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Structural and Mechanical properties of Ti–Si–C–ON for biomedical applications

Guimarães, Freddy; Oliveira, Cristina; Sequeiros, Elsa; Torres, Marta; Susano, M.; Henriques, M.; Oliveira, Rosário; Escobar-Galindo, Ramón; Carvalho, Sandra; Parreira, N.M.G.; Vaz, Filipe; Cavaleiro, Albano

Abstract

Ti–Si–C–ON films were deposited by DC reactive magnetron sputtering using different partial pressure of oxygen (pO2) and nitrogen (pN2) ratio. Compositional analysis revealed the existence of two different growth zones for the films; one zone deposited under low pO2/pN2 and another zone deposited under high pO2/pN2. The films produced under low pO2/pN2 were deposited at a lower rate and presented a fcc structure, as well as, dense and featureless morphologies. The films deposited with high pO2/pN2, consequently higher oxygen content, were deposited at a higher rate and developed an amorphous structure. The structural changes are consistent with the hardness and Young's modulus evolution, as seen by the significant reduction of the hardness and influence on the Young's modulus by increasing pO2/pN2.

Full text

S uc u al and Mechanical p ope ies o Ti–Si–C–ON o biomedical applica ions F eddy Guima ães a , C is ina Oli ei a a , Elsa Sequei os a , Ma a To es a , M. Susano b , M. Hen iques b , R. Oli ei a b , R. Escoba Galindo c , S. Ca alho a, ⁎, N.M.G. Pa ei a d ,F.Vaz a , A. Ca alei o d a Dep . Física, Uni e sidade do Minho, Campus de Azu ém, 4800-058 Guima ães, Po ugal b IBB—Ins i u e o Bio echnology and Bioenginee ing Cen e o Biological Enginee ing, Uni e sidade do Minho, Campus de Gual a , 4700-057, Po ugal c Ins i u o de Ciencia de Ma e iales de Mad id (ICMM-CSIC), Can oblanco, 28049, Mad id, Spain d ICEMS—Fac. de Ciências e Tecnologia da Uni e sidade de Coimb a, 3030-788 Coimb a, Po ugal A ailable online 4 Sep embe 2007 Abs ac Ti–Si–C–ON ilms we e deposi ed by DC eac i e magne on spu e ing using di e en pa ial p essu e o oxygen (p O2 ) and ni ogen (p N2 ) a io. Composi ional analysis e ealed he exis ence o wo di e en g ow h zones o he ilms; one zone deposi ed unde low p O2 /p N2 and ano he zone deposi ed unde high p O2 /p N2 . The ilms p oduced unde low p O2 /p N2 we e deposi ed a a lowe a e and p esen ed a cc s uc u e, as well as, dense and ea u eless mo phologies. The ilms deposi ed wi h high p O2 /p N2, consequen ly highe oxygen con en , we e deposi ed a a highe a e and de eloped an amo phous s uc u e. The s uc u al changes a e consis en wi h he ha dness and Young's modulus e olu ion, as seen by he signi ican educ ion o he ha dness and in luence on he Young's modulus by inc easing p O2 /p N2. © 2007 Else ie B.V. All igh s ese ed. Keywo ds: Ti–Si–C–ON; Mechanical; S uc u al; Bioma e ials 1. In oduc ion Signi ican de elopmen o nano echnology in ma e ial science and enginee ing has aken place in he las decade. The ecen in e es in he so-called mul i unc ional-coa ing ma e ials is o majo impo ance, om bo h he undamen al scien i ic iewpoin and in e ms o indus ial applica ions. Mo e speci ically nowadays, as he endency in implan science is o subs i u e he o al hip eplacemen , usually a a ie y o ma e ials, such as me als, ce amics, polyme s and composi es by ma e ials coa ed wi h p o ec i e hin- ilms [1]. Clinical esul s show ha excessi e wea and wea deb is a e he p ima y cause o ailu e implan s o ul a high molecula weigh polye hylene—UHMWPE o me al [2]. Mo eo e , in ec ions caused by commensal mic o ganisms a e also a cause o implan ailu e. Fo example, S aphylococcus epide midis and o he coagulase-nega i e s aphylococci (CoNS) a e amongs he majo culp i s o hese in ec ions [3,4]. This is ela ed, in pa , o hei abili y o adhe e o implan ed medical de ices and o m bio ilms. Despi e se e al e o s o ind medical he apies o ea bio ilm in ec ions [5], he physical emo al o an in ec ed medical de ice is o en necessa y wi h i s associa ed incon enience and addi ional economic cos . The e is conside - able in e es in inc easing he li e ime o implan s h ough he inhibi ion o bio ilm o ma ion and he use o mo e wea - esis an biocompa ible coa ings. The pu pose o his wo k is o s a o in es iga e he easibili y o a ious Ti–Si–C–ON ilms o load-bea ing medical de ices. F om known esul s i is widely accep ed ha is possible o achie e supe ha dness by Si inco po a ion in TiN [6] and a dec ease in he Young's modulus is obse ed by addi ion o oxygen [7]. Also, wo k has shown ha he co osion esis ance ends o be sligh ly imp o ed by oxygen inco po a- ion [8]. Recen published wo ks showed ha Ti–Si–Cisa p omising sys em because o i s pa icula s uc u e, as well as, i s ex ao dina y mechanical and ibological p ope ies [9]. A ailable online a www.sciencedi ec .com Su ace & Coa ings Technology 202 (2008) 2403–2407 www.else ie .com/loca e/su coa ⁎Co esponding au ho . E-mail add ess: [email p o ec ed] (S. Ca alho). 0257-8972/$ - see on ma e © 2007 Else ie B.V. All igh s ese ed. doi:10.1016/j.su coa .2007.08.056 Taking his in o conside a ion, he main ask o his pape is ocussed on he s udy o he s uc u al and mechanical p ope ies o Ti–Si–C–ON ilms wi h di e en O/N a ios. 2. Expe imen al de ails The Ti–Si–C–ON samples we e deposi ed by d.c. eac i e magne on spu e ing om wo opposed high pu i y (99.6%) Ti a ge s (20×10 cm 2 ); one Ti a ge wi h some inc us ed Si pelle s (he ea e designa ed as he TiSi a ge ) and he o he wi h ca bon pelle s (designa ed as he TiC a ge ), placed in p e e en ial e oded zone. The a ea occupied by he pelle s was close o 11 cm 2 in each a ge . Deposi ions we e ca ied ou unde an A +(N 2 +O 2 ) a mosphe e in an Alca el SCM 650 appa a us. Du ing he deposi ions he subs a es (s eel and silicon) we e o a ed 70 mm abo e he a ge a cons an speed o 7 pm. The base p essu e in he chambe was abou 10 −4 Pa and ose 4.5× 10 −1 Pa du ing he deposi ions. In o de o change he amoun o oxygen, he samples we e g own wi h a a ia ion in he N 2 +O 2 low (changing he N 2 om 6.5 o 0 sccm and he O 2 om 0 o 5.25 sccm), while main aining he A low cons an a 60 sccm. The subs a e bias ol age and he empe a u e we e kep cons an a −50 V and 200 °C, espec i ely. The cu en densi y applied o he TiC a ge was 5 mA/cm 2 and ha o he TiSi a ge was 6 mA/cm 2 . Elec on P obe Mic oAnalysis (EMPA) and Glow Discha ge Op ical Emission Spec oscopy (GDOES) we e used o he de e mina ion o he chemical composi ion o he coa ings and we e ca ied ou using a Cameca SX-50 elec on p obe mic oanalysis appa a us and a Jobin Y on RF GD P o ile , espec i ely. The c oss-sec ional mo phology was examined using a con en ional SEM on ac u ed samples. The s uc u e and phase composi ion o he coa ings we e assessed by XRD, using a con en ional Philips PW 1710 di ac ome e , ope a ing wi h CuK α adia ion, in a B agg-B en ano con igu a ion. The ha dness (H) and he Young's modulus (E), we e e alua ed by dep h-sensing inden a ion, using a Fishe scope H100 appa a us a maximum load o 30 mN. Co ec ion o he geome ical de ec s in he ip o he inden e , he mal d i o he equipmen and unce ain y o he ini ial con ac was also pe o med in ag eemen wi h wha is p oposed on [10,11]. I should be poin ed ou ha any co ec ion due o esidual s esses was done. The Residual s esses, σ , we e ob ained by he de lec ion me hod om S oney's equa ion [12], using subs a e cu a u e adii, bo h be o e and a e coa ing deposi ion [13]. 3. Resul s and discussion 3.1. Composi ion mo phology analysis The chemical analysis o he ilms was ob ained using GDOES and EPMA measu emen s. Fo he deposi ed samples he esul s o an a e age o hese analyses as unc ion o he oxygen pa ial p essu e and he ni ogen pa ial p essu e a io (p O2 /p N2 ) a e shown in Fig. 1. I is isible ha he Si and C con en emains almos cons an o all coa ings independen o p O2 /p N2 and he alue is e y low (b10 a .%). As expec ed, he ni ogen con en dec eased om 54 o 2 a . % and he oxygen inc eased om 2.9 o 34.7 a . % on inc easing he p O2 /p N2 om 0.046 o 20. Also an inc ease in Ti con en was obse ed as p O2 / p N2 inc eased. In ac , due o he high amoun o ni ogen in he coa ing deposi ed wi h lowe p O2 /p N2 (NN50 a .%), i is possible ha he a ge s a e al eady poisoned; his would also explain he low deposi ion a e o his coa ing (as can be seen in Fig. 2). By inc easing he oxygen low, he oxygen beha iou is no linea , o lowe low a es dissocia ion o he oxy- gen molecules can occu , which inc eases he eac i i y o he sys em and hus he deposi ion a e (seen in Fig. 2). A he same ime some ni ogen a oms a e eplaced by oxygen (p O2 /p N2 =0.6) and in a second phase, he eac ion be ween he oxygen in he a ge commences. This eac ion s a s in a monolaye o med by chemiso p ion and o each oxygen a om inco po a ed in he a ge , wo o ni ogen a e eed, due o he o ma ion o a TiN laye o he o ma ion o a TiO 2 laye . This will inc ease he pa ial p essu e o ni ogen in he eac i e a mosphe e, which can explain he lowe oxygen con en o he coa ing deposi ed a p O2 /p N2 =0.8, keeping in mind ha , he low o eac i e gas is always he same and so, he numbe o molecules o O 2 +N 2 is cons an . To educe oxygen poisoning, Fig. 1. Va ia ion o he concen a ion o Ti, C, Si, O and N as a unc ion o p O2 / p N2 . Fig. 2. Va ia ion o he deposi ion a e as a unc ion o p O2 /p N2 . 2404 F. Guima ães e al. / Su ace & Coa ings Technology 202 (2008) 2403–2407 i is equi ed o double he numbe o a oms in compa ison o ha o ni ogen. This will inc ease o he non-poisoned ac ion o he a ge , acco ding he Be g's Model, and should inc ease in he numbe o he spu e ed Ti a oms, leading o an inc ease in Ti composi ion. Fo he coa ings deposi ed wi h a high p O2 /p N2 a io, he con inua ion o he p e iously desc ibed phenomenon occu s, bu because o he dec ease o he ni ogen low, he amoun o ni ogen in he coa ing educes, while a he same ime he oxygen low is inc eased, which will p omo e an inc ease o he oxygen in he coa ing. The amoun o oxygen added o he eac i e a mosphe e is no enough o each he s oichiome ic composi ion TiO 2 , see composi ion o he coa ing deposi ed wi h p O2 /p N2 =20, his is an e idence o a non-poisoned a ge , du ing he deposi ion wi h high amoun o oxygen, and his is he explana ion o he high deposi ion a e o his coa ing, as is seen in Fig. 2. The mo phology o he coa ings is disclosed by c oss-sec ional SEM mic og aphs o ac u ed samples, shown in Fig. 3. Conside ing he esul s o samples ep esen ing he g oup deposi ed wi h low p O2 /p N2 (Fig. 3a), all ilms show dense and e y compac ea u eless mo phologies. The dec ease in he deposi ion a e can induce his compac mo phology. The mic os uc u e o single-phase ilms is quali a i ely well desc ibed by he s uc u al zone models de eloped by Mo chan and Demchishin [14] and Tho n on [15]. These models, howe e , change ma kedly when impu i ies o selec ed addi i es a e inco po a ed in he ilms [16]. Impu i ies o addi i es (like oxygen in ou case) s op he g ain g ow h and s imula e a enuclea ion o g ains, which esul s in a globula mo phology. The sample deposi ed wi h p O2 /p N2 =1.76 (Fig. 3b) p esen s his ype o mo phology. As he p O2 /p N2 is u he inc eased he coa ings p esen mo phologies wi h a la ge numbe o oids wi hin shaped c ys alli es (Fig. 3c), as a esul o he highe deposi ion a e. 3.2. S uc u e cha ac e iza ion The di e ences in he composi ion a e well co ela ed wi h he di e ences obse ed in he de eloped s uc u e. The X- ay di ac og ams o he as-deposi ed samples a e illus a ed in Fig. 4. In e na ional Cen e o Di ac ion Da a (ICDD) o α—Ti (ICDD ca d n . 44-1294), TiN (ICDD ca d n . 38-1420, TiC (ICDD ca d n . 01-071-6256), and TiC 0.2 N 0.8 (ICDD ca d n . 01-076-2484) we e also included a he op o Fig. 4.The abo e-men ioned egimes changes (low p O2 /p N2 a io and high p O2 /p N2 a io) a e also e iden in he s uc u al ea u es e ealed by he XRD esul s. Fo he samples deposi ed unde low p O2 /p N2 i is possible o iden i y a cc ype s uc u e and he e is a endency o an inc ease in he peak in ensi y a io I (111) /(I (111) +I (200) wi h inc ease in p O2 /p N2 , indica ing a p e e en ial c ys alline g ow h change. I is di icul o unequi ocally iden i y which phases a e o med. E.V. Shalae a e al. [17] s a ed o Ti–Si–N–O ilms ha a a silicon con en o 10 a . %, he ilms had nea ly single- phase c ys alline s uc u e TiSiN(O) wi h minimum g ain size 1.5–2 nm. Al hough, a ha momen , wi h he di ac ion analysis, he e is no e idence ha silicon is pa ially dissol ed in a cubic solid solu ion TiSiN(O). Ca bon and oxygen subs i u ion o egula ni ogen posi ions o o med cc Ti(C,O,N) phase, once he ni ogen con en dec eases, could be possible. The samples ha we e deposi ed a high p O2 /p N2 p esen ed a signi ican loss o c ys allini y, wi h he sample wi h highes oxygen con en ound o be amo phous. Fo his g oup he inc ease in he deposi ion a e (as men ioned be o e) and he a ailable oxygen ha is in- co po a ed in he la ice, educes he possibili y o c ys alliza ion. The ex ended de o ma ion o he cc s uc u e esul ing om he Fig. 3. C oss-sec ional mic og aphs o Ti–Si–C–ON coa ings o di e en p O2 /p N2 a) 0.046 b) 1.73 c) 20. Fig. 4. XRD pa e ns o di e en Ti–Si–C–ON ilms. 2405F. Guima ães e al. / Su ace & Coa ings Technology 202 (2008) 2403–2407 inco po a ion o oxygen p obably inc eases he numbe o de ec s, which acili a es he o ma ion o he amo phous s uc u e. The obse ed changes in ilm s uc u e and o ien a ion as a unc ion o p O2 /p N2 , can be desc ibed in h ee s eps: - Fi s a low p O2 /p N2 , he oxygen is p obably inco po a ed in o he g ain bounda ies and con inues o accumula e du ing GB mig a ion, esul ing in a ex u e wi h low deg ee o p e e ed o ien a ion and wi h low g ain size (Fig. 4); - Second wi h sligh ly highe p O2 /p N2 coa sening du ing coalescence is se e ely supp essed. The compe i i e g ow h which ollows is go e ned by aniso opic c ys allog aphic e ec s since he oxygen is inco po a ed in o he la ice, as desc ibed in [18]. The ilm is composed o globula g ains (Fig. 3b) wi h andom o ien a ion (Fig. 4); - Thi d as he p O2 /p N2 is u he inc eased, wi h inc easing oxygen concen a ion, he g ain size dec eased. The p esence o oxide phases inhibi s GB mig a ion in he bulk o he ilm, p e en ing g ain coa sening, becoming he ilm g ow h, a e y high p O2 /p N2 , amo phous. 3.3. Mechanical p ope ies The e olu ion o ha dness and Young's modulus as a unc ion o he p O2 /p N2 is illus a ed in Fig. 5. The s uc u al changes a e consis en wi h he e olu ion o he ha dness, as i can be seen by he signi ican educ ion o he ha dness by inc easing p O2 /p N2 , a ying om ypical TiN (23 GPa) ilm o he lowes p O2 /p N2 o hose o TiO x amo phous phase o highes concen a ion o oxygen (≈15 GPa) [19]. The eplace- men o ni ogen by ca bon a oms and he addi ion o Si in he coa ings leads o a dis o ion in he NaCl la ice ype s uc u e, which usually esul s in he inc ease o ha dness [20,21]. This is no obse ed in ou coa ings p obably due o he amoun o oxygen, as i is known ha he oxygen ac ing as an impu i y dec eases he ha dness o he coa ings [22]. A isible dec ease in Young's modulus was ound, wi h inc easing p O2 /p N2 and ela es o an inc ease on he de ec densi y and also he dec ease o he bonding ene gy, due o he inc ease dis ance be ween he a oms Ti, N and O, as he s uc u e changes o an amo phous ype. Fig. 6 shows he e olu ion o esidual s ess as unc ion o p O2 /p N2 . F om his g aph i is clea ha all coa ings a e in he comp essi e s ess s a e. This esul should be expec ed because o he low wo king p essu e (b0.45 Pa). Unde hese condi ions, spu e ed a oms o e lec ed A neu als could induce he well- known a omic peening e ec , which p omo es he comp essi e esidual s ess s a e [12,23]. Rega ding he e olu ion o he comp essi e s esses wi h inc easing p O2 /p N2 , i is possible o see ha he e is a dependence o he esidual s ess on he p O2 / p N2 . I is also no iceable a co ela ion be ween he comp essi e s esses and he measu ed ha dness. Fi s he ha des samples (deposi ed wi h low p O2 /p N2 ) p esen ed he highes esidual s ess alues, which we belie e is due o ilm densi ica ion and he p esence o la ice de ec s in he ilm's s uc u e, which ac as an obs acle o disloca ion mo ion. Secondly, o he ilms deposi ed wi h a high p O2 /p N2 which p esen ed e y low ha dness alues and de eloped a po ous columna g ow h is obse ed a s ong endency o s ess educ ion. Fu he mo e, as he oxygen inc eases he dis o ion in he c ys alline la ice inc eases, leading o a endency o ilm o become amo phous, as can be seen om he di ac ion pa e ns. As a esul o his highe deg ee o amo phous s uc u e, he ilms enhance hei capaci y o accommoda e he s ess, leading o a educ ion o i s alue. Fo he highes oxygen con en , eached o highes p O2 /p N2 , he coa ing is amo phous and he e o e he esidual s esses and ha dness a e e y low. In he li e a u e, Pa ei a e al. [12] as well as Vaz e al. [19] ha e s udied he in luence o he oxygen ac ion in he esidual s esses and ha dness o W–O–N, Ti–O–N coa ings, espec i ely. Globally, also hei case, he ha dness and esidual s ess dec eased wi h inc easing oxygen ac ion. 4. Conclusions Ti–Si–C–ON hin ilms we e deposi ed by eac i e mag- ne on spu e ing wi h di e en p O2 /p N2 . The ilms deposi ed unde low p O2 /p N2 p esen ed a dense and compac mo phology, a cc—c is alline s uc u e, ha dness highe han 20 GPa, highe Fig. 6. Comp essi e esidual s esses o spu e ed Ti–Si–C–ON as a unc ion o p O2 /p N2 . Fig. 5. Ha dness o spu e ed Ti–Si–C–ON as a unc ion o p O2 /p N2 . 2406 F. Guima ães e al. / Su ace & Coa ings Technology 202 (2008) 2403–2407 comp essi e esidual s ess. The ilms ha we e deposi ed wi h highe p O2 /p N2 p esen ed a po ous mo phology and a e amo phous. These samples exhibi ed low ha dness and e y low comp essi e esidual s ess. Tanking accoun he applica ion o hese coa ings (biomedical applica ion), p elimina y esul s showed, ha samples deposi ed wi h highe a ios o p O2 /p N2 p esen ed lowe alues o bio ilm o ma ion, indica ing ha he inc ease o oxygen leads o bioma e ials less suscep ible o be colonized by S. epide midis. Howe e , hese bioassays will be p esen ed by he au ho s in a u u e publica ion. Re e ences [1] D.V. S ansky, D.V. Le asho , N.B. Glushanko a, N.B. D'yakono a, e al., Su . Coa . Technol. 182 (1) (2004) 101. [2] Kalpana S. Ka i, Colloids Su . B Bioin e aces 39 (2004) 133. [3] Nuno Ce ca, Síl ia Ma ins, Ge a d B. Pie , Rosá io Oli ei a, Joana Aze edo, Res. Mic obiol. 156 (2005) 650. [4] M. Hen iques, J. Aze edo, R. Oli ei a, B . J. Biomed. Sci. 63 (1) (2006) 5. [5] B. Jansen, K. K is insson, S. Jansen, G. Pe e s, G. Pul e e , J. An imic ob. Chemo he . 30 (1992) 135. [6] S. Vep ěk, A. Niode ho e , K. Mo o, e al., Su . Coa . Technol. 133–134 (2000) 152. [7] F. Vaz, P. Ce quei a, L.Rebou a, S.M.C. 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