e 10 – Visual ep esen a ion o he HSV scale [34]. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 25 2.4.2 Logic Ope a ions To begin analyzing image p ocessing ope a ions, one o he s a ing poin s can be logical ope a ions. These ope a ions aim o compa e wo images o equal size and subsequen ly combine hem in o a single image. The e a e wo main g oups o logical ope a ions: a i hme ic ope a ions and compa ison ope a ions. A i hme ic ope a ions aim o c ea e a esul ing image ha is he esul o adding o sub ac ing he elemen s p esen in wo ini ial images. These ope a ions in ol e pai ing he co esponding pixels in he wo images ha occupy he same posi ion, and hese pixel pai s a e hen summed o sub ac ed o ob ain he inal image [36]. Figu e 11 p o ides examples o sub ac ion and addi ion, espec i ely. Figu e 11 – Examples o image sub ac ion and addi ion [36]. These ope a ions can se e a ious pu poses, bu he mos common use is o enhance o elimina e speci ic aspec s o an image. Fo ins ance, when iden i ying changes be ween wo images in a ideo, a commonly used p ocess in ol es sub ac ing hese wo images. This esul s in an image ha highligh s only he di e ences be ween he pai o images, as exempli ied in Figu e 12. Figu e 12 – Example o using sub ac ion o highligh changes [36]. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 26 Compa ison ope a ions, on he o he hand, aim o compa e aspec s be ween a pai o images and gene a e a esul ing image ha combines he wo o iginals in a ious ways. These ope a ions a e mos ly used wi h bina y pixel alue images, i.e., black (1) and whi e (0). The mos common ypes o compa isons a e: • "AND" Compa ison: Compa es he wo images and c ea es an image whe e he only pixels wi h a alue o 1 a e hose ha ha e his alue in bo h images, assigning a alue o 0 o hose ha ha e i in only one o he images (Figu e 13) [36]. Figu e 13 – "AND" compa ison demons a ion [36]. • "OR" Compa ison: Compa es he wo images and c ea es an image whe e he pixels wi h a alue o 1 a e hose ha ha e his same alue in a leas one o he o iginal images (Figu e 14) [36]. Figu e 14 – "OR" compa ison demons a ion [36]. • "XOR" Compa ison: Pe o ms an ope a ion simila o he "OR" compa ison; howe e , all pixels wi h a alue o 1 in bo h compa ed images will ha e a alue o 0 in he esul ing image (Figu e 15) [36]. Figu e 15 – "XOR" compa ison demons a ion [36]. The e is also an ope a ion ha , while no belonging o he compa ison g oup, is commonly used in conjunc ion wi h hem. This ope a ion is in e sion o "NOT," whe e all pixels in an image ake he Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 27 opposi e alue, i.e., all pixels wi h a alue o 1 become 0, and ice e sa, as demons a ed in Figu e 16 [36]. Figu e 16 – Demons a ion o he in e sion ope a ion [36]. 2.4.3 “Th esholding” Ope a ion One o he mos e sa ile g oups o p ocesses in image p ocessing ope a ions is he "Th esholding" g oup. I s objec i e is o sepa a e a ious de ails in he image o acili a e hei isola ion o enhance hei p ominence. The simples p ocesses wi hin his g oup a e bina y h esholding me hods, which in ol e di iding all he pixels in he image in o wo classes. A pixel alue h eshold is used o c ea e hese classes. Pixels wi h alues g ea e han he h eshold a e g ouped in o one class, while hose wi h alues below he h eshold a e g ouped in o ano he [36], [37]. In egula bina y h esholding (Equa ion 10), pixels in he class wi h alues abo e he h eshold a e assigned he maximum alue o 255, while pixels in he class wi h alues below he h eshold a e assigned he minimum alue o 0. In he case o in e se bina y h esholding (Equa ion 11), he same p ocess occu s, bu he classes a e swapped. In o he wo ds, pixels in he class wi h alues abo e he h eshold a e assigned he minimum alue [36], [37]. 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙(𝑥,𝑦)= {255 𝑖𝑓 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙 (𝑥,𝑦)>𝑡ℎ𝑟𝑒𝑠ℎ𝑜𝑙𝑑 0 𝑖𝑓 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙(𝑥,𝑦)≤𝑡ℎ𝑟𝑒𝑠ℎ𝑜𝑙𝑑 (10) 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙(𝑥,𝑦)= {255 𝑖𝑓 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙 (𝑥,𝑦)≤𝑡ℎ𝑟𝑒𝑠ℎ𝑜𝑙𝑑 0 𝑖𝑓 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙(𝑥,𝑦)>𝑡ℎ𝑟𝑒𝑠ℎ𝑜𝑙𝑑 (11) In addi ion o hese p ocesses, he e a e also "Th esholding o ze o" p ocesses and hei in e ses. These p ocesses unc ion simila ly o bina y h esholding; howe e , only one o he classes is a ec ed. Fo example, in he egula "Th esholding o ze o" case (Equa ion 12), only he class con aining alues equal o o less han he h eshold alue is modi ied, assigning all i s pixels he minimum alue o Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 28 0. The opposi e occu s in he case o in e se "Th esholding o ze o" (Equa ion 13), whe e only pixels in he class abo e he h eshold alue a e a ec ed, assigning hem he maximum alue o 255 [36], [37]. 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙(𝑥,𝑦)= {𝑉𝑎𝑙 𝑝𝑖𝑥𝑒𝑙(𝑥,𝑦) 𝑖𝑓 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙 (𝑥,𝑦)>𝑡ℎ𝑟𝑒𝑠ℎ𝑜𝑙𝑑 0 𝑖𝑓 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙(𝑥,𝑦)≤𝑡ℎ𝑟𝑒𝑠ℎ𝑜𝑙𝑑 (12) 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙(𝑥,𝑦)= { 0 𝑖𝑓 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙 (𝑥,𝑦)>𝑡ℎ𝑟𝑒𝑠ℎ𝑜𝑙𝑑 𝑉𝑎𝑙 𝑝𝑖𝑥𝑒𝑙(𝑥,𝑦) 𝑖𝑓 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙(𝑥,𝑦)≤𝑡ℎ𝑟𝑒𝑠ℎ𝑜𝑙𝑑 (13) The las o he bina y h esholding p ocesses is unca ion (Equa ion 14). I ac s in a e y simila way o in e se "Th esholding o ze o"; howe e , he alues assigned o he pixels in he a ec ed class a e he h eshold alue i sel , a he han he maximum alue. Figu e 17 p o ides a isualiza ion o he e ec o each ype o h esholding desc ibed he e [36], [37]. 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙(𝑥,𝑦)= { 𝑡ℎ𝑟𝑒𝑠ℎ𝑜𝑙𝑑 𝑖𝑓 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙 (𝑥,𝑦)>𝑡ℎ𝑟𝑒𝑠ℎ𝑜𝑙𝑑 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙(𝑥,𝑦) 𝑖𝑓 𝑣𝑎𝑙 𝑝𝑖𝑥𝑒𝑙(𝑥,𝑦)≤𝑡ℎ𝑟𝑒𝑠ℎ𝑜𝑙𝑑 (14) Figu e 17 – Visual ep esen a ion o all ypes o bina y h esholding [38]. All o hese p ocesses belong o he g oup o bina y h esholding, as hey sepa a e he pixels in he image in o wo classes, speci ically o g ayscale images. Howe e , he e a e mo e ad anced p ocesses Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 29 ha can isola e pixels in an image in o 3 o mo e classes, which ob iously in ol es a g ea e numbe o h eshold alues and a highe le el o sepa a ion and ea u e enhancemen in he image. I is also possible o pe o m hese p ocesses on images in o he colo spec ums, such as RGB o HSV, which can no only sepa a e classes by colo bu also by b igh ness and sa u a ion [36], [37]. These p ocesses a e conside ably mo e complex and will no be u he explo ed he e as hey a e beyond he scope o his wo k. 2.4.4 OTSU me hod The OTSU me hod is commonly e e ed o as ano he ype o h esholding; howe e , i is mo e accu a e o s a e ha i is a me hod ha can be associa ed wi h any o he o he h esholding p ocesses. In o he wo ds, when he OTSU me hod is combined wi h, o example, a bina y h esholding p ocess, i assis s in de e mining, h ough ma hema ical algo i hm me hodology, he bes h eshold alue choice [39], [40]. The way he algo i hm ope a es is by es ing all possible alues o he h eshold, seeking he one ha yields he maximum a iance be ween classes (in his case, classes e e o he image backg ound and subjec ). This a iance can be calcula ed using equa ion 15 [39], [40]: 𝜎𝑊 2= 𝑊𝑠×𝜎𝑠2+𝑊𝑓×𝜎𝑓2 (15) Whe e: • W co esponds o he ela i e weigh o each class, i.e., he p obabili y ha any pixel belongs o he espec i e class. This means ha he g ea e he numbe o pixels belonging o each class, he highe hei ela i e weigh . • s and co espond o he nomencla u e o he subjec and backg ound classes, espec i ely. Figu e 18 p o ides a isualiza ion o he applica ion o his me hod o an image. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 30 Figu e 18 – G aphical ep esen a ion o he OTSU me hod [39]. 2.4.5 Linea Fil e s Ano he commonly used p ocess in image p ocessing me hodologies is image ans o ma ion using linea il e s [36], [41], [42]. This p ocess di e s om he p e ious ones in ha he inal alue o a pixel depends no only on i s ini ial alue bu also on he ini ial alues o i s neighbo s. I is a pa icula ly use ul p ocess o de ec ing con ou s, poin s, geome ic shapes, and objec s in gene al in an image. Fo example, i is a p ocess ha can be used o de ec he p esence o a pe son in an image. I can also be used o apply a ious il e s o he image, such as blu ing (Figu e 19) o adding noise. Figu e 19 – Example o applying a linea il e o blu ing [36]. Be o e explaining he p ocess by which he ans o ma ion occu s, i is impo an o cla i y he e m "linea il e s" in his con ex . A linea il e e e s o a squa e ma ix o o de 3 o highe . Fo easons ha will be men ioned la e , he o de o a mask ma ix mus always be an odd numbe . Figu e 20 shows an example o a simple linea il e . 1 9[1 1 1 1 1 1 1 1 1] Figu e 20 – Example o a linea il e ma ix. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 31 This ans o ma ion begins by o e laying he il e ma ix on o he pixels o he image, as illus a ed in Figu e 21. Figu e 21 – O e laying a il e on image pixels [36]. Nex , a mul iplica ion ope a ion is pe o med be ween he ma ices. Howe e , his ope a ion is no a ypical ma hema ical ma ix mul iplica ion. The ope a ion in ol es mul iplying each e m in he il e ma ix by he e m in he same posi ion in he image ma ix. Fo example, ini ially, he e ms a posi ion (1, 1) in he il e ma ix a e mul iplied by he e m a posi ion (1, 1) in he image ma ix. This p ocess is epea ed o all e ms in he il e ma ix. A e execu ing his ope a ion, a new ma ix is ob ained. Figu e 22 ep esen s he new ma ix o he example o he p e ious image. I is impo an o no e ha , when dealing wi h pixel alues, decimal numbe s a e always ounded. In his con ex , only in ege s be ween 0 and 255 a e used. [0 0 0 0 0 0 0 0 3] Figu e 22 – The esul ing ma ix om he mul iplica ion o ma ices. Nex , he sum o all he e ms in he esul ing ma ix is calcula ed. The esul is he inal alue o he cen al pixel in he image ma ix, as shown in Figu e 23. Figu e 23 – Replacemen o he inal alue in he ma ix [36]. This p ocess o applica ion o he linea il e , can also be desc ibed by Equa ion 16. 𝑁𝑒𝑤[𝑖,𝑗]= ∑ ∑ 𝑂𝑟𝑖𝑔𝑖𝑛𝑎𝑙[𝑖+𝑘,𝑗+𝑙]×𝐹𝑖𝑙𝑡𝑒𝑟[𝑘,𝑙] 𝑙𝑘 (16) Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 32 This en i e p ocess is epea ed as many imes as he il e i s in o he o iginal image, always wi h a di e en pixel in he cen al posi ion o he o e lapping ma ices. The ac ha his p ocess equi es he exis ence o a cen al e m (a e m a he geome ic cen e o he ma ix) in he esul ing ma ix means ha he linea il e ma ix mus ha e a cen al e m. This equi emen necessi a es ha he linea il e be a squa e ma ix o odd o de , as e en-o de ma ices do no ha e a single cen al e m. One o he mos common and e sa ile linea il e s is he Gaussian il e . I s pu pose is o educe noise in an image by applying a sligh blu o he image. Applying a Gaussian il e is one o he i s s eps in many image p ocessing me hodologies. Al hough coun e in ui i e, blu ing he image can esul in a clea e inal image because emo ing ini ial noise leads o a clea e inal image. I is impo an o no e ha he la ge he o de o he Gaussian il e applied, he g ea e he e ec on he image. Figu e 24 p o ides an example o he applica ion o a Gaussian il e . The con as o his ype o blu is compa ed wi h ha o Figu e 19. Figu e 24 – Applica ion o a Gaussian il e [36]. The e m "Gaussian il e " does no e e o a single linea il e bu a he o a ype o il e ha ollows he same ule. These il e s a e named a e he no mal dis ibu ion in wo dimensions. Figu e 25 gi es an example o a 7x7 o de Gaussian il e ma ix. Figu e 25 – Example o a 7x7 Gaussian ma ix [36]. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 33 The second ype o il e s o discuss a e line de ec ion il e s. Thei goal is o iden i y he p esence o lines wi h he desi ed o ien a ion. They a e widely used in applica ions ha seek o iden i y objec s in an image. The il e ma ix used a emp s o ma ch he shape o he objec o be ound. Figu e 26 p o ides an example o a e ical line de ec ion il e as well as how i ans o ms he o iginal image. Figu e 26 – Example o applying a e ical line de ec ion il e [36]. The example shown is a simple applica ion o hese il e s. Mo e commonly, mul iple il e s a e used o simul aneously de ec e ical, ho izon al, and diagonal lines, e ealing he p esence o mo e complex shapes. Figu e 27 demons a es he applica ion o h ee il e s o iden i y a complex objec . Figu e 27 – Using mul iple il e s o de ec a complex shape [36]. Fo he las example, a il e ma ix o o de 3 was used, bu a highe le el o de ail can be achie ed by inc easing he o de o he il e ma ix. Figu e 28 shows he esul o pe o ming he same ope a ion bu wi h a 5x5 o de il e . Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 40 A ‘da ase ’, in b oad e ms, e e s o a collec ion o da a ha has been ga he ed and o ganized in some way. These da a can ep esen in o ma ion abou a a ie y o phenomena o objec s, such as images, ex , numbe s, o any o he o m o measu able in o ma ion. 'Da ase s' a e essen ial o eeding machine lea ning algo i hms and enabling hem o acqui e knowledge and make in o med decisions based on he a ailable da a. Be o e del ing in o he a ious ypes o machine lea ning, i is impo an o unde s and ha 'da ase s' play a pi o al ole as hey se e as he aw ma e ial upon which algo i hms lea n and de elop hei capabili ies [46], [47], [48]. F om his poin onwa d, he di e en ypes o machine lea ning a e in oduced, including supe ised lea ning, unsupe ised lea ning, and ein o cemen lea ning, and p o ide an explana ion o how hese algo i hms u ilize da ase s in speci ic ways o achie e hei espec i e objec i es [46], [47], [48]. Figu e 39 – Subse s o a i icial in elligence [46]. • Supe ised lea ning: When he algo i hm has a labeled da ase (da a wi h hei espec i e co ec ou pu s) and lea ns by compa ing he model ou pu wi h he expec ed ou pu , and i s pa ame e s a e eadjus ed, i necessa y, un il eaching an accep able h eshold and p ede e mined. Figu e 40 shows he p ocesses in de ail. Figu e 40 – Supe ised lea ning. S eps: (1) made anno a ions in he da ase ; (2) da ase sepa a ion; (3) Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 41 algo i hm aining; (4) da ase es o algo i hm e alua ion and pe o mance [48]. Supe ised lea ning can be u he ca ego ized in o wo main ypes: classi ica ion and eg ession. Classi ica ion in ol es p edic ing a disc e e alue whe e he algo i hm iden i ies inpu da a as belonging o a speci ic class ( o example, de e mining whe he a pho o con ains a p e-iden i ied animal). The algo i hm's pe o mance is e alua ed based on how accu a ely i can co ec ly classi y new images acco ding o he p o ided anno a ions. Reg ession, on he o he hand, deals wi h con inuous da a [46], [47], [48]. • Unsupe ised lea ning ope a es wi hou p io anno a ions on he da a. In his ca ego y, he algo i hm is p o ided wi h a da ase lacking anno a ions and seeks o disco e simila i ies among g oups o da a. Wi hin unsupe ised lea ning, wo p ima y asks exis : da a clus e ing and in o ma ion ex ac ion. Da a clus e ing, also known as clus e ing algo i hms (Figu e 41), in ol es g ouping da a based on hei simila i ies. In o ma ion ex ac ion (Figu e 42), on he o he hand, en ails he algo i hm associa ing new in o ma ion wi h p e iously ob ained da a, such as p o iding mo ie ecommenda ions on a websi e based on a use 's pas iewing his o y [46], [47], [48]. Figu e 41 – Clus e ing algo i hm [49]. Figu e 42 – Unsupe ised lea ning–In o ma ion ex ac ion [50]. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 42 • Rein o cemen lea ning in ol es aining machine lea ning models o make a se ies o decisions based on a ewa d/punishmen amewo k. In essence, his echnique aims o accomplish a speci ic ask, ini ially employing a ial-and-e o app oach. Subsequen ly, he ou comes o each a emp , ega dless o success, a e u ilized o aining by means o a ewa d/punishmen sys em, as depic ed in Figu e 43 [50]. Figu e 43 – Unsupe ised lea ning–In o ma ion ex ac ion [50]. As p e iously e e ed a da ase is a collec ion o da a used as he ounda ion o de eloping a i icial in elligence algo i hms o a ious o he ypes o da a science p ojec s. Typically, c ea ing a da ase is a c i ical and ime-in ensi e phase ha signi ican ly impac s he pe o mance o he sys em. I is o en di ided in o h ee subse s: aining, alida ion, and es da ase s, as illus a ed in Figu e 44 [50]. Figu e 44 - Unsupe ised lea ning—in o ma ion ex ac ion [50]. • T aining da ase : This se consis s o samples used o model de elopmen and con e gence. I se es as he basis o aining he algo i hm and enabling i o lea n om he p o ided da a. • Valida ion da ase : In his phase, samples om he alida ion da ase a e employed o objec i ely assess a model's pe o mance a e he aining p ocess. This s age also allows o ine- uning Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 43 he algo i hm's hype pa ame e s, which can lead o adjus men s and imp o emen s in he aining phase. • Tes da ase : The es da ase comp ises samples used o igo ously es ing he algo i hm. I p o ides a inal e alua ion o he model's pe o mance. I is c ucial ha he samples in he es da ase a e no used in ei he he aining o alida ion phases o main ain he in eg i y o he e alua ion esul s. 2.5.2 Neu al Ne wo ks o Objec De ec ion A signi ican ad ancemen has been made in he ield o compu e ision. Thus a , he eme gence o algo i hms designed o image classi ica ion has been wi nessed, enabling he disce nmen o he p esence o objec s such as dogs, ca s, ca s, o bicycles wi hin an image. Howe e , he nex on ie in his domain is objec de ec ion. Dis inc om classi ica ion algo i hms, objec de ec ion algo i hms aim o p ecisely loca e objec s o in e es wi hin an image by d awing bounding boxes ( e e ed o as objec de ec o s) o bounding cu es (ins an segmen a ion) a ound hem [51]. No ably, a single image can con ain mul iple dis inc objec s equi ing de ec ion. One possible solu ion would in ol e pa i ioning he image in o a ious egions o in e es and employing con olu ional neu al ne wo ks o classi y he p esence o objec s wi hin hese egions. None heless, his app oach p esen s challenges, pa icula ly when objec s o in e es exhibi a ying spa ial loca ions and p opo ions wi hin he image. Consequen ly, selec ing nume ous egions may lead o excessi e compu a ional cos s, especially in scena ios such as highway su eillance whe e nume ous ehicles need o be de ec ed [51]. To add ess hese issues, a amily o algo i hms was de eloped, including R-CNN (Region-based Con olu ional Neu al Ne wo k), Fas R-CNN (imp o emen o e R-CNN), Fas e R-CNN (ex ension o Fas R-CNN), R-FCN (Region-based Fully Con olu ional Ne wo ks), YOLO (You Only Look Once), and o he s [51]. YOLO YOLO (You Only Look Once) was in oduced by Joseph Redmon and Ali Fa hadi in 2015 du ing hei doc o al s udies [52]. Since i s ini ial elease, YOLO has unde gone se e al i e a ions, wi h he la es e sion being YOLO 8. YOLO ep esen s a depa u e om he egion-based algo i hms discussed ea lie . I is a con olu ional ne wo k ha p edic s bo h bounding boxes and class p obabili ies o hese boxes. YOLO di ides he image in o N g ids, each o which has a uni o m SxS dimension. Each g id is esponsible o de ec ing and pinpoin ing he objec s i encompasses. These g ids p edic he coo dina es Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 44 o bounding boxes ( ela i e o cell coo dina es), as well as he objec label and he p obabili y o i s p esence wi hin he cell. By ha ing mul iple cells p edic he same objec wi h a ying bounding box p edic ions, YOLO signi ican ly educes compu a ional equi emen s, as bo h de ec ion and ecogni ion asks a e e icien ly handled wi hin he image (see Figu e 45). Figu e 45 - Models he de ec ion as a eg ession p oblem [52]. In Figu e 45, he image is di ided in o an S×S g id, and o each cell o he g id, i p edic s bounding boxes (B), con idence sco es o hose boxes ( hicke lines indica e highe con idence), and class p obabili ies (C). These p edic ions a e encoded as a enso o dimensions S×S×(B×5+C) [52], [53]. The YOLO a chi ec u es consis o h ee dis inc componen s, backbone, neck, and head, as depic ed in Figu e 46. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 45 Figu e 46 - YOLO a chi ec u e and how i wo ks [53]. Howe e , his p ocess o en esul s in nume ous duplica e p edic ions. To add ess his issue, YOLO u ilizes he Non-Maximum Supp ession (NMS) echnique [54]. NMS ope a es by elimina ing edundan bounding boxes wi h lowe p obabili y sco es. YOLO achie es his by e alua ing he p obabili y sco es associa ed wi h each op ion and selec ing he one wi h he highes sco e as he p ima y choice. Subsequen ly, i supp esses bounding boxes ha exhibi high In e sec ion o e Union (IoU) wi h he cu en ly selec ed high p obabili y bounding box (as illus a ed in Figu e 47). This p ocess con inues un il he e a e no mo e boxes o be emo ed, as demons a ed in Figu e 48. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 46 Figu e 47 - In e sec ion o e Union—B1: P edica ion Box and B2: De ec ion Box [55]. Figu e 48 - Non-Maximum Supp ession P ocess example [54]. YOLO s ands ou o i s excep ional speed, achie ing an imp essi e a e o 45 ames pe second, su passing he pe o mance o o he objec de ec ion algo i hms. Howe e , i is wo h no ing ha YOLO does ha e a limi a ion in e ms o de ec ing excep ionally small objec s in images, p ima ily s emming om he inhe en spa ial cons ain s o he algo i hm [54], [55]. Da a Augmen a ion Da a augmen a ion in YOLO 5 in ol es he p ac ice o gene a ing addi ional aining da a by applying a ious ans o ma ions o he o iginal images. The p ima y objec i e is o enhance he di e si y wi hin he aining da ase , he eby imp o ing he model's capaci y o gene alize e ec i ely o new and unseen da a [16]. Wi hin YOLO 5, da a augmen a ion encompasses a ange o echniques, including andom c opping, o a ion, lipping, and colo ji e ing, all o which a e employed o c ea e no el aining images. These ans o ma ions a e andomly applied o he o iginal images du ing he aining p ocess, expanding he da ase and in oducing a b oade a ie y o images o he model o lea n om [16]. As illus a ed in Figu e 49, you can obse e an example o augmen ed aining images in YOLO 5. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 47 Figu e 49 - Example o augmen a ion [56]. Th ough da a augmen a ion, he model gains p o iciency in de ec ing objec s unde a ious condi ions, encompassing di e en o ien a ions, scales, and ligh ing scena ios. This con ibu es o he enhancemen o he model's accu acy and obus ness [16]. The da a loade in YOLO 5 execu es h ee ca ego ies o augmen a ions [16]: • Basic Augmen a ions: This ca ego y includes andom c opping and esizing o images, ho izon al lipping, and andom colo dis o ion. These echniques aim o enhance he model's gene aliza ion capabili ies; • Mosaic Augmen a ions: This ca ego y combines ou indi idual images in o a single mosaic image. This helps he model lea n o de ec objec s ha may appea in p oximi y wi hin a single image; Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 48 • Au o Augmen a ions: This ca ego y employs ein o cemen lea ning o sea ch o he op imal se o augmen a ions ailo ed o a speci ic da ase . This op imiza ion con ibu es o imp o ed model pe o mance on ha pa icula da ase . In addi ion o he abo e, YOLO 5 employs colo space adjus men s as a o m o da a augmen a ion. This in ol es modi ying he colo balance, b igh ness, con as , and sa u a ion o aining da ase images. This adap a ion enhances he model's obus ness o a ia ions in eal-wo ld ligh ing condi ions and colo schemes. The da a loade in YOLO 5 implemen s colo space adjus men s by andomly al e ing he hue, sa u a ion, and b igh ness o each image du ing aining. I is impo an o no e ha augmen a ion does no gene a e en i ely new da a; a he , i p esen s exis ing da a in di e se, andom con igu a ions each ime an image is u ilized. Consequen ly, no wo iews o an image a e iden ical du ing he aining p ocess. Se ings o aining augmen a ion a e de ined in a hype pa ame e ile, and hype pa ame e e olu ion can be employed o op imize hese alues acco ding o speci ic aining equi emen s (as shown in Figu e 50). Figu e 50 - T aining augmen a ion de ined in a hype pa ame e ile [56]. Au o Lea ning Bounding Box Ancho s Wi hin he con ex o YOLO 5, he Au o Lea ning Bounding Box Ancho s (Figu e 51) echnique is employed o au onomously p oduce ancho boxes me iculously ailo ed o he cha ac e is ics o he pa icula da ase in use. Th oughou he aining p ocess, he model sc u inizes he dis ibu ion o objec dimensions and con igu a ions wi hin he aining da ase , subsequen ly ine- uning he ancho box sizes Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 49 and aspec a ios o align wi h hese cha ac e is ics. This adap i e app oach enables he model o mo e e ec i ely pinpoin objec s p esen ing a ying sizes and shapes, ul ima ely enhancing he p ecision o objec de ec ion [57]. Figu e 51 - Lea ning Bounding Box Ancho s [57]. To illus a e, conside an ins ance o ancho s ha ha e been de i ed om he aining da a and inco po a ed in o a YOLO 5 con igu a ion ile (Figu e 52). Figu e 52 - A ske ch o he objec de ec ion ask. In his pa icula ins ance, i can be obse ed ha h ee ancho boxes a e de ined, wi h each ancho box ep esen ed as a lis con aining six alues. These alues co espond o he wid h and heigh o he ancho boxes a h ee dis inc scales. I is no ewo hy ha hese ancho boxes ha e been deduced om he aining da a and a e u ilized o gene a ing box p edic ions du ing he in e ence phase. In he ealm o objec de ec ion (see Figu e 53), he p ima y objec i e is o iden i y and p ecisely delinea e objec s wi hin an image. This di e s ma kedly om image classi ica ion, whe e he p ima y ask in ol es ca ego izing he en i e image in o a single class. In objec de ec ion, he challenge lies in he po en ial exis ence o mul iple ins ances o iden ical o dissimila objec s wi hin he image. The o e a ching goal is o accu a ely p edic bo h he p esence and he p ecise loca ion o all hese objec s. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 56 E alua ion Me ics E alua ion me ics in deep lea ning a e quan i a i e measu es used o assess he pe o mance o a deep lea ning model in speci ic asks. Common me ics include accu acy, p ecision, ecall, F1-sco e, loss, and he con usion ma ix. These me ics help in unde s anding how well he model is pe o ming and compa ing di e en models. The ini ial e alua ion me ics o a deep lea ning algo i hm like YOLO 5 se e he pu pose o assessing he pe o mance o he objec de ec ion algo i hm on a speci ic da ase . These me ics, commonly employed, a e speci ic o YOLO 5 o o he simila algo i hms (Fas e R-CNN - Region-based Con olu ional Neu al Ne wo k; SSD - Single Sho Mul ibox De ec o ; Re inaNe ; Mask R-CNN - Mask Region-based Con olu ional Neu al Ne wo k; E icien De ; YOLO 7; YOLO 8) [61], [62]: 1) A e age P ecision (AP): A e age P ecision is a widely used me ic o e alua ing objec de ec ion pe o mance. I measu es he accu acy o de ec ions a di e en con idence le els ( h esholds) and calcula es he a ea unde he P ecision-Recall cu e. The highe he AP alue, he be e he model pe o mance. A e age P ecision is compu ed using he P ecision-Recall (P-R) cu e. The P-R cu e is ob ained by a ying he con idence h eshold o posi i e de ec ions and calcula ing he P ecision and Recall o each h eshold. AP is calcula ed by aking he a e age o p ecisions calcula ed a speci ic poin s on he cu e (e.g., a ecall in e als). AP is as ollows: AP= 1 n ∑P ( )∆ (17) Whe e: • n is he numbe o h eshold poin s on he P-R cu e; • P( ) is he P ecision a he ecall poin ; • Δ is he di e ence in ecall be ween wo consecu i e poin s on he P-R cu e. 2) Mean A e age P ecision (mAP): mAP is he a e age o he A e age P ecisions calcula ed o a ious objec classes. I is a global me ic ha p o ides an o e all iew o he model pe o mance ac oss all classes. mAP is as ollows: mAP= 1 C ∑AP c =1 (18) Whe e: • C ep esen s he numbe o ca ego ies in he da ase . The highe he mAP alue, he be e he model pe o mance; Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 57 • [email p o ec ed] o mAP@50 o IoU = 0.50 mean A e age P ecision wi h an In e sec ion o e Union h eshold o 0.5 o 50%; • mAP.5:95 means a e age mAP o e di e en IoU h esholds, om 0.5 o 0.95. 3) IoU (In e sec ion o e Union): IoU is a me ic ha measu es he o e lap be ween he bounding box p edic ed by he model and he g ound u h bounding box o he objec . A high o e lap indica es an accu a e de ec ion. IoU is as ollows: IoU=In e sec ion A ea Union A ea (19) 4) Accu acy: Accu acy measu es he p opo ion o co ec de ec ions ela i e o he o al de ec ions made by he model. Accu acy is as ollows: Accu acy=Numbe o Co ec De ec ions (To al Numbe o De ec ions) (20) O Accu acy= TP+TN TP+TN+FP+FN (21) Whe e: • T ue Posi i e (TP): he numbe o samples co ec ly classi ied as posi i e; • False Posi i e (FP): he numbe o samples inco ec ly classi ied as posi i e; • False Nega i e (FN): he numbe o samples inco ec ly classi ied as nega i e; • T ue Nega i e (TN): he numbe o samples co ec ly classi ied as nega i e. 5) P ecision: P ecision (also known as Posi i e P edic i e Value) measu es he p opo ion o co ec de ec ions among he o al posi i e de ec ions made by he model. P ecision is as ollows: 𝑃𝑟𝑒𝑐𝑖𝑠𝑖𝑜𝑛= 𝑇𝑃 (𝑇𝑃+𝐹𝑃) (22) Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 58 6) Recall: Recall (also known as Sensi i i y o T ue Posi i e Ra e) measu es he p opo ion o co ec de ec ions among he o al ue objec s p esen in he images. Recall is as ollows: 𝑅𝑒𝑐𝑎𝑙𝑙= 𝑇𝑃 (𝑇𝑃+𝐹𝑁) (23) 7) F1-Sco e: The F1-Sco e is he ha monic mean o P ecision and Recall. I is use ul when one desi es a me ic ha conside s bo h he p ecision and ecall o he model. F1-Sco e is as ollows: F1− Sco e= 2 x P ecision x Recall P ecision+Recall (24) 8) Con usion Ma ix: The Con usion Ma ix (Figu e 59) is a able ha shows he coun o co ec and inco ec de ec ions o each class o objec . I is a use ul ool o e alua ing he model's disc imina ion abili y ac oss di e en classes. These e alua ion me ics enable he assessmen o he quali y and pe o mance o he neu al ne wo k du ing bo h aining and es ing p ocesses. Figu e 59 –Con usion Ma ix o Bina y Classi ica ion [63]. Typically, in he e alua ion o de ec ion quali y, esul s a e ca ego ized in o ou g oups by compa ing he model ou pu o he g ound u h. When he model co ec ly de ec s an objec , i is labeled as a T ue Posi i e (TP). Con e sely, i he model de ec s an objec ha is no p esen in he image, i is Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 59 e e ed o as a False Posi i e (FP). When an objec in he g ound u h goes unde ec ed by he model, i is e med a False Nega i e (FN). T ue Nega i es (TN), ep esen ing co ec ly unde ec ed objec s o backg ound, a e no ypically conside ed in he e alua ion o objec de ec ion. These ou ca ego ies o m he basis o a con usion ma ix. The P ecision-Recall Cu e and mAP (Mean A e age P ecision) The P ecision-Recall Cu e and mAP (Mean A e age P ecision) a e impo an e alua ion me ics in machine lea ning, pa icula ly o asks like objec de ec ion and in o ma ion e ie al [64]. The P ecision-Recall Cu e, depic ed in Figu e 60, p o ides a g aphical ep esen a ion o he ade-o be ween p ecision, and ecall o a machine lea ning model. P ecision assesses he accu acy o he model posi i e p edic ions, while ecall (o sensi i i y) e alua es he model abili y o cap u e all he ac ual posi i e ins ances. This cu e illus a es how p ecision and ecall alues change as he model's decision h eshold is adjus ed, o e ing insigh s in o how he model pe o mance can be ine- uned o mee speci ic ask equi emen s. The a ea unde he P ecision-Recall Cu e (AUC-PR) se es as a quan i a i e measu e o he o e all model pe o mance, wi h a highe AUC-PR alue indica ing supe io pe o mance [64]. Figu e 60 – An example o he p ecision- ecall cu e [64]. mAP (Mean A e age P ecision), shown in Figu e 61, se es as a comp ehensi e me ic o assessing a model p edic ion in objec de ec ion and in o ma ion e ie al asks, condensing he o e all quali y o hose p edic ions in o a single nume ical alue. I is compu ed by aking he a e age o he a e age p ecision (AP) alues o each class o ca ego y in a mul i-class p oblem. AP ep esen s he a ea unde he P ecision-Recall Cu e o a single class and quan i ies he model abili y o dis inguish objec s o ha class om he backg ound. mAP is pa icula ly aluable when e alua ing models in scena ios Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 60 in ol ing mul iple objec classes, as i o e s a uni ied pe o mance me ic ha accoun s o pe o mance ac oss all classes [65]. Figu e 61 – An example o he p ecision- ecall cu e [65]. In summa y, he P ecision-Recall Cu e illus a es how changes in he classi ica ion h eshold a ec p ecision and ecall. I helps in unde s anding he model's ade-o be ween making accu a e posi i e p edic ions and cap u ing all ele an ins ances. mAP, on he o he hand, is a summa izing me ic ha is pa icula ly use ul o e alua ing models in mul i-class classi ica ion asks, such as objec de ec ion, by a e aging he pe o mance ac oss di e en classes, p o iding an o e all assessmen o he model e ec i eness. Bo h me ics a e c ucial o e alua ing he pe o mance o machine lea ning models, especially in asks whe e p ecision and ecall a e i al, such as objec de ec ion [65]. k- old C oss Valida ion k- old C oss-Valida ion is a echnique used in machine lea ning and model e alua ion o assess a model pe o mance and i s gene aliza ion capabili ies. I helps o add ess he p oblem o o e i ing and o ob ain a mo e eliable es ima e o how well a model is likely o pe o m on unseen da a. k- old C oss- Valida ion wo ks as ollows [66]. 1. Da a Spli ing: The da ase is di ided in o K app oxima ely equal-sized olds o subse s. Fo example, i k is se o 5, he da ase is di ided in o i e pa s; 2. Model T aining and Tes ing: The aining and e alua ion p ocess is epea ed k imes. In each i e a ion, one o he k olds is held ou as a alida ion se , while he emaining k-1 olds a e used o ain he model. The model is hen es ed on he alida ion se ; 3. Pe o mance Me ics: Fo each i e a ion, a pe o mance me ic (e.g., accu acy, mean Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 61 squa ed e o ) is calcula ed based on he model's pe o mance on he alida ion se ; 4. A e age Pe o mance: A e k i e a ions, one has k pe o mance me ic alues (one o each old). The inal pe o mance me ic is ypically calcula ed as he a e age o hese k alues. This p o ides a mo e obus es ima e o he model's pe o mance compa ed o a single ain- es spli . k- old C oss-Valida ion o e s se e al ad an ages in model e alua ion. Fi s ly, i p o ides a mo e accu a e es ima ion o a model's pe o mance by subjec ing i o es ing on di e en subse s o he da a. This app oach aids in assessing how well a model gene alizes o unseen da a, as i unde goes es ing on a ious da a pa i ions, hus enhancing i s eliabili y. Addi ionally, k- old C oss-Valida ion helps mi iga e he isk o o e i ing, as he model is ained on mul iple da a subse s and es ed on di e en alida ion se s, ensu ing ha he model's pe o mance is no o e ly ailo ed o a speci ic da ase . This me hod p o es especially aluable when dealing wi h limi ed da ase s, whe e maximizing da a u ili y is c ucial [67]. The choice o k (e.g., 5, 10) depends on he speci ic da ase and p oblem. La ge alues o k educe he a iance in he pe o mance es ima e bu can be compu a ionally expensi e. Smalle alues may in oduce highe a iance bu equi e less compu a ion. In p ac ice, k- old C oss-Valida ion is a aluable ool o assessing and compa ing machine lea ning models and selec ing he bes -pe o ming one o speci ic p oblem [67]. k- old C oss Valida ion s ands as a obus app oach o app aising machine lea ning models. I s me i s lie in mi iga ing o e i ing and unde i ing issues, ul ima ely deli e ing a mo e p ecise gauge o a model's e ec i eness on unseen da a. This echnique is ex ensi ely employed in p ac ical scena ios o model alida ion, compa ison, and he selec ion o an op imal model ailo ed o a speci ic p oblem [68]. A isual ep esen a ion o he me hod's implemen a ion can be obse ed in Figu e 62 [69]. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 62 Figu e 62 – An example o he p ecision- ecall cu e [69]. The alue k = 10 is equen ly chosen o k- old C oss Valida ion due o se e al compelling easons [70], [71]: 1. Reduc ion in Resul Va iance: The use o a la ge k alue, such as 10, se es o diminish he a iance in he esul s. Consequen ly, when k- old C oss Valida ion is conduc ed mul iple imes, he ou comes a e mo e likely o exhibi consis ency and accu a ely e lec he model's ue pe o mance; 2. E icien Da a U iliza ion: In he case o k = 10, oughly 90% o he da ase is alloca ed o aining du ing each i e a ion, wi h only 10% dedica ed o alida ion. This balance is gene ally conside ed e ec i e o ensu ing ha he model lea ns comp ehensi ely and is igo ously e alua ed; 3. Equi able Model Compa isons: The selec ion o k = 10 os e s equi able compa isons among di e en models. This is achie ed by e alua ing all models using he same da ase and adhe ing o he iden ical c oss- alida ion me hodology. The p ocedu e o k- old C oss Valida ion wi h k = 10 un olds as ollows [72], [73]: 1. The da ase is pa i ioned in o 10 oughly equi alen segmen s, o olds; 2. The model unde goes 10 ounds o aining and e alua ion. In each i e a ion, one- old is se aside as he alida ion se , while he emaining 9 olds cons i u e he aining se ; 3. In each i e a ion, pe o mance me ics such as p ecision, ecall, F1-sco e, among o he s, a e compu ed o assess he model pe o mance; Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 63 4. Upon comple ion o he 10 i e a ions, he pe o mance me ics ob ained in each ound a e ypically a e aged o yield an agg ega e ep esen a ion o he model's pe o mance. This p o ides a mo e dependable es ima ion o how he model will pe o m on unseen da a. 2.5.3 YOLO 5 Algo i hm o Objec De ec ion I is he i h i e a ion in he YOLO se ies o algo i hms, which ha e gained popula i y o hei abili y o pe o m eal- ime objec de ec ion wi h imp essi e accu acy. Some key ea u es and cha ac e is ics o YOLO 5 a e as ollows [74]: • Accu acy and Speed: YOLO 5 is enowned o i s balance be ween accu acy and speed in objec de ec ion asks. I achie es imp essi e eal- ime pe o mance while main aining high p ecision; • A chi ec u al Imp o emen s: YOLO 5 in oduces a chi ec u al enhancemen s o e i s p edecesso s, such as CSPDa kne 53 as he backbone and PANe as he neck, leading o imp o ed ea u e ex ac ion and agg ega ion; • Scale Handling: YOLO 5 e ec i ely add esses scale a ia ion, enabling i o de ec objec s o a ious sizes wi hin an image, hanks o he ea u e py amid and ancho box echniques; • Adap i e Da a Augmen a ion: YOLO 5 employs da a augmen a ion echniques like andom c opping, o a ion, and colo ji e ing o enhance i s abili y o gene alize o new and unseen da a; • Poin -Based Sampling: The PA-Ne (Poin Agg ega ion Ne wo k) Neck in YOLO 5 u ilizes poin - based sampling o agg ega e ea u es a di e en scales, con ibu ing o i s accu acy; • Model Va ian s: YOLO 5 comes in di e en a ian s (e.g., YOLO 5s, YOLO 5m, YOLO 5l, and YOLO 5x) wi h a ying model sizes o sui di e en compu a ional esou ces and deploymen scena ios; • S a e-o - he-A Pe o mance: YOLO 5 has achie ed s a e-o - he-a esul s in e ms o accu acy and e iciency in objec de ec ion asks, making i a popula choice o a ious applica ions, including au onomous d i ing, su eillance, and mo e; • Open-Sou ce: YOLO 5 is open-sou ce, allowing esea che s and de elope s o access i s codebase, cus omize i , and in eg a e i in o hei p ojec s; • Communi y Suppo : Due o i s popula i y, YOLO 5 has a g owing communi y o use s, con ibu ing o ongoing de elopmen , imp o emen s, and he a ailabili y o p e- ained models and esou ces; • Ve sa ili y: YOLO 5 can be adap ed o a wide ange o objec de ec ion asks, including single- objec de ec ion, mul i-objec de ec ion, and e en cus om objec de ec ion scena ios. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 64 In summa y, YOLO 5 is a cu ing-edge objec de ec ion algo i hm known o i s speed, accu acy, and e sa ili y, making i a signi ican asse in compu e ision applica ions. Sub- a ian s o YOLO 5 YOLO 5 is a ailable in ou p ima y e sions: small (s), medium (m), la ge (l), and ex a-la ge (x), wi h each e sion deli e ing inc easingly imp o ed accu acy a es [56]. Addi ionally, he aining ime equi ed o each a ian a ies (Figu e 63). Figu e 63 – Sub- a ian s o YOLO 5 [56]. The objec i e o he Figu e 63 is o demons a e he pe o mance o an objec de ec ion model conce ning i s in e ence ime (X-axis) and o e all e ec i eness (Y-axis). Ini ial indings indica e ha YOLO 5 excels in achie ing excep ional pe o mance ela i e o o he cu ing-edge echniques. As illus a ed in he Figu e 63, all YOLO 5 a ian s exhibi as e aining imes when compa ed o E icien De . E icien De is a ype o objec de ec ion model op imized o e icien and accu a e objec de ec ion, known o i s abili y o achie e good pe o mance while main aining low compu a ional demands. No ably, he highes pe o ming YOLO 5 model, YOLO 5x, can p ocess images a a signi ican ly accele a ed a e while main aining a le el o accu acy simila o ha o he E icien De D4 model [56]. I is impo an o no e ha YOLO 5 pe o mance imp o emen s a e p ima ily a ibu ed o he aining p ocedu es in PyTo ch, while he undamen al model a chi ec u e emains closely aligned wi h YOLO 4 [56]. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 65 O e iew o he YOLO 5s6 A chi ec u e The YOLO 5s6 deep lea ning de ec ion algo i hm has been u ilized o iden i y and cha ac e ize ya n hai iness, as will be elabo a ed in chap e 5. This choice is mo i a ed by i s op imized deploymen on esou ce-cons ained edge de ices, ende ing i sui able o manu ac u ing applica ions, as well as i s un es ic ed accessibili y o esea ch pu poses. Tes s we e conduc ed o compa e di e en YOLO e sions, and YOLO 5s6 ou pe o med he o he s in e ms o e alua ion me ics, es ablishing i as he p e e ed choice. The YOLO 5s6 model comp ises h ee essen ial componen s, as illus a ed in Figu e 64 [75], [76], [77]: • Backbone: YOLO 5 employs a con olu ional backbone o ex ac ea u es om inpu images. This backbone pe o ms ini ial con olu ions and ex ac s low-le el ep esen a ions om he inpu images; • Neck: In ce ain a ian s o YOLO 5, such as YOLO 5m, YOLO 5l, and YOLO 5x, a "neck" is inco po a ed. This neck consis s o a sequence o con olu ional laye s designed o use ea u es om a ious scales. This capabili y enables he model o cap u e in o ma ion a di e en le els o esolu ion, enhancing i s abili y o de ec objec s o a ying sizes; • Head o De ec : The "head" o "De ec " is he inal componen o he model, whe e he objec de ec ion p ocess occu s. I comp ises se e al con olu ional and de ec ion laye s esponsible o p edic ing bounding boxes and objec classes wi hin he inpu image. Figu e 64 illus a es he ne wo k s uc u e o YOLO 5s6, highligh ing he in e play be ween hese h ee key componen s [76]. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 72 Figu e 70 - Compa ison o ac i a ion unc ions [81]. In esume, hese ac i a ion unc ions play an impo an ole in he aining and pe o mance o neu al ne wo ks, and he choice o which one o use can depend on he speci ic ask and desi ed esul s. In YOLO 5s and o he YOLO a ian s, as p e iously e e ed, hese ac i a ion unc ions a e used in he ne wo k laye s o in oduce non-linea i y and lea ning capabili y. Hype pa ame e s in YOLO 5s6 Hype pa ame e s in machine lea ning models, including deep lea ning models like YOLO 5, play a c ucial ole in de ining he aining and da a augmen a ion se ings [82]. When dealing wi h la ge models, which ypically ha e mo e pa ame e s and complexi y, i is common o adjus ce ain hype pa ame e s o mi iga e o e i ing and imp o e model gene aliza ion. Hype pa ame e s o da a augmen a ions a e o en de ined in a sepa a e hype pa ame e ile, which is p o ided as pa o he aining con igu a ion. In he case o YOLO 5, he hype pa ame e s ha con ol da a augmen a ions can be ound in he 'hyp.sc a ch.yaml' o 'hyp.sc a ch-low.yaml' ile (o a simila ile) loca ed wi hin he da a di ec o y. These augmen a ion hype pa ame e s include se ings o a ious ypes o da a ans o ma ions such as o a ion, ansla ion, scaling, lipping, and mo e. By con igu ing hese hype pa ame e s, i can be con olled he ype and in ensi y o augmen a ions applied o he aining da a, which can help imp o e he model abili y o gene alize o di e en si ua ions. In Figu e 71, i is explained how i wo ks he YOLO 5 image da a augmen a ion wi h a da ase in aining phase o a neu al ne wo k wi h de ined hype pa ame e s. Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 73 Figu e 71 – YOLO 5s6 Image Augmen a ion [82]. I is common p ac ice o de ine hese hype pa ame e s in a sepa a e ile o keep hem o ganized and easily con igu able, allowing o expe imen a ion wi h di e en augmen a ion s a egies du ing model aining. Adjus ing hese hype pa ame e s can ha e a signi ican impac on he obus ness and pe o mance o he ained model. The hype pa ame e s con igu a ion o aining he YOLO 5 model, a e ollowing explained [82]: • l 0: The ini ial lea ning a e used by he op imize du ing aining. I is se o 0.01 o SGD and 0.001 o Adam. SGD s ands o "S ochas ic G adien Descen ," which is an op imize used o adjus he weigh s o a neu al ne wo k du ing aining. "Adam" e e s o ano he op imize called "Adam" (Adap i e Momen Es ima ion), which is also used o op imize he pa ame e s o a neu al ne wo k. The alues men ioned (0.01 o SGD and 0.001 o Adam) a e he ini ial lea ning a es used by hese op imize s o adjus he ne wo k's weigh s du ing aining. Each op imize may equi e a di e en lea ning a e o wo k e ec i ely based on he p oblem and he neu al ne wo k a chi ec u e; • l : The inal lea ning a e o he OneCycleLR a he end o aining, calcula ed as he p oduc o he ini ial lea ning a e (l 0) and his alue (0.01); • momen um: The momen um alue used in he SGD op imize o he be a1 alue used in he Adam op imize ; • weigh _decay: The weigh decay alue used by he op imize o con ol he penaliza ion o la ge weigh s in he model. In his case, i is se o 0.0005; • wa mup_epochs: The numbe o "wa m-up" epochs a he s a o aining du ing which he lea ning a e is g adually inc eased. I is se o 3.0 epochs; Chap e 2 – Theo ical Concep s ___________________________________________________________________________ 74 • wa mup_momen um: The ini ial momen um alue du ing he wa m-up pe iod, con igu ed as 0.8; • wa mup_bias_l : The ini ial lea ning a e o he bias e m du ing he wa m-up pe iod, se o 0.1; • box, cls, cls_pw, obj, obj_pw: These pa ame e s adjus he weigh s o di e en componen s o he YOLO 5 loss unc ion, in luencing he impac o di e en pa s o he loss unc ion du ing aining; • iou_ : The aining h eshold o In e sec ion o e Union (IoU) used o de e mine whe he a de ec ion is conside ed a ue posi i e du ing aining. In his case, i is se o 0.20; • ancho _ : The h eshold ha de e mines whe he an ancho is conside ed ac i e o inac i e; • l_gamma: The gamma alue used in he ocal loss. In his case, i is se o 0.0. • hs _h, hs _s, hs _ : These pa ame e s con ol a ia ion in he hue, sa u a ion, and alue o he HSV colo space du ing da a augmen a ion; • deg ees, ansla e, scale, shea , pe spec i e: Pa ame e s o adjus ing a ious geome ic ans o ma ions applied o images du ing da a augmen a ion, such as o a ion, ansla ion, scale, shea , and pe spec i e; • lipud, lipl : P obabili ies o applying e ical and ho izon al lipping o images; • mosaic, mixup, copy_pas e: P obabili ies o applying echniques like mosaic, image mixup, and segmen copy-pas e du ing da a augmen a ion. These hype pa ame e s a e c ucial o aining he YOLO 5 model and i s abili y o gene alize o objec de ec ion. P ope ly uning hese hype pa ame e s is essen ial o ob ain a high-quali y objec de ec ion model. Summa y o he chap e : This chap e p o ided a comp ehensi e ounda ion o heo e ical concep s essen ial o unde s anding he subsequen de elopmen o a ya n quali y analysis sys em. I encompasses ya n cha ac e iza ion pa ame e s, s a is ical pa ame e s o ya n, spec al analysis echniques, he p inciples o image p ocessing and compu e ision, and he undamen als o deep lea ning. These opics collec i ely se he s age o he wo k objec i es, enabling a deepe unde s anding o he me hodologies and echnologies in ol ed in his in e disciplina y esea ch endea o . Addi ionally, his chap e in oduces key concep s ela ed o YOLO 5s, which will be u he explo ed and applied in chap e 5 conside ing hei ele ance o he wo k goals. 3. LITERATURE REVIEW O e iew Technological e olu ion has eached impo an p opo ions in e ms o sys ems ob aining cha ac e is ics ha measu e ya n quali y and he use o a i icial in elligence o de ec ya n de ec s. The e o e, his chap e p esen s some s udies ha explo e image p ocessing/compu e ision and a i icial in elligence app oaches o ob ain ya n cha ac e is ics. I is in ended o analyze wha he scien i ic communi y has explo ed, he challenges encoun e ed, and he p oblems ha s ill need o be add essed in o de o unde ake he objec i es o his wo k. Nex , he mos ele an wo ks a e p esen ed. A he end, a compa a i e able and a c i ical e iew analysis a e p esen ed. 3.1 Use o image p ocessing, compu e ision and a i icial in elligence in ya n analysis 3.2 Compa ison be ween sys ems wi h image p ocessing, compu e ision and a i icial in elligence echniques 3.3 C i ical e iew analysis Chap e 3 – Li e a u e Re iew ___________________________________________________________________________ 76 3.1 Use o image p ocessing, compu e ision and a i icial in elligence in ya n analysis Technological e olu ion has achie ed signi ican ad ancemen s in sys ems o measu ing ya n quali y cha ac e is ics. Consequen ly, his subchap e in oduces a ious solu ions and ini ia i es ha le e age echnology o assess ya n p ope ies. I is impo an o examine he esea ch unde aken by he scien i ic communi y, he obs acles aced, and he ou s anding issues ha need solu ions o enhancing esea ch app oaches. Each subchap e highligh s he mos signi ican wo ks om 2020 o 2023, p o iding an assessmen o he p og ess made in his ield. Based on he cu en esea ch, limi ed documen ed ins ances o al e na i e ya n analysis sys ems a e a ailable o compa ison wi h he p oposed de eloped sys em, which will be ex ensi ely discussed in subsequen chap e s. The analysis pe o med ou line he sho comings and inadequacies ound wi hin each sys em, he eby p o iding a c i ical e alua ion o hei limi a ions. 3.1.1 Sys em A – S udy by Zhisong Li e al. (2020) In he compu e ision sys em de eloped by Zhisong Li and colleagues in 2020 [83], hence o h e e ed o as Sys em A, an e alua ion o ya n quali y was conduc ed. This assessmen ocused on acqui ing he ollowing pa ame e s: Ya n diame e , De ec s and Hai iness. These cha ac e is ics we e de e mined using compu e ision and image p ocessing echniques. In hei p oposed sys em (Figu e 72), hey de ined a diame e image p ocessing uni (DIPU) and selec ed se e al sampling poin s om he mo ing ya n. The DIPU co esponding o each sampling poin was segmen ed om he cap u ed ya n images. The a e age DIPU diame e was used o ep esen he ya n diame e o he es poin s. When ex ac ing ya n images, he DIPU was ca ego ized in o: • Fo eg ound egion; • De ined backg ound egion; • Unknown egion based on g ay le el p ojec ion dis ibu ion cha ac e is ics. Chap e 3 – Li e a u e Re iew ___________________________________________________________________________ 77 Figu e 72 - Flowcha o he me hod o de ec ing ya n pa ame e s and e alua ing ya n quali y [83]. The unknown egion was u he p ocessed using he Poisson Ma ing me hod [84], which employed a de ined connec i i y classi ie o sepa a e he ya n image om he backg ound image. A e he classi ie ex ac ed he ya n co e, hai iness was di e en ia ed using image sub ac ion. Fu he mo e, ya n de ec s we e analyzed using s a is ical me hods o assess ya n quali y. The designed sys em employed a closed box as an image cap u e pla o m o shield agains s ay ligh dis u bance. They used whi e di used glass o elimina e e lec ed ligh and shadows. Fo simula ing ya n mo emen , a d i e and ol age con olle we e u ilized. The in eg a ed s uc u e o he sys em is depic ed in Figu e 73. The ya n image cap u e sys em p ima ily consis ed o wo componen s: Figu e 73 - Sys em de ice o de ec ya n pa ame e s [83]. Chap e 3 – Li e a u e Re iew ___________________________________________________________________________ 78 • Imaging sys em, including a senso , came a lens, and ligh sou ce, wi h a CCD (cha ge-coupled de ice) image senso o collec ing he sequence o images om he ya n; • Imaging lens wi h a la ge dep h o ield o ensu e clea analysis o hai iness in di e en posi ions. Images we e cap u ed using a SONY C Zoom lens wi h a ocal leng h o 12.5 o 75 mm connec ed o a CCD came a (Basle acA2040-180 km/kc, pixel size 5.5 µm, esolu ion o 2048 × 2048 pixels, sampling a e o 180 ps) and p ocessed by a pe sonal compu e wi h an image p ocesso . Ya n hai iness e e s o he numbe o ibe s p ojec ing ou o he ya n co e, was iden i ied as an impo an indica o a ec ing ya n p ope ies, wea ing e iciency, and ab ic appea ance. In his s udy, he ya n hai iness index was included as a equi emen o ya n quali y. The au ho s explained ha he ya n could be di ided in o a ya n co e and hai iness. Using he desc ibed me hod, hey ex ac ed he DIPU om he ya n co e based on pixel connec i i y o each image, hus enabling he de e mina ion o hai iness pixels using he image sub ac ion me hod (see Figu e 74). Figu e 74 - a) New o eg ound image, b) ya n co e, c) hai iness [83]. The au ho s did no p opose speci ic imp o emen s o u u e wo k o his p ojec . They simply s a ed ha he p oposed me hod and i s co esponding de ec ion sys em acili a e au oma ion and indus ializa ion in online ya n de ec ion. Se e al o he au ho s ha e also wo ked in he ield o ya n image p ocessing bu wi hou in oducing signi ican inno a ions compa ed o p e ious esea ch e o s [11], [85], [86]. Chap e 3 – Li e a u e Re iew ___________________________________________________________________________ 79 3.1.2 Sys em B – S udy by Noman Haleem e al. (2021) A sys em was also de eloped by Noman Haleem and colleagues in 2021 [87], he eina e e e ed o as Sys em B. In hei wo k, he au ho s emphasized he po en ial o conduc ing ya n es ing in eal- ime mode o minimize p ocess la ency, p o ide apid insigh s in o ya n quali y, and enhance he p oduc ion o high-quali y ya n. They poin ed ou ha while capabili y-based uni o mi y es equipmen and eme ging image-based uni o mi y es sys ems a e widely used in o line se ings, he e is s ill a lack o a sui able online sys em o assessing ya n quali y unde ypical indus ial condi ions. As a esponse, he au ho s o his p ojec p oposed an online uni o mi y es sys em designed speci ically o de ec ing neps. To achie e his, hey ha nessed image p ocessing echniques and compu e ision. The sys em hey de eloped (Figu e 75) di ec ly cap u es ya n images on a o a ing ame and employs he Viola-Jones objec de ec ion algo i hm [88] o eal- ime nep de ec de ec ion. The alida ion o he nep de ec ion algo i hms, along wi h a compa ison o he new me hod o an exis ing uni o mi y es equipmen in e ms o nep coun , demons a ed a easonable le el o de ec de ec ion accu acy and p omising po en ial o applica ions in he ya n spinning indus y. These esul s we e u he alida ed by compa ing hem wi h USTER exis ing comme cial uni o mi y es ing equipmen (TESTER). The image collec ion p ocess (see Figu e 75) u ilized a Basle 1440-220 μm digi al came a om Ge many, equipped wi h a 50 mm lens. Figu e 75 - An example o a ya n image wi h a nep de ec ob ained using he image acquisi ion sys em [87]. The au ho s le e aged h ee compu e ision models ( e e ed o A, B, and C), all based on he machine lea ning Viola-Jones algo i hm [88]. These models we e de eloped using he OpenCV compu e ision lib a y in he Py hon p og amming language. They essen ially unc ioned as image classi ie s, wi h a ia ions in he inpu da a used du ing hei aining phase. The aining da a comp ised posi i e and nega i e images in a 2:1 a io, and hese images we e esized by ac o s o 0.2 and 0.1, espec i ely, o Chap e 3 – Li e a u e Re iew ___________________________________________________________________________ 80 op imize he aining p ocess. Each model unde wen en aining cycles. Each model was ained using a speci ic ype o image da a: o iginal images o ya ns wi h neps, syn he ic images o neps, o a combina ion o bo h. This app oach allowed hem o explo e di e en aspec s o nep de ec ion and op imize he models. A e aining, each model was alida ed using a sepa a e da ase con aining images o ya ns wi h and wi hou neps. This alida ion p ocess assessed he models' abili y o accu a ely classi y images as ei he posi i e (wi h neps) o nega i e (wi hou neps) Figu e 76 showcases a se o conca ena ed images o ya ns exhibi ing he nep de ec , acqui ed using he p oposed image acquisi ion con igu a ion du ing he ya n spinning p ocess. Addi ionally, he au ho s no ed ha in hei analysis o a se ies o con inuous ya n shape images, i was c ucial o he ield o iew o be subs an ial enough o accommoda e he la e al oscilla ions o he ya n du ing he spinning p ocess. Figu e 76 - An example o a ya n image wi h a nep de ec ob ained using he image acquisi ion sys em [87]. Figu e 77 p esen s he models con usion ma ices which p o ided insigh s in o he models' pe o mance in e ms o ue posi i es, ue nega i es, alse posi i es, and alse nega i es. Chap e 3 – Li e a u e Re iew ___________________________________________________________________________ 81 Figu e 77 - Con usion ma ices ha o e insigh s in o he pe o mance o he model sys em [87]. Fo u u e esea ch di ec ions, he au ho s sugges ed he ollowing [87]: • Acquisi ion o high-quali y online ya n images h ough an imaging sys em wi h ul a-low exposu e ime, combined wi h ex e nal ligh ing and an app op ia e op ical se up; • Expansion o he online ya n uni o mi y measu emen sys em o de ec o he ypes o ya n de ec s, along wi h necessa y addi ions o he image p ocessing module o c ea e a comp ehensi e ya n quali y es ing solu ion sui able o indus ial en i onmen s. • Imp o emen o T aining Models: The au ho s sugges ed adjus ing aining s a egies o enhance nep de ec ion accu acy. Addi ionally, inc easing he da ase size could imp o e model pe o mance, while explo ing al e na i e objec de ec ion app oaches could op imize esul s. • Expansion o he online uni o mi y measu emen sys em: The au ho s belie e ha in he u u e a sys em o iden i ying addi ional de ec s in he ya n in addi ion o neps could be de eloped. They also sugges ha image p ocessing modules be modi ied o encompass new de ec de ec ion equi emen s. • Finally, he au ho s p opose an in es iga ion in o disc epancies compa ed o he Us e Tes e 3 machine: Conduc u he s udies o unde s and and add ess signi ican di e ences be ween online and adi ional es ing me hods, imp o ing es ing me hodologies o ensu e alignmen and accu acy in quali y assessmen . 3.1.3 Sys em C – S udy by Adel El-Geiheini e al. (2020) Conce ning he applica ion o a i icial in elligence o modeling ya n ensile p ope ies, Adel El- Geiheini and colleagues in 2020 [89], he eina e e e ed o as Sys em C, emphasized ha he u iliza ion Chap e 3 – Li e a u e Re iew ___________________________________________________________________________ 88 machine. 10. Analysis Limi a ions: None o he sys ems pe o m spec al analysis on he ya n based on image p ocessing, and only sys ems B and D use a i icial in elligence o ya n de ec de ec ion. In he con ex o deep lea ning echniques, a ho ough li e a u e e iew e ealed no ins ances o sys ems o p o o ypes employing deep lea ning, speci ically he YOLO 5s6 algo i hm, o he cha ac e iza ion o ya n hai iness. 3.3 C i ical e iew analysis In he ab ic de ec de ec ion domain, a mul i ude o solu ions has eme ged, capi alizing on enhanced i e a ions o he YOLO 3, YOLO 4, and YOLO 5 algo i hms. These s udies consis en ly exhibi imp o ed me ics, unde sco ing he ad ancemen s in his ield [75], [93], [94], [95], [96]. Ne e heless, a e conduc ing a e iew o he exis ing li e a u e, no ins ances we e iden i ied whe e sys ems o p o o ypes employed deep lea ning, speci ically he YOLO 5s6 algo i hm, o he cha ac e iza ion o ya n hai iness [75], [93], [94], [95], [96]. In he ield o ya n analysis, ad ances d i en by image p ocessing and a i icial in elligence ha e e olu ionized he assessmen o he quali y and cha ac e is ics o ya ns. While p io esea ch has explo ed he in eg a ion o a i icial in elligence o ab ic analysis, he in ica e applica ion o such echnology in ya n analysis has emained a ela i ely uncha ed e i o y. Following his pa h, he subsequen analysis aims o p o ide a c i ical e iew o he a ious ya n analysis sys ems p esen ed in he p e ious sec ion, highligh ing he dis inc i e ea u es and con ibu ions o each, while also emphasizing exis ing gaps and wha should be done in his ega d so ha a p oposed sys em can be c ea ed ha b ing all hese gaps oge he , namely: • Sys em A [83]: • Does No Ob ain: Ya n wis o ien a ion, ya n wis s ep, linea mass, mean de ia ion U (%), coe icien o a ia ion CV (%), hai iness mean de ia ion UH (%), hai iness s anda d de ia ion sH (%), classi ica ion o hai iness ypes (loop/p o uding ibe s), spec al analysis. • Limi ed in Ob aining: Numbe o cables, numbe o loose ibe s, olume, non-des uc i e a ibu es, use o deep lea ning echniques o ya n de ec de ec ion. • Sys em B [87]: • Does No Ob ain: Ya n wis o ien a ion, ya n wis s ep, linea mass, mean de ia ion U Chap e 3 – Li e a u e Re iew ___________________________________________________________________________ 89 (%), coe icien o a ia ion CV (%), hai iness coe icien H, hai iness mean de ia ion UH (%), hai iness s anda d de ia ion sH (%), classi ica ion o hai iness ypes (loop/p o uding ibe s), spec al analysis, hin and hick places de ec s. • Limi ed in Ob aining: Numbe o cables, numbe o loose ibe s, olume, non-des uc i e a ibu es. • Sys em C [89]: • Does No Ob ain: Ya n wis o ien a ion, ya n wis s ep, mean de ia ion o mass U (%), hai iness coe icien H, hai iness mean de ia ion UH (%), hai iness s anda d de ia ion sH (%), classi ica ion o hai iness ypes (loop/p o uding ibe s), Thin, Thick and Nep de ec s, spec al analysis based in image p ocessing, ya n diame e , linea mass, use o deep lea ning echniques o ya n de ec de ec ion. • Limi ed in Ob aining: Numbe o cables, numbe o loose ibe s, olume, non-des uc i e a ibu es. • Sys em D [91]: • Does No Ob ain: Ya n wis o ien a ion, ya n wis s ep, mean de ia ion o mass U (%), hai iness coe icien H, hai iness mean de ia ion UH (%), hai iness s anda d de ia ion sH (%), classi ica ion o hai iness ypes (loop/p o uding ibe s), spec al analysis based on image p ocessing, ya n diame e , olume. • Limi ed in Ob aining: Numbe o cables, numbe o loose ibe s, olume, non-des uc i e a ibu es. The analysis o he cha ac e is ics ob ained by Sys ems A, B, C and D elucida es a c i ical pe spec i e on he exis ing sys ems and p o o ypes o he ya ns analysis. Each sys em p esen s a mix o s eng hs and weaknesses, highligh ing he complex na u e o his ield. Al hough Sys em A p esen ad ances in ce ain pa ame e s, such as mecha onic de elopmen and image analysis o de ec de ec ion, hei limi a ions in se e al c i ical measu emen s canno be igno ed. Con e sely, Sys em B employs inno a i e app oaches like a i icial in elligence (AI) and image p ocessing o de ec de ec ion, ye i also alls sho in essen ial a eas, lacking comp ehensi e pa ame e s necessa y o holis ic ya n analysis. Simila ly, sys ems C and D in oduce inno a i e aspec s such as AI o de ec de ec ion, bu hey also ail in c ucial a eas, lacking comp ehensi e pa ame e s essen ial o holis ic ya n analysis. These gaps collec i ely indica e he inadequacy o any single sys em o comp ehensi ely add ess all aspec s o ya n analysis, especially he inco po a ion o deep lea ning echniques, image Chap e 3 – Li e a u e Re iew ___________________________________________________________________________ 90 p ocessing and compu e ision o de ec de ec ion and ob aining a majo i y o ya n pa ame e s, which a e lacking in mos sys ems. A c i ical analysis o hese sys ems highligh s a no able disc epancy: none alone p o ide a holis ic solu ion o ya ns analysis. The absence o a de eloped sys em ha inco po a es all a ibu es leads o an incomple e unde s anding o ya n quali y, making comp ehensi e assessmen s and quali y con ol in ex ile p oduc ion p ocesses di icul . Fu he mo e, he limi a ions o each sys em highligh he gap in he indus y sea ch o a comp ehensi e solu ion. The absence o spec al analysis based on image p ocessing, he inabili y o measu e ya n wis o ien a ion, and he lack o ce ain ya n quali y pa ame e s con inue o be un esol ed challenges in all sys ems. This gap highligh s he need o a comp ehensi e p o o ype ha no only ills hese gaps bu also add esses he de iciencies p esen in each sys em. In he sea ch o an e ec i e and comp ehensi e solu ion, i becomes inc easingly e iden ha a p o o ype capable o assimila ing he s eng hs o Sys ems A, B, C and D and, a he same ime, mi iga ing hei limi a ions is necessa y. Such a p o o ype should inco po a e mecha onic de elopmen , inco po a e non-des uc i e a ibu es, encompass a wide ange o ya n pa ame e s o measu emen , and le e age ad anced echnologies such as deep lea ning o de ec de ec ion. This p o o ype aims o ill he gap in ya n analysis me hodologies, enabling a deepe unde s anding o ya n quali y and p omo ing ad ancemen s in ex ile manu ac u ing p ocesses. In he con ex o deep lea ning echniques, om he au ho s knowledge li e a u e e iew e ealed no ins ances o sys ems o p o o ypes employing deep lea ning, speci ically he YOLO 5s6 algo i hm, o he cha ac e iza ion o ya n hai iness. Following his, he p oposed sys em in his hesis, which esponds o all hese gaps men ioned abo e and which jus i ied i s c ea ion, is desc ibed in he ollowing chap e s, and se es as a ca alys o inno a ion in ya n analysis and es ablishing he in oduc ion o deep lea ning o ya n quali y assessmen wi h he po en ial o allowing p oduc ion op imiza ion. Summa y o he chap e : This chap e p o ided an ex ensi e e iew o he li e a u e e e ing o ya n analysis sys ems, wi h a speci ic ocus on he u iliza ion o image p ocessing, compu e ision, and a i icial in elligence echniques. Then a compa a i e analysis is p esen ed o p o ide an o e iew o he s eng hs and limi a ions o he sys ems p esen ed. The chap e concludes wi h a c i ical e iew and analysis o he discussed li e a u e, o e ing an impa ial assessmen o he ad an ages and limi a ions o di e en ya n analysis sys ems. 4. IMAGE PROCESSING AND COMPUTER VISION SYSTEM FOR YARN ANALYSIS O e iew This chap e de ails he image p ocessing echniques u ilized in he compu e ision sys em dedica ed o ya n analysis. I includes segmen a ion algo i hms, ea u e ex ac ion me hods, and pa e n ecogni ion echniques ailo ed o his pu pose. Addi ionally, he ha dwa e se up o image acquisi ion is discussed, ou lining he speci ica ions o he imaging de ices used. Fu he mo e, he chap e desc ibes he in e ace so wa e de eloped o acili a e use in e ac ion wi h he sys em. 4.1 In oduc ion 4.2 Image p e-p ocessing 4.3 Ob aining he ya n co e 4.4 Isola ion o hai iness 4.5 Isola ion o pa icles 4.6 Image cap u e so wa e and ha dwa e 4.7 De eloped in e ace Chap e 4 – Image P ocessing and Compu e Vision Sys em o ya n analysis ___________________________________________________________________________ 92 4.1 In oduc ion This chap e ou lines he image p ocessing echniques employed in he de elopmen o algo i hms ocused on examining ya n cha ac e is ics o de e mine i s quali y. Key pa ame e s include linea mass, speci ic olume, de ec s in he ya n, and i s le el o hai iness. Addi ionally, he ha dwa e used o ob ain images is p esen ed, and he in e ace so wa e de eloped is desc ibed. 4.2 Image p e-p ocessing As i will be desc ibed in Figu e 100 o he lowcha in subchap e 4.7, a e image cap u e he i s s ep employs he con e sion o he image o g ayscale. This s ep is necessa y e en in he case o using a came a ha cap u es images only in g ayscale due o he o ma in which he came a na i e so wa e s o es he images. When hese images a e subsequen ly opened in he "Visual S udio" so wa e, he e is an impe ec con e sion o pixel alues, which equi es he g ayscale ans o ma ion. A e con e ing he image o g ayscale (Figu e 84a), he linea iza ion ( h esholding) o he image is ini ia ed. This p ocess is employed o ans o m he image in o a monoch oma ic o ma wi h he aim o dis inguishing he backg ound om he ya n. The OTSU linea iza ion me hod was employed, as depic ed in Figu e 84b. Figu e 84 – a) A ya n in g ayscale (le ); b) Image a e linea iza ion using he OTSU algo i hm ( igh ) [97]. In he nex s ep, a Gaussian il e is applied o he p e ious image (Figu e 85). This il e in oduces a blu ing e ec o he image, and i s applica ion aims a noise emo al. This app oach will enable he subsequen image ans o ma ions o be mo e success ul in isola ing o elimina ing desi ed de ails om he image. Chap e 4 – Image P ocessing and Compu e Vision Sys em o ya n analysis ___________________________________________________________________________ 93 Figu e 85 - a) G ay scale image (le ); b) Image wi h Gaussian il e ( igh ) [97]. 4.3 Ob aining he ya n co e To acili a e he analysis o he ya n co e exclusi ely, i was necessa y o pe o m mo phological ope a ions o elimina e he ya n hai iness, po en ial a i ac s in he image, and loose ibe s. The opening mo phological ope a ion was employed, which in ol es he applica ion o wo consecu i e mo phological ope a ions using he same s uc u al elemen as a e e ence. Fi s , an e osion ope a ion is applied o he image in ques ion using a s uc u al elemen , ollowed by a dila ion ope a ion on he same image using he same s uc u al elemen . These wo consecu i e ope a ions a e e e ed o as an "opening." In e ms o he s uc u al elemen , also known as he ke nel, a 16 × 16 ma ix was u ilized, whe e all i s elemen s ha e a alue o 1 [97]. The esul s o his ope a ion a e depic ed in Figu e 86. Figu e 86 - a) Image p io o he applica ion o he opening mo phological ope a ion (le ); b) Image subsequen o he implemen a ion o he opening mo phological ope a ion ( igh ) [97]. This p ocedu e allows o begin o disce n he co e o he ya n, which is now clea ly sepa a ed om all o he de ails in he ini ial image. Howe e , as can be obse ed, he e a e s ill some emnan s o de ails beyond he co e, pa icula ly he s a ing poin s o he ya n's uzz. Fo his eason, i is necessa y Chap e 4 – Image P ocessing and Compu e Vision Sys em o ya n analysis ___________________________________________________________________________ 94 o elimina e hese emnan s. To accomplish his, a mo phological closing p ocess is applied. This p ocess smoo hens he ya n ends, and in ce ain cases whe e aces o ya n uzz a e s ill isible, i emo es any emaining ya n aces ou side he co e. Figu e 87a) p o ides an example o he ou come. Figu e 87 - a) Image a e he closing p ocess (le ); b) Isola ed co e image ( igh ) [97]. In his image, he isola ion o he co e can be conside ed comple e. Consequen ly, i becomes possible o calcula e all he desi ed pa ame e s and cha ac e is ics. Howe e , o u u e ope a ions, as well as o isual and compu a ional consis ency, a inal in e se "Th esholding" p ocess is ad isable. This p ocess se es solely o in e he colo s and, consequen ly, he pixel alues. The esul o his ans o ma ion is illus a ed in Figu e 87b. Wi h he co e comple ely isola ed, i can begin he ex ac ion o pa ame e s om he ya n. The i s and mos e iden pa ame e is he ya n diame e , which can be de e mined by coun ing he whi e pixels in a column o he image. This p ocess is epea ed o all columns, and in he end, he a e age alue is ob ained o ensu e ha i is no in luenced by he p esence o hick o hin places. In he case o ideo analysis, he e is an impo an di e en ia ion o highligh . Fo each image, he ya n diame e is measu ed in only one column o he image. This is done o educe measu emen edundancy, a oiding measu ing he same sec ion mul iple imes. Addi ionally, i sa es analysis ime and compu a ional esou ces. The diame e measu ed in his manne is in pixel uni s, which, on i s own, may no be p ac ical unless con e ed o a eal-wo ld uni , in his case, millime e s. To con e om pixels o millime e s, he ac ual leng h o he ya n in he image was measu ed (see Appendix A – Ma hema ical Calcula ion o he Real Image Size and Lens Magni ica ion Fac o ). Wi h he eal image size known, i is possible o con e a pixel measu emen o millime e s using Equa ion 28. 𝒅𝒎𝒎 =𝒅𝒑×𝒉 𝟏𝟒𝟒𝟎 (28) Whe e: • dmm and dp co espond o he diame e s in millime e s and in pixels, espec i ely; Chap e 4 – Image P ocessing and Compu e Vision Sys em o ya n analysis ___________________________________________________________________________ 95 • h co esponds o he ac ual heigh o he image, and 1440 co esponds o he numbe o pixels p esen pe column. This p ocess can be epea ed o de e mining hick o hin places o he ya n and o de ec ing neps. Ini ially, he o al numbe o diame e samples is di ided by he desi ed numbe o di isions, meaning ha he en i e analyzed ya n is di ided in o he sec ions de ined by he use . Nex , he a e age diame e alue is calcula ed o each o hese sec ions, and his alue is compa ed o he o e all a e age diame e . The ole ance alue is used as a e e ence poin , om which a sec ion is conside ed ei he hick o hin. In con as , o neps de ec ion, he dimensional ole ance alue is cons an and se a 200%, meaning ha sec ions wi h a diame e alue abo e double he a e age a e conside ed a nep. A highe numbe o di isions esul s in g ea e esolu ion in de ec ing dimensional de ec s in he ya n. All es s aim o achie e a minimum esolu ion o one sample pe e e y 3 millime e s o ya n, as is used in USTER machines. The second and hi d pa ame e s o calcula e a e linea mass and ya n olume, espec i ely. Re e ing o hei espec i e equa ions, i can be seen ha he calcula ion o linea mass and olume depends on he leng h o he ya n pe sample, po osi y, ma e ial densi y, and he unknown a iable is he diame e . Finally, wi h all he basic ya n pa ame e s calcula ed, i is possible o p oceed o he s a is ical esul s ela ed o mass, including he mean de ia ion and he coe icien o a ia ion. 4.4 Isola ion o hai iness To ini ia e he p ocess o isola ing hai iness, i will e u n o he end o he common b anch (Figu e 100), speci ically o he image ea ed wi h he Gaussian il e (Figu e 85b). This image is ini ially subjec ed o ano he Gaussian il e . The eason o his is ha he con ou de ec ion p ocess ha ollows is pa icula ly sensi i e o image noise, and o bes de ec he o e all silhoue e o hai iness, i is necessa y o emo e as much noise as possible. This p ocess is no pa o he common b anch because, in es s, i was obse ed ha a hea ie Gaussian il e would comp omise o he esul s, speci ically in pa icle de ec ion (Figu e 86a) and co e isola ion. A e ob aining an image wi h educed noise, he Canny algo i hm is applied o pe o m a con ou de ec ion p ocess. The esul ing image will be a silhoue e o he ya n, as shown in Figu e 88. Chap e 4 – Image P ocessing and Compu e Vision Sys em o ya n analysis ___________________________________________________________________________ 96 . Figu e 88 - Isola ed ou lines o he ya n. A e obse a ion, bo h he ya n's silhoue e and ha o i s hai iness a e delinea ed. The goal om he e is o emo e he whi e pixels in his image, which co espond o he ya n's co e, in o de o isola e i s hai iness. To achie e his, he aim is o ob ain an image ha con ains only he co e's pixels, which will be used o sub ac ion. Fo una ely, one o he p e iously ob ained images can se e his pu pose. Since he i s b anch o his me hodology was ocused on isola ing he ya n's co e, i s inal image (Figu e 86b) can be used o his pu pose. Howe e , his image alone canno be used di ec ly o he sub ac ion p ocess, as image sub ac ion sub ac s he alue o each pixel pai . In he case o sub ac ing wo whi e pixels (bo h wi h a alue o 255) o wo black pixels (bo h wi h a alue o 0), he esul would be posi i e. Bu sub ac ing a whi e pixel om a black pixel (0 – 255) would esul in a nega i e alue. Fo his eason, i s i was needed o ob ain only he pixels ha a e common o bo h he isola ed co e image and he ya n con ou s image. I was used a logical "AND" ope a ion, which e ains he pixel alues ha a e he same in bo h images, se ing he o he s o 0, which, in his case, ep esen s a black pixel. An example o he esul o his ope a ion can be seen in Figu e 89. Figu e 89 - Con ou s o he isola ed co e. Chap e 4 – Image P ocessing and Compu e Vision Sys em o ya n analysis ___________________________________________________________________________ 97 Analyzing he igu e, he esul ing image om he logical ope a ion (Figu e 89) isola es he co e's con ou pixels. Using his image hen is pe o med he sub ac ion ope a ion be ween he ya n con ou s image (Figu e 88). The esul ing image ob ains he hai iness isola ed (Figu e 90). Figu e 90 - Con ou s o he isola ed hai iness. Wi h he hai iness isola ed i is possible o ex ac pa ame e s ela ed o he hai iness. To de e mine he hai iness coe icien (Equa ion 5), wo pa ame e s om he image a e needed o know: he ya n's leng h in he image and he leng h o he hai iness. The leng h o he hai iness can be es ima ed by coun ing he whi e pixels in he image and using he es ablished pixel- o-millime e con e sion. Howe e , i is impo an o no e ha he images ob ained do no con ain pixels exclusi ely om he ya n's hai iness, as he ou e co e con ou s a e s ill p esen . To ob ain he ac ual alue o he hai iness leng h in he image, sub ac ing wice he ya n leng h om he pixel coun is necessa y o elimina e he leng h measu ed by he co e's con ou pixels. The second pa ame e o de e mine is he numbe o loose ibe s om he co e, in o he wo ds, he numbe o loose hai s s ands om he co e. To calcula e his pa ame e , he coun o whi e pixels a a speci ic dis ance om he co e o he ya n is pe o med in a ow o he image. This coun is done bo h abo e and below he ya n. To pe o m his ope a ion, i is necessa y o i s iden i y he uppe and lowe bounda ies o he ya n co e. Re e ing o Figu e 86b, which shows he isola ed co e, one can analyze column by column o de e mine he s a and end poin s o he co e. Wi h his in o ma ion i becomes possible o iden i y he ow ha app oxima ely con ains he co e midpoin . This in o ma ion allows o coun ing he numbe o loose ibe s loca ed a a ce ain dis ance, bo h abo e and below he co e. I is impo an o no e ha since he p ocessed image con ains he con ou s o he hai iness, coun ing 2 pixels is equi alen o he p esence o only one loose end ibe . Chap e 4 – Image P ocessing and Compu e Vision Sys em o ya n analysis ___________________________________________________________________________ 104 2. Speci ic hai iness da a: • Hai iness index; • Numbe o loose ibe s ( his pa ame e is calcula ed only in image analysis, as i becomes inconsis en in ideo analysis due o he mo emen o he ya n). 3. Faul s da a and s a is ical pa ame e s: • Thin places; • Thick places; • Neps; • Mean mass de ia ion (U%); • Coe icien o mass a ia ion (CV%); • Hai iness s anda d de ia ion (sH%) (calcula ed o ideos/image sequences only, as a single image does no p o ide enough da a o an exac esul ). 4. Video and ame p ocessing: • To al ideo ame; • P ocessed ames; • F ames wi h e o . Ha ing p esen ed all he p og am inpu and ou pu pa ame e s, i will now be desc ibed he me hodology used o ob ain he desi ed esul s. While image and ideo analysis me hodologies di e due o he o me ocusing on single images and he la e in ol ing mul iple images, he me hodology o analyzing a single image emains qui e simila . The p ima y dis inc ion lies in he epe i ion o p ocesses o each image wi hin a ideo du ing ideo analysis, wi h esul s agg ega ed a he end. Gi en he di e se ange o da a equi ed om a single image, he e is no single sequence o p ocesses ha p o ides all he necessa y in o ma ion. To ob ain he h ee di e en ypes o images, namely: • an image wi h an insula ed ya n co e; • an image wi h isola ed hai s; • an image wi h isola ed winding pa icles. Chap e 4 – Image P ocessing and Compu e Vision Sys em o ya n analysis ___________________________________________________________________________ 105 A mul i ace ed app oach in ol ing a ious image p ocessing echniques is employed. The ollowing lowcha (Figu e 100) illus a es his mul i ace ed app oach used o gene a e each o he h ee image ypes. Figu e 100 – Algo i hm Analysis Me hodology Flowcha [92]. Wi h his ool i is possible o p esen in o ma ion in a legible and in ui i e way o he use . Chap e 4 – Image P ocessing and Compu e Vision Sys em o ya n analysis ___________________________________________________________________________ 106 Summa y o he chap e : This chap e p o ided a comp ehensi e pe spec i e on he elemen s in ol ed in de eloping image p ocessing algo i hms. These algo i hms a e designed o e alua e ya n quali y by analyzing i s a ibu es, such as linea mass, speci ic olume, ya n de ec s, and he le el o hai iness. 5. DEEP LEARNING TECHNIQUES FOR YARN HAIRINESS ANALYSIS O e iew The ollowing chap e desc ibes he me hods employed o he de ec ion and classi ica ion o hai iness in ya n using a new imp o ed YOLO 5s6 con olu ional neu al ne wo k (CNN). In his chap e , a comp ehensi e b eakdown o he YOLO 5s6 de ec ion me hod is p o ided, elucida ing i s cons i uen blocks and he enhancemen s ha ha e been in eg a ed. A concise o e iew o he Bo -T ans o me module, MHSA (Mul i-Head Sel -A en ion) blocks, and he C2 (coa se- o- ine) module, all in eg al componen s o he op imized YOLO 5s6 Hai iness algo i hm, is p esen ed. Addi ionally, he ac i a ion unc ions employed in bo h he de aul YOLO 5s6 algo i hm, and he a ian u ilized in he op imized YOLO 5s6-Hai iness algo i hm a e de ailed, along wi h he a ionale behind hese selec ions. 5.1 YOLO 5s6 Ne wo k – P oposed A chi ec u e 5.2 Bo -T ans o me Module & MHSA Block 5.3 C2 Module 5.4 Hype pa ame e s 5.5 Ac i a ion unc ion GeLU Chap e 5 – Deep lea ning echniques o ya n hai iness analysis ___________________________________________________________________________ 108 5.1 YOLO 5s6 Algo i hm – P oposed A chi ec u e Among he a ious e sions o YOLO 5, he YOLO 5s6 a chi ec u e was chosen o he s udy [75], [76], [77]. Se e al p elimina y es s we e ca ied ou , and i was obse ed ha his model ou pe o med o he algo i hm a ian s in e ms o o e all esul s. The decision o op o he YOLO 5s6 e sion ins ead o YOLO 8 (mos ecen e sion) was d i en by se e al ac o s [102]: 1. Pe o mance supe io i y: Th ough p elimina y es ing, i was e iden ha he YOLO 5s6 model ou pe o med o he algo i hm a ian s, including YOLO 8, in e ms o o e all esul s. 2. P io i y on p ocessing speed: Gi en he emphasis on speed, pa icula ly c ucial in applica ions equi ing ins an de ec ion and classi ica ion o ya n ibe s, YOLO 5s6 ema kable ames pe second (FPS) a e made i he p e e ed choice. 3. U iliza ion o GPU (G aphics P ocessing Uni ) esou ces: Ope a ing in an en i onmen wi h GPU access, YOLO 5s6 eme ged as he op imal selec ion due o i s op imized pe o mance o GPUs. Le e aging GPU esou ces signi ican ly accele a ed he p ocess o ibe de ec ion in ya n. 4. Balance be ween accu acy and speed: While YOLO 8 o e s ma ginal highe accu acy, YOLO 5s6 main ains a compe i i e equilib ium be ween accu acy and speed. This balance aligns wi h he equi emen s o he de eloped applica ion, necessi a ing bo h accu acy and swi esponse imes. 5. Use - iendliness: YOLO 5s6 s ands ou as he mo e use - iendly op ion compa ed o YOLO 8. Buil on he PyTo ch amewo k, i o e s seamless u iliza ion and deploymen o de elope s, enhancing ease o use du ing applica ion de elopmen and deploymen p ocesses. Recognizing he hai iness de ec ion pe o mance o he YOLO 5s6 model, an enhanced e sion named YOLO 5s6-Hai iness was de eloped. This imp o ed model inco po a es a Bo ans o me , a C2 (Coa se- o-Fine) module, and a GeLU (Gaussian E o Linea Uni ) ac i a ion unc ion, as depic ed in Figu e 101. Chap e 5 – Deep lea ning echniques o ya n hai iness analysis ___________________________________________________________________________ 109 Figu e 101 - Imp o ed a chi ec u e based on YOLO 5s6 – YOLO 5s6-Hai iness [76]. The imp o ed YOLO 5s6-Hai iness model inco po a es h ee key modi ica ions when compa ed o he o iginal/de aul YOLO 5s6: • In he o iginal YOLO 5s6 a chi ec u e, he las C3_1 laye in he Backbone, posi ioned jus be o e he s anda d SPPF (spa ial py amid pooling as ) module, has been eplaced by he C2 module, which is a ea u e bo owed om he mo e ad anced YOLO 8 objec de ec ion model [103]. This change enhances he algo i hm pe o mance and op imiza ion o i s speci ic neu al s uc u e; • Wi hin he Neck po ion o he a chi ec u e, he p e ious C3_1_F module has been eplaced by he Bo - ans o me module. This adjus men se es o enhance he model's e iciency in de ec ing looped ibe s wi hin he cap u ed images; • The CBS (Con + Ba chNo m + SiLU) module, which plays a undamen al ole in he a chi ec u e by pe o ming asks like downsampling, dimensionali y augmen a ion and educ ion, no maliza ion, and applying non-linea i ies o ea u e maps, has unde gone a ans o ma ion. I has been eplaced by he CBG (Con olu ional, Ba ch No maliza ion, GeLU) module, in oducing Chap e 5 – Deep lea ning echniques o ya n hai iness analysis ___________________________________________________________________________ 110 a new GeLU ac i a ion unc ion ins ead o he o iginal SiLU (Sigmoid Linea Uni ). This block consis s o a Con olu ional laye , a Ba ch No maliza ion laye , and he GeLU ac i a ion unc ion (Figu e 102). Figu e 102 - The CBG module in he op imized YOLO 5s6-Hai iness [104]. This CBG block is u ilized in mul iple o he blocks (Figu e 103) and in wo dis inc bo leneck blocks (Figu e 104). Figu e 103 - The CBG module employed in a ious o he blocks [104]. Figu e 104 - The CBG module is used in wo di e en ypes o bo leneck blocks [104]. The C3 module plays a i al ole in ea u e ex ac ion, comp ising h ee CBG modules and se e al s acked Bo leneck blocks. The no a ion C3_x indica es he p esence o x s acked Bo leneck blocks. In Figu e 105, he ea u e map is di ided in o wo b anches a e en e ing he C3 module. One b anch a e ses he CBG and Bo lenecks, while he o he solely passes h ough he CBG. Subsequen ly, he wo b anches a e conca ena ed and pass h ough ano he CBG module. Chap e 5 – Deep lea ning echniques o ya n hai iness analysis ___________________________________________________________________________ 111 Figu e 105 - Two dis inc ypes o CSP blocks (C3) [104]. In each Bo leneck block, wo CBG modules a e inco po a ed. The i s module conduc s a 1x1 con olu ion, educing he channel coun by hal , while he second module pe o ms a 3x3 con olu ion, doubling he numbe o channels. The ini ial educ ion in dimensionali y aids in enhancing he unde s anding o ea u e in o ma ion by he con olu ional ke nel, while he subsequen inc ease in dimensionali y acili a es he ex ac ion o mo e de ailed ea u es. To mi iga e he anishing g adien p oblem, a esidual s uc u e is employed, ensu ing he addi ion o he inpu and ou pu . The " anishing g adien p oblem" is a well- ecognized challenge in aining deep neu al ne wo ks, pa icula ly hose wi h nume ous laye s [76], [77], [105]. This issue a ises du ing backp opaga ion when g adien s diminish signi ican ly as hey p opaga e backwa d h ough mul iple laye s. Consequen ly, his esul s in slow o no lea ning in he ea ly laye s, ende ing he aining o deep ne wo ks a duous. Se e al echniques ha e been de eloped o add ess he anishing g adien p oblem [76], [77], [105]: 1. Ac i a ion Func ions: U ilizing ac i a ion unc ions like ReLU p omo es he low o g adien s, alle ia ing he anishing g adien p oblem; 2. Ba ch No maliza ion: The use o ba ch no maliza ion no malizes laye inpu s, s abilizing g adien low du ing aining; 3. Skip Connec ions: The inco po a ion o skip connec ions di ec ly connec s ea lie laye s o la e laye s, acili a ing smoo he g adien low and mi iga ing he anishing g adien p oblem. By implemen ing hese echniques, deep lea ning models can e ec i ely ain in deep ne wo ks wi h mul iple laye s, leading o enhanced con e gence and imp o ed pe o mance. The p ima y unc ion o he C3 module is o cap u e in ica e pa e ns and de ails in images as he ne wo k's dep h inc eases. A his s age, 3x3 con olu ions a e widely employed as hey enable he neu al ne wo k o lea n iche and mo e abs ac ep esen a ions o he objec s p esen ed in he images. Chap e 5 – Deep lea ning echniques o ya n hai iness analysis ___________________________________________________________________________ 112 When analyzing loop ibe s and p o uding ibe s in ya ns using he YOLO 5 model, each block assumes a speci ic ole in enhancing he de ec ion o hese hai iness ypes: 1. Backbone: • Func ion: The Backbone is asked wi h ex ac ing ele an ea u es om ya n images, encompassing low and mid-le el in o ma ion like edges, ex u es, and pa e ns in he ya n; • Impac on de ec ion: An e icien backbone cap u es dis inc i e ea u es o loop ibe s and p o uding ibe s in ya n. This ea u e ex ac ion p ocess con ibu es o mo e accu a e subsequen de ec ion. 2. Neck: • Func ion: The Neck se es as an in e media e componen ha amalgama es in o ma ion a a ious scales, enabling he model o de ec objec s o di e en sizes and con ex s; • Impac on de ec ion: Gi en he a ying sizes o loop ibe s and p o uding ibe s in ya n, he Neck acili a es he cap u e o con ex ual in o ma ion ac oss mul iple scales. This is pa icula ly ad an ageous o he accu a e de ec ion o smalle o mo e di use hai iness. 3. Head: • Func ion: The Head is esponsible o objec de ec ion, gene a ing p edic ions ega ding bounding boxes and objec classes wi hin he ya n ibe s, • Impac on de ec ion: The Head empowe s he model o pinpoin and classi y loop ibe s and p o uding ibe s. Bounding box p edic ions speci y he loca ion and size o he hai iness, while class p edic ions disce n whe he hey a e loop ibe s o p o uding ibe s. Each block plays a pi o al ole in he de ec ion o loop ibe s and p o uding ibe s, wi h he Backbone ex ac ing pe inen ea u es, he Neck consolida ing in o ma ion a di e se scales, and he Head execu ing he inal de ec ion. This comp ehensi e app oach p o ides he equisi e in o ma ion o p ecise hai iness iden i ica ion. Fu he mo e, in he op imized algo i hm, he C2 module was in oduced, a no el elemen de i ed om YOLO 8, o eplace he C3_1 module in he Backbone sec ion o he a chi ec u e. The C2 module in eg a es concep s om he C3 module and ELAN (E icien Laye Agg ega ion Ne wo k) [104], [106]. Figu e 106 illus a es he wo dis inc ions be ween he C2 and C3 modules. Chap e 5 – Deep lea ning echniques o ya n hai iness analysis ___________________________________________________________________________ 113 Figu e 106 - Di e ence be ween C3_x ( op) and C2 module (bo om) [104]. The dispa i y be ween he C3 and C2F blocks can be delinea ed based on hei s uc u e, objec i e, and applica ion [104], [106]: 1) S uc u e: C3 Block: The C3 block se es as a s eamlined i e a ion o he CSP block u ilized in YOLO 4 [104], [106]. I comp ises a sequence o 1x1 and 3x3 con olu ional laye s, ollowed by s acked Bo leneck modules. A key ea u e o he C3 block is he u iliza ion o a skip connec ion o amalgama e he o iginal ea u es wi h hose acqui ed wi hin he block. C2F Block: The C2F block, deno ed as he CSP2 (C oss S age Pa ial Ne wo k 2) block, ex ends he o iginal CSP block ound in YOLO [104], [106]. I in oduces a no el spli in he inpu , c ea ing wo dis inc pa hways (main and seconda y). The seconda y pa hway a e ses h ough addi ional con olu ional Bo leneck modules. Subsequen ly, he ou pu om hese Bo leneck modules is conca ena ed wi h he ou pu om he main pa hway, leading o he inal con olu ional laye s. 2) Objec i e: C3 Block: The p ima y aim o he C3 block is o p o ide a ligh e and mo e e icien al e na i e o he CSP block, op imizing compu a ional pe o mance while p ese ing objec de ec ion accu acy. C2F Block: In con as , he C2F block is speci ically designed o enhance he capaci y o cap u ing in o ma ion a a ied esolu ion le els. By pa i ioning he inpu in o wo pa hways and inco po a ing Chap e 5 – Deep lea ning echniques o ya n hai iness analysis ___________________________________________________________________________ 120 Wi hin he con ex o he p oposed op imized algo i hm YOLO 5s6-Hai iness, he placemen o he C2F block in he YOLO 5s6 a chi ec u e can exe a signi ican in luence on he de ec ion o loop ibe s and p o uding ibe s wi hin ya ns. In he YOLO 5s6-Hai iness algo i hm, he C2F block was posi ioned be o e he SPPF block. The C2F block's unc ion lies in i s capaci y o cap u e and use in o ma ion a di e se esolu ion le els, while he SPPF block is esponsible o ea u e usion h ough spa ial py amids, hus augmen ing he ea u e ep esen a ion wi hou he loss o c ucial con ex ual in o ma ion. Rega ding i s impac on he de ec ion o loop ibe s and p o uding ibe s, in oducing he C2F block p io o he SPPF block enabled he model o e ec i ely g asp essen ial con ex ual and spa ial in o ma ion ac oss di e en scales. This capabili y is pa icula ly ad an ageous in he iden i ica ion o in ica e objec s like loop and p o uding ibe s wi hin ya ns. 5.4 Hype pa ame e s In he speci ic con ex o de ec ing loop ibe s and p o uding ibe s in ya ns, signi ican changes we e implemen ed in high-le el hype pa ame e s. The modi ied hype pa ame e s [107] encompassed "ancho _ " and "scale" wi h he ollowing alues: ancho _ : 5.0 • The alue ancho _ : 5.0 designa es he h eshold employed o assigning ancho boxes o objec s in he images, se a 5.0; • Ancho boxes se e he pu pose o p edic ing he posi ion and size o objec s de ec ed by he model. Ancho s whose dimensions a e oughly i e imes la ge han he s anda d ancho dimensions a e exclusi ely conside ed when ancho _ is se o 5.0; • This adjus men inc eased he model's capabili y o selec la ge and mo e sui able ancho s o he de ec ion o la ge o unusually sized objec s wi hin he images. This was especially ele an in he case o objec classes ha signi ican ly exceeded he ypical ancho dimensions o he YOLO 5s6 model; • The ele a ion o his pa ame e helped diminish he occu ence o alse posi i e de ec ions, a aluable cha ac e is ic when he aining da a is p one o noise o complex backg ounds, as is he case wi h loop ibe s; • In he pa icula con ex o de ec ing loop ibe s and p o uding ibe s in ya ns, his adap a ion was ins umen al o accu a ely cap u ing s uc u es ha span ex ensi e a eas and exhibi a ied Chap e 5 – Deep lea ning echniques o ya n hai iness analysis ___________________________________________________________________________ 121 sizes. Fo ins ance, loop ibe s o p o uding ibe s ha ex end ac oss subs an ial egions o he image could be mo e e ec i ely de ec ed, gi en ha he images had a esolu ion o 1280x1280 pixels. scale: 2.0 • A scale o 2.0 was employed, which ansla ed o esizing he images o app oxima ely +/-200% o 300% beyond o below he s anda d image esolu ion; • The inc ease in scale esul ed in la ge images, which p o ed o be ad an ageous o he de ec ion o in ica e de ails in loop ibe s and p o uding ibe s wi hin ya ns; • I is essen ial o highligh ha esizing images o such an ele a ed scale subs an ially augmen ed he compu a ional demands, necessi a ing addi ional memo y and p ocessing esou ces; • These adjus men s played a pi o al ole in achie ing accu a e and comp ehensi e de ec ion. Gi en ha he images we e o 1280x1280-pixel esolu ion, signi ying a la ge scale, he model's capaci y o iden i y hese s uc u es wi h g ea e eliabili y was signi ican ly enhanced. The selec ion o he speci ic alues o "ancho _ " and "scale" was con ingen on he unique cha ac e is ics o he ya n da ase and he na u e o he loop ibe s and p o uding ibe s ha we e he a ge o de ec ion. 5.5 Ac i a ion unc ion GeLU The choice o he GeLU ac i a ion unc ion was pe o med a e a se ies o es s and a ho ough ma hema ical analysis, aking in o accoun he ollowing conside a ions [108]: • Cap u ing Complex Non-linea i ies: Loop ibe s and p o uding ibe s exhibi a di e se ange o shapes and ex u es, ende ing he de ec ion ask in ica e. The GeLU unc ion, dis inguished by i s heigh ened non-linea i y compa ed o SiLU, is adep a cap u ing in ica e and sub le ela ionships among he pa e ns inhe en in he ibe s and hei isual cha ac e is ics. This enhancemen subs an ially augmen s he model's capaci y o acqui e he capabili y o disce n a ious ypes o ya n hai iness; • Reduc ion o Vanishing G adien s: Deep neu al ne wo ks can con on he challenge o anishing g adien s, pa icula ly when employing he SiLU ac i a ion unc ion, cha ac e ized by de i a i es ha app oach ze o o la ge o nega i e inpu s. GeLU, on he o he hand, boas s smoo h de i a i es ac oss all poin s, e ec i ely mi iga ing he issue o anishing g adien s and ins illing g ea e s abili y in o he aining p ocess; Chap e 5 – Deep lea ning echniques o ya n hai iness analysis ___________________________________________________________________________ 122 • Imp o ed T aining S abili y: GeLU, which app oxima es he cumula i e Gaussian dis ibu ion unc ion, o e s an addi ional laye o aining s abili y. This s abili y, in u n, u nishes he neu al ne wo k wi h he capaci y o ine- une i s weigh s mo e p ecisely, ul ima ely enhancing i s abili y o de ec loop ibe s and p o uding ibe s; • Supe io Pe o mance Me ics: GeLU consis en ly deli e ed supe io esul s in me ics when compa ed o o he ac i a ion unc ions, a de ailed exposi ion o which will be p esen ed in chap e 6. Taking hese ac o s in o accoun , GeLU eme ged as he mos adequa e o he ac i a ion unc ion in he p oposed op imized YOLO 5 algo i hm. Summa y o he chap e : The chap e p esen ed a comp ehensi e explo a ion o c ucial componen s in he enhanced YOLO 5s6 Hai iness algo i hm, ocusing on he Bo -T ans o me Module, MHSA Block, and C2 Module. I explo es hei in eg a ion and ope a ional mechanisms, showcasing how hese elemen s enhance he neu al ne wo k's capaci y in in ica e asks such as objec de ec ion and ins ance segmen a ion. Addi ionally, i p o ides insigh s in o he a ionale behind choosing he GeLU ac i a ion unc ion, highligh ing i s bene i s in cap u ing complex pa e ns, educing anishing g adien s, ensu ing aining s abili y, and deli e ing supe io pe o mance me ics. O e all, his comp ehensi e analysis con ibu es signi ican ly o he imp o ed de ec ion and classi ica ion o hai iness in ya n using he op imized YOLO 5s6 algo i hm. 6. MECHATRONIC PROTOTYPE DEVELOPMENT O e iew This chap e p esen s he design o a specialized p o o ype ailo ed o mee indus y demands. The de elopmen p ocess and key conside a ions a e p esen ed, encompassing mechanical and au oma ion domains. This p o o ype au oma ically unwinds and winds ya n while allowing i o mo e swi ly pas a came a lens wi hin p ede ined ole ances and con olled ligh ing condi ions 6.1 Mecha onic sys ems design 6.2 Requi emen s 6.3 Me hodology 6.4 Func ions o a ya n es ing equipmen 6.5 Au oma ic sys em design 6.6 Con olle 6.7 Subsys ems and kinema ic chains 6.8 De elopmen o he au oma ion con ol p og am o he ya n unwinding, conduc ion, and winding Sys em 6.9 Main enance and emo e access o he mecha onic p o o ype 6.10 Tes s and esul s 6.11 Compa ison be ween he de eloped p o o ype and he o he sys ems ci ed in s a e o a 6.12 C i ical Re iew analysis Chap e 6 – Mecha onic P o o ype De elopmen ___________________________________________________________________________ 124 6.1 Mecha onic sys ems design The VDI 2206 s anda d is a Ge man echnical s anda d ha p o ides guidelines and me hodologies o he de elopmen o mecha onic sys ems. I add esses issues ela ed o he de elopmen p ocess, om iden i ying equi emen s o alida ing and e i ying he inal sys em. The VDI 2206 s anda d is known o i s sys ema ic app oach and he "V" model ha desc ibes he phases o mecha onic p oduc de elopmen . I is used by enginee s and indus y p o essionals o ensu e e iciency and quali y in mecha onic sys em de elopmen [109]. The objec i e o VDI 2206 is o p o ide a suppo me hodology o he de elopmen o mecha onic sys ems. The main cha ac e is ic o VDI is o be he p ocess, me hod, and ool o he ini ial phase o de elopmen , ocused on sys em design. The esul o he sys em design is he mecha onic sys em concep ( he solu ion is es ablished a e e i ica ion and alida ion). This VDI guide is a supplemen o he VDI 2221 s anda d and VDI 2422 [109]. Acco ding o he VDI 2206 s anda d, he de elopmen o a mecha onic p oduc ollows a "V" model. In he model depic ed in Figu e 106, cus ome needs a e ans o med in o equi emen s. Subsequen ly, hese equi emen s a e ans o med in o speci ica ions, as hey de ine he me ic cha ac e is ics ha he mecha onic p oduc mus mee . A e his, he nex necessa y s ep is Sys em Design [109]. In he de elopmen o mecha onic sys ems, i is essen ial o ollow an app op ia e me hodology o ensu e e iciency and use sa is ac ion. The VDI 2206 s anda d [110] o e s an impo an me hodological amewo k ha encompasses he mul idisciplina y inhe en in such sys ems, in eg a ing elec onic, mechanical, and in o ma ion echnology componen s. A he hea o his me hodology is he V-Model, a amewo k ha p oposes a sequence o s eps o mecha onic sys ems design. Howe e , i is impo an o no e ha no all au oma ion p ojec s s ic ly i in o a mul idisciplina y app oach. Following his, he s anda d ela ed o equi emen s, hei ca ego ies, and hei signi icance in shaping sys ems ha align wi h use and s akeholde needs will be discussed. This explo a ion aims o es ablish a obus g oundwo k o he e ec i e de elopmen o au oma ion sys ems [110]. The VDI 2206 s anda d p o ides a me hodological amewo k o he mul idisciplina y de elopmen o mecha onic sys ems, pa icula ly hose ha in ol e elec onic and mechanical componen s in Chap e 6 – Mecha onic P o o ype De elopmen ___________________________________________________________________________ 125 symbiosis wi h in o ma ion echnology. This me hodology e ol es a ound he cen al elemen known as he V-model (Figu e 109) [110]. Figu e 109 – V-Model o he Design o a Mecha onic Sys em - VDI 2206 [110]. The V-Model p oposes a sequence o s eps o he design o mecha onic sys ems, which a e [110]: 1. Requi emen s - This is he i s s age, consis ing o desc ibing he sys em o be ob ained in he o m o equi emen s agains which he esul ing sys em will be subsequen ly e alua ed; 2. Concep ual Sys em Design - This s age allows o he c ea ion o a mul idisciplina y solu ion concep ha leads o he equi ed cha ac e is ics o he sys em o be ob ained. To achie e his, he main unc ion is di ided in o sub- unc ions, o which indi idual solu ion o ope a ion p inciples a e ound. Thei pe o mance is e alua ed wi hin he con ex o he sys em ac oss a ious domains; Chap e 6 – Mecha onic P o o ype De elopmen ___________________________________________________________________________ 126 3. Speci ic Sys em Design - This s ep in ol es de eloping sec ions o he global solu ion ela ed o a ious a eas in ol ed (Mechanical Enginee ing, Elec onics, Compu e Science, among o he domains); 4. In eg a ion - The esul s o a ious componen s o he global de eloped solu ion wi hin each domain a e in eg a ed o ob ain an o e all solu ion o he sys em; 5. P ope y Ve i ica ion - This s age in ol es compa ing he p ope ies o he de eloping sys em wi h hose de ined o i and is associa ed wi h he concep s o e i ica ion and alida ion. Ve i ica ion in ol es o mally analyzing whe he he sys em mee s all p oposed equi emen s. Valida ion in ol es in o mally checking i he sys em is sui able, ypically done in an in o mal manne . The p ope y e i ica ion p ocess con inues h oughou he p ojec , al hough i is o mally loca ed du ing sys em in eg a ion. This can be done i ually, physically, o in a mixed app oach; 6. Modeling and Model Analysis - This s age uns pa allel o all s eps excep equi emen s and in ol es assessing he sys em's p ope ies using models o compu e -based simula ion ools. Ano he me hodology ollowed o his mecha onic p o o ype, is based on he a ional me hodology p esen ed by Nigel C oss, which is simila o bu wi h some imp o emen s o e he me hodology ou lined in he Ge man enginee ing s anda d VDI 2221 [110]. The gene al me hodology p esen ed in VDI 2221 consis s o se en phases: 1. Cla i ica ion o objec i es; 2. Func ion s uc u e; 3. Solu ion p inciples and hei combina ions; 4. Di ision in o modules; 5. De elopmen o he main modules; 6. De elopmen o all modules; 7. P oduc ion p epa a ion. Howe e , he "Requi emen s" s age emains o undamen al impo ance, as i se es as he ounda ion o he p ojec . Requi emen s a e he building blocks upon which he au oma ion sys em will Chap e 6 – Mecha onic P o o ype De elopmen ___________________________________________________________________________ 127 be cons uc ed, and hei p ope de ini ion is essen ial o ensu e ha he sys em mee s he needs and expec a ions o he use s. This is whe e a jou ney o unde s and equi emen s begins, a opic o u mos signi icance in he de elopmen o he au oma ion sys em o winding and unwinding ya n [111]. The "Requi emen s" se es as a means o ensu e ha he sys em mee s he p oposed needs and expec a ions, cons i u ing he p ima y inpu o he p ojec . In his ega d, he ollowing concep s ela ed o his heme a e p esen ed [111]. 6.2 Requi emen s In he con ex o de eloping he mecha onic p o o ype, his subchap e plays a cen al ole. The objec i es se o his esea ch in ol e he design o a mecha onic de ice capable o e icien ly winding and unwinding he ya n, enabling in-dep h analyses o a ious aw ma e ials. To achie e his challenge, i is c ucial o es ablish a comp ehensi e unde s anding o he equi emen s unde lying his mecha onic sys em. The "Requi emen s" ho oughly explo es he p ope ies ha he de ice mus possess o mee he needs and cons ain s o use s, highligh ing he dis inc ion be ween explici and implici , unc ional, and non- unc ional equi emen s. These equi emen s o m he ounda ion upon which he mecha onic p o o ype will be designed and cons uc ed, ensu ing i ul ills i s pu pose o e icien ly winding and unwinding he ya n in pe ec alignmen wi h he hesis objec i es. Requi emen s a e he p ope ies ha a pa icula sys em mus possess o mee he needs and cons ain s imposed by he use . Speci ically applied o he ield o au oma ion/so wa e, hey can be di ided in o wo ca ego ies: explici and implici , and unc ional and non- unc ional. Explici equi emen s a e he elemen s di ec ly eques ed by clien s, while implici equi emen s a e hose included by he de elopmen eam based on hei echnical knowledge, e en i hey ha e no been men ioned by he clien . Func ional equi emen s a e elemen s associa ed wi h he sys em's unc ionali y, while non- unc ional equi emen s ela e o aspec s o i s pe o mance. Func ional equi emen s should be cohe en and co e all he sys em's needs, cha ac e izing i s esponse o ce ain s imuli wi hou being bound o design and implemen a ion aspec s in o de o maximize he ange o solu ions o explo e. Non- unc ional equi emen s, by hei na u e, do no in luence he sys em's unc ionali ies o be de eloped and can be classi ied in o eigh ypes: appea ance, usabili y, pe o mance, ope abili y Chap e 6 – Mecha onic P o o ype De elopmen ___________________________________________________________________________ 128 (cha ac e is ics ha enable he sys em o ope a e p ope ly in i s en i onmen ), main enance and suppo , secu i y, cul u al and poli ical aspec s, and legal aspec s. 6.3 Me hodology Following he goal ee me hod, he main objec i es conside ed o he p ojec we e six [97]: 1. Sa e y; 2. Simplici y; 3. Reliabili y; 4. Po abili y; 5. Ve sa ili y; 6. Lowe cos . F om he objec i es, i was hen necessa y o quan i y and de ine some pa ame e s ha he machine mus mee o achie e he goals. The bounda ies se , acco ding o he me hod o pe o mance speci ica ions, we e as ollows in Table 3. Table 3 - P ojec Pe o mance Speci ica ions Objec i e Values Reason o choosing his op ion Analyze a ious ype o ya n ma e ials The machine should be compa ible wi h co on and polyes e ; B eaking Fo ce ≥ 1 N; Compa ible wi h a ia ions in b eaking ension ≤ |10|%. Ve sa ili y: Analyzing a ious ypes o ya n ma e ials, diame e s, and bobbin dimensions allows he p o o ype o be e sa ile, accommoda ing di e en ma e ials and sizes commonly used in ex ile indus ies. This e sa ili y enables b oade applica ions and compa ibili y wi h di e se ya n ypes, ca e ing o a wide ange o p oduc ion needs. Analyze a ious ype o ya n diame e s Compa ible wi h diame e s ≤ 2 mm. Compa ible wi h a ia ions in diame e ≤ |10|%. Analyze a ious bobbin dimensions Compa ible wi h bobbins wi h an ou e base diame e ≤ 160 mm and heigh ≤ 200 mm. Adhe ence o Speed ≤ 4.2 m/s wi h a maximum Accu acy and P ecision: Adhe ence o speed and Chap e 6 – Mecha onic P o o ype De elopmen ___________________________________________________________________________ 129 speed ole ances a ia ion o 0.5%. posi ion ole ances ensu es ha he machine ope a es wi h high accu acy and p ecision. This is c ucial in ya n analysis, as p ecise measu emen s a e necessa y o quali y con ol and consis ency in p oduc ion. Adhe ence o posi ion ole ance De ia ion in posi ion ≤ 1 mm. Machine and use sa e y In case o an eme gency, he machine should s op wi hin ≤ 1 second. Sa e y: P io i izing machine and use sa e y is undamen al. Ensu ing ha he machine s ops p omp ly in case o eme gencies, as well as ha ing simple and in ui i e se up p ocedu es, con ibu es o a sa e wo king en i onmen and educes he isk o acciden s o mishaps du ing ope a ion. Simple, in ui i e, and quick se up Se up ime ≤ 2 minu es. Du abili y and Main enance: Reducing wea o mo ing componen s is essen ial o he du abili y and longe i y o he machine. By minimizing wea and ea , main enance equi emen s a e educed, leading o cos sa ings, and ensu ing consis en pe o mance o e ime. Reduced wea o mo ing componen s Op imal ope a ing condi ions ≥ 10 km. Quali y Con ol: A oiding ya n b eakage is c i ical o main aining he in eg i y o he ya n being analyzed. I ensu es ha he p ocess emains unin e up ed and p e en s ma e ial was e, allowing o accu a e analysis wi hou comp omising quali y. A oid ya n b eakage A oid ≤ 5 ya n b eaks pe 10 km. Reduced Mass Mass ≤ 30 kg. Po abili y and P ac icali y: Reducing he mass and olume o he machine makes i mo e po able and space e icien . This aspec is aluable o indus ies whe e space is limi ed o whe e mobili y and lexibili y a e necessa y, enabling easie anspo a ion and ins alla ion in di e en se ings. 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A ailable: h ps://apenasimagens.com/p /dis ancia- ocal-ci culo- imagem/ APPENDIXES A.1 Ma hema ical Calcula ion o he Real Image Size and Lens Magni ica ion Fac o A.2 Full sys em con olle speci ica ion A.3 Highe Hie a chy G a ce - Coo dina ion o Ope a ing Modes A.4 P ede ined sc eens o HMI ins alled on he machine body A.5 LabVIEW in e ace - Local compu e A.6 De eloped Wo k Dissemina ion Appendixes ___________________________________________________________________________ 241 A.1 Ma hema ical Calcula ion o he Real Image Size and Lens Magni ica ion Fac o Be o e any measu emen s can be made on a cap u ed image, i is necessa y o p ecisely know he dimensions o a e e ence objec om which all o he desi ed dimensions can be ex apola ed. The bes e e ence objec is he pixel, as i is he elemen al objec o he image and has a simple geome ic shape (a squa e). To ob ain he eal dimensions o a pixel, he aim is o de e mine he dimensions o he en i e image. Then, i is simply a ma e o di iding he wid h o he image by he numbe o pixels in a ow o he image. To de e mine he dimensions o he image a he heigh o he ya n, he eal dimensions o he image backg ound we e i s calcula ed. Knowing he dis ance be ween he image backg ound and he came a, as well as he dis ance be ween he came a and he ya n, allows o a compa a i e calcula ion o ob ain he eal leng h o he ya n in he image. This is possible because he a ea o he image sec ion inc eases p opo ionally wi h he dis ance be ween he sec ion and he came a lens, as demons a ed in Figu e A.1-1. Figu e A.1-1 - Field o View Visualiza ion [128] To ob ain he ac ual size o he image backg ound, an image was cap u ed wi h a backg ound con aining a known 2-millime e squa e. Then, a simple ule o h ee was applied o ind he o al leng h o he image (Y), which is 4.23 millime e s. Knowing ha he image dimension is 1440x1080 pixels, he heigh o he image can be di ec ly calcula ed as 3.17 millime e s. Wi h he size o he image backg ound calcula ed, he dis ance be ween he image backg ound and he came a (Z) and he dis ance be ween he came a and he ya n (B) we e measu ed, esul ing in 41.6 millime e s and 12.8 millime e s, espec i ely. Wi h all hese dimensions, a simple ule o h ee can be applied o calcula e he ac ual leng h o Appendixes ___________________________________________________________________________ 248 G a ce C Figu e A.2-9 - G a ce C - Tes Mode Appendixes ___________________________________________________________________________ 249 G a ce o Tes Te mina ion Mode Figu e A.2-10 - G a ce o Tes Te mina ion Mode – Pa 1 Appendixes ___________________________________________________________________________ 250 Figu e A.2-11 - G a ce o Tes Te mina ion Mode – Pa 2 Appendixes ___________________________________________________________________________ 251 Figu e A.2-12 - G a ce o Tes Te mina ion Mode – Pa 3 Appendixes ___________________________________________________________________________ 252 G a ce o S op Mode Figu e A.2-13 - G a ce o S op Mode – Pa 1 Appendixes ___________________________________________________________________________ 253 Figu e A.2-14 - G a ce o S op Mode – Pa 2 Appendixes ___________________________________________________________________________ 254 Manual Mode G a ce G a ce A Figu e A.2-15 - Manual Mode G a ce – G a ce A – Pa 1 Figu e A.2-16 - Manual Mode G a ce – G a ce A – Pa 2 Appendixes ___________________________________________________________________________ 255 Figu e A.2-17 - Manual Mode G a ce – G a ce A – Pa 3 Figu e A.2-18 - Manual Mode G a ce – G a ce A – Pa 4 G a ce C Figu e A.2-19 - Manual Mode G a ce – G a ce C Appendixes ___________________________________________________________________________ 256 A.3 Highe Hie a chy G a ce - Coo dina ion o Ope a ing Modes Figu e A.3-1- Highe Hie a chy G a ce - Coo dina ion o Ope a ing Modes G a ce o Tes Mode G a ce A Figu e A.3-2 - G a ce o Tes Mode - G a ce A – Pa 1 Appendixes ___________________________________________________________________________ 257 Figu e A.3-3 - G a ce o Tes Mode - G a ce A – Pa 2 Appendixes ___________________________________________________________________________ 264 Figu e A.4- 3 - P ede ined sc eens o HMI ins alled on he machine body – Pa 3 Appendixes ___________________________________________________________________________ 265 Figu e A.4- 4 - P ede ined sc eens o HMI ins alled on he machine body – Pa 4 Figu e A.4- 5 - P ede ined sc eens o HMI ins alled on he machine body – Pa 5 Appendixes ___________________________________________________________________________ 266 A.5 LabVIEW in e ace - Local compu e Figu e A.5- 1 - LabVIEW in e ace - Local compu e Appendixes ___________________________________________________________________________ 267 A.6 De eloped Wo k Dissemina ion All con ibu ions esul ing om he de eloped wo k a e desc ibed below: F.1. Jou nal publica ions [1] Filipe Pe ei a, Leand o Pin o, Filomena Soa es, Rosa Vasconcelos, José Machado and Ví o Ca alho. A No el Deep Lea ning-Based Ya n Hai iness Cha ac e iza ion Me hodology Using an Imp o ed YOLO 5 Algo i hm. IEEE Access 2024. Submi ed [2] Filipe Pe ei a, Leand o Pin o, Filomena Soa es, Rosa Vasconcelos, José Machado and Vi o Ca alho, ONLINE YARN HAIRINESS - LOOP & PROTRUDING FIBERS DATASET, Da a in B ie , 2024, 110355, ISSN 2352-3409, h ps://doi.o g/10.1016/j.dib.2024.110355. [3] Filipe Pe ei a, Alexand e Macedo, Leand o Pin o, Filomena Soa es, Rosa Vasconcelos, José Machado and Vi o Ca alho, In elligen Compu e Vision Sys em o Analysis and Cha ac e iza ion o Ya n Quali y, Elec onics, 2023, 12 , 236. h ps://doi.o g/10.3390/elec onics12010236. F.2. Con e ence publica ions [1] Filipe Pe ei a, José Machado, Filomena Soa es, Rosa Vasconcelos and Vi o Ca alho, Design o a Ya n Analysis Mecha onic P o o ype o Tex ile Indus y, DESIGNCOMMIT 2024, B aga, Po ugal, 20-22 May 2024 (In p ess). [2] Rica do Pin o, Filipe Pe ei a, Vi o Ca alho, Filomena Soa es and Rosa Vasconcelos, Ya n linea mass de e mina ion using image p ocessing: i s insigh s, IECON 2019 - 45 h Annual Con e ence o he IEEE Indus ial Elec onics Socie y, Lisbon, Po ugal, 2019, pp. 198-203, doi:10.1109/IECON.2019.8926650. [3] Filipe Pe ei a, Vi o Ca alho, Rosa Vasconcelos, Filomena Soa es, A Re iew in he use o A i icial In elligence in Tex ile Indus y, Inno a ions in Mecha onics Enginee ing – ICIENG, 2021, Lec u e No es in Mechanical Enginee ing, Sp inge , h ps://doi.o g/10.1007/978-3-030-79168-1_34. Appendixes ___________________________________________________________________________ 268 F.3. Book publica ions [1] Filipe Pe ei a, Vi o Ca alho, Filomena Soa es, Rosa Vasconcelos, José Machado, 6 - Compu e ision echniques o de ec ing ya n de ec s, Tex ile Ins i u e Book Se ies, Applica ions o Compu e Vision in Fashion and Tex iles, Woodhead Publishing, 2018, Pages 123-145, ISBN 9780081012178, h ps://doi.o g/10.1016/B978-0-08-101217-8.00006-3. F.4. Da ase publica ion [1] Filipe Pe ei a, Leand o Pin o, José Machado, Filomena Soa es, Rosa Vasconcelos and Vi o Ca alho, Ya n Hai iness - Loop & P o uding Fibe s Da ase , Mendeley Da a, 2023, V1, h ps://da a.mendeley.com/da ase s/dk 6j6 w6c/1