Method for measuring noise parameters of microwave two-port
Abstract
A new tuner-based method for measuring the four noise-parameters of a two-port is proposed. It makes use of a novel measurement ratio that includes noise powers and mismatch factors simultaneously. In contrast to previous works, no restrictions on the noise source, tuner state temperatures and cold temperatures are assumed.
Full text
Me hod o measu ing noise pa ame e s o
mic owa e wo-po
A.
Lhza o,
L.
P adell and
J.M.
O'Callaghan
A
new une -based me hod o measu ing
he
ou noise-
pa ame e s
o
a wo-po
is
p oposed. I makes
use
o
a
no el
measu emen
a io
ha includes noise powe s and misma ch
ac o s simul aneously. In con as o p e ious wo ks,
no
es ic ions
on
he
noise sou ce,
une
s a e
empe a u es
and
cold
empe a u es a e assumed.
In oduc ion;
The measu emen o he ou noise pa ame e s
("s)
NPs
o
a
wo-po in he mic owa e equency ange is usually
pe o med by measu ing he wo-po de ice noise igu e
F
o a
minimum o ou sou ce e lec ion-coe icien s
,,
p oduced wi h a
une connec ed a he wo-po inpu ( e lec ion- ype une ) [I ~
61. The equa ion ela ing
F
and
s,
(i
=
1,
...,
N)
is exp essed in lin-
ea o m, and he esul ing o e de e mined linea equa ion sys em
is sol ed o he
NPs
[I, 2, 51.
A
numbe o measu emen me hods ha e been p oposed. In
131,
F( s )
is de e mined om he measu ed
,,
and he co esponding
noise powe s deli e ed by he wo-po o he ecei e , a oom
empe a u e. The sys em gain is compu ed om he ho and cold
noise powe s deli e ed by
a
wo-s a e noise-sou ce
13,
71.
Equal
ho and cold sou ce e lec ion-coe icien s
sH
=
s,)
mus be
assumed. Typically, his assump ion does no a ec he measu e-
men accu acy o he
NPs,
because he di e ences be ween
,,
and
s,
a e e y small, bu some applica ions ( o example, c yo-
genic measu emen s o adiome e calib a ion) may equi e di e -
en ho and cold loads. In
141,
a me hod is gi en ha a oids he
o me es ic ion by using an al e na i e measu emen magni ude,
i.e. he a io be ween he deli e ed noise powe s and
a
misma ch
coe cien . Only he ho -sou ce measu emen
is
equi ed o de e -
mine he sys em gain, bu i is implici ly assumed ha he cold
( oom) empe a u e,
T,,
equals he e e ence empe a u e,
To
(=
290K)
[4].
This assump ion is a limi a ion in a eal labo a o y
en i onmen , o whene e he une includes semiconduc o
(PIN
diode) swi ches, because he diodes add a non- he mal (sho ) con-
ibu ion o he empe a u es o he une s a es,
T,,
(i
=
1,
...,
N).
Al e na i e echniques o measu e he ou
Nps
o he pa icula
case o
a
ansis o
181,
make use o he ansis o equi alen ci -
cui as addi ional in o ma ion. Howe e , a une mus be used o
calib a e he ecei e noise.
10,
,
120,
0.4
I
I
200,
I
0
10
20
30
,GHz
(34611j
Fig.
1
Recei e noise pa ame e s measu ed using new me hod, me hod
p oposed
by
Adamian
[3]
and me hod
p oposed
by Da idson
[4]
~ new me hod
0
Da idson
V
Adamian
While
a
une is equi ed o measu e he
NPs
o a gene al wo-
po ando o calib a e he ecei e , a gene al case
csH
#
Tsc,
T,
#
To,
T,,
#
To,
and di e en
T,,
o e e y s a e
i)
is o en encoun-
e ed.
No
accu acy deg ada ion should be expec ed in hese cases
i a measu emen me hod wi h no es ic i e assump ions we e
used. The pu pose o his Le e is o p opose a new me hod o
measu ing he ou
NPs
o a wo-po , based
on
a e lec ion- ype
une . I is a mo e gene al me hod han hose in
[3,
41 because: (i)
i does no equi e measu emen o he cold-sou ce;
(ii)
T,
need
no be
To;
(iii)
c,
(i
=
1,
...,
N)
need no
be
ei he he same as o
equal o
To.
Mo eo e , i demons a es an imp o ed accu acy in
c i ical measu emen si ua ions (i.e.
l opTl
in he wo-po close o
1).
Expe imen al e i ica ion is gi en up o 26GHz.
,GHz
~
Fig.
2
HEMT
noise pa ame e s measu ed using new me hod, me hod
p oposed
by
Adamian
131,
me hod p oposed by Da idson
[4]
and
F50
me hod
[8]
~
new
me hod
0
Da idson
Adamian
0
F50
Measu emen me hod:
To calib a e he ecei e , he une is con-
nec ed o i s inpu and he noise powe deli e ed o he ecei e
de ec o is measu ed o e e y une s a e
,
(i
=
1,
...,
N).
This
powe can be exp essed as:
whe e
k
is he Bol zmann cons an ,
,
is he ecei e inpu e lec-
ion coe icien ,
Ts
is he noise empe a u e o he sou ce imped-
ance
,,,
TJ ,)
is
i s co esponding ecei e noise empe a u e,
(Cop)
is he ecei e ansduce powe gain,
Go
is he ecei e
ansduce powe gain o
a
ma ched sou ce
( ,
=
0),
and
p( R,
,)
=
(l-~~s~z)~l-~s~R~z is a misma ch ac o .
Go
is a cons an
h oughou he measu emen , because i only depends on ecei e
pa ame e s.
To
elimina e he gain cons an
Go
he noise powe PH
deli e ed by a ho sou ce (whose ho empe a u e
TH
is known), is
used as a e e ence o de ine a no el measu emen a io
R,:
The ecei e noise empe a u e
T,
is exp essed in a linea o m by
using he Lane's pa ame e s
A,
B,
C,
D
[I],
whch a e unc ions o
he ecei e
NPs,
T,,,,,,
G,,,
Bop, and
R,,:
whe e
Y,
=
Gs
+
jBs is he sou ce admi ance. Subs i u ing eqn.
3
in o eqn. 2, he ollowing o e de e mined linea equa ion sys em
is
ob ained o
A,
B, C,
D:
[Sz]
=
[VI
.
[A
B
C
D]'
(i
=
1,
...,
N)
(4)
S,
E
R,TH
-
Ts,
(5)
The sys em in eqn.
4
is sol ed o
A,
B,
C,
D,
by weigh ed leas -
squa es using he concep o he pseudo-in e se ma ix, and he
ecei e
NPs
a e eadily compu ed. This calcula ion comple es he
ecei e calib a ion. Then he wo-po is inse ed, and by using
he F iis's o mula, he ollowing equa ion is eadily de i ed:
s;
=
TDUT( Sz)
-
R:T~~~(~~~)
(i
=
1,
...,
N)
(8)
1332
ELECTRONICS
LETTERS
25 h
June
1998
Vol.
34
No.
13
whe e
R,‘
is de ined as in eqn. 2, bu wi h he e lec ion coe icien
,
e e ed o he wo-po inpu . In eqn.
9,
he e lec ion coe i-
cien s
,,’,
s/
co espond o
s,
and
,,,
espec i ely, bu a e
e e ed o he wo-po ou pu .
TDUT
and
Ga DuT
a e he wo-po
noise empe a u e and a ailable gain, espec i ely, and
72
is he
ecei e noise empe a u e, compu ed om he ecei e
NPs
p e i-
ously measu ed. The wo-po noise empe a u e in eqn.
8
is
exp essed in linea o m, and a linea sys em simila o eqns. 4
-
7
is ob ained o
[A
B
C
DITDuT,
wi h
R,
and S, eplaced by
R,‘
and
SE’,
espec i ely.
Expe imen al esul s:
The me hod has been es ed on on-wa e
ansis o s. The es se up includes a b oadband (2-26GHz), com-
me cial une [6] wi h nine a ailable sou ce s a es. The une and
ho sou ce e lec ion-coe icien s a e measu ed oge he wi h hei
co esponding noise powe s and used in [2
-
91. Fig.
1
shows ha
he measu ed ecei e
NPs
up o 26GHz o he me hod p oposed
he e and o hose p oposed in [3, 41 a e almos iden ical, which is
o be expec ed since he es condi ions needed in he o me me h-
ods [3, 41 a e me
(TsX
=
,,
o [3] and
T,,
=
To
o [4]). Fig. 2
compa es he measu ed
NPs
o an on-wa e HEMT up o 26GHz.
The ag eemen be ween he ou me hods (Fs0 me hod
[SI
is also
compa ed) is good excep a low equencies, o which
l oPTl
is
e y high (close o 1). The new me hod is mo e obus o his c i -
ical measu emen si ua ion han hose in [3, 41, which ha e non-
physical pa ame e s.
Conclusions;
A
no el une -based me hod o measu ing he ou
NPs o a gene al wo-po wi h no es ic ions in he noise sou ce
o une , has been p oposed and success ully applied o he
ecei e calib a ion and o an HEMT. I has been compa ed o
o he une -based me hods in he li e a u e, demons a ing accu-
acy imp o emen s in he de e mina ion o he NPs o c i ical
measu emen si ua ions, such as a de ice
I &
close o
1.
Acknowledgmen :
This wo k has been suppo ed by he esea ch
p ojec s TIC93-672-C04-03 and TIC97-1129-C04-04 manced by
he Spanish CICYT.
0
IEE 1998
Elec onics Le e s Online
No:
19980942
A. Laza o, L. P adell and J.M. O’Callaghan
(Poly echnic Uni e si y
o
Ca alunya
(UPC),
Dep . TSC, Campus No d UPC,
08034
Ba celona,
Spain)
7
May
I998
Re e ences
LANE, R.Q.:
‘The de e mina ion o de ice noise pa ame e s’,
P oc.
CARUSO, G.,
and
SANNINO,
M.:
‘Compu e -aided de e mina ion o
mic owa e wo-po noise pa ame e s’,
ZEEE T ans. Mic ow.
Theo y Tech.,
1978,
26,
(9), pp. 639-642
ADAMIAN,
A.,
and
UHLIR,
A
:
‘A no el p ocedu e o ecei e noise
cha ac e isa ion’,
IEEE T ans. Zns um. Meas.,
1973,
22,
(6), pp.
181-182
DA iDsoN, A.c.,
LEAKE,
B.w.,
and
STRID,
E.:
‘Accu acy imp o emen s
in mic owa e noise pa ame e measu emen s’,
IEEE T ans.
Mic ow. Theo y Tech.,
1989, 37, (12), pp. 1973-1978
OCALLAGHAN,
J.M., and
MONDAL,
J.P.:
‘A ec o app oach o noise
pa ame e i ing and selec ion
o
sou ce admi ances’,
ZEEE T ans.
Mic ow. Theo y Tech.,
1991,
37,
(12),
pp.
1376-1382
NPTS-26 Sys em, Cascade-Mic o ech, Inc., 14255 SW B igadoon,
Bea e on,
OR
97005
CROZAT,
P.]
DOUTLX,
c.,
CTI*””ET,
M
,
DANELON,
V.)
SYLVESTRE)
a.,
and
VERNET,
G.:
‘SO
0
noise measu emen s wi h ull ecei e
calib a ion wi hou une ’,
Elec on. Le .,
1996,
3,
pp. 261-262
LAZARO,
A.,
PRADELL, L., BELTRAN, A.,
and
O’CALLAGHAN,
J.M.:
‘Di ec ex ac ion
o
all ou ansis o noise pa ame e s om
Son
noise igu e measu emen s’,
Elec on. Le .,
1998,
32,
(3),
pp.
289-
291
ZEEE,
1969,
57,
pp.
1461-1462
Nonlinea s abili y anallysis
o
mic owa e
ci cui s using comme cial so wa e
A.
Sua ez,
V.
Iglesias,
J.-M.
Collan es, J. Jug0 and
J.L.
Ga cia
A new echnique is p esen ed o he s abili y analysis
o
s eady
nonlinea egimes in mic owa e ci cui s, using comme cial
so wa e. The Nyquis s abili y c i e ion is applied o he open-
loop
ans e unc ions o he ci cui linea isa ion a ound he
s eady s a e. Th ough a simple nonlinea op imisa ion echnique i
is also possible o de e mine he p edic ed quasi-pe iodic o
pe iod-doubled s eady solu ions. The s abili y analysis o wo
a ac o -based ci cui s has p o ided excellen esul s when
compa ed wi h ime domain simula ions and measu emen s.
In oduc ion:
Ha monic balance (HB) comme cial simula o s a e
an in aluable ool o he analysis
o
he nonlinea s eady egimes
o mic owa e ci cui s, such as powe ampli ie s, oscilla o s o e-
quency double s.
A
nonlinea s abili y analysis is also necessa y in
o de o ensu e he physical exis ence o he simula ed solulions
[l,
21.
This analysis p o ides in o ma ion abou he possible exis -
ence o uns able na u al equencies ha would gi e ise o, o en
undesi able, quasi-pe iodic o pe iod doubled egimes. Howe e ,
he s abili y analysis o hese egimes is no ye a ailable. Ins ead,
comme cial simula o s only include s abili y analysis op ions o
he DC solu ions o oscilla o ci cui s.
In his Le e , a new echnique is p esen ed o he s abili y
analysis o nonlinea s eady egimes, using comme cial so wa e. I
is based on he Nyquis s abili y c i e ion, which is applied o he
open-loop ans e unc ion o he ci cui linea isa ion a ound i s
nonlinea s eady solu ion. To calcula e his ans e unc ion, a
eal equency pe u ba ion is in oduced o e he s eady egime,
in he o m o an auxilia y gene a o (AG) o neghgible ampli ude.
This enables he e alua ion o he open-loop ans e unc ion a
he AG loca ion. The Nyquis plo s a e hen di ec ly ob ained by
sweeping he
AG
equency. Fo a igo ous analysis, a oiding
unce ain y abou possible ze o-pole cancella ions, se e al obse -
a ion po s should be conside ed sequen ially.
A new echnique is also p esen ed o he s eady-s a e analysis
o he p edic ed au onomous quasi-pe iodic and equency di ided
egimes. This is based on nonlinea op imisa ion o he auxilia y
gene a o a iables, imposing a non-pe u ba ion condi ion. The
uns able na u al equency is es ima ed om he Nyquis plo ,
which p o ides a aluable s a ing poin o he op imisa ion.
Since he new analysis echniques a e in ended o comme cial
simula o s, hey a e eadily usable by any mic owa e-ci cui
designe . Ad an age is also aken o he lexibili y o comme cial
so wa e, which enables he analysis o complex opologies, which
a e ypically di icul o in oduce in in-house so wa e.
He e, he p oposed analysis me hod has been applied o he
s abili y analysis o wo a ac o -based ci cui s: a simple ci cui
o equency di ision and a equency double ha exhibi s an
asynch onous ins abili y. The espec i e pe iod doubled and quasi-
pe iodic solu ions we e p edic ed and de e mined by means o he
new me hod, ob aining an excellen ag eemen wi h ime domain
simula ions and measu emen s. Fo bo h he s abili y and s eady
s a e analysis, HP-MDS comme cial so wa e has been used.
Fig.
1
Block diag am
o
pe u bed ci cui , linea ised a ound nonlinea
pe iodic solu ion
XpO
Analysis me hod:
A
nonlinea ci cui , exhibi ing a s eady egime o
pe u ba ion will be supe imposed o e he s eady solu ion
X,O.
This is done by in oducing in o he ci cui an auxilia y gene a o
(AG) o negligible ampli ude
E
and a iable equency ,, wi h a
il e which elimina es i s in luence a all equencies di e en om
i s own [3]. The inpu immi ance a ,, obse ed om he AG e -
minals, may be spli in o wo con ibu ions. Whene e possible,
-d-en al ;,,
will
he
conside ed
To
analyse
i s
s abili y,
a
small
ELECTRONICS LETTERS
25 h
June
7998
Vol.
34
No.
13
1333