Upgrade of 5m-Bench System for Traceable Measurements of Tapes and Rules at SASO-NMCC Dimensional Laboratory

Mac oScale Recen de elopmen s in aceable dimensional measu emen s 1 This wo k is licensed unde he C ea i e Commons A ibu ion 4.0 In e na ional License. To iew a copy o his license, isi h p://c ea i ecommons.o g/licenses/by/4.0/. Upg ade o 5m-Bench Sys em o T aceable Measu emen s o Tapes and Rules a SASO-NMCC Dimensional Labo a o y Bülen ÖZGÜR1,*, Okhan GANİOĞLU1, Nasse Al-Qah ani2, Faisal Al-Qah ani2 1TÜBİTAK, Na ional Me ology Ins i u e (UME) – Dimensional Labo a o y P.K. 54 41470 Gebze – KOCAELİ, TURKEY 2SASO NMCC, Saudi S anda ds, Me ology and Quali y O g. o Kingdom o Saudi A abia, Na ional Measu emen and Calib a ion Cen e *Co esponding au ho : [email p o ec ed] Abs ac TUBİTAK UME and SASO-NMCC ha e signed he p ojec named "STAGE D-3 De elopmen Consul ancy Se ice P og am o SASO-NMCC" in 2014. One pa o he p ojec was he upg ade o he old 5m-Bench sys em o SASO-NMCC ha was p e iously cons uc ed by NPL India. The e o e a e anspo ing and se -up p ocess o he old sys em o he new building o SASO-NMCC, upg ade p ocess has been s a ed. The old sys em, which was demoun ed, was mo ed o i s new loca ion and he pa s and main body o be used we e cleaned and ins alla ion was comple ed. The new ca ie was designed, manu ac u ed and assembled. All sys em a e loca ed on a special design app oxima ely 7.25 m long ables ha a e p e iously cons uc ed. The new ca ie is designed such ha i can ca y a came a o p obing o he scales, adjus able x-y ables, lap op pc and a e o- e lec o o lase in e e ome e . New ape clamping and ensioning sys em a e designed and manu ac u ed. A ca iage, which employs a came a o p obing o he scales on he apes, is mo ed along he ails du ing he measu emen . The image o he scale aken by he came a is iewed on he moni o sc een wi h he help o a so wa e. The ope a o can pe o m he p obing p ocess by simply placing he measu ed scales on he iewed a ge wi h he help o an X-Y able loca ed on he ca iage. The X-Y able and he ca iage mo emen a e measu ed by a lase in e e ome e . The measu emen alues a e ob ained and e alua ed acco ding o (OIML R 35-1), Eu opean legal me ology (73/362/EEC) s anda ds, o wi h he use speci ica ions. The de eloped so wa e o moni o ing he posi ion o he scale ha is unning unde windows en i onmen bu empe a u e measu emen and equi ed co ec ions a e made h ough lase in e e ome e . The o e all unce ain y o he sys em is m, whe e L is measu ed leng h o he ape o ule in me e s. In his pape he upg ade p ocess and he upg aded 5m-Bench Sys em o SASO-NMCC Dimensional Labo a o y is explained and i s pe o mance esul s a e shown. 1. In oduc ion SASO-NMCC has wo ked on a measu emen sys em named 5m-Bench ela ed o s eel ape and ule calib a ion in 3 di e en ime pe iods in 2014-2016. The cu en sys em o SASO-NMCC was p oduced and se iced by NPL-India. Howe e , new me ology building has cons uc ed and his sys em has no been mo ed o new building and le as demoun ed and hus became ou o se ice. As TÜBİTAK UME, one pa o he SASO de elopmen p ojec was o make 5m-Bench sys em ope a ional again in a easible way o he pu pose o p o iding se ices ela ed o s eel ape and ule calib a ions. Wo k low was as ollows; DOI: 10.7795/810.20180323A Mac oScale Recen de elopmen s in aceable dimensional measu emen s 2 This wo k is licensed unde he C ea i e Commons A ibu ion 4.0 In e na ional License. To iew a copy o his license, isi h p://c ea i ecommons.o g/licenses/by/4.0/.  Inspec ion o he exis ing 5m-Bench sys em, eassembly and ins alla ion o exis ing pa s and cons uc ion.  Remo al o us and dus om he old cons uc ion due o being ou o se ice o long ime and lack o main anence.  Ins alla ion o new sys em componen s, calib a ion wo k and es measu emen s  Desc ibing he wo king p inciples o he exis ing lase in e e ome e s and equipmen and showing how hey a e used on he sys em. Pe o ming sample calib a ion s udies wi h he new sys em. The wo k summa ized abo e and he upg aded sys em is called as 5m-Bench, "S eel Tape and Rule " measu ing sys em. As a esul , wi h he upg aded 5m-Bench sys em, i is now possible o SASO- NMCC o p o ide se ices in acco dance wi h in e na ional (OIML R 35-1) and Eu opean legal me ology (73/362/EEC) s anda ds. 2. 5m-Bench Measu emen Sys em S uc u es and Func ions Figu e 1: 5m-Bench sys em gene al iew The aim o he wo k was o modi y and upg ade he S eel Tape and Rule measu emen sys em o make i ope a ional again o he calib a ion o ule s up o 5 m in SASO-NMCC dimensional labo a o y. Calib a ion o he s eel apes and ule s can be done in one s ep up o 5 m and mul iple s eps o longe ule s by using s i ching me hod. The aceabili y o he measu emen sys em is p o ided di ec ly h ough he lase in e e ome e . Sys em body which is abou 7.25 m in leng h, is designed and manu ac u ed om s eel ma e ial. The sys em is equipped wi h a CCD came a and a lase in e e ome e op ics and a ca ie ha mo es on a double ow ail. Lase in e e ome e and dis ance op ics a e used in he sys em as a e e ence o calib a ing he s eel apes and ule s. A he beginning o he measu emen , he lase in e e ome e indica o is ese o ze o. The mo emen o he sys em is done manually. The dis ance be ween he op ics on he main body changes wi h he manual mo ion o he ca iage. The esul ing dis ance alue is ead di ec ly h ough he lase in e e ome e indica o . DOI: 10.7795/810.20180323A Mac oScale Recen de elopmen s in aceable dimensional measu emen s 3 This wo k is licensed unde he C ea i e Commons A ibu ion 4.0 In e na ional License. To iew a copy o his license, isi h p://c ea i ecommons.o g/licenses/by/4.0/. 2.1. 5m-Bench sys em ins alla ion and gene al cons uc ion s uc u e The en i e sys em is app oxima ely 7.25 m in leng h and 0.3 m in wid h and abou 1 m in heigh . Sys em consis s o 7.25 m long s eel p o ile body, 6 s eel p o ile s and, 2 line linea ail and a ious appa a us. I is ope a ing a 20 ± 0.5 °C. Angula e o s (pi ch and yaw) o ails was minimized by measu emen wi h lase in e e ome e angle op ics. The appea ance o he sys em du ing eassembly is simila o ha o Fig. 2. Figu e 2: Reassembling 5m-Bench sys em in he labo a o y Fi s , 6 pieces o s eel p o ile legs a e loca ed. The main body is placed on hese legs wi h he help o a c ane. Once he main body is in place on he legs, he linea i y in he pi ch and yaw di ec ions is also adjus ed o he maximum le el wi h he adjus men sc ews on he legs. 2.2. The Ca ie Mechanism The Ca ie is connec ed o 4 sliding bea ings on he main body. I can mo e manually on he ails. The ca ie has a 3-axis mic ome e mo ing able ca ying he lase in e e ome e dis ance op ics a ached on he CCD came a body. Wi h his mechanism, i is easy o adjus he dis ance op ics o he iew on he so wa e sc een. Figu e 3: Ca ie mechanism 2.3. S eel Rule and S e ching Uni S eel apes o ule s a e connec ed o he sys em wi h he aid o special appa a us. Wi h his appa a us, he ule o be measu ed can be connec ed o he sys em on p ope condi ions. In addi ion, he ca ie mo emen and he came a images can be pe o med in pa allel. DOI: 10.7795/810.20180323A Mac oScale Recen de elopmen s in aceable dimensional measu emen s 4 This wo k is licensed unde he C ea i e Commons A ibu ion 4.0 In e na ional License. To iew a copy o his license, isi h p://c ea i ecommons.o g/licenses/by/4.0/. As i can be seen in he s anda ds, i is necessa y o s e ch he alues o he s aigh sec ions o he ape on he me e . These alues can ange om 10N o 50N. S eel weigh s and clips a e used o he use o hese weigh s. Figu e 4: S e ching uni 2.4. Layou o a ge lines on ule scale lines and op ical p obing On he so wa e sc een he e a e a ge lines o assis he use du ing he measu emen . (Fig. 5) Figu e 5: So wa e sc een, a ge and scale line Wi h he help o hese lines, he posi ioning and alignmen o he s eel ape and ule on he sys em a e allowed o be adjus ed du ing he measu emen mo emen . I is also possible o mo e he came a wi h he aid o he XYZ s age and mic ome e on he ca iage ca and hus possible o each he desi ed posi ion using he a ge lines. Ta ge lines make i possible o make a isual decision o ind he midpoin s o he a ge lines. This mo emen wi h mic ome e s is called op ical p obing mechanism. P ecise adjus men be ween each measu ing poin s o he ca iage while app oaching he a ge poin is made by mic ome e s manually. Thus, he desi ed measu emen poin is eached on he ideo image wi h he help o p ecise mo ion. DOI: 10.7795/810.20180323A Mac oScale Recen de elopmen s in aceable dimensional measu emen s 5 This wo k is licensed unde he C ea i e Commons A ibu ion 4.0 In e na ional License. To iew a copy o his license, isi h p://c ea i ecommons.o g/licenses/by/4.0/. 2.5. Leng h Measu emen Sys em The me e is de ined as " he leng h o he pa h a elled by ligh in a acuum du ing he ime in e al o l/c=1/299 792 458 o a second.” This de ini ion es ablishes a ixed alue o he speed o ligh , “c”, in a acuum. Lase in e e ome e s ha e high linea i y, and also me ologically aceable leng h measu emen sys em. In he 5m-Bench measu ing sys em, He-Ne HP 5528A Lase in e e ome e wi h a wa eleng h o 633 nm and accu acy o 3 ppm is used as e e ence de ice along wi h i s display sc een, pe iphe al senso s and dis ance op ics. HP 5528A Lase in e e ome e used Michelson in e e ome e as i s op ical p inciple. Figu e 6: Michelson in e e ome e me hod Figu e 7: Lase in e e ome e accesso ies The lase measu emen sys em is connec ed o he cen e o he wo acks and o he posi ion closes o he ule o be measu ed. This dis ance was de e mined as 18 mm in he pi ch di ec ion and 2 mm in he yaw di ec ion. In his way he measu emen accu acy is inc eased and he Abbe o se is educed g ea ly. 2.6. Tempe a u e measu ing sys em Pla inum Resis o The mome e s (100 ohm: P 100) a e used o de e mine he empe a u e alues o he ule o be measu ed in he sys em. Th ee senso s a e loca ed nea he ule along he 5 me e sys em. 2.7. So wa e The homemade so wa e is w i en in Visual Basic 6.0 and wo ks on Windows 7 ope a ing sys em. The so wa e basically allows he display o he me e o be ans e ed o he sc een in he so wa e. This allows us o enla ge he image and make p ecise decisions a he des ina ion. In addi ion, image on he sc een can be u he enhanced by digi al zoom by so wa e. DOI: 10.7795/810.20180323A Mac oScale Recen de elopmen s in aceable dimensional measu emen s 6 This wo k is licensed unde he C ea i e Commons A ibu ion 4.0 In e na ional License. To iew a copy o his license, isi h p://c ea i ecommons.o g/licenses/by/4.0/. Figu e8: Gene al iew o so wa e 2.8. Da a collec ion and e alua ion Calib a ion o he s eel apes and ule s is pe o med a 10 equal in e als unless he cus ome has a speci ic eques . The acquisi ion o he da a om he lase in e e ome e display uni is aken manually. Unidi ec ional da a collec ion me hod is applied. The s a ing poin '0' is accep ed and s a ed. The measu emen s eps a e inc eased s ep by s ep up o he maximum measu ing poin and he dis ance alue a each poin is collec ed and e alua ed in manually c ea ed excel sp eadshee s. Measu emen is epea ed a leas h ee imes a he same a ge poin and a e age on hese da a is collec ed as measu emen esul . 3. Ve i ica ion o Measu emen Sys em Du ing he calib a ion o he 5m-Bench sys em, ollowing s eps a e ca ied ou ;  De e mina ion o he angula (pi ch and yaw) e o s o he ca ie ehicle  The accu acy o he measu emen due o he design o he ca ie ehicle.  De ec ion o de ec s in op ical p obe wi h mic ome e 3.1. Angula (pi ch and yaw) e o s ha occu du ing he mo ion o he ca ie Pi ch and yaw e o a e de e mined by angle op ics du ing 5 m mo emen o he ca iage ca . Pi ch e o = 500 a cseconds, Yaw e o = 500 a cseconds. The la ges angula e o in he sys em is he angula e o in he di ec ion o pi ch in e ms o pi ch o yaw. I he Abbe o se alue is assumed o be 25 mm, hen he maximum e o alue e = Sin (500/3600) x 25 = 60.6 m will esul in he unce ain y budge (60.6 / (3) 1/2 = 35 μm) I he Abbe o se alue in he same di ec ion is assumed o be 2mm, hen he maximum e o alue ha will esul om his is e = Sin (500/3600) x 2 = 4.85 μm, which is 4.85 / (3) 1/2 inch / 2 = 2.8 μm he unce ain y budge 3.2. Accu acy o measu emen due o he design o he ca ie I is no possible o combine he op ical axis o he lase in e e ome e and he measu ing axis o he s eel ape o ule o he same axis du ing he in es iga ion o he accu acy o he leng h measu emen p ocess while he ca ie is in mo ion. In his design, howe e , he lase in e e ome e axis and s eel ape o ule axis a e as close as possible o each o he . In his wo k, i is necessa y o ensu e ha he Abbe o se , in which he di e ences in angula alues caused by he sepa a ion o he axes om each o he , is as low as possible. The posi ion o Abbe o se and angula e o s in ou sys em is he lowes a he posi ion whe e he lase in e e ome e is closes o he me e axis is shown below (Fig. 9) DOI: 10.7795/810.20180323A Mac oScale Recen de elopmen s in aceable dimensional measu emen s 7 This wo k is licensed unde he C ea i e Commons A ibu ion 4.0 In e na ional License. To iew a copy o his license, isi h p://c ea i ecommons.o g/licenses/by/4.0/. Figu e 9: 5m-Bench design iew 3.3. De ec ion o de ec s in op ical p obe wi h mic ome e The mic ome e mo emen on he X-Y able is con olled by mo ing he bea ings in di e en di ec ions and dis ances, so ha he measu ing e ec s o he ca ie ehicle a di e en posi ions on he ail a e checked. As a esul o hese e ec s, i was de e mined ha he maximum op ic p obing accu acy ob ained was 20 μm and he maximum op ic p obing ep oducibili y was 5 μm. This alue is also included in he unce ain y budge . 4. Pe omans Tes o 5m-Bench Sys em Pe o mance o he 5m-Bench measu emen sys em; The Rich e b and 10 m ule calib a ed by he Swiss Na ional Me ology Ins i u e (METAS) in 2015 was used as e e ence a he SASO-NMCC labo a o ies o a 5m-Bench measu emen sys em. Measu emen s and esul s o SASO-NMCC we e used o de e mine unce ain y alues, METAS measu emen esul s and unce ain y alues using he En o mula. E alua ed measu emen esul s and unce ain y alues a e shown in Fig.10. SASO-NMCC 5m-Bench calib a ion sys em ensu es ha he calib a ion esul s o he Swiss Na ional Ins i u e o Me ology a e ag eed. SASO and METAS S eel ape measu emen esul s e alua ed wi h espec o En Value Nominal Leng h (mm) En Value 500 0,00 1000 0,37 1500 0,21 2000 0,11 2500 1,13 3000 0,21 3500 0,13 4000 0,52 4500 0,46 5000 0,50 Table 1: S eel Tape measu emen esul s e alua ed wi h espec o En Value DOI: 10.7795/810.20180323A Mac oScale Recen de elopmen s in aceable dimensional measu emen s 8 This wo k is licensed unde he C ea i e Commons A ibu ion 4.0 In e na ional License. To iew a copy o his license, isi h p://c ea i ecommons.o g/licenses/by/4.0/. Figu e 10: E alua ed measu emen esul s wi h unce aini y 5. Measu emen Unce ain y In he ollowing, he main e o sou ces o he bench a e cha ac e ized and hei unce ain y con ibu ions a e es ima ed [7]. The unce ain y o measu emen has been es ima ed acco ding o “The Guide o he Exp ession o Unce ain y in Measu emen (GUM)”, and has been exp essed in a leng h dependen o m o [(a)2 + (b x10-6L)2]1/2 using a co e age ac o o k=2. He e, a is he cons an alue, b is he leng h dependen alue and L is he measu ed leng h. Analysis o he unce ain y con ibu ions has been in es iga ed in de ail and has been combined wi h he leng h dependen o ma . The unce ain y budge s a e gi en o calib a ion o es ape using a lase in e e ome e . The accu acy o lase in e e ome e : Agilen HP5529A lase in e e ome e [6] used as a e e ence o he bench has an accu acy o 3.0x10- 6x L o displacemen measu emen s in labo a o y condi ions. This leng h dependen alue is conside ed as ec angula dis ibu ion esul ing in (3.0x10-6 x L)/ = 1.73x10-6 x L Resolu ion o lase in e e ome e : The esolu ion o he in e e ome e is 0.1 m. This alue is aken as digi al esolu ion esul ing in 0.1/(2x )= 0.0288 m unce ain y con ibu ion wi h ec angula dis ibu ion. The s anda d de ia ion o he mean alue: The s anda d de ia ion o he mean alue o ypically 3 se ies o epea measu emen s is be e han 20 m o ape measu emen s. Unce ain y con ibu ion is es ima ed as 20/ = 11.55 m Unce ain y con ibu ion om pi ch angula e o : Maximum peak o peak angula pi ch e o is 500 a cseconds. The measu emen axis is measu ed in ±18 mm in he e ical di ec ion. Abbe e o due o pi ch e o can be calcula ed as Sin (500/3600)x25 = 60.6 m. This leads o 60.6/ = 35 m unce ain y con ibu ion wi h ec angula dis ibu ion. Unce ain y con ibu ion om yaw angula e o : Maximum peak o peak angula yaw e o is 500 a cseconds. The measu emen axis is measu ed in ± 2 mm in he ho izon al di ec ion. Abbe e o due o yaw e o is Sin (500/3600)x2 =4.85 m, esul ing in 4.85/ = 2.8 m unce ain y con ibu ion wi h ec angula dis ibu ion. The accu acy o op ical p obing: I was de e mined ha he maximum op ical p obing accu acy ob ained was 20 μm, esul ing 20 / = 11.54 m unce ain y con ibu ion wi h ec angula dis ibu ion. -0,10 -0,05 0,00 0,05 0,10 0,15 0,20 0,25 0,30 0 500 1000 1500 2000 2500 3000 3500 4000 4500 5000 Measu emen E o (mm) Measu emen Poin s (mm) E alua ed Measu emen Resul s wi h Unce aini y SASO-NMCC METAS DOI: 10.7795/810.20180323A Mac oScale Recen de elopmen s in aceable dimensional measu emen s 9 This wo k is licensed unde he C ea i e Commons A ibu ion 4.0 In e na ional License. To iew a copy o his license, isi h p://c ea i ecommons.o g/licenses/by/4.0/. The s anda d de ia ion o he mean alue: The s anda d de ia ion o he mean alue o ypically 3 se ies o epea measu emen s is be e han 5 m o he op ical p obing es . Unce ain y con ibu ion is es ima ed as 5 / = 2.89 m. Unce ain y con ibu ion om Cosine e o : The lase is adjus ed pa allel o he measu emen axis be e han 2 mm la e al shi in 10 m leng h. This esul s in a cosine e o o 2 x10-7x L esul ing in (2 x10-7x L = 1.16 x10-7x L wi h ec angula dis ibu ion. Unce ain y con ibu ion om coe icien o he mal expansion (CTE) co ec ions; No CTE co ec ion is made o calib a ion o s eel apes and ules. Howe e , unce ain y con ibu ion is aken in o accoun due o possible di e ences in CTE alues. CTE o s eel ule o ape is known wi hin ±1 ppm and maximum empe a u e de ia ion om 20oC is less han 0.5 oC. Unce ain y con ibu ion due o CTE co ec ion can be calcula ed by 0.5oCx1x10-6xL esul ing in 0.5 x10-6x L. Conside ing his alue as ec angula dis ibu ion, unce ain y con ibu ion is es ima ed as (0.5 x10-6x L = 0.29 x10-6x L. Unce ain y con ibu ion om Tempe a u e measu emen s: No empe a u e measu emen co ec ion is pe o med. The unce ain y o empe a u e measu emen o line scale used in 10m-Bench using ma e ial senso s is be e han 0.25oC. Unce ain y con ibu ion can be calcula ed as 0.25oC x11.5x10-6 xL. Unce ain y con ibu ion is es ima ed as (0.25oC x11.5x10- 6xL) = 1.66 x10-6x L. wi h ec angula dis ibu ion. Unce ain y con ibu ion om Measu emen o ce ( ension load): Measu emen o ces, i.e. ension loads a e applied du ing calib a ion o apes acco ding o manu ac u e speci ica ions. Unce ain y con ibu ion a ises due o leng h a ia ions when he e is he di e ence be ween applied o ce and speci ied o ce. The co ec ion o di e en ension om speci ied can be es ima ed by Hooke’s law; LF = ( N) whe e LF is a de ia ion in leng h due o applied o ce F, E is he modulus o elas ici y and L is he leng h. The e m (L/EA) is he sensi i i y coe icien used o make he connec ion be ween measu emen o ce and de ia ion in leng h and u(F) is he unce ain y o applied o ce and u(LF) is a de ia ion in leng h due o he unce ain y o applied o ce whe e F0 is ape ension a calib a ion (N), F is ape ension (N), L is he dis ance measu ed (mm), E is Young’s elas ic modulus (N/mm2) and A is c oss-sec ional a ea o he ape (mm2). The ollowing nume ical alues o A and E a e gi en by he manu ac u e . (F-F0)=0.5 N (Es ima ed), A=2,4 mm2 and E=20.7x104 N/mm2 Manu ac u e s gi e speci ica ions and e en co ec ion alues due o he di e ence in he applied and speci ied o ce ( ensioning loads). The nume ical alues ob ained om li e a u e is ec angula dis ibu ion, he s anda d unce ain y con ibu ion is calcula ed as u(LF) = = 5.81 x10-7x L The expanded unce ain y alue; Uk=2 =   2 21.4)80(xL m : (L = m) is alid o he leng h measu emen s up o 5 m. DOI: 10.7795/810.20180323A